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2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) / / Institute of Electrical and Electronics Engineers (IEEE)
| 2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) / / Institute of Electrical and Electronics Engineers (IEEE) |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2017 |
| Descrizione fisica | 1 online resource (various paging) : illustrations some color |
| Disciplina | 621.38152 |
| Soggetto topico |
Semiconductors - Cooling
Semiconductors - Thermal properties |
| ISBN | 1-5386-1531-2 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2017 33rd Thermal Measurement, Modeling & Management Symposium |
| Record Nr. | UNISA-996280189603316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2017 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) / / Institute of Electrical and Electronics Engineers (IEEE)
| 2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) / / Institute of Electrical and Electronics Engineers (IEEE) |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2017 |
| Descrizione fisica | 1 online resource (various paging) : illustrations some color |
| Disciplina | 621.38152 |
| Soggetto topico |
Semiconductors - Cooling
Semiconductors - Thermal properties |
| ISBN | 1-5386-1531-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2017 33rd Thermal Measurement, Modeling & Management Symposium |
| Record Nr. | UNINA-9910172623503321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2017 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2018 34th Thermal Measurement, Modeling & Management Symposium : 19-23 March 2018, San Jose, CA, USA / / Institute of Electrical and Electronics Engineers
| 2018 34th Thermal Measurement, Modeling & Management Symposium : 19-23 March 2018, San Jose, CA, USA / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (62 pages) |
| Disciplina | 621.38152 |
| Soggetto topico |
Semiconductors - Thermal properties
Semiconductors - Cooling |
| ISBN | 1-5386-4402-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996280725503316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2018 34th Thermal Measurement, Modeling & Management Symposium : 19-23 March 2018, San Jose, CA, USA / / Institute of Electrical and Electronics Engineers
| 2018 34th Thermal Measurement, Modeling & Management Symposium : 19-23 March 2018, San Jose, CA, USA / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (62 pages) |
| Disciplina | 621.38152 |
| Soggetto topico |
Semiconductors - Thermal properties
Semiconductors - Cooling |
| ISBN | 1-5386-4402-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910280927503321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Fifteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : San Diego, CA, USA, March 9-11, 1999
| Fifteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : San Diego, CA, USA, March 9-11, 1999 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 1999 |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductors - Thermal properties
Semiconductors - Cooling Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996215109603316 |
| [Place of publication not identified], : IEEE, 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Fifteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : San Diego, CA, USA, March 9-11, 1999
| Fifteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : San Diego, CA, USA, March 9-11, 1999 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 1999 |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductors - Thermal properties
Semiconductors - Cooling Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872889303321 |
| [Place of publication not identified], : IEEE, 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM proceedings 2003 : San Jose, CA, USA, March 11-13, 2003
| Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM proceedings 2003 : San Jose, CA, USA, March 11-13, 2003 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2003 |
| Soggetto topico |
Semiconductors - Thermal properties
Semiconductors - Cooling Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996210044003316 |
| [Place of publication not identified], : IEEE, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM proceedings 2003 : San Jose, CA, USA, March 11-13, 2003
| Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM proceedings 2003 : San Jose, CA, USA, March 11-13, 2003 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2003 |
| Soggetto topico |
Semiconductors - Thermal properties
Semiconductors - Cooling Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910873052403321 |
| [Place of publication not identified], : IEEE, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Proceedings / / Annual IEEE Semiconductor Thermal Measurement and Management Symposium
| Proceedings / / Annual IEEE Semiconductor Thermal Measurement and Management Symposium |
| Pubbl/distr/stampa | New York, NY : , : Institute of Electrical and Electronics Engineers, , 1991- |
| Disciplina |
621
621.3815/2 |
| Soggetto topico |
Semiconductors - Thermal properties
Semiconductors - Cooling Amorphous semiconductors - Thermal properties Integrated circuits |
| Soggetto genere / forma | Conference papers and proceedings. |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996279663203316 |
| New York, NY : , : Institute of Electrical and Electronics Engineers, , 1991- | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings / / Annual IEEE Semiconductor Thermal Measurement and Management Symposium
| Proceedings / / Annual IEEE Semiconductor Thermal Measurement and Management Symposium |
| Pubbl/distr/stampa | New York, NY : , : Institute of Electrical and Electronics Engineers, , 1991- |
| Disciplina |
621
621.3815/2 |
| Soggetto topico |
Semiconductors - Thermal properties
Semiconductors - Cooling Amorphous semiconductors - Thermal properties Integrated circuits |
| Soggetto genere / forma | Conference papers and proceedings. |
| ISSN | 1065-2221 |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
IEEE SEMI-THERM Symposium
Annual IEEE Semiconductor Thermal Measurement and Management Symposium Annual Semiconductor Thermal Measurement and Management Symposium SEMI-THERM Semiconductor Thermal Measurement and Management Symposium |
| Record Nr. | UNISA-996559964103316 |
| New York, NY : , : Institute of Electrical and Electronics Engineers, , 1991- | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
