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1999 4th International Workshop on Statistical Metrology
| 1999 4th International Workshop on Statistical Metrology |
| Pubbl/distr/stampa | [Place of publication not identified], : Purchased from IEEE Service Center Single Publication Sales Unit, 1999 |
| Disciplina | 621.3815/2/0287 |
| Soggetto topico |
Semiconductors - Characterization - Statistical methods
Semiconductors - Measurement Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996199631103316 |
| [Place of publication not identified], : Purchased from IEEE Service Center Single Publication Sales Unit, 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1999 4th International Workshop on Statistical Metrology
| 1999 4th International Workshop on Statistical Metrology |
| Pubbl/distr/stampa | [Place of publication not identified], : Purchased from IEEE Service Center Single Publication Sales Unit, 1999 |
| Disciplina | 621.3815/2/0287 |
| Soggetto topico |
Semiconductors - Characterization - Statistical methods
Semiconductors - Measurement Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872615003321 |
| [Place of publication not identified], : Purchased from IEEE Service Center Single Publication Sales Unit, 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2001 6th International Workshop on Statistical Methodology : IWSM : June 10, 2001/Kyoto
| 2001 6th International Workshop on Statistical Methodology : IWSM : June 10, 2001/Kyoto |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2001 |
| Soggetto topico |
Semiconductors - Characterization - Statistical methods
Semiconductors - Measurement Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996213519903316 |
| [Place of publication not identified], : IEEE, 2001 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2001 6th International Workshop on Statistical Methodology : IWSM : June 10, 2001/Kyoto
| 2001 6th International Workshop on Statistical Methodology : IWSM : June 10, 2001/Kyoto |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2001 |
| Soggetto topico |
Semiconductors - Characterization - Statistical methods
Semiconductors - Measurement Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872993803321 |
| [Place of publication not identified], : IEEE, 2001 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
IWSM : 1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu
| IWSM : 1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 1998 |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductors - Statistical methods - Characterization
Semiconductors - Measurement Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996212464703316 |
| [Place of publication not identified], : IEEE, 1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
IWSM : 1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu
| IWSM : 1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 1998 |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductors - Statistical methods - Characterization
Semiconductors - Measurement Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872849103321 |
| [Place of publication not identified], : IEEE, 1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Semiconductor microelectronics and nanoelectronics programs [[electronic resource] /] / edited by Stephen Knight, Joaquin V. Martinez de Pinillos, and Michele Buckley
| Semiconductor microelectronics and nanoelectronics programs [[electronic resource] /] / edited by Stephen Knight, Joaquin V. Martinez de Pinillos, and Michele Buckley |
| Autore | Knight Stephen |
| Pubbl/distr/stampa | [Gaithersburg, Md.] : , : NIST, Technology Administration, U.S. Dept. of Commerce, , [2007] |
| Descrizione fisica | vii, 244 pages : digital, PDF file |
| Altri autori (Persone) |
KnightStephen
PinillosJoaquin V. Martinez de BuckleyMichele |
| Collana | NISTIR |
| Soggetto topico |
Semiconductors - Measurement
Nanotechnology - Research Molecular electronics - Research Microelectronics - Research |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910697237003321 |
Knight Stephen
|
||
| [Gaithersburg, Md.] : , : NIST, Technology Administration, U.S. Dept. of Commerce, , [2007] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
