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1999 4th International Workshop on Statistical Metrology
| 1999 4th International Workshop on Statistical Metrology |
| Pubbl/distr/stampa | [Place of publication not identified], : Purchased from IEEE Service Center Single Publication Sales Unit, 1999 |
| Disciplina | 621.3815/2/0287 |
| Soggetto topico |
Semiconductors - Characterization - Statistical methods
Semiconductors - Measurement Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996199631103316 |
| [Place of publication not identified], : Purchased from IEEE Service Center Single Publication Sales Unit, 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1999 4th International Workshop on Statistical Metrology
| 1999 4th International Workshop on Statistical Metrology |
| Pubbl/distr/stampa | [Place of publication not identified], : Purchased from IEEE Service Center Single Publication Sales Unit, 1999 |
| Disciplina | 621.3815/2/0287 |
| Soggetto topico |
Semiconductors - Characterization - Statistical methods
Semiconductors - Measurement Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872615003321 |
| [Place of publication not identified], : Purchased from IEEE Service Center Single Publication Sales Unit, 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2000 5th International Workshop on Statistical Metrology
| 2000 5th International Workshop on Statistical Metrology |
| Pubbl/distr/stampa | [Place of publication not identified], : I E E E, 2000 |
| Descrizione fisica | 1 online resource (90 pages) : illustrations |
| Disciplina | 621.3815/2/0287 |
| Soggetto topico |
Semiconductors - Characterization - Statistical methods
Semiconductors |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872506903321 |
| [Place of publication not identified], : I E E E, 2000 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2001 6th International Workshop on Statistical Methodology : IWSM : June 10, 2001/Kyoto
| 2001 6th International Workshop on Statistical Methodology : IWSM : June 10, 2001/Kyoto |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2001 |
| Soggetto topico |
Semiconductors - Characterization - Statistical methods
Semiconductors - Measurement Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996213519903316 |
| [Place of publication not identified], : IEEE, 2001 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2001 6th International Workshop on Statistical Methodology : IWSM : June 10, 2001/Kyoto
| 2001 6th International Workshop on Statistical Methodology : IWSM : June 10, 2001/Kyoto |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2001 |
| Soggetto topico |
Semiconductors - Characterization - Statistical methods
Semiconductors - Measurement Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872993803321 |
| [Place of publication not identified], : IEEE, 2001 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
