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2001 GaAs Reliability Workshop : proceedings : October 21, 2001, Baltimore, Maryland / / sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards
| 2001 GaAs Reliability Workshop : proceedings : October 21, 2001, Baltimore, Maryland / / sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards |
| Pubbl/distr/stampa | New York : , : IEEE, , 2002 |
| Descrizione fisica | 1 online resource (222 pages) |
| Soggetto topico |
Gallium arsenide semiconductors
Semiconductors - Reliability |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996211254003316 |
| New York : , : IEEE, , 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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2008 ROCS Workshop [Reliability of Compound Semiconductors Workshop] : 12 October 2008
| 2008 ROCS Workshop [Reliability of Compound Semiconductors Workshop] : 12 October 2008 |
| Pubbl/distr/stampa | New York : , : IEEE, , 2010 |
| Descrizione fisica | 1 online resource (196 pages) |
| Soggetto topico |
Semiconductors - Materials
Semiconductors - Reliability Gallium arsenide semiconductors - Reliability |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996207153203316 |
| New York : , : IEEE, , 2010 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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2009 ROCS Workshop : proceedings : October 11, 2009, Greensboro, North Carolina / / sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards
| 2009 ROCS Workshop : proceedings : October 11, 2009, Greensboro, North Carolina / / sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards |
| Pubbl/distr/stampa | New York : , : IEEE, , 2009 |
| Descrizione fisica | 1 online resource (viii, 146 pages) |
| Soggetto topico |
Gallium arsenide semiconductors
Semiconductors - Reliability |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996201321603316 |
| New York : , : IEEE, , 2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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2014 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, South Lake Tahoe, California, October 12-16, 2014 / / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
| 2014 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, South Lake Tahoe, California, October 12-16, 2014 / / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2014 |
| Descrizione fisica | 1 online resource (57 pages) |
| Disciplina | 621.38152 |
| Soggetto topico |
Semiconductors - Reliability
Integrated circuits - Reliability |
| ISBN | 1-4799-7274-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996280816603316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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2014 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, South Lake Tahoe, California, October 12-16, 2014 / / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
| 2014 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, South Lake Tahoe, California, October 12-16, 2014 / / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2014 |
| Descrizione fisica | 1 online resource (57 pages) |
| Disciplina | 621.38152 |
| Soggetto topico |
Semiconductors - Reliability
Integrated circuits - Reliability |
| ISBN | 1-4799-7274-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910139970403321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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2015 IEEE International Integrated Reliability Workshop Final Report : S. Lake Tahoe, California, October 11-15, 2015
| 2015 IEEE International Integrated Reliability Workshop Final Report : S. Lake Tahoe, California, October 11-15, 2015 |
| Autore | Ryan Jason |
| Pubbl/distr/stampa | New York : , : IEEE, , 2016 |
| Descrizione fisica | 1 online resource (183 pages) |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Semiconductors - Reliability |
| ISBN | 1-4673-7396-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | PLATFORM TECHNICAL PRESENTATIONS -- POSTER PRESENTATIONS-REFEREED -- POSTER PRESENTATIONS-OPEN -- Tutorials -- Discussion Group (DG) Summaries -- BIOGRAPHIES -- PICTURES. |
| Record Nr. | UNISA-996280072303316 |
Ryan Jason
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| New York : , : IEEE, , 2016 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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2015 IEEE International Integrated Reliability Workshop Final Report : S. Lake Tahoe, California, October 11-15, 2015
| 2015 IEEE International Integrated Reliability Workshop Final Report : S. Lake Tahoe, California, October 11-15, 2015 |
| Autore | Ryan Jason |
| Pubbl/distr/stampa | New York : , : IEEE, , 2016 |
| Descrizione fisica | 1 online resource (183 pages) |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Semiconductors - Reliability |
| ISBN | 1-4673-7396-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | PLATFORM TECHNICAL PRESENTATIONS -- POSTER PRESENTATIONS-REFEREED -- POSTER PRESENTATIONS-OPEN -- Tutorials -- Discussion Group (DG) Summaries -- BIOGRAPHIES -- PICTURES. |
| Record Nr. | UNINA-9910136366303321 |
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Ryan Jason
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| New York : , : IEEE, , 2016 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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2020 IEEE International Reliability Physics Symposium (IRPS) / / Institute of Electrical and Electronics Engineers (IEEE)
| 2020 IEEE International Reliability Physics Symposium (IRPS) / / Institute of Electrical and Electronics Engineers (IEEE) |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2020 |
| Descrizione fisica | 1 online resource |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Semiconductors - Reliability |
| ISBN | 1-7281-3199-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2020 IEEE International Reliability Physics Symposium |
| Record Nr. | UNINA-9910437340003321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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2020 IEEE International Reliability Physics Symposium (IRPS) / / Institute of Electrical and Electronics Engineers (IEEE)
| 2020 IEEE International Reliability Physics Symposium (IRPS) / / Institute of Electrical and Electronics Engineers (IEEE) |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2020 |
| Descrizione fisica | 1 online resource |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Semiconductors - Reliability |
| ISBN | 1-7281-3199-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2020 IEEE International Reliability Physics Symposium |
| Record Nr. | UNISA-996575487403316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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IIRW : 2018 IEEE International Integrated Reliability Workshop : Stanford Sierra Conference Center, South Lake Tahoe, CA, USA, October 7-11, 2018 / / sponsored by the Electron Devices Society and the IEEE Reliability Society
| IIRW : 2018 IEEE International Integrated Reliability Workshop : Stanford Sierra Conference Center, South Lake Tahoe, CA, USA, October 7-11, 2018 / / sponsored by the Electron Devices Society and the IEEE Reliability Society |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (69 pages) |
| Disciplina | 621.3815 |
| Soggetto topico |
Semiconductors - Reliability
Integrated circuits - Wafer-scale integratio - Reliability Integrated circuits - Reliability |
| ISBN | 1-5386-6039-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910326259803321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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