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Analysis of LDEF experiment AO187-2 chemical and isotopic measurements of micrometeoroids by secondary ion mass spectrometry [[electronic resource] ] : final report NAG1-1174 to the National Aeronautics and Space Administration ; principal investigator, Ernst Zinner
| Analysis of LDEF experiment AO187-2 chemical and isotopic measurements of micrometeoroids by secondary ion mass spectrometry [[electronic resource] ] : final report NAG1-1174 to the National Aeronautics and Space Administration ; principal investigator, Ernst Zinner |
| Autore | Zinner Ernst |
| Edizione | [[Redacted ed.]] |
| Pubbl/distr/stampa | [Washington, D.C.] : , : [National Aeronautics and Space Administration], , [1995] |
| Descrizione fisica | 1 online resource |
| Collana | [NASA contractor report] |
| Soggetto topico |
Chemical analysis
Foils (materials) Hypervelocity impact Impingement Interplanetary dust Isotopic labeling Long Duration Exposure Facility Metallizing Micrometeoroids Secondary ion mass spectrometry Space debris Analytical chemistry |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Analysis of LDEF experiment AO187-2 chemical and isotopic measurements of micrometeoroids by secondary ion mass spectrometry |
| Record Nr. | UNINA-9910697279803321 |
Zinner Ernst
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| [Washington, D.C.] : , : [National Aeronautics and Space Administration], , [1995] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Cluster secondary ion mass spectrometry [[electronic resource] ] : principles and applications / / edited by Christine M. Mahoney
| Cluster secondary ion mass spectrometry [[electronic resource] ] : principles and applications / / edited by Christine M. Mahoney |
| Pubbl/distr/stampa | Hoboken, N.J., : John Wiley & Sons, Inc., 2013 |
| Descrizione fisica | 1 online resource (366 p.) |
| Disciplina | 543/.65 |
| Altri autori (Persone) | MahoneyChristine M |
| Collana | Wiley Series on Mass Spectrometry |
| Soggetto topico |
Secondary ion mass spectrometry
Mass spectrometry |
| ISBN |
1-118-58924-6
1-118-58933-5 1-299-47587-6 1-118-58925-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
CLUSTER SECONDARY ION MASS SPECTROMETRY; CONTENTS; Contributors; About the Editor; 1 AN INTRODUCTION TO CLUSTER SECONDARY ION MASS SPECTROMETRY (CLUSTER SIMS); 1.1 Secondary Ion Mass Spectrometry in a Nutshell; 1.1.1 SIMS Imaging; 1.1.2 SIMS Depth Profiling; 1.2 Basic Cluster SIMS Theory; 1.3 Cluster SIMS: An Early History; 1.3.1 Nonlinear Sputter Yield Enhancements; 1.3.2 Molecular Depth Profiling; 1.4 Recent Developments; 1.5 About this Book; Acknowledgment; References; 2 CLUSTER SIMS OF ORGANIC MATERIALS: THEORETICAL INSIGHTS; 2.1 Introduction
2.2 Molecular Dynamics Simulations of Sputtering with Clusters2.2.1 The Cluster Effect; 2.2.2 Computer Simulations and the Molecular Dynamics ""Experiment""; 2.2.3 Light and Heavy Element Clusters, and the Importance of Mass Matching; 2.2.4 Structural Effects in Organic Materials; 2.2.4.1 Amorphous Molecular Solids and Polymers; 2.2.4.2 Organic Crystals; 2.2.4.3 Thin Organic Layers on Metal Substrates; 2.2.4.4 Hybrid Metal-Organic Samples; 2.2.5 Induced Chemistry; 2.2.6 Multiple Hits and Depth Profiling; 2.2.7 From Small Polyatomic Projectiles to Massive Clusters 2.2.7.1 Light-Element Clusters2.2.7.2 Large Argon Clusters; 2.2.7.3 Massive Gold Clusters; 2.3 Other Models; 2.3.1 Analytical Models: From Linear Collision Cascades to Fluid Dynamics; 2.3.2 Recent Developments and Hybrid Approaches; 2.4 Conclusions; Acknowledgments; References; 3 ION SOURCES USED FOR SECONDARY ION MASS SPECTROMETRY; 3.1 Introduction; 3.2 Research Needs that have Influenced the Development of Primary Ion Sources for Sputtering; 3.3 Functional Aspects of Various Ion Sources; 3.3.1 Energy Spread in the Beam; 3.3.2 Point-Source Ionization; 3.3.3 Stable Emission 3.3.4 Ion Reactivity3.3.5 Source Lifetime; 3.3.6 Penetration Depth and Surface Energy Spread of the Projectile; 3.4 Atomic Ion Sources; 3.4.1 Field Emission; 3.4.2 Radio Frequency (RF) Ionization; 3.4.3 Electron Impact; 3.4.4 Thermal Ionization; 3.4.5 DC-Glow Discharge; 3.4.6 Sputtering; 3.5 Molecular Ion Sources; 3.5.1 Field Emission; 3.5.2 Radio Frequency Discharge; 3.5.3 Electron Impact; 3.5.4 DC-Glow Discharge; 3.5.5 Sputtering; 3.6 Cluster Ion Sources; 3.6.1 Jets and Electron Impact (Massive Gas Clusters); 3.6.2 Field Emission; 3.7 Summary; References 4 SURFACE ANALYSIS OF ORGANIC MATERIALS WITH POLYATOMIC PRIMARY ION SOURCES4.1 Introduction; 4.2 Cluster Sources in Static SIMS; 4.2.1 A Brief Introduction to Static SIMS; 4.2.2 Analysis beyond the Static Limit; 4.2.3 Increased Ion Yields; 4.2.4 Decreased Charging; 4.2.5 Surface Cleaning; 4.3 Experimental Considerations; 4.3.1 When to Employ Cluster Sources as Opposed to Atomic Sources; 4.3.2 Type of Cluster Source Used; 4.3.2.1 Liquid Metal Ion Gun (LMIG); 4.3.2.2 C + 60 for Mass Spectral Analysis and Imaging Applications; 4.3.2.3 The Gas Cluster Ion Beam (GCIB); 4.3.2.4 Au 4+ 400 4.3.2.5 Other Sources |
| Record Nr. | UNINA-9910139006703321 |
| Hoboken, N.J., : John Wiley & Sons, Inc., 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Cluster secondary ion mass spectrometry : principles and applications / / edited by Christine M. Mahoney
| Cluster secondary ion mass spectrometry : principles and applications / / edited by Christine M. Mahoney |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Hoboken, N.J., : John Wiley & Sons, Inc., 2013 |
| Descrizione fisica | 1 online resource (366 p.) |
| Disciplina | 543/.65 |
| Altri autori (Persone) | MahoneyChristine M |
| Collana | Wiley Series on Mass Spectrometry |
| Soggetto topico |
Secondary ion mass spectrometry
Mass spectrometry |
| ISBN |
9781118589243
1118589246 9781118589335 1118589335 9781299475878 1299475876 9781118589250 1118589254 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
CLUSTER SECONDARY ION MASS SPECTROMETRY; CONTENTS; Contributors; About the Editor; 1 AN INTRODUCTION TO CLUSTER SECONDARY ION MASS SPECTROMETRY (CLUSTER SIMS); 1.1 Secondary Ion Mass Spectrometry in a Nutshell; 1.1.1 SIMS Imaging; 1.1.2 SIMS Depth Profiling; 1.2 Basic Cluster SIMS Theory; 1.3 Cluster SIMS: An Early History; 1.3.1 Nonlinear Sputter Yield Enhancements; 1.3.2 Molecular Depth Profiling; 1.4 Recent Developments; 1.5 About this Book; Acknowledgment; References; 2 CLUSTER SIMS OF ORGANIC MATERIALS: THEORETICAL INSIGHTS; 2.1 Introduction
2.2 Molecular Dynamics Simulations of Sputtering with Clusters2.2.1 The Cluster Effect; 2.2.2 Computer Simulations and the Molecular Dynamics ""Experiment""; 2.2.3 Light and Heavy Element Clusters, and the Importance of Mass Matching; 2.2.4 Structural Effects in Organic Materials; 2.2.4.1 Amorphous Molecular Solids and Polymers; 2.2.4.2 Organic Crystals; 2.2.4.3 Thin Organic Layers on Metal Substrates; 2.2.4.4 Hybrid Metal-Organic Samples; 2.2.5 Induced Chemistry; 2.2.6 Multiple Hits and Depth Profiling; 2.2.7 From Small Polyatomic Projectiles to Massive Clusters 2.2.7.1 Light-Element Clusters2.2.7.2 Large Argon Clusters; 2.2.7.3 Massive Gold Clusters; 2.3 Other Models; 2.3.1 Analytical Models: From Linear Collision Cascades to Fluid Dynamics; 2.3.2 Recent Developments and Hybrid Approaches; 2.4 Conclusions; Acknowledgments; References; 3 ION SOURCES USED FOR SECONDARY ION MASS SPECTROMETRY; 3.1 Introduction; 3.2 Research Needs that have Influenced the Development of Primary Ion Sources for Sputtering; 3.3 Functional Aspects of Various Ion Sources; 3.3.1 Energy Spread in the Beam; 3.3.2 Point-Source Ionization; 3.3.3 Stable Emission 3.3.4 Ion Reactivity3.3.5 Source Lifetime; 3.3.6 Penetration Depth and Surface Energy Spread of the Projectile; 3.4 Atomic Ion Sources; 3.4.1 Field Emission; 3.4.2 Radio Frequency (RF) Ionization; 3.4.3 Electron Impact; 3.4.4 Thermal Ionization; 3.4.5 DC-Glow Discharge; 3.4.6 Sputtering; 3.5 Molecular Ion Sources; 3.5.1 Field Emission; 3.5.2 Radio Frequency Discharge; 3.5.3 Electron Impact; 3.5.4 DC-Glow Discharge; 3.5.5 Sputtering; 3.6 Cluster Ion Sources; 3.6.1 Jets and Electron Impact (Massive Gas Clusters); 3.6.2 Field Emission; 3.7 Summary; References 4 SURFACE ANALYSIS OF ORGANIC MATERIALS WITH POLYATOMIC PRIMARY ION SOURCES4.1 Introduction; 4.2 Cluster Sources in Static SIMS; 4.2.1 A Brief Introduction to Static SIMS; 4.2.2 Analysis beyond the Static Limit; 4.2.3 Increased Ion Yields; 4.2.4 Decreased Charging; 4.2.5 Surface Cleaning; 4.3 Experimental Considerations; 4.3.1 When to Employ Cluster Sources as Opposed to Atomic Sources; 4.3.2 Type of Cluster Source Used; 4.3.2.1 Liquid Metal Ion Gun (LMIG); 4.3.2.2 C + 60 for Mass Spectral Analysis and Imaging Applications; 4.3.2.3 The Gas Cluster Ion Beam (GCIB); 4.3.2.4 Au 4+ 400 4.3.2.5 Other Sources |
| Record Nr. | UNINA-9910827678303321 |
| Hoboken, N.J., : John Wiley & Sons, Inc., 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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The detection of doped Cr presence in Sr0.6Ba0.4Nb2O3 by SIMS / / Unchul Lee
| The detection of doped Cr presence in Sr0.6Ba0.4Nb2O3 by SIMS / / Unchul Lee |
| Autore | Lee Unchul |
| Pubbl/distr/stampa | Adelphi, MD : , : Army Research Laboratory, , May 1999 |
| Descrizione fisica | 1 online resource (iii, 12 pages) : illustrations |
| Collana | ARL-TN |
| Soggetto topico |
Photorefractive materials
Secondary ion mass spectrometry |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
Detection of doped Cr presence in Sr(0.6)Ba(0.4)Nb2O3 by SIMS
Detection of doped chromium presence in Sr0.6Ba0.4Nb2O3 by SIMS Detection of doped chromium presence in Sr0.6Ba0.4Nb2O3 by Secondary Ion Mass Spectrometry |
| Record Nr. | UNINA-9910698064603321 |
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Lee Unchul
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| Adelphi, MD : , : Army Research Laboratory, , May 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Lanthanide-based multifunctional materials : from OLEDs to SIMs / / edited by Pablo Martin-Ramos, Manuela Ramos-Silva
| Lanthanide-based multifunctional materials : from OLEDs to SIMs / / edited by Pablo Martin-Ramos, Manuela Ramos-Silva |
| Pubbl/distr/stampa | Amsterdam, Netherlands : , : Elsevier, , [2018] |
| Descrizione fisica | 1 online resource (492 pages) |
| Disciplina | 546.41 |
| Collana | Micro & Nano Technologies Series |
| Soggetto topico |
Rare earth metals
Light emitting diodes Secondary ion mass spectrometry |
| ISBN |
0-12-813841-6
0-12-813840-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910583048803321 |
| Amsterdam, Netherlands : , : Elsevier, , [2018] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Secondary ion mass spectrometry : an introduction to principles and practices / / Paul van der Heide
| Secondary ion mass spectrometry : an introduction to principles and practices / / Paul van der Heide |
| Autore | Van der Heide Paul <1962-> |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : Wiley, , 2014 |
| Descrizione fisica | 1 online resource (365 p.) |
| Disciplina | 543/.65 |
| Collana | THEi Wiley ebooks |
| Soggetto topico | Secondary ion mass spectrometry |
| ISBN |
1-118-91677-8
1-118-91678-6 1-118-91676-X |
| Classificazione | SCI013010 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Machine generated contents note: Forward x Preface xi Acknowledgements xiv List of physical constants xiv Chapter 1: Introduction 1.1 Matter and the Mass Spectrometer 1.2 Secondary Ion Mass Spectrometry 1.3 Summary Section I Chapter 2: Properties of atoms, ions, molecules and solids 2.1 The Atom 2.2 Electronic structure of atoms and ions 2.3 Summary Chapter 3: Current understanding of sputtering and ion formation 3.1 The fundamentals of SIMS 3.2 Sputtering 3.3 Ionization/neutralization 3.4 Summary Section II Chapter 4: Instrumentation 4.1 The science of measurement 4.2 Hardware 4.3 Summary Chapter 5: Data collection 5.1 The art of measurement 5.2 Sample preparation and handling 5.3 Data collection 5.4 Data conversion 5.5 Summary Appendix i) Periodic table of the elements ii) Isotope masses, natural isotope abundances, atomic weights and mass densities of the elements iii) 1st and 2nd Ionization potentials and electron affinities of the elements iv) Work-functions of elemental solids v) SIMS detection limits of selected elements vi) Charged particle beam transport vii) Statistical properties viii) SIMS instrument designs ix) Additional SIMS methods of interest x) Additional spectrometric/spectroscopic techniques xi) Additional microscopic techniques xii) Diffraction / reflection techniques Technique acronym list Abbreviations commonly used in SIMS Glossary of terms Questions and answers References Index Notes. |
| Record Nr. | UNINA-9910132342103321 |
|
Van der Heide Paul <1962->
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| Hoboken, New Jersey : , : Wiley, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Secondary ion mass spectrometry : an introduction to principles and practices / / Paul van der Heide
| Secondary ion mass spectrometry : an introduction to principles and practices / / Paul van der Heide |
| Autore | Van der Heide Paul <1962-> |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : Wiley, , 2014 |
| Descrizione fisica | 1 online resource (365 p.) |
| Disciplina | 543/.65 |
| Collana | THEi Wiley ebooks |
| Soggetto topico | Secondary ion mass spectrometry |
| ISBN |
1-118-91677-8
1-118-91678-6 1-118-91676-X |
| Classificazione | SCI013010 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Machine generated contents note: Forward x Preface xi Acknowledgements xiv List of physical constants xiv Chapter 1: Introduction 1.1 Matter and the Mass Spectrometer 1.2 Secondary Ion Mass Spectrometry 1.3 Summary Section I Chapter 2: Properties of atoms, ions, molecules and solids 2.1 The Atom 2.2 Electronic structure of atoms and ions 2.3 Summary Chapter 3: Current understanding of sputtering and ion formation 3.1 The fundamentals of SIMS 3.2 Sputtering 3.3 Ionization/neutralization 3.4 Summary Section II Chapter 4: Instrumentation 4.1 The science of measurement 4.2 Hardware 4.3 Summary Chapter 5: Data collection 5.1 The art of measurement 5.2 Sample preparation and handling 5.3 Data collection 5.4 Data conversion 5.5 Summary Appendix i) Periodic table of the elements ii) Isotope masses, natural isotope abundances, atomic weights and mass densities of the elements iii) 1st and 2nd Ionization potentials and electron affinities of the elements iv) Work-functions of elemental solids v) SIMS detection limits of selected elements vi) Charged particle beam transport vii) Statistical properties viii) SIMS instrument designs ix) Additional SIMS methods of interest x) Additional spectrometric/spectroscopic techniques xi) Additional microscopic techniques xii) Diffraction / reflection techniques Technique acronym list Abbreviations commonly used in SIMS Glossary of terms Questions and answers References Index Notes. |
| Record Nr. | UNINA-9910817869403321 |
|
Van der Heide Paul <1962->
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| Hoboken, New Jersey : , : Wiley, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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