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2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan
| 2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2005 |
| Disciplina | 621.39/732 |
| Soggetto topico |
Semiconductor storage devices - Testing
Random access memory Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5386-0323-3 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996206157703316 |
| [Place of publication not identified], : IEEE Computer Society, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan
| 2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2005 |
| Disciplina | 621.39/732 |
| Soggetto topico |
Semiconductor storage devices - Testing
Random access memory Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN |
9781538603239
1538603233 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910142332303321 |
| [Place of publication not identified], : IEEE Computer Society, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings
| 2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2006 |
| Disciplina | 621.39/732 |
| Soggetto topico |
Semiconductor storage devices - Testing
Random access memory Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-9829-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996197570903316 |
| [Place of publication not identified], : IEEE Computer Society, 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings
| 2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2006 |
| Disciplina | 621.39/732 |
| Soggetto topico |
Semiconductor storage devices - Testing
Random access memory Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN |
9781509098293
1509098291 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910145618003321 |
| [Place of publication not identified], : IEEE Computer Society, 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2021 IEEE International Memory Workshop (IMW) / / Institute of Electrical and Electronics Engineers
| 2021 IEEE International Memory Workshop (IMW) / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | [Place of publication not identified] : , : IEEE, , 2021 |
| Descrizione fisica | 1 online resource |
| Disciplina | 004.5 |
| Soggetto topico |
Computer storage devices
Semiconductor storage devices - Testing |
| ISBN | 1-7281-8517-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2021 IEEE International Memory Workshop |
| Record Nr. | UNINA-9910554065403321 |
| [Place of publication not identified] : , : IEEE, , 2021 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2021 IEEE International Memory Workshop (IMW) / / Institute of Electrical and Electronics Engineers
| 2021 IEEE International Memory Workshop (IMW) / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | [Place of publication not identified] : , : IEEE, , 2021 |
| Descrizione fisica | 1 online resource |
| Disciplina | 004.5 |
| Soggetto topico |
Computer storage devices
Semiconductor storage devices - Testing |
| ISBN | 1-7281-8517-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2021 IEEE International Memory Workshop |
| Record Nr. | UNISA-996574843603316 |
| [Place of publication not identified] : , : IEEE, , 2021 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Memory Technology, Design and Testing, 1996: IEEE International Workshop On
| Memory Technology, Design and Testing, 1996: IEEE International Workshop On |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 1996 |
| Descrizione fisica | 1 online resource |
| Disciplina | 004.5 |
| Soggetto topico |
Random access memory
Semiconductor storage devices - Testing |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Memory Technology, Design and Testing -- Future trends in flash memories -- Recent developments in dram testing -- Built in self testing for detection of coupling faults in semiconductor memories -- A built in self test scheme for 256Meg sdram -- Proposed on-chip test structure to quantify trap densities within flash meories -- A concurrent placement and routing strategy for improving the quality of application specific memory designs -- Flash memory quality and reliability issues -- A low power current sensing scheme for cmos sram. |
| Record Nr. | UNINA-9910872434503321 |
| [Place of publication not identified], : IEEE Computer Society Press, 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
MTDT 2004 : records of the 2004 International Workshop on Memory Technology, Design and Testing : 9-10 August, 2004, San Jose, California, USA
| MTDT 2004 : records of the 2004 International Workshop on Memory Technology, Design and Testing : 9-10 August, 2004, San Jose, California, USA |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2004 |
| Disciplina | 621.39/732 |
| Soggetto topico |
Semiconductor storage devices - Testing
Random access memory Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996199768303316 |
| [Place of publication not identified], : IEEE Computer Society, 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
MTDT 2004 : records of the 2004 International Workshop on Memory Technology, Design and Testing : 9-10 August, 2004, San Jose, California, USA
| MTDT 2004 : records of the 2004 International Workshop on Memory Technology, Design and Testing : 9-10 August, 2004, San Jose, California, USA |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2004 |
| Disciplina | 621.39/732 |
| Soggetto topico |
Semiconductor storage devices - Testing
Random access memory Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872516103321 |
| [Place of publication not identified], : IEEE Computer Society, 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
MTDT 2009 : 2009 IEEE International Workshop on Memory Technology, Design, and Testing : proceedings, 31 August- 2 September 2009, Hsinchu, Taiwan
| MTDT 2009 : 2009 IEEE International Workshop on Memory Technology, Design, and Testing : proceedings, 31 August- 2 September 2009, Hsinchu, Taiwan |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2009 |
| Disciplina | 004.568 |
| Soggetto topico |
Semiconductor storage devices - Testing
Random access memory Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-7335-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996216377803316 |
| [Place of publication not identified], : IEEE Computer Society, 2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
