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Electrochemical nanotechnology [[electronic resource] ] : in-situ local probe techniques at electrochemical interfaces / / edited by W.J. Lorenz and W. Plieth
| Electrochemical nanotechnology [[electronic resource] ] : in-situ local probe techniques at electrochemical interfaces / / edited by W.J. Lorenz and W. Plieth |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Weinheim ; ; Chichester, : Wiley-VCH, c1998 |
| Descrizione fisica | 1 online resource (354 p.) |
| Disciplina | 620.5 |
| Altri autori (Persone) |
LorenzW. J
PliethW (Waldfried) |
| Soggetto topico |
Nanotechnology
Atomic force microscopy Electrochemistry Scanning probe microscopy Scanning tunneling microscopy Surface chemistry Surfaces (Physics) |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-281-76387-X
9786611763879 3-527-61215-7 3-527-61214-9 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Electrochemical Nanotechnology; Preface; Contents; Part I General Aspects; Local Probing of Electrochemical Processes at Non-ideal Electrodes; Electrochemistry and Nanotechnology; Imaging of Electrochemical Processes and Biological Macromolecular Adsorbates by in-situ Scanning Tunneling Microscopy; Beyond the Landscapes: Imaging the Invisible; Part II Roughness and Interface Structure; Roughness Kinetics and Mechanism Derived from the Analysis of AFM and STM Imaging Data; Electrodes with a Defined Mesoscopic Structure
In-situ Stress Measurements at the Solid/liquid Interface Using a Micromechanical SensorSurface Structure and Electrochemistry: New Insight by Scanning Tunneling Microscopy; Part III Surface Modification; STM and AFM Studies of the Electrified Solid-Liquid Interface: Monolayers, Multilayers, and Organic Transformations; Scanning Probe Microscopy Studies of Molecular Redox Films; New Aspects of Iodine-modified Single-crystal Electrodes; The Growth and the Surface Properties of Polypyrrole on Single Crystal Graphite Electrodes as Studied by in-situ Electrochemical Scanning Probe Microscopy Part IV Nucleation and ElectrodepositionNucleation and Growth at Metal Electrode Surfaces; STM Studies of Electrodeposition of Strained-Layer Metallic Superlattices; Part V Oxide Layers and Corrosion; STM Studies of Thin Anodic Oxide Layer; Local Probing of Electrochemical Interfaces in Corrosion Research; Morphology and Nucleation of Ni-Ti02 LIGA Layers; SPM Investigations on Oxide-covered Titanium Surfaces: Problems and Possibilities; Part VI Semiconductors; Electrochemical Surface Processing of Semiconductors at the Atomic Level In-situ Electrochemical AFM Study of Semiconductor Electrodes in Electrolyte SolutionsPart VII STM and Complementary Methods; In-situ STM and Electrochemical UHV Technique: Complementary, Noncompeting Techniques; Growth Morphology and Molecular Orientation of Additives in Electrocrystallization Studied by Surface-enhanced Raman spectroscopy; Instrumental Design and Prospects for NMR-Electrochemistry; List of Contributors; List of Abbreviations; Symbol List; Subject Index |
| Record Nr. | UNINA-9910144260503321 |
| Weinheim ; ; Chichester, : Wiley-VCH, c1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Electrochemical nanotechnology [[electronic resource] ] : in-situ local probe techniques at electrochemical interfaces / / edited by W.J. Lorenz and W. Plieth
| Electrochemical nanotechnology [[electronic resource] ] : in-situ local probe techniques at electrochemical interfaces / / edited by W.J. Lorenz and W. Plieth |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Weinheim ; ; Chichester, : Wiley-VCH, c1998 |
| Descrizione fisica | 1 online resource (354 p.) |
| Disciplina | 620.5 |
| Altri autori (Persone) |
LorenzW. J
PliethW (Waldfried) |
| Soggetto topico |
Nanotechnology
Atomic force microscopy Electrochemistry Scanning probe microscopy Scanning tunneling microscopy Surface chemistry Surfaces (Physics) |
| ISBN |
1-281-76387-X
9786611763879 3-527-61215-7 3-527-61214-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Electrochemical Nanotechnology; Preface; Contents; Part I General Aspects; Local Probing of Electrochemical Processes at Non-ideal Electrodes; Electrochemistry and Nanotechnology; Imaging of Electrochemical Processes and Biological Macromolecular Adsorbates by in-situ Scanning Tunneling Microscopy; Beyond the Landscapes: Imaging the Invisible; Part II Roughness and Interface Structure; Roughness Kinetics and Mechanism Derived from the Analysis of AFM and STM Imaging Data; Electrodes with a Defined Mesoscopic Structure
In-situ Stress Measurements at the Solid/liquid Interface Using a Micromechanical SensorSurface Structure and Electrochemistry: New Insight by Scanning Tunneling Microscopy; Part III Surface Modification; STM and AFM Studies of the Electrified Solid-Liquid Interface: Monolayers, Multilayers, and Organic Transformations; Scanning Probe Microscopy Studies of Molecular Redox Films; New Aspects of Iodine-modified Single-crystal Electrodes; The Growth and the Surface Properties of Polypyrrole on Single Crystal Graphite Electrodes as Studied by in-situ Electrochemical Scanning Probe Microscopy Part IV Nucleation and ElectrodepositionNucleation and Growth at Metal Electrode Surfaces; STM Studies of Electrodeposition of Strained-Layer Metallic Superlattices; Part V Oxide Layers and Corrosion; STM Studies of Thin Anodic Oxide Layer; Local Probing of Electrochemical Interfaces in Corrosion Research; Morphology and Nucleation of Ni-Ti02 LIGA Layers; SPM Investigations on Oxide-covered Titanium Surfaces: Problems and Possibilities; Part VI Semiconductors; Electrochemical Surface Processing of Semiconductors at the Atomic Level In-situ Electrochemical AFM Study of Semiconductor Electrodes in Electrolyte SolutionsPart VII STM and Complementary Methods; In-situ STM and Electrochemical UHV Technique: Complementary, Noncompeting Techniques; Growth Morphology and Molecular Orientation of Additives in Electrocrystallization Studied by Surface-enhanced Raman spectroscopy; Instrumental Design and Prospects for NMR-Electrochemistry; List of Contributors; List of Abbreviations; Symbol List; Subject Index |
| Record Nr. | UNISA-996203158003316 |
| Weinheim ; ; Chichester, : Wiley-VCH, c1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Electrochemical nanotechnology [[electronic resource] ] : in-situ local probe techniques at electrochemical interfaces / / edited by W.J. Lorenz and W. Plieth
| Electrochemical nanotechnology [[electronic resource] ] : in-situ local probe techniques at electrochemical interfaces / / edited by W.J. Lorenz and W. Plieth |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Weinheim ; ; Chichester, : Wiley-VCH, c1998 |
| Descrizione fisica | 1 online resource (354 p.) |
| Disciplina | 620.5 |
| Altri autori (Persone) |
LorenzW. J
PliethW (Waldfried) |
| Soggetto topico |
Nanotechnology
Atomic force microscopy Electrochemistry Scanning probe microscopy Scanning tunneling microscopy Surface chemistry Surfaces (Physics) |
| ISBN |
1-281-76387-X
9786611763879 3-527-61215-7 3-527-61214-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Electrochemical Nanotechnology; Preface; Contents; Part I General Aspects; Local Probing of Electrochemical Processes at Non-ideal Electrodes; Electrochemistry and Nanotechnology; Imaging of Electrochemical Processes and Biological Macromolecular Adsorbates by in-situ Scanning Tunneling Microscopy; Beyond the Landscapes: Imaging the Invisible; Part II Roughness and Interface Structure; Roughness Kinetics and Mechanism Derived from the Analysis of AFM and STM Imaging Data; Electrodes with a Defined Mesoscopic Structure
In-situ Stress Measurements at the Solid/liquid Interface Using a Micromechanical SensorSurface Structure and Electrochemistry: New Insight by Scanning Tunneling Microscopy; Part III Surface Modification; STM and AFM Studies of the Electrified Solid-Liquid Interface: Monolayers, Multilayers, and Organic Transformations; Scanning Probe Microscopy Studies of Molecular Redox Films; New Aspects of Iodine-modified Single-crystal Electrodes; The Growth and the Surface Properties of Polypyrrole on Single Crystal Graphite Electrodes as Studied by in-situ Electrochemical Scanning Probe Microscopy Part IV Nucleation and ElectrodepositionNucleation and Growth at Metal Electrode Surfaces; STM Studies of Electrodeposition of Strained-Layer Metallic Superlattices; Part V Oxide Layers and Corrosion; STM Studies of Thin Anodic Oxide Layer; Local Probing of Electrochemical Interfaces in Corrosion Research; Morphology and Nucleation of Ni-Ti02 LIGA Layers; SPM Investigations on Oxide-covered Titanium Surfaces: Problems and Possibilities; Part VI Semiconductors; Electrochemical Surface Processing of Semiconductors at the Atomic Level In-situ Electrochemical AFM Study of Semiconductor Electrodes in Electrolyte SolutionsPart VII STM and Complementary Methods; In-situ STM and Electrochemical UHV Technique: Complementary, Noncompeting Techniques; Growth Morphology and Molecular Orientation of Additives in Electrocrystallization Studied by Surface-enhanced Raman spectroscopy; Instrumental Design and Prospects for NMR-Electrochemistry; List of Contributors; List of Abbreviations; Symbol List; Subject Index |
| Record Nr. | UNINA-9910830357303321 |
| Weinheim ; ; Chichester, : Wiley-VCH, c1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Electrochemical nanotechnology : in-situ local probe techniques at electrochemical interfaces / / edited by W.J. Lorenz and W. Plieth
| Electrochemical nanotechnology : in-situ local probe techniques at electrochemical interfaces / / edited by W.J. Lorenz and W. Plieth |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Weinheim ; ; Chichester, : Wiley-VCH, c1998 |
| Descrizione fisica | 1 online resource (354 p.) |
| Disciplina | 620.5 |
| Altri autori (Persone) |
LorenzW. J
PliethW (Waldfried) |
| Soggetto topico |
Nanotechnology
Atomic force microscopy Electrochemistry Scanning probe microscopy Scanning tunneling microscopy Surface chemistry Surfaces (Physics) |
| ISBN |
9786611763879
9781281763877 128176387X 9783527612154 3527612157 9783527612147 3527612149 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Electrochemical Nanotechnology; Preface; Contents; Part I General Aspects; Local Probing of Electrochemical Processes at Non-ideal Electrodes; Electrochemistry and Nanotechnology; Imaging of Electrochemical Processes and Biological Macromolecular Adsorbates by in-situ Scanning Tunneling Microscopy; Beyond the Landscapes: Imaging the Invisible; Part II Roughness and Interface Structure; Roughness Kinetics and Mechanism Derived from the Analysis of AFM and STM Imaging Data; Electrodes with a Defined Mesoscopic Structure
In-situ Stress Measurements at the Solid/liquid Interface Using a Micromechanical SensorSurface Structure and Electrochemistry: New Insight by Scanning Tunneling Microscopy; Part III Surface Modification; STM and AFM Studies of the Electrified Solid-Liquid Interface: Monolayers, Multilayers, and Organic Transformations; Scanning Probe Microscopy Studies of Molecular Redox Films; New Aspects of Iodine-modified Single-crystal Electrodes; The Growth and the Surface Properties of Polypyrrole on Single Crystal Graphite Electrodes as Studied by in-situ Electrochemical Scanning Probe Microscopy Part IV Nucleation and ElectrodepositionNucleation and Growth at Metal Electrode Surfaces; STM Studies of Electrodeposition of Strained-Layer Metallic Superlattices; Part V Oxide Layers and Corrosion; STM Studies of Thin Anodic Oxide Layer; Local Probing of Electrochemical Interfaces in Corrosion Research; Morphology and Nucleation of Ni-Ti02 LIGA Layers; SPM Investigations on Oxide-covered Titanium Surfaces: Problems and Possibilities; Part VI Semiconductors; Electrochemical Surface Processing of Semiconductors at the Atomic Level In-situ Electrochemical AFM Study of Semiconductor Electrodes in Electrolyte SolutionsPart VII STM and Complementary Methods; In-situ STM and Electrochemical UHV Technique: Complementary, Noncompeting Techniques; Growth Morphology and Molecular Orientation of Additives in Electrocrystallization Studied by Surface-enhanced Raman spectroscopy; Instrumental Design and Prospects for NMR-Electrochemistry; List of Contributors; List of Abbreviations; Symbol List; Subject Index |
| Record Nr. | UNINA-9911019615703321 |
| Weinheim ; ; Chichester, : Wiley-VCH, c1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Elektrochemische Herstellung und Charakterisierung von Nanostrukturen - Entwicklung ultrascharfer STM-Spitzen als Nanoelektroden / / Philipp Hugelmann
| Elektrochemische Herstellung und Charakterisierung von Nanostrukturen - Entwicklung ultrascharfer STM-Spitzen als Nanoelektroden / / Philipp Hugelmann |
| Autore | Hugelmann Philipp |
| Pubbl/distr/stampa | [Place of publication not identified] : , : KIT Scientific Publishing, , 2005 |
| Descrizione fisica | 1 online resource (190 pages) |
| Disciplina | 502/.8/2 |
| Soggetto topico |
Scanning tunneling microscopy
Scanning probe microscopy |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | ger |
| Record Nr. | UNINA-9910688209503321 |
Hugelmann Philipp
|
||
| [Place of publication not identified] : , : KIT Scientific Publishing, , 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Introduction to scanning tunneling microscopy [[electronic resource] /] / C. Julian Chen
| Introduction to scanning tunneling microscopy [[electronic resource] /] / C. Julian Chen |
| Autore | Chen C. Julian |
| Pubbl/distr/stampa | New York, : Oxford University Press, 1993 |
| Descrizione fisica | 1 online resource (469 p.) |
| Disciplina | 502/.8/2 |
| Collana | Oxford series in optical and imaging sciences |
| Soggetto topico |
Scanning tunneling microscopy
Microscopy |
| Soggetto genere / forma | Electronic books. |
| ISBN |
0-19-802356-1
1-4237-6461-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Contents; List of Figures; Gallery of STM Images; 1 Overview; PART I: IMAGING MECHANISM; PART II : INSTRUMENTATION; Appendix A: Real wavefunctions; Appendix B: Green's functions; Appendix C: Spherical modified Bessel functions; Appendix D: Two-dimensional Fourier series; Appendix E: Plane groups and invariant functions; Appendix F: Elementary elasticity theory; Appendix G: A short table of Laplace transforms; Appendix H: Operational amplifiers; References; Index |
| Record Nr. | UNINA-9910452148103321 |
|
Chen C. Julian
|
||
| New York, : Oxford University Press, 1993 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Introduction to scanning tunneling microscopy [[electronic resource] /] / C. Julian Chen
| Introduction to scanning tunneling microscopy [[electronic resource] /] / C. Julian Chen |
| Autore | Chen C. Julian |
| Pubbl/distr/stampa | New York, : Oxford University Press, 1993 |
| Descrizione fisica | 1 online resource (469 p.) |
| Disciplina | 502/.8/2 |
| Collana | Oxford series in optical and imaging sciences |
| Soggetto topico |
Scanning tunneling microscopy
Microscopy |
| ISBN |
0-19-773239-9
0-19-802356-1 1-4237-6461-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Contents; List of Figures; Gallery of STM Images; 1 Overview; PART I: IMAGING MECHANISM; PART II : INSTRUMENTATION; Appendix A: Real wavefunctions; Appendix B: Green's functions; Appendix C: Spherical modified Bessel functions; Appendix D: Two-dimensional Fourier series; Appendix E: Plane groups and invariant functions; Appendix F: Elementary elasticity theory; Appendix G: A short table of Laplace transforms; Appendix H: Operational amplifiers; References; Index |
| Record Nr. | UNINA-9910777534003321 |
|
Chen C. Julian
|
||
| New York, : Oxford University Press, 1993 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Introduction to scanning tunneling microscopy / C. Julien Chen
| Introduction to scanning tunneling microscopy / C. Julien Chen |
| Autore | Chen, C. Julien |
| Pubbl/distr/stampa | New York ; Oxford : Oxford University Press, 1993 |
| Descrizione fisica | ix, 412 p. ; 24 cm |
| Disciplina | 502.825 |
| Collana | Oxford series in optical and imaging sciences ; 4 |
| Soggetto topico | Scanning tunneling microscopy |
| ISBN | 0195071506 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991000172929707536 |
|
Chen, C. Julien
|
||
| New York ; Oxford : Oxford University Press, 1993 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
| ||
Nanoscale characterization of surfaces and interfaces / / N. John DiNardo
| Nanoscale characterization of surfaces and interfaces / / N. John DiNardo |
| Autore | DiNardo N. John |
| Pubbl/distr/stampa | Weinheim, [Germany] : , : VCH, , 1994 |
| Descrizione fisica | 1 online resource (176 p.) |
| Disciplina |
530.427
620.44 |
| Soggetto topico |
Surfaces (Physics)
Scanning tunneling microscopy Nanotechnology |
| ISBN |
1-281-84293-1
9786611842932 3-527-61595-4 3-527-61594-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Nanoscale Characterization of Surfaces and Interfaces; Nanoscale Characterization of Surfaces and Interfaces; List of Symbols and Abbreviations; 1 Introduction; 2 Scanning Tunneling Microscopy (STM); 2.1 Historical Perspective; 2.2 Theory; 2.2.1 Electron Tunneling and STM Imaging; 2.2.2 Scanning Tunneling Spectroscopy (STS); 2.2.3 Inelastic Tunneling Spectroscopy; 2.2.4 Ballistic Electron Emission Microscopy (BEEM); 2.3 Instrumentation; 2.3.1 Microscope Design: STM Heads; 2.3.2 Tips; 2.3.3 Vibration and Shock Isolation; 2.3.4 Electronics; 2.3.5 Microcomputer Control
2.6.2 Surface Diffusion2.6.3 Stepped Surfaces; 2.6.4 Adsorbate-Induced Reconstructions of Metal Surfaces; 2.6.5 Growth of Metallic Adlayers; 2.6.6 Resistivity in Polycrystalline Metals - Scanning Tunneling Potentiometry; 2.7 Insulators; 2.8 Layered Compounds .; 2.9 Charge Density Wave Systems; 2.10 Superconductors; 2.11 Molecular Films, Adsorbates, and Surface Chemistry; 2.11.1 Molecular Imaging; 2.11.2 Adsorption and Surface Chemistry; 2.12 Electrochemistry at Liquid-Solid Interfaces; 2.1 3 Biological Systems; 2.14 Metrological Applications; 3 Atomic Force Microscopy 3.1 Atomic Force Imaging3.1.1 Graphite; 3.1.2 Insulators; 3.1.3 Metals; 3.1.4 Films; 3.1.5 Polymer Surfaces and Metal Films on Polymer Substrates; 3.1.6 Biological Molecules; 3.1.7 Adsorption Dynamics of Biological Molecules in Real Time; 3.2 Nanoscale Surface Forces; 3.3 Nanotribology; 3.4 Non-Contact Imaging; 3.4.1 Van der Waals Forces; 3.4.2 Electrostatic Forces; 3.4.3 Magnetic Forces; 4 Manipulation of Atoms and Atom Clusters on the Nanoscale; 4.1 Transfer of Atoms and Atom Clusters Between Tip and Sample; 4.2 Tip-Induced Lateral Motion of Atoms on Surfaces 4.3 Nanoscale Modification by Tip-Induced Local Electron-Stimulated Desorption4.4 Nanoscale Chemical Modification; 4.5 High-Temperature Nanofabrication; 4.6 Nanoscale Surface Modification Using the AFM; 4.7 Towards Nanoscale Devices; 5 Spin-offs of STM - Non-Contact Nanoscale Probes; 5.1 Scanning Near-Field Optical Microscope (SNOM); 5.2 Photon Scanning Tunneling Microscope (PSTM); 5.3 Scanning Thermal Profiler (STP); 5.4 Scanning Chemical Potential Microscope (SCPM); 5.5 Optical Absorption Microscope (OAM); 5.6 Scanning Ion Conductance Microscope (SICM); 6 Acknowledgements; 7 References |
| Record Nr. | UNISA-996199395203316 |
|
DiNardo N. John
|
||
| Weinheim, [Germany] : , : VCH, , 1994 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Nanoscale characterization of surfaces and interfaces / / N. John DiNardo
| Nanoscale characterization of surfaces and interfaces / / N. John DiNardo |
| Autore | DiNardo N. John |
| Pubbl/distr/stampa | Weinheim, [Germany] : , : VCH, , 1994 |
| Descrizione fisica | 1 online resource (176 p.) |
| Disciplina |
530.427
620.44 |
| Soggetto topico |
Surfaces (Physics)
Scanning tunneling microscopy Nanotechnology |
| ISBN |
1-281-84293-1
9786611842932 3-527-61595-4 3-527-61594-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Nanoscale Characterization of Surfaces and Interfaces; Nanoscale Characterization of Surfaces and Interfaces; List of Symbols and Abbreviations; 1 Introduction; 2 Scanning Tunneling Microscopy (STM); 2.1 Historical Perspective; 2.2 Theory; 2.2.1 Electron Tunneling and STM Imaging; 2.2.2 Scanning Tunneling Spectroscopy (STS); 2.2.3 Inelastic Tunneling Spectroscopy; 2.2.4 Ballistic Electron Emission Microscopy (BEEM); 2.3 Instrumentation; 2.3.1 Microscope Design: STM Heads; 2.3.2 Tips; 2.3.3 Vibration and Shock Isolation; 2.3.4 Electronics; 2.3.5 Microcomputer Control
2.6.2 Surface Diffusion2.6.3 Stepped Surfaces; 2.6.4 Adsorbate-Induced Reconstructions of Metal Surfaces; 2.6.5 Growth of Metallic Adlayers; 2.6.6 Resistivity in Polycrystalline Metals - Scanning Tunneling Potentiometry; 2.7 Insulators; 2.8 Layered Compounds .; 2.9 Charge Density Wave Systems; 2.10 Superconductors; 2.11 Molecular Films, Adsorbates, and Surface Chemistry; 2.11.1 Molecular Imaging; 2.11.2 Adsorption and Surface Chemistry; 2.12 Electrochemistry at Liquid-Solid Interfaces; 2.1 3 Biological Systems; 2.14 Metrological Applications; 3 Atomic Force Microscopy 3.1 Atomic Force Imaging3.1.1 Graphite; 3.1.2 Insulators; 3.1.3 Metals; 3.1.4 Films; 3.1.5 Polymer Surfaces and Metal Films on Polymer Substrates; 3.1.6 Biological Molecules; 3.1.7 Adsorption Dynamics of Biological Molecules in Real Time; 3.2 Nanoscale Surface Forces; 3.3 Nanotribology; 3.4 Non-Contact Imaging; 3.4.1 Van der Waals Forces; 3.4.2 Electrostatic Forces; 3.4.3 Magnetic Forces; 4 Manipulation of Atoms and Atom Clusters on the Nanoscale; 4.1 Transfer of Atoms and Atom Clusters Between Tip and Sample; 4.2 Tip-Induced Lateral Motion of Atoms on Surfaces 4.3 Nanoscale Modification by Tip-Induced Local Electron-Stimulated Desorption4.4 Nanoscale Chemical Modification; 4.5 High-Temperature Nanofabrication; 4.6 Nanoscale Surface Modification Using the AFM; 4.7 Towards Nanoscale Devices; 5 Spin-offs of STM - Non-Contact Nanoscale Probes; 5.1 Scanning Near-Field Optical Microscope (SNOM); 5.2 Photon Scanning Tunneling Microscope (PSTM); 5.3 Scanning Thermal Profiler (STP); 5.4 Scanning Chemical Potential Microscope (SCPM); 5.5 Optical Absorption Microscope (OAM); 5.6 Scanning Ion Conductance Microscope (SICM); 6 Acknowledgements; 7 References |
| Record Nr. | UNINA-9910144717503321 |
|
DiNardo N. John
|
||
| Weinheim, [Germany] : , : VCH, , 1994 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
