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Advances in surface treatments . Volume 4 : technology, applications, effects / / A Niku-Lari
Advances in surface treatments . Volume 4 : technology, applications, effects / / A Niku-Lari
Autore Niku-Lari A.
Edizione [First edition.]
Pubbl/distr/stampa Oxford, England : , : Pergamon Press Ltd, , 1987
Descrizione fisica 1 online resource (587 p.)
Disciplina 620.44
Soggetto topico Surfaces (Technology) - Analysis
Surfaces (Technology) - Design
ISBN 1-4831-9100-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Front Cover; Advances in Surface Treatments: Technology - Applications - Effects; Copyright Page; INTERNATONAL EDITORIAL ADVISORY COMMITTEE FOR THIS VOLUME; BOARD OF REFEREES; PREFACE; EDITORIAL; MAIN AREAS COVERED IN THE SERIES; INDUSTRIAL COMMITTEE AND SUPPORT GROUP; INSTRUCTIONS TO CONTRIBUTORS; Table of Contents; CONVERSION UNITS; INTRODUCTION TO RESIDUAL STRESS; INTRODUCTORY REMARKS; DEFINITIONS OF RESIDUAL STRESSES; CHARACTERISTIC EXAMPLES OF RESIDUAL STRESS STATES; MEASUREMENT OF RESIDUAL STRESSES; COMPUTATIONAL RESIDUAL STRESS ANALYSES; ASSESSING ASPECTS OF RESIDUAL STRESSES
CONCLUDING NOTESREFERENCES; PART I: GENERATION OF RESIDUAL STRESSES; CHAPTER 1. RESIDUAL STRESSES AS A CONSEQUENCE OF WELDING; INTRODUCTION; DIFFERENT SOURCES OF WELDING STRESSES; RESIDUAL STRESSES IN SINGLE PASS WELDS OF THIN SHEETS. FINITE ELEMENT CALCULATIONS AND EXPERIMENTAL RESULTS; RESIDUAL STRESS DISTRIBUTIONS IN MULTI-PASS WELDED PLATES AND TUBES; REFERENCES; CHAPTER 2. RESIDUAL STRESSES INTRODUCED BY MACHINING; ABSTRACT; NOMENCLATURE; INTRODUCTION; FUNDAMENTALS OF MACHINING RESIDUAL STRESSES; GRINDING RESIDUAL STRESSES; MILLING RESIDUAL STRESSES; TURNING RESIDUAL STRESSES
RESIDUAL STRESS DISTRIBUTIONS AFTER COMBINATIONS OF DIFFERENT MACHINING OPERATIONSCONSEQUENCES OF MACHINING RESIDUAL STRESSES; REFERENCES; CHAPTER 3. MECHANICAL PRODUCTION OF SELF STRESSES; ABSTRACT; OVERLOADING; AUTOFRETTAGE - EXPANDING TUBES AND HOLES; SHOT PEENING; REFERENCES; CHAPTER 4. RESIDUAL STRESSES CAUSED BY THERMAL AND THERMOCHEMICAL SURFACE TREATMENTS; ABSTRACT; KEYWORDS; INTRODUCTION; SUMMARY; REFERENCES; CHAPTER 5. RESIDUAL STRESSES IN COMPOSITE MATERIALS: AN OVERVIEW OF MEASUREMENT METHODS USED; ABSTRACT; NOMENCLATURE; INTRODUCTION; ORIGIN OF RESIDUAL STRESSES AT THE INTERFACES
X-RAY AND NEUTRON DIFFRACTIONOPTICAL METHUOD (RAMAN SPECTROSCOPY); ULTRASONIC METHODS; MAGNETIC METHODS; SUMMARY; ACKNOWLEDGEMENT; REFERENCES; CHAPTER 6. RESIDUAL STRESSES IN URANIUM AND URANIUM ALLOYS; ABSTRACT; INTRODUCTION; GENERATION OF RESIDUAL STRESSES; MEASUREMENT AND PREDICTION OF RESIDUAL STRESSES; RELIEVING OF RESIDUAL STRESSES; CONSEQUENCES OF RESIDUAL STRESSES; SUMMARY; REFERENCES; CHAPTER 7. RESIDUAL STRESSES IN CVD AND PVD REFRACTORY COATINGS; ABSTRACT; INTRODUCTION; THE COATING MATERIALS; EXPERIMENTAL TECHNIQUE; INSTRUMENTATION; EXPERIMENTAL RESULTS; DISCUSSION; CONCLUSIONS
REFERENCESPART II: MEASUREMENT AND PREDICTION OF RESIDUAL STRESSES; CHAPTER 8. THE TREPAN OR RING CORE METHOD, CENTRE-HOLE METHOD, SACH'S METHOD, BLIND HOLE METHODS, DEEP HOLE TECHNIQUE; ABSTRACT; NOMENCLATURE; INTRODUCTION; TREPAN OR RING-CORE METHOD; THEORETICAL CONSIDERATIONS; HOLE DRILLING; EVALUATION OF TECHNIQUE; SECTIONING; DEEP HOLE METHOD; CONCLUSIONS; ACKNOWLEDGEMENT; REFERENCES; CHAPTER 9. MEASUREMENT OF RESIDUAL STRESS DISTRIBUTION BY THE INCREMENTAL HOLE-DRILLING METHOD; INDUSTRIAL SUMMARY; NOMENCLATURE; INTRODUCTION; ""TRADITIONAL"" HOLE DRILLING METHOD
CALIBRATION OF THE HOLE-DRILLING METHOD
Record Nr. UNINA-9910786637903321
Niku-Lari A.  
Oxford, England : , : Pergamon Press Ltd, , 1987
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Advances in surface treatments . Volume 4 : technology, applications, effects / / A Niku-Lari
Advances in surface treatments . Volume 4 : technology, applications, effects / / A Niku-Lari
Autore Niku-Lari A.
Edizione [First edition.]
Pubbl/distr/stampa Oxford, England : , : Pergamon Press Ltd, , 1987
Descrizione fisica 1 online resource (587 p.)
Disciplina 620.44
Soggetto topico Surfaces (Technology) - Analysis
Surfaces (Technology) - Design
ISBN 1-4831-9100-1
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Front Cover; Advances in Surface Treatments: Technology - Applications - Effects; Copyright Page; INTERNATONAL EDITORIAL ADVISORY COMMITTEE FOR THIS VOLUME; BOARD OF REFEREES; PREFACE; EDITORIAL; MAIN AREAS COVERED IN THE SERIES; INDUSTRIAL COMMITTEE AND SUPPORT GROUP; INSTRUCTIONS TO CONTRIBUTORS; Table of Contents; CONVERSION UNITS; INTRODUCTION TO RESIDUAL STRESS; INTRODUCTORY REMARKS; DEFINITIONS OF RESIDUAL STRESSES; CHARACTERISTIC EXAMPLES OF RESIDUAL STRESS STATES; MEASUREMENT OF RESIDUAL STRESSES; COMPUTATIONAL RESIDUAL STRESS ANALYSES; ASSESSING ASPECTS OF RESIDUAL STRESSES
CONCLUDING NOTESREFERENCES; PART I: GENERATION OF RESIDUAL STRESSES; CHAPTER 1. RESIDUAL STRESSES AS A CONSEQUENCE OF WELDING; INTRODUCTION; DIFFERENT SOURCES OF WELDING STRESSES; RESIDUAL STRESSES IN SINGLE PASS WELDS OF THIN SHEETS. FINITE ELEMENT CALCULATIONS AND EXPERIMENTAL RESULTS; RESIDUAL STRESS DISTRIBUTIONS IN MULTI-PASS WELDED PLATES AND TUBES; REFERENCES; CHAPTER 2. RESIDUAL STRESSES INTRODUCED BY MACHINING; ABSTRACT; NOMENCLATURE; INTRODUCTION; FUNDAMENTALS OF MACHINING RESIDUAL STRESSES; GRINDING RESIDUAL STRESSES; MILLING RESIDUAL STRESSES; TURNING RESIDUAL STRESSES
RESIDUAL STRESS DISTRIBUTIONS AFTER COMBINATIONS OF DIFFERENT MACHINING OPERATIONSCONSEQUENCES OF MACHINING RESIDUAL STRESSES; REFERENCES; CHAPTER 3. MECHANICAL PRODUCTION OF SELF STRESSES; ABSTRACT; OVERLOADING; AUTOFRETTAGE - EXPANDING TUBES AND HOLES; SHOT PEENING; REFERENCES; CHAPTER 4. RESIDUAL STRESSES CAUSED BY THERMAL AND THERMOCHEMICAL SURFACE TREATMENTS; ABSTRACT; KEYWORDS; INTRODUCTION; SUMMARY; REFERENCES; CHAPTER 5. RESIDUAL STRESSES IN COMPOSITE MATERIALS: AN OVERVIEW OF MEASUREMENT METHODS USED; ABSTRACT; NOMENCLATURE; INTRODUCTION; ORIGIN OF RESIDUAL STRESSES AT THE INTERFACES
X-RAY AND NEUTRON DIFFRACTIONOPTICAL METHUOD (RAMAN SPECTROSCOPY); ULTRASONIC METHODS; MAGNETIC METHODS; SUMMARY; ACKNOWLEDGEMENT; REFERENCES; CHAPTER 6. RESIDUAL STRESSES IN URANIUM AND URANIUM ALLOYS; ABSTRACT; INTRODUCTION; GENERATION OF RESIDUAL STRESSES; MEASUREMENT AND PREDICTION OF RESIDUAL STRESSES; RELIEVING OF RESIDUAL STRESSES; CONSEQUENCES OF RESIDUAL STRESSES; SUMMARY; REFERENCES; CHAPTER 7. RESIDUAL STRESSES IN CVD AND PVD REFRACTORY COATINGS; ABSTRACT; INTRODUCTION; THE COATING MATERIALS; EXPERIMENTAL TECHNIQUE; INSTRUMENTATION; EXPERIMENTAL RESULTS; DISCUSSION; CONCLUSIONS
REFERENCESPART II: MEASUREMENT AND PREDICTION OF RESIDUAL STRESSES; CHAPTER 8. THE TREPAN OR RING CORE METHOD, CENTRE-HOLE METHOD, SACH'S METHOD, BLIND HOLE METHODS, DEEP HOLE TECHNIQUE; ABSTRACT; NOMENCLATURE; INTRODUCTION; TREPAN OR RING-CORE METHOD; THEORETICAL CONSIDERATIONS; HOLE DRILLING; EVALUATION OF TECHNIQUE; SECTIONING; DEEP HOLE METHOD; CONCLUSIONS; ACKNOWLEDGEMENT; REFERENCES; CHAPTER 9. MEASUREMENT OF RESIDUAL STRESS DISTRIBUTION BY THE INCREMENTAL HOLE-DRILLING METHOD; INDUSTRIAL SUMMARY; NOMENCLATURE; INTRODUCTION; ""TRADITIONAL"" HOLE DRILLING METHOD
CALIBRATION OF THE HOLE-DRILLING METHOD
Record Nr. UNINA-9910828236103321
Niku-Lari A.  
Oxford, England : , : Pergamon Press Ltd, , 1987
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Applied Surface Analysis
Applied Surface Analysis
Pubbl/distr/stampa [Place of publication not identified], : American Society for Testing & Materials, 1980
Descrizione fisica 1 online resource (207 pages)
Disciplina 620.1/1292
Collana ASTM special technical publication
Soggetto topico Surfaces (Technology) - Analysis
Spectrum analysis
ISBN 0-8031-5552-2
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910164744503321
[Place of publication not identified], : American Society for Testing & Materials, 1980
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Beam effects, surface topography, and depth profiling in surface analysis [[electronic resource] /] / edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell
Beam effects, surface topography, and depth profiling in surface analysis [[electronic resource] /] / edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell
Edizione [1st ed. 2002.]
Pubbl/distr/stampa New York, : Plenum Press, c1998
Descrizione fisica 1 online resource (451 p.)
Disciplina 620/.44
Altri autori (Persone) CzandernaAlvin Warren <1930->
MadeyTheodore E
PowellC. J (Cedric John)
Collana Methods of surface characterization
Soggetto topico Surfaces (Technology) - Analysis
Materials - Effect of radiation on
Soggetto genere / forma Electronic books.
ISBN 1-280-20495-8
9786610204953
0-306-46914-6
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Photon Beam Damage and Charging at Solid Surfaces -- Electron Beam Damage at Solid Surfaces -- Ion Beam Bombardment Effects on Solid Surfaces at Energies Used for Sputter Depth Profiling -- Characterization of Surface Topography -- Depth Profiling Using Sputtering Methods.
Record Nr. UNINA-9910455255203321
New York, : Plenum Press, c1998
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Beam effects, surface topography, and depth profiling in surface analysis [[electronic resource] /] / edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell
Beam effects, surface topography, and depth profiling in surface analysis [[electronic resource] /] / edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell
Edizione [1st ed. 2002.]
Pubbl/distr/stampa New York, : Plenum Press, c1998
Descrizione fisica 1 online resource (451 p.)
Disciplina 620/.44
Altri autori (Persone) CzandernaAlvin Warren <1930->
MadeyTheodore E
PowellC. J (Cedric John)
Collana Methods of surface characterization
Soggetto topico Surfaces (Technology) - Analysis
Materials - Effect of radiation on
ISBN 1-280-20495-8
9786610204953
0-306-46914-6
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Photon Beam Damage and Charging at Solid Surfaces -- Electron Beam Damage at Solid Surfaces -- Ion Beam Bombardment Effects on Solid Surfaces at Energies Used for Sputter Depth Profiling -- Characterization of Surface Topography -- Depth Profiling Using Sputtering Methods.
Record Nr. UNINA-9910779845403321
New York, : Plenum Press, c1998
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Electro-optical characterization [[electronic resource] /] / National Center for Photovoltaics, Measurements & Characterization
Electro-optical characterization [[electronic resource] /] / National Center for Photovoltaics, Measurements & Characterization
Pubbl/distr/stampa Golden, CO : , : National Renewable Energy Laboratory, , [2006]
Descrizione fisica 4 unnumbered pages : digital, PDF file
Collana NREL/BR
Soggetto topico Electrooptics
Materials testing laboratories - Instruments
Surfaces (Technology) - Analysis
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti Electro optical characterization
Record Nr. UNINA-9910698350603321
Golden, CO : , : National Renewable Energy Laboratory, , [2006]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
An essential guide to electronic material surfaces and interfaces / / Leonard J. Brillson, Ohio State University
An essential guide to electronic material surfaces and interfaces / / Leonard J. Brillson, Ohio State University
Autore Brillson L. J.
Pubbl/distr/stampa Hoboken, New Jersey : , : John Wiley & Sons, Incorporated, , 2016
Descrizione fisica 1 online resource (379 p.)
Disciplina 621.381
Soggetto topico Electronics - Materials
Surfaces (Technology) - Analysis
Spectrum analysis
Semiconductors - Materials
ISBN 1-119-02713-6
1-78785-141-9
1-119-02714-4
1-119-02712-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Why surfaces and interfaces of electronic materials -- Semiconductor electronic and optical properties -- Electrical measurements of surfaces and interfaces -- Localized states at surfaces and interfaces -- Ultrahigh vacuum technology -- Surface and interface analysis -- Surface and interface spectroscopies -- Dynamical depth-dependent analysis and imaging -- Electron beam diffraction and microscopy of atomic-scale geometrical structure -- Scanning probe techniques -- Optical spectroscopies -- Electronic material surfaces -- Surface electronic applications -- Semiconductor heterojunctions -- Metal-semiconductor interfaces -- Next generation surfaces and interfaces.
Record Nr. UNINA-9910136943803321
Brillson L. J.  
Hoboken, New Jersey : , : John Wiley & Sons, Incorporated, , 2016
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
An essential guide to electronic material surfaces and interfaces / / Leonard J. Brillson, Ohio State University
An essential guide to electronic material surfaces and interfaces / / Leonard J. Brillson, Ohio State University
Autore Brillson L. J.
Pubbl/distr/stampa Hoboken, New Jersey : , : John Wiley & Sons, Incorporated, , 2016
Descrizione fisica 1 online resource (379 p.)
Disciplina 621.381
Soggetto topico Electronics - Materials
Surfaces (Technology) - Analysis
Spectrum analysis
Semiconductors - Materials
ISBN 1-119-02713-6
1-78785-141-9
1-119-02714-4
1-119-02712-8
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Why surfaces and interfaces of electronic materials -- Semiconductor electronic and optical properties -- Electrical measurements of surfaces and interfaces -- Localized states at surfaces and interfaces -- Ultrahigh vacuum technology -- Surface and interface analysis -- Surface and interface spectroscopies -- Dynamical depth-dependent analysis and imaging -- Electron beam diffraction and microscopy of atomic-scale geometrical structure -- Scanning probe techniques -- Optical spectroscopies -- Electronic material surfaces -- Surface electronic applications -- Semiconductor heterojunctions -- Metal-semiconductor interfaces -- Next generation surfaces and interfaces.
Record Nr. UNINA-9910818236403321
Brillson L. J.  
Hoboken, New Jersey : , : John Wiley & Sons, Incorporated, , 2016
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Formulation science and technology . Volume 1 Basic theory of interfacial phenomena and colloid stability / / Tharwat F. Tadros
Formulation science and technology . Volume 1 Basic theory of interfacial phenomena and colloid stability / / Tharwat F. Tadros
Autore Tadros Tharwat F.
Pubbl/distr/stampa Berlin ; ; Boston : , : De Gruyter, , [2018]
Descrizione fisica 1 online resource (430 pages)
Disciplina 620.44
Collana Formulation Science and Technology
Soggetto topico Surfaces (Technology) - Analysis
Solid-liquid interfaces
Soggetto genere / forma Electronic books.
ISBN 3-11-058760-2
3-11-058794-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Frontmatter -- Preface -- Contents -- 1. General introduction -- 2. Classification of surfactants, their solution properties and self-assembly structures -- 3. General classification of polymeric surfactants and their solution properties -- 4. Adsorption of surfactants at the liquid/liquid interface -- 5. Surfactant adsorption at the solid/liquid interface -- 6. Adsorption and conformation of polymeric surfactants at interfaces -- 7. Electrostatic stabilization of dispersions -- 8. Interaction between particles or droplets containing adsorbed polymer layers and the theory of steric stabilization -- 9. Flocculation of dispersions -- 10. Ostwald ripening in dispersions and its prevention -- 11. Emulsion coalescence and its prevention -- 12. Phase inversion and its prevention -- 13. Sedimentation of suspensions, creaming of emulsions and their prevention -- 14. Flow characteristics (rheology) of formulations -- Index
Record Nr. UNINA-9910466825603321
Tadros Tharwat F.  
Berlin ; ; Boston : , : De Gruyter, , [2018]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Formulation science and technology . Volume 1 Basic theory of interfacial phenomena and colloid stability / / Tharwat F. Tadros
Formulation science and technology . Volume 1 Basic theory of interfacial phenomena and colloid stability / / Tharwat F. Tadros
Autore Tadros Tharwat F.
Pubbl/distr/stampa Berlin ; ; Boston : , : De Gruyter, , [2018]
Descrizione fisica 1 online resource (430 pages)
Disciplina 620.44
Collana Formulation Science and Technology
Soggetto topico Surfaces (Technology) - Analysis
Solid-liquid interfaces
ISBN 3-11-058760-2
3-11-058794-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Frontmatter -- Preface -- Contents -- 1. General introduction -- 2. Classification of surfactants, their solution properties and self-assembly structures -- 3. General classification of polymeric surfactants and their solution properties -- 4. Adsorption of surfactants at the liquid/liquid interface -- 5. Surfactant adsorption at the solid/liquid interface -- 6. Adsorption and conformation of polymeric surfactants at interfaces -- 7. Electrostatic stabilization of dispersions -- 8. Interaction between particles or droplets containing adsorbed polymer layers and the theory of steric stabilization -- 9. Flocculation of dispersions -- 10. Ostwald ripening in dispersions and its prevention -- 11. Emulsion coalescence and its prevention -- 12. Phase inversion and its prevention -- 13. Sedimentation of suspensions, creaming of emulsions and their prevention -- 14. Flow characteristics (rheology) of formulations -- Index
Record Nr. UNINA-9910796875803321
Tadros Tharwat F.  
Berlin ; ; Boston : , : De Gruyter, , [2018]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui