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10th IEEE International Conference on Advanced Thermal Processing of Semiconductors--RTP 2002 : September 25-27, 2002, the Coast Plaza Hotel, Vancouver, Canada
| 10th IEEE International Conference on Advanced Thermal Processing of Semiconductors--RTP 2002 : September 25-27, 2002, the Coast Plaza Hotel, Vancouver, Canada |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2002 |
| Soggetto topico |
Semiconductors - Heat treatment
Rapid thermal processing - Defects Semiconductor doping Semiconductors Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996216841703316 |
| [Place of publication not identified], : IEEE, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
10th IEEE International Conference on Advanced Thermal Processing of Semiconductors--RTP 2002 : September 25-27, 2002, the Coast Plaza Hotel, Vancouver, Canada
| 10th IEEE International Conference on Advanced Thermal Processing of Semiconductors--RTP 2002 : September 25-27, 2002, the Coast Plaza Hotel, Vancouver, Canada |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2002 |
| Soggetto topico |
Semiconductors - Heat treatment
Rapid thermal processing - Defects Semiconductor doping Semiconductors Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910873050203321 |
| [Place of publication not identified], : IEEE, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
12th IEEE International Conference on Advanced Thermal Processing of Semiconductors : RTP 2004 : September 28-30, 2004, Hilton Portland & Executive Tower, Portland, OR
| 12th IEEE International Conference on Advanced Thermal Processing of Semiconductors : RTP 2004 : September 28-30, 2004, Hilton Portland & Executive Tower, Portland, OR |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2004 |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductors - Heat treatment
Rapid thermal processing - Defects Semiconductor doping Semiconductors Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996202108703316 |
| [Place of publication not identified], : IEEE, 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
12th IEEE International Conference on Advanced Thermal Processing of Semiconductors : RTP 2004 : September 28-30, 2004, Hilton Portland & Executive Tower, Portland, OR
| 12th IEEE International Conference on Advanced Thermal Processing of Semiconductors : RTP 2004 : September 28-30, 2004, Hilton Portland & Executive Tower, Portland, OR |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2004 |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductors - Heat treatment
Rapid thermal processing - Defects Semiconductor doping Semiconductors Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872550103321 |
| [Place of publication not identified], : IEEE, 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
15th IEEE International Conference on Advanced Thermal Processing of Semiconductors--RTP 2007 : October 2-5, 2007, Grand Hotel Baia Verde, Catania, Italy / / IEEE Electron Devices Society
| 15th IEEE International Conference on Advanced Thermal Processing of Semiconductors--RTP 2007 : October 2-5, 2007, Grand Hotel Baia Verde, Catania, Italy / / IEEE Electron Devices Society |
| Pubbl/distr/stampa | IEEE |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductors - Heat treatment
Rapid thermal processing Semiconductor doping Semiconductors - Defects |
| ISBN | 1-5090-8215-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
2007 15th International Conference on Advanced Thermal Processing of Semiconductors
Computer and Automation Engineering |
| Record Nr. | UNISA-996279733003316 |
| IEEE | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
15th IEEE International Conference on Advanced Thermal Processing of Semiconductors--RTP 2007 : October 2-5, 2007, Grand Hotel Baia Verde, Catania, Italy / / IEEE Electron Devices Society
| 15th IEEE International Conference on Advanced Thermal Processing of Semiconductors--RTP 2007 : October 2-5, 2007, Grand Hotel Baia Verde, Catania, Italy / / IEEE Electron Devices Society |
| Pubbl/distr/stampa | IEEE |
| Disciplina | 621.3815/2 |
| Soggetto topico |
Semiconductors - Heat treatment
Rapid thermal processing Semiconductor doping Semiconductors - Defects |
| ISBN |
9781509082155
1509082158 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
2007 15th International Conference on Advanced Thermal Processing of Semiconductors
Computer and Automation Engineering |
| Record Nr. | UNINA-9910143021203321 |
| IEEE | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2009 17th International Conference on Advanced Thermal Processing of Semiconductors
| 2009 17th International Conference on Advanced Thermal Processing of Semiconductors |
| Pubbl/distr/stampa | [Place of publication not identified], : I E E E, 2009 |
| Descrizione fisica | 1 online resource (216 pages) : illustrations |
| Disciplina | 004.6 |
| Soggetto topico | Semiconductor doping |
| ISBN |
1-4244-3816-0
1-4244-3815-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996214028203316 |
| [Place of publication not identified], : I E E E, 2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2009 17th International Conference on Advanced Thermal Processing of Semiconductors
| 2009 17th International Conference on Advanced Thermal Processing of Semiconductors |
| Pubbl/distr/stampa | [Place of publication not identified], : I E E E, 2009 |
| Descrizione fisica | 1 online resource (216 pages) : illustrations |
| Disciplina | 004.6 |
| Soggetto topico | Semiconductor doping |
| ISBN |
9781424438167
1424438160 9781424438150 1424438152 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910145413903321 |
| [Place of publication not identified], : I E E E, 2009 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Carrier density and compensation in semiconductors with multi dopants and multi transition energy levels [[electronic resource] ] : the case of Cu impurity in CdTe : preprint / / Su-Huai Wei ... [and others]
| Carrier density and compensation in semiconductors with multi dopants and multi transition energy levels [[electronic resource] ] : the case of Cu impurity in CdTe : preprint / / Su-Huai Wei ... [and others] |
| Pubbl/distr/stampa | [Golden, CO] : , : National Renewable Energy Laboratory, , [2011] |
| Descrizione fisica | 1 online resource (4 pages) : color illustrations |
| Altri autori (Persone) | WeiSu-Huai |
| Collana | NREL/CP |
| Soggetto topico |
Solar cells - Testing
Semiconductor doping Semiconductor films |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Carrier density and compensation in semiconductors with multi dopants and multi transition energy levels |
| Record Nr. | UNINA-9910700742503321 |
| [Golden, CO] : , : National Renewable Energy Laboratory, , [2011] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Defects in Organic Semiconductors and Devices
| Defects in Organic Semiconductors and Devices |
| Autore | Nguyen Thien-Phap |
| Pubbl/distr/stampa | Newark : , : John Wiley & Sons, Incorporated, , 2023 |
| Descrizione fisica | 1 online resource (279 pages) |
| Soggetto topico |
Organic semiconductors
Semiconductor doping |
| ISBN |
9781394229451
1394229453 9781394229437 1394229437 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Cover -- Title Page -- Copyright Page -- Contents -- Abbreviations -- Introduction -- Chapter 1. Overview of Organic Semiconductors -- 1.1. Organic semiconductors -- 1.2. Doping of organic semiconductors -- 1.3. Organic electronic devices -- 1.3.1. Architectures of organic devices -- 1.3.2. Organic light-emitting diodes (OLEDs) -- 1.3.3. Organic solar cells (OSCs or OPVs) -- 1.3.4. Organic field-effect transistors (OFETs) -- Chapter 2. Defects in Materials -- 2.1. Order and disorder -- 2.2. Crystalline semiconductors -- 2.2.1. Localized states -- 2.2.2. Density of states (DOS) -- 2.3. Amorphous semiconductors -- 2.3.1. Localized states -- 2.3.2. Density of states (DOS) -- 2.4. Organic semiconductors -- 2.4.1. Polymer structure -- 2.4.2. Polymer crystallinity -- 2.4.3. Defects in conjugated polymers -- 2.4.4. Defects in small-molecule crystals -- 2.4.5. Localized states -- 2.4.6. Density of states -- 2.5. Distribution of the energetic states -- Chapter 3. Defects and Physical Properties of Semiconductors -- 3.1. Carrier transport in organic semiconductors -- 3.1.1. Hopping conduction -- 3.1.2. Uniform density of states model -- 3.1.3. Non-uniform density of states models -- 3.2. Effects of defects on the carrier transport -- 3.2.1. Traps and recombination centers -- 3.2.2. Trapping mechanisms and trap parameters -- 3.3. Optical properties of semiconductors and defects -- 3.3.1. Defects and absorption -- 3.3.2. Defects and luminescence -- Chapter 4. Techniques for Studying Defects in Semiconductors -- 4.1. Electron spin resonance (ESR) -- 4.1.1. Basic concepts of ESR -- 4.1.2. Interpretation of ESR line -- 4.1.3. Electron nuclear double resonance (ENDOR) -- 4.1.4. Investigation of defects using the ESR technique -- 4.2. Optical techniques -- 4.2.1. Fluorescence spectroscopy (FL) -- 4.2.2. Thermally stimulated luminescence (TSL) spectroscopy.
4.3. Electrical techniques -- 4.3.1. Thermally stimulated current (TSC) technique -- 4.3.2. Current-voltage measurements: space charge-limited current (SCLC) -- 4.3.3. Impedance spectroscopy (IS) -- 4.3.4. Deep-level transient spectroscopy (DLTS) -- 4.3.5. Time of flight (TOF) and charge carrier extraction by linearly increasing voltage (CELIV) techniques -- Chapter 5. Defect Origins -- 5.1. Defects in organic semiconductors -- 5.1.1. Structural defects -- 5.1.2. Impurity defects -- 5.2. Defects in organic devices -- 5.2.1. Defects from the semiconductor -- 5.2.2. Defects from the surface and the interface -- 5.2.3. Defects from diffused impurities -- Chapter 6. Defects, Performance and Reliability of Organic Devices -- 6.1. Impact of defects on the performance of organic devices -- 6.1.1. Defects and efficiency of OLEDs -- 6.1.2. Defects and efficiency of OPVs -- 6.1.3. Defects and performance of OFETs -- 6.2. Impact of defects on the stability of organic devices -- 6.2.1. Overview of degradation mechanisms in organic semiconductors and devices -- 6.2.2. Defects and degradation of organic semiconductor and devices -- Future Prospects -- References -- Index -- EULA. |
| Record Nr. | UNINA-9911019272603321 |
Nguyen Thien-Phap
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| Newark : , : John Wiley & Sons, Incorporated, , 2023 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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