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The Common Misuse Scoring System (CMSS) : metrics for software feature misuse vulnerabilities / / Elizabeth Van Ruitenbeek, Karen Scarfone
| The Common Misuse Scoring System (CMSS) : metrics for software feature misuse vulnerabilities / / Elizabeth Van Ruitenbeek, Karen Scarfone |
| Autore | Van Ruitenbeek Elizabeth |
| Edizione | [Draft.] |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , [2009] |
| Descrizione fisica | v, 31 pages : digital, PDF file |
| Altri autori (Persone) | ScarfoneKaren |
| Collana | NIST interagency report ; v 7517.Computer security |
| Soggetto topico |
Software configuration management - Standards - Government policy - United States
Computer security - Standards - Government policy - United States |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Common Misuse Scoring System |
| Record Nr. | UNINA-9910698969603321 |
Van Ruitenbeek Elizabeth
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , [2009] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Recommendation for applications using approved hash algorithms [[electronic resource] /] / Quynh Dang
| Recommendation for applications using approved hash algorithms [[electronic resource] /] / Quynh Dang |
| Autore | Dang Quynh |
| Edizione | [Draft.] |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , [2008] |
| Descrizione fisica | 1 online resource (iii, 17 pages) |
| Collana | NIST special publication ;Computer security |
| Soggetto topico |
Software configuration management - Standards - Government policy - United States
Federal government - Computer networks - Security measures - United States |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910696807903321 |
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Dang Quynh
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , [2008] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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