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129 Xe Relaxation and Rabi Oscillations / / by Mark E. Limes
| 129 Xe Relaxation and Rabi Oscillations / / by Mark E. Limes |
| Autore | Limes Mark E |
| Edizione | [1st ed. 2015.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2015 |
| Descrizione fisica | 1 online resource (151 p.) |
| Disciplina | 538.3 |
| Collana | Springer Theses, Recognizing Outstanding Ph.D. Research |
| Soggetto topico |
Spectrum analysis
Microscopy Low temperatures Spectroscopy and Microscopy Low Temperature Physics Spectroscopy/Spectrometry |
| ISBN | 3-319-13632-1 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- Longitudinal Relaxation in Solid 129XE -- Dipolar and Exchange Coupling Between Carrier Pairs in Disordered Semiconductors Undergoing Resonance -- Low-Frequency Modulation of Longitudinal Field: Modified Rabi Envelopes. |
| Record Nr. | UNINA-9910300429803321 |
Limes Mark E
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| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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18th and 19th Century Porcelain Analysis : A Forensic Provenancing Assessment / / by Howell G. M. Edwards
| 18th and 19th Century Porcelain Analysis : A Forensic Provenancing Assessment / / by Howell G. M. Edwards |
| Autore | Edwards Howell G. M. <1943-> |
| Edizione | [1st ed. 2020.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 |
| Descrizione fisica | 1 online resource (XXVII, 324 p. 58 illus., 52 illus. in color.) |
| Disciplina |
738.20740161781
738.209 |
| Soggetto topico |
Ceramics
Glass Composite materials Cultural property Analytical chemistry Porcelain Spectrum analysis Microscopy Ceramics, Glass, Composites, Natural Materials Cultural Heritage Analytical Chemistry Fine Arts Spectroscopy and Microscopy |
| ISBN | 3-030-42192-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Chapter 1: Porcelain and its Composition -- Chapter 2: The Development of British Porcelain from the 18th into the 19th Centuries -- Chapter 3: Appraisal of the Earliest Chemical Analyses of Sir Arthur Church (1894) and of Herbert Eccles & Bernard Rackham (1922). Chapter 4: Analytical Studies of Porcelains: Correlation with the Holistic Information about the 18th and 19th Century Factories -- Chapter 5: Analytical Compositional Data and the Interpretation of the Data Acquired from Elemental Oxide -- Chapter 6: The Molecular Spectroscopic Analysis of Porcelains -- Chapter 7: The Earliest Porcelain in Europe… Meissen? -- Chapter 8 : The Role of Analytical Data in the Holistic Interpretation of Porcelains -- Chapter 9 : The Future for the Holistic Analysis of Porcelains -- Chapter 10: Summary and Conclusions -- References -- Appendix I: What Quantities of Raw Materials were used in a Typical Kiln Charge? -- Appendix II : A Combined Analytical Study of the Nantgarw Porcelain Glaze on Shard No. NG6 and Others: Implications for Nantgarw Porcelain Attribution -- Implications for the History of Nantgarw Porcelain -- Raman Spectroscopy of Glazes : Potential for the Dating of Porcelain Substrates -- Appendix III:William Billingsley and His Pursuit of Perfection in the Manufacture of Highly Translucent Porcelain -- Appendix IV : Analysis of Pigments on Porcelains -- Glossary -- Index. . |
| Record Nr. | UNINA-9910412152003321 |
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Edwards Howell G. M. <1943->
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| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Accurate Calibration of Raman Systems : At the Karlsruhe Tritium Neutrino Experiment / / by Magnus Schlösser
| Accurate Calibration of Raman Systems : At the Karlsruhe Tritium Neutrino Experiment / / by Magnus Schlösser |
| Autore | Schlösser Magnus |
| Edizione | [1st ed. 2014.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2014 |
| Descrizione fisica | 1 online resource (226 p.) |
| Disciplina | 535.846 |
| Collana | Springer Theses, Recognizing Outstanding Ph.D. Research |
| Soggetto topico |
Particles (Nuclear physics)
Quantum field theory Atomic structure Molecular structure Spectrum analysis Microscopy Elementary Particles, Quantum Field Theory Atomic/Molecular Structure and Spectra Spectroscopy and Microscopy |
| ISBN | 3-319-06221-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- The KATRIN Experiment -- Theory of Quantitative Raman spectroscopy -- Experimental Setup -- Calibration Based on Theoretical Intensities and Spectral Sensitivity -- Calibration Based on Accurate Gas Samples -- Comparison of Calibration Methods -- Summary and Outlook -- Appendix A Statistical Terms -- Appendix B Complete Derivation of Integration Formula for Depolarization Measurements -- Appendix C Jones Calculations for Polarization Aberrations in the Raman Collection System -- Appendix D Measurements of Polarization Aberrations in Raman Cell Windows -- Appendix D Error Estimation in Depolarization Ratio Measurements -- Appendix F Relation Between Experimental Error of Raman Intensities and Depolarization Ratios -- Appendix H Demonstration of Bootstrapping on HYDE Data -- Appendix I Publications. |
| Record Nr. | UNINA-9910300396803321 |
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Schlösser Magnus
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| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Advanced Computing in Electron Microscopy [[electronic resource] /] / by Earl J. Kirkland
| Advanced Computing in Electron Microscopy [[electronic resource] /] / by Earl J. Kirkland |
| Autore | Kirkland Earl J |
| Edizione | [3rd ed. 2020.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 |
| Descrizione fisica | 1 online resource (XII, 354 p. 146 illus., 8 illus. in color.) |
| Disciplina | 502.825 |
| Soggetto topico |
Spectroscopy
Microscopy Optical data processing Materials science Spectroscopy and Microscopy Image Processing and Computer Vision Characterization and Evaluation of Materials Biological Microscopy Spectroscopy/Spectrometry |
| ISBN | 3-030-33260-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- The Transmission Electron Microscope -- Some Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programss -- App. A: Plotting Transfer Functions -- App. B: The Fourier Projection Theorem -- App. C: Atomic Potentials and Scattering Factors -- App. D: The Inverse Problem -- App. E: Bilinear Interpolation -- App. F: 3D Perspective View. |
| Record Nr. | UNISA-996418444503316 |
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Kirkland Earl J
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| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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Advanced Computing in Electron Microscopy / / by Earl J. Kirkland
| Advanced Computing in Electron Microscopy / / by Earl J. Kirkland |
| Autore | Kirkland Earl J. |
| Edizione | [3rd ed. 2020.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 |
| Descrizione fisica | 1 online resource (XII, 354 p. 146 illus., 8 illus. in color.) |
| Disciplina | 502.825 |
| Soggetto topico |
Spectrum analysis
Microscopy Optical data processing Materials science Spectroscopy and Microscopy Image Processing and Computer Vision Characterization and Evaluation of Materials Biological Microscopy Spectroscopy/Spectrometry |
| ISBN | 3-030-33260-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- The Transmission Electron Microscope -- Some Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programss -- App. A: Plotting Transfer Functions -- App. B: The Fourier Projection Theorem -- App. C: Atomic Potentials and Scattering Factors -- App. D: The Inverse Problem -- App. E: Bilinear Interpolation -- App. F: 3D Perspective View. |
| Record Nr. | UNINA-9910409987503321 |
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Kirkland Earl J.
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| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Advanced Optical Methods for Brain Imaging / / edited by Fu-Jen Kao, Gerd Keiser, Ankur Gogoi
| Advanced Optical Methods for Brain Imaging / / edited by Fu-Jen Kao, Gerd Keiser, Ankur Gogoi |
| Edizione | [1st ed. 2019.] |
| Pubbl/distr/stampa | Singapore : , : Springer Singapore : , : Imprint : Springer, , 2019 |
| Descrizione fisica | 1 online resource (XX, 334 p. 113 illus., 101 illus. in color.) |
| Disciplina | 616.804754 |
| Collana | Progress in Optical Science and Photonics |
| Soggetto topico |
Biomedical engineering
Spectrum analysis Microscopy Signal processing Image processing Speech processing systems Biophysics Lasers Photonics Biomedical Engineering and Bioengineering Spectroscopy and Microscopy Biomedical Engineering/Biotechnology Signal, Image and Speech Processing Biological and Medical Physics, Biophysics Optics, Lasers, Photonics, Optical Devices |
| ISBN | 981-10-9020-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- Optical Coherence Tomography for Brain Imaging -- Light-sheet microscopy for whole brain imaging -- The Airyscan detector from ZEISS: Confocal Microscopy Evolution for the Neurosciences -- Recording Ca++ Transients in Neurons by TCSPC FLIM -- In vivo imaging of all cortical layers and hippocampal CA1 pyramidal cells by two-photon excitation microscopy -- Patterned two-photon illumination for high-speed functional imaging of brain networks in vivo -- Holographic functional calcium imaging of neuronal circuit activity -- Advanced miniature microscopy for Brain Imaging -- Stimulated Raman scattering microscopy for brain imaging: basic principle, measurements and applications -- Super resolving approaches suitable for brain imaging applications -- Super resolution STED and STORM/PALM microscopy for brain imaging -- Expansion microscopy for brain imaging -- Adaptive Optics in Multiphoton Microscopy -- Chemical processing of brain tissues for large-volume, high-resolution optical imaging. |
| Record Nr. | UNINA-9910337609103321 |
| Singapore : , : Springer Singapore : , : Imprint : Springer, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Analytical Transmission Electron Microscopy : An Introduction for Operators / / by Jürgen Thomas, Thomas Gemming
| Analytical Transmission Electron Microscopy : An Introduction for Operators / / by Jürgen Thomas, Thomas Gemming |
| Autore | Thomas Jürgen |
| Edizione | [1st ed. 2014.] |
| Pubbl/distr/stampa | Dordrecht : , : Springer Netherlands : , : Imprint : Springer, , 2014 |
| Descrizione fisica | 1 online resource (XVII, 348 p. 238 illus., 33 illus. in color.) |
| Disciplina | 620.11 |
| Soggetto topico |
Materials science
Spectrum analysis Microscopy Nanotechnology Characterization and Evaluation of Materials Spectroscopy and Microscopy Spectroscopy/Spectrometry Nanotechnology and Microengineering |
| ISBN | 94-017-8601-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | From the Contents: Why this effort? -- What should we know about electron optics and the construction of an electron microscope -- We prepare electron-transparent samples -- Let us start with the work -- Let us switch to electron diffraction -- Why do we see any contrasts in the images? -- We increase the magnification -- Let us switch to scanning transmission electron microscopy -- Let us use the analytical possibilities -- Basics explained in more detail (a little bit more mathematics). |
| Record Nr. | UNINA-9910298651603321 |
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Thomas Jürgen
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| Dordrecht : , : Springer Netherlands : , : Imprint : Springer, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Angle Resolved Photoemission Spectroscopy of Delafossite Metals / / by Veronika Sunko
| Angle Resolved Photoemission Spectroscopy of Delafossite Metals / / by Veronika Sunko |
| Autore | Sunko Veronika |
| Edizione | [1st ed. 2019.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019 |
| Descrizione fisica | 1 online resource (XVII, 198 p. 122 illus., 104 illus. in color.) |
| Disciplina | 530.41 |
| Collana | Springer Theses, Recognizing Outstanding Ph.D. Research |
| Soggetto topico |
Solid state physics
Spectrum analysis Microscopy Materials—Surfaces Thin films Solid State Physics Spectroscopy and Microscopy Surfaces and Interfaces, Thin Films Spectroscopy/Spectrometry |
| ISBN | 3-030-31087-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- Angle Resolved Photoemission -- Theory and Models -- Bulk States in PtCoO2 and PdCoO2 -- Coupling of Metallic and Mott-insulating states in PdCrO2 -- Rashba-like Spin-Split Surface States -- Conclusions and Outlook -- Appendices. |
| Record Nr. | UNINA-9910349507003321 |
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Sunko Veronika
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| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Angle-Resolved Photoemission Spectroscopy on High-Temperature Superconductors : Studies of Bi2212 and Single-Layer FeSe Film Grown on SrTiO3 Substrate / / by Junfeng He
| Angle-Resolved Photoemission Spectroscopy on High-Temperature Superconductors : Studies of Bi2212 and Single-Layer FeSe Film Grown on SrTiO3 Substrate / / by Junfeng He |
| Autore | He Junfeng |
| Edizione | [1st ed. 2016.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2016 |
| Descrizione fisica | 1 online resource (XVI, 126 p. 77 illus., 71 illus. in color.) |
| Disciplina | 537.623 |
| Collana | Springer Theses, Recognizing Outstanding Ph.D. Research |
| Soggetto topico |
Superconductivity
Superconductors Surfaces (Physics) Interfaces (Physical sciences) Thin films Spectrum analysis Microscopy Strongly Correlated Systems, Superconductivity Surface and Interface Science, Thin Films Spectroscopy and Microscopy |
| ISBN | 3-662-52732-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | From the Contents: Brief introduction to cuprates and Fe-based high Tc superconductors -- The discovery of high Tc superconductors -- Cuprates -- Fe-based superconductors -- Introduction to angle-resolved photoemission spectroscopy (ARPES) -- Energy resolution -- Momentum resolution (three-step model) -- The physical processes in photoemission. |
| Record Nr. | UNINA-9910254633903321 |
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He Junfeng
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| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2016 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Angle-Resolved Photoemission Spectroscopy Studies of 2D Material Heterostructures [[electronic resource] /] / by Eryin Wang
| Angle-Resolved Photoemission Spectroscopy Studies of 2D Material Heterostructures [[electronic resource] /] / by Eryin Wang |
| Autore | Wang Eryin |
| Edizione | [1st ed. 2020.] |
| Pubbl/distr/stampa | Singapore : , : Springer Singapore : , : Imprint : Springer, , 2020 |
| Descrizione fisica | 1 online resource (XIV, 79 p. 55 illus., 51 illus. in color.) |
| Disciplina | 530.41 |
| Collana | Springer Theses, Recognizing Outstanding Ph.D. Research |
| Soggetto topico |
Superconductivity
Superconductors Nanotechnology Spectroscopy Microscopy Nanoscale science Nanoscience Nanostructures Strongly Correlated Systems, Superconductivity Spectroscopy and Microscopy Nanoscale Science and Technology |
| ISBN | 981-15-1447-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- Experimental techniques -- Band engineering in van der Waals heterostructures Graphene/h-BN -- Simpler van der Waals heterostructure-Twisted bilayer graphene -- Proximity effect between topological insulator and d-wave superconductors -- Effect of magnetic Cr deposition on Bi2Se3 surface -- Conclusion. |
| Record Nr. | UNISA-996418438303316 |
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Wang Eryin
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| Singapore : , : Springer Singapore : , : Imprint : Springer, , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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