Info
- Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.
2005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX
| 2005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX |
| Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2005 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Testing
Semiconductors - Testing Electronics Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| ISBN | 1-5090-9767-8 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996204068103316 |
| [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX
| 2005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX |
| Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2005 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Testing
Semiconductors - Testing Electronics Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| ISBN | 1-5090-9767-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910146829703321 |
| [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2006 IEEE International Conference on Microelectronic Test Structures
| 2006 IEEE International Conference on Microelectronic Test Structures |
| Pubbl/distr/stampa | [Place of publication not identified], : I E E E, 2006 |
| Descrizione fisica | 1 online resource (xiii, 229 pages) : illustrations |
| Disciplina | 621.3810287 |
| Soggetto topico |
Electronic apparatus and appliances - Testing
Semiconductors - Testing |
| ISBN | 1-5090-9294-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910145625903321 |
| [Place of publication not identified], : I E E E, 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2006 IEEE International Conference on Microelectronic Test Structures
| 2006 IEEE International Conference on Microelectronic Test Structures |
| Pubbl/distr/stampa | [Place of publication not identified], : I E E E, 2006 |
| Descrizione fisica | 1 online resource (xiii, 229 pages) : illustrations |
| Disciplina | 621.3810287 |
| Soggetto topico |
Electronic apparatus and appliances - Testing
Semiconductors - Testing |
| ISBN | 1-5090-9294-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996207692603316 |
| [Place of publication not identified], : I E E E, 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan
| 2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2007 |
| Soggetto topico |
Integrated circuits - Testing
Semiconductors - Testing Electronic apparatus and appliances - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-8269-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996280845903316 |
| [Place of publication not identified], : IEEE, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan
| 2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2007 |
| Soggetto topico |
Integrated circuits - Testing
Semiconductors - Testing Electronic apparatus and appliances - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-8269-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910143014603321 |
| [Place of publication not identified], : IEEE, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2017 IEEE International Test Conference (ITC) / / Institute of Electrical and Electronics Engineers Staff
| 2017 IEEE International Test Conference (ITC) / / Institute of Electrical and Electronics Engineers Staff |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2017 |
| Descrizione fisica | 1 online resource (485 pages) : illustrations |
| Disciplina | 621.38411 |
| Soggetto topico |
Radio frequency
Semiconductors - Testing Computer software - Testing |
| ISBN | 1-5386-3413-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2017 IEEE International Test Conference |
| Record Nr. | UNISA-996280879503316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2017 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2017 IEEE International Test Conference (ITC) / / Institute of Electrical and Electronics Engineers Staff
| 2017 IEEE International Test Conference (ITC) / / Institute of Electrical and Electronics Engineers Staff |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2017 |
| Descrizione fisica | 1 online resource (485 pages) : illustrations |
| Disciplina | 621.38411 |
| Soggetto topico |
Radio frequency
Semiconductors - Testing Computer software - Testing |
| ISBN | 1-5386-3413-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2017 IEEE International Test Conference |
| Record Nr. | UNINA-9910250058603321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2017 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2018 IEEE International Conference on Microelectronic Test Structures : 19-22 March 2018, Austin, TX, USA / / IEEE Electron Devices Society
| 2018 IEEE International Conference on Microelectronic Test Structures : 19-22 March 2018, Austin, TX, USA / / IEEE Electron Devices Society |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (78 pages) |
| Disciplina | 621.381548 |
| Soggetto topico |
Integrated circuits - Testing
Semiconductors - Testing Electronic apparatus and appliances - Testing |
| ISBN | 1-5386-5071-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996280709603316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2018 IEEE International Conference on Microelectronic Test Structures : 19-22 March 2018, Austin, TX, USA / / IEEE Electron Devices Society
| 2018 IEEE International Conference on Microelectronic Test Structures : 19-22 March 2018, Austin, TX, USA / / IEEE Electron Devices Society |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (78 pages) |
| Disciplina | 621.381548 |
| Soggetto topico |
Integrated circuits - Testing
Semiconductors - Testing Electronic apparatus and appliances - Testing |
| ISBN | 1-5386-5071-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910280918003321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
