top

  Info

  • Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.

  Info

  • Utilizzare questo link per rimuovere la selezione effettuata.

Biblioteca

MARC Lista (tabellare)
Force microscopy [[electronic resource] ] : applications in biology and medicine / / edited by Bhanu P. Jena, J.K. Heinrich Hörber
Force microscopy [[electronic resource] ] : applications in biology and medicine / / edited by Bhanu P. Jena, J.K. Heinrich Hörber
Pubbl/distr/stampa Hoboken, N.J., : Wiley-Liss, c2006
Descrizione fisica 1 online resource (312 p.)
Disciplina 502.82
610.28
Altri autori (Persone) JenaBhanu P
HörberJ. K. Heinrich
Soggetto topico Medical electronics
Scanning force microscopy
Scanning probe microscopy
Nanotechnology
Soggetto genere / forma Electronic books.
ISBN 1-280-50788-8
9786610507887
0-470-00770-2
0-470-00769-9
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto FORCE MICROSCOPY; CONTENTS; Preface; Contributors; Chapter 1. Porosome: The Universal Secretory Machinery in Cells; Chapter 2. Molecular Mechanism of SNARE-Induced Membrane Fusion; Chapter 3. Molecular Mechanism of Secretory Vesicle Content Expulsion During Cell Secretion; Chapter 4. Fusion Pores in Growth-Hormone-Secreting Cells of the Pituitary Gland: An AFM Study; Chapter 5. Properties of Microbial Cell Surfaces Examined by Atomic Force Microscopy; Chapter 6. Scanning Probe Microscopy of Plant Cell Wall and Its Constituents; Chapter 7. Cellular Interactions of Nano Drug Delivery Systems
Chapter 8. Adapting AFM Techniques for Studies on Living CellsChapter 9. Intermolecular Forces of Leukocyte Adhesion Molecules; Chapter 10. Mechanisms of Avidity Modulation in Leukocyte Adhesion Studied by AFM; Chapter 11. Resolving the Thickness and Micromechanical Properties of Lipid Bilayers and Vesicles Using AFM; Chapter 12. Imaging Soft Surfaces by SFM; Chapter 13. High-Speed Atomic Force Microscopy of Biomolecules in Motion; Chapter 14. Atomic Force Microscopy in Cytogenetics
Chapter 15. Atomic Force Microscopy in the Study of Macromolecular Interactions in Hemostasis and Thrombosis: Utility for Investigation of the Antiphospholipid SyndromeIndex
Record Nr. UNINA-9910585798703321
Hoboken, N.J., : Wiley-Liss, c2006
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Force microscopy [[electronic resource] ] : applications in biology and medicine / / edited by Bhanu P. Jena, J.K. Heinrich Hörber
Force microscopy [[electronic resource] ] : applications in biology and medicine / / edited by Bhanu P. Jena, J.K. Heinrich Hörber
Pubbl/distr/stampa Hoboken, N.J., : Wiley-Liss, c2006
Descrizione fisica 1 online resource (312 p.)
Disciplina 502.82
610.28
Altri autori (Persone) JenaBhanu P
HörberJ. K. Heinrich
Soggetto topico Medical electronics
Scanning force microscopy
Scanning probe microscopy
Nanotechnology
ISBN 1-280-50788-8
9786610507887
0-470-00770-2
0-470-00769-9
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto FORCE MICROSCOPY; CONTENTS; Preface; Contributors; Chapter 1. Porosome: The Universal Secretory Machinery in Cells; Chapter 2. Molecular Mechanism of SNARE-Induced Membrane Fusion; Chapter 3. Molecular Mechanism of Secretory Vesicle Content Expulsion During Cell Secretion; Chapter 4. Fusion Pores in Growth-Hormone-Secreting Cells of the Pituitary Gland: An AFM Study; Chapter 5. Properties of Microbial Cell Surfaces Examined by Atomic Force Microscopy; Chapter 6. Scanning Probe Microscopy of Plant Cell Wall and Its Constituents; Chapter 7. Cellular Interactions of Nano Drug Delivery Systems
Chapter 8. Adapting AFM Techniques for Studies on Living CellsChapter 9. Intermolecular Forces of Leukocyte Adhesion Molecules; Chapter 10. Mechanisms of Avidity Modulation in Leukocyte Adhesion Studied by AFM; Chapter 11. Resolving the Thickness and Micromechanical Properties of Lipid Bilayers and Vesicles Using AFM; Chapter 12. Imaging Soft Surfaces by SFM; Chapter 13. High-Speed Atomic Force Microscopy of Biomolecules in Motion; Chapter 14. Atomic Force Microscopy in Cytogenetics
Chapter 15. Atomic Force Microscopy in the Study of Macromolecular Interactions in Hemostasis and Thrombosis: Utility for Investigation of the Antiphospholipid SyndromeIndex
Record Nr. UNINA-9910830250803321
Hoboken, N.J., : Wiley-Liss, c2006
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Force microscopy : applications in biology and medicine / / edited by Bhanu P. Jena, J.K. Heinrich Horber
Force microscopy : applications in biology and medicine / / edited by Bhanu P. Jena, J.K. Heinrich Horber
Pubbl/distr/stampa Hoboken, N.J., : Wiley-Liss, c2006
Descrizione fisica 1 online resource (312 p.)
Disciplina 610.28
Altri autori (Persone) JenaBhanu P
HörberJ. K. Heinrich
Soggetto topico Medical electronics
Scanning force microscopy
Scanning probe microscopy
Nanotechnology
ISBN 9786610507887
9781280507885
1280507888
9780470007709
0470007702
9780470007693
0470007699
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto FORCE MICROSCOPY; CONTENTS; Preface; Contributors; Chapter 1. Porosome: The Universal Secretory Machinery in Cells; Chapter 2. Molecular Mechanism of SNARE-Induced Membrane Fusion; Chapter 3. Molecular Mechanism of Secretory Vesicle Content Expulsion During Cell Secretion; Chapter 4. Fusion Pores in Growth-Hormone-Secreting Cells of the Pituitary Gland: An AFM Study; Chapter 5. Properties of Microbial Cell Surfaces Examined by Atomic Force Microscopy; Chapter 6. Scanning Probe Microscopy of Plant Cell Wall and Its Constituents; Chapter 7. Cellular Interactions of Nano Drug Delivery Systems
Chapter 8. Adapting AFM Techniques for Studies on Living CellsChapter 9. Intermolecular Forces of Leukocyte Adhesion Molecules; Chapter 10. Mechanisms of Avidity Modulation in Leukocyte Adhesion Studied by AFM; Chapter 11. Resolving the Thickness and Micromechanical Properties of Lipid Bilayers and Vesicles Using AFM; Chapter 12. Imaging Soft Surfaces by SFM; Chapter 13. High-Speed Atomic Force Microscopy of Biomolecules in Motion; Chapter 14. Atomic Force Microscopy in Cytogenetics
Chapter 15. Atomic Force Microscopy in the Study of Macromolecular Interactions in Hemostasis and Thrombosis: Utility for Investigation of the Antiphospholipid SyndromeIndex
Record Nr. UNINA-9911019604503321
Hoboken, N.J., : Wiley-Liss, c2006
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Scanning force microscopy : with applications to electric, magnetic, and atomic forces / / Dror Sarid
Scanning force microscopy : with applications to electric, magnetic, and atomic forces / / Dror Sarid
Autore Sarid Dror
Edizione [Rev. ed.]
Pubbl/distr/stampa New York ; , : Oxford University Press, , 2023
Descrizione fisica 1 online resource (xiii,263p. ) : ill
Disciplina 502.82
Collana Oxford series in optical and imaging sciences
Oxford scholarship online
Soggetto topico Scanning force microscopy
Surfaces (Physics)
ISBN 0-19-773261-5
1-280-44178-X
0-19-802281-6
9786610441785
0-19-534469-3
1-60256-628-3
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Intro -- Contents -- PREFACE TO THE REVISED EDITION -- PREFACE -- PART ONE. LEVERS AND NOISE -- Chapter 1 Mechanical Properties of Levers -- 1.1. Introduction -- 1.2. Stress and Strain -- 1.3. Moments -- 1.4. Spring Constant -- 1.5. The Rayleigh Solution to a Vibrating Lever -- 1.6. The Classical Solution to a Vibrating Lever -- 1.7. Normal Modes -- 1.8. Lumped Systems -- 1.9. Examples -- 1.10. Summary -- Chapter 2 Resonance Enhancement -- 2.1. Introduction -- 2.2. Bimorph Driver -- 2.3. Effective Spring Constant -- 2.4. Bimorph-Driven Lever -- 2.5. Sample-Driven Lever -- 2.6. Tip-Driven Lever -- 2.7. Summary -- Chapter 3 Sources of Noise -- 3.1. Introduction -- 3.2. General Discussion of Noise -- 3.3. Shot Noise -- 3.4. Resistor Johnson Noise -- 3.5. Laser Intensity Noise -- 3.6. Laser Phase Noise -- 3.7. Thermally Induced Lever Noise -- 3.8. Bimorph Noise -- 3.9. Lever Noise-Limited SNR -- 3.10. Experimental Characterization of Noise -- 3.11. Summary -- PART TWO. SCANNING FORCE MICROSCOPES -- Chapter 4 Tunneling Detection System -- 4.1. Introduction -- 4.2. Theory -- 4.3. Perpendicular Arrangement -- 4.4. Cross Arrangement -- 4.5. Parallel Arrangement -- 4.6. Serial Arrangement -- 4.7. Single-Lever Arrangement -- 4.8. Summary -- Chapter 5 Capacitance Detection System -- 5.1. Introduction -- 5.2. Theory -- 5.3. Noise Considerations -- 5.4. Performance of Systems -- 5.5. Summary -- Chapter 6 Homodyne Detection System -- 6.1. Introduction -- 6.2. Theory -- 6.3. Noise Considerations -- 6.4. System Performance -- 6.5. Summary -- Chapter 7 Heterodyne Detection System -- 7.1. Introduction -- 7.2. Theory -- 7.3. Noise Considerations -- 7.4. Performance -- 7.5. Summary -- Chapter 8 Laser-Diode Feedback Detection System -- 8.1. Introduction -- 8.2. Theory -- 8.3. Noise Considerations -- 8.4. Performance -- 8.5. Summary.
Chapter 9 Polarization Detection System -- 9.1. Introduction -- 9.2. Theory -- 9.3. Noise Considerations -- 9.4. Performance -- 9.5. Summary -- Chapter 10 Deflection Detection System -- 10.1. Introduction -- 10.2. Theory -- 10.3. Noise Considerations -- 10.4. Performance -- 10.5. Summary -- PART THREE. SCANNING FORCE MICROSCOPY -- Chapter 11 Electric Force Microscopy -- 11.1. Introduction -- 11.2. Basic Concepts -- 11.3. Examples -- 11.4. Principles of Operation -- 11.5. Noise Considerations -- 11.6. Applications -- 11.7. Performance -- 11.8. Summary -- Chapter 12 Magnetic Force Microscopy -- 12.1. Introduction -- 12.2. Basic Concepts -- 12.3. Examples -- 12.4. Principles of Operation -- 12.5. Noise Considerations -- 12.6. Applications -- 12.7. Performance -- 12.8. Summary -- Chapter 13 Atomic Force Microscopy -- 13.1. Introduction -- 13.2. Intermolecular Microscopic Interactions -- 13.3. Intermolecular Macroscopic Interactions -- 13.4. Lever-Tip-Sample Contact Interactions -- 13.5. Lever-Tip-Sample Noncontact Interactions -- 13.6. Experimental Results for the Contact Mode -- References -- Index.
Record Nr. UNINA-9910953576703321
Sarid Dror  
New York ; , : Oxford University Press, , 2023
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Scanning force microscopy : with applications to electric, magnetic, and atomic forces / / Dror Sarid
Scanning force microscopy : with applications to electric, magnetic, and atomic forces / / Dror Sarid
Autore Sarid Dror
Edizione [Rev. ed.]
Pubbl/distr/stampa New York, New York ; ; Oxford, England : , : Oxford University Press, , 1994
Descrizione fisica 1 online resource (xiii,263p. ) : ill
Disciplina 502.82
Collana Oxford series in optical and imaging sciences
Soggetto topico Scanning force microscopy
Surfaces (Physics)
Soggetto genere / forma Electronic books.
ISBN 1-280-44178-X
0-19-802281-6
9786610441785
0-19-534469-3
1-60256-628-3
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Intro -- Contents -- PREFACE TO THE REVISED EDITION -- PREFACE -- PART ONE. LEVERS AND NOISE -- Chapter 1 Mechanical Properties of Levers -- 1.1. Introduction -- 1.2. Stress and Strain -- 1.3. Moments -- 1.4. Spring Constant -- 1.5. The Rayleigh Solution to a Vibrating Lever -- 1.6. The Classical Solution to a Vibrating Lever -- 1.7. Normal Modes -- 1.8. Lumped Systems -- 1.9. Examples -- 1.10. Summary -- Chapter 2 Resonance Enhancement -- 2.1. Introduction -- 2.2. Bimorph Driver -- 2.3. Effective Spring Constant -- 2.4. Bimorph-Driven Lever -- 2.5. Sample-Driven Lever -- 2.6. Tip-Driven Lever -- 2.7. Summary -- Chapter 3 Sources of Noise -- 3.1. Introduction -- 3.2. General Discussion of Noise -- 3.3. Shot Noise -- 3.4. Resistor Johnson Noise -- 3.5. Laser Intensity Noise -- 3.6. Laser Phase Noise -- 3.7. Thermally Induced Lever Noise -- 3.8. Bimorph Noise -- 3.9. Lever Noise-Limited SNR -- 3.10. Experimental Characterization of Noise -- 3.11. Summary -- PART TWO. SCANNING FORCE MICROSCOPES -- Chapter 4 Tunneling Detection System -- 4.1. Introduction -- 4.2. Theory -- 4.3. Perpendicular Arrangement -- 4.4. Cross Arrangement -- 4.5. Parallel Arrangement -- 4.6. Serial Arrangement -- 4.7. Single-Lever Arrangement -- 4.8. Summary -- Chapter 5 Capacitance Detection System -- 5.1. Introduction -- 5.2. Theory -- 5.3. Noise Considerations -- 5.4. Performance of Systems -- 5.5. Summary -- Chapter 6 Homodyne Detection System -- 6.1. Introduction -- 6.2. Theory -- 6.3. Noise Considerations -- 6.4. System Performance -- 6.5. Summary -- Chapter 7 Heterodyne Detection System -- 7.1. Introduction -- 7.2. Theory -- 7.3. Noise Considerations -- 7.4. Performance -- 7.5. Summary -- Chapter 8 Laser-Diode Feedback Detection System -- 8.1. Introduction -- 8.2. Theory -- 8.3. Noise Considerations -- 8.4. Performance -- 8.5. Summary.
Chapter 9 Polarization Detection System -- 9.1. Introduction -- 9.2. Theory -- 9.3. Noise Considerations -- 9.4. Performance -- 9.5. Summary -- Chapter 10 Deflection Detection System -- 10.1. Introduction -- 10.2. Theory -- 10.3. Noise Considerations -- 10.4. Performance -- 10.5. Summary -- PART THREE. SCANNING FORCE MICROSCOPY -- Chapter 11 Electric Force Microscopy -- 11.1. Introduction -- 11.2. Basic Concepts -- 11.3. Examples -- 11.4. Principles of Operation -- 11.5. Noise Considerations -- 11.6. Applications -- 11.7. Performance -- 11.8. Summary -- Chapter 12 Magnetic Force Microscopy -- 12.1. Introduction -- 12.2. Basic Concepts -- 12.3. Examples -- 12.4. Principles of Operation -- 12.5. Noise Considerations -- 12.6. Applications -- 12.7. Performance -- 12.8. Summary -- Chapter 13 Atomic Force Microscopy -- 13.1. Introduction -- 13.2. Intermolecular Microscopic Interactions -- 13.3. Intermolecular Macroscopic Interactions -- 13.4. Lever-Tip-Sample Contact Interactions -- 13.5. Lever-Tip-Sample Noncontact Interactions -- 13.6. Experimental Results for the Contact Mode -- References -- Index.
Record Nr. UNINA-9910450104603321
Sarid Dror  
New York, New York ; ; Oxford, England : , : Oxford University Press, , 1994
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Scanning force microscopy : with applications to electric, magnetic, and atomic forces / / Dror Sarid
Scanning force microscopy : with applications to electric, magnetic, and atomic forces / / Dror Sarid
Autore Sarid Dror
Edizione [Rev. ed.]
Pubbl/distr/stampa New York, New York ; ; Oxford, England : , : Oxford University Press, , 1994
Descrizione fisica 1 online resource (xiii,263p. ) : ill
Disciplina 502.82
Collana Oxford series in optical and imaging sciences
Soggetto topico Scanning force microscopy
Surfaces (Physics)
ISBN 0-19-773261-5
1-280-44178-X
0-19-802281-6
9786610441785
0-19-534469-3
1-60256-628-3
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Intro -- Contents -- PREFACE TO THE REVISED EDITION -- PREFACE -- PART ONE. LEVERS AND NOISE -- Chapter 1 Mechanical Properties of Levers -- 1.1. Introduction -- 1.2. Stress and Strain -- 1.3. Moments -- 1.4. Spring Constant -- 1.5. The Rayleigh Solution to a Vibrating Lever -- 1.6. The Classical Solution to a Vibrating Lever -- 1.7. Normal Modes -- 1.8. Lumped Systems -- 1.9. Examples -- 1.10. Summary -- Chapter 2 Resonance Enhancement -- 2.1. Introduction -- 2.2. Bimorph Driver -- 2.3. Effective Spring Constant -- 2.4. Bimorph-Driven Lever -- 2.5. Sample-Driven Lever -- 2.6. Tip-Driven Lever -- 2.7. Summary -- Chapter 3 Sources of Noise -- 3.1. Introduction -- 3.2. General Discussion of Noise -- 3.3. Shot Noise -- 3.4. Resistor Johnson Noise -- 3.5. Laser Intensity Noise -- 3.6. Laser Phase Noise -- 3.7. Thermally Induced Lever Noise -- 3.8. Bimorph Noise -- 3.9. Lever Noise-Limited SNR -- 3.10. Experimental Characterization of Noise -- 3.11. Summary -- PART TWO. SCANNING FORCE MICROSCOPES -- Chapter 4 Tunneling Detection System -- 4.1. Introduction -- 4.2. Theory -- 4.3. Perpendicular Arrangement -- 4.4. Cross Arrangement -- 4.5. Parallel Arrangement -- 4.6. Serial Arrangement -- 4.7. Single-Lever Arrangement -- 4.8. Summary -- Chapter 5 Capacitance Detection System -- 5.1. Introduction -- 5.2. Theory -- 5.3. Noise Considerations -- 5.4. Performance of Systems -- 5.5. Summary -- Chapter 6 Homodyne Detection System -- 6.1. Introduction -- 6.2. Theory -- 6.3. Noise Considerations -- 6.4. System Performance -- 6.5. Summary -- Chapter 7 Heterodyne Detection System -- 7.1. Introduction -- 7.2. Theory -- 7.3. Noise Considerations -- 7.4. Performance -- 7.5. Summary -- Chapter 8 Laser-Diode Feedback Detection System -- 8.1. Introduction -- 8.2. Theory -- 8.3. Noise Considerations -- 8.4. Performance -- 8.5. Summary.
Chapter 9 Polarization Detection System -- 9.1. Introduction -- 9.2. Theory -- 9.3. Noise Considerations -- 9.4. Performance -- 9.5. Summary -- Chapter 10 Deflection Detection System -- 10.1. Introduction -- 10.2. Theory -- 10.3. Noise Considerations -- 10.4. Performance -- 10.5. Summary -- PART THREE. SCANNING FORCE MICROSCOPY -- Chapter 11 Electric Force Microscopy -- 11.1. Introduction -- 11.2. Basic Concepts -- 11.3. Examples -- 11.4. Principles of Operation -- 11.5. Noise Considerations -- 11.6. Applications -- 11.7. Performance -- 11.8. Summary -- Chapter 12 Magnetic Force Microscopy -- 12.1. Introduction -- 12.2. Basic Concepts -- 12.3. Examples -- 12.4. Principles of Operation -- 12.5. Noise Considerations -- 12.6. Applications -- 12.7. Performance -- 12.8. Summary -- Chapter 13 Atomic Force Microscopy -- 13.1. Introduction -- 13.2. Intermolecular Microscopic Interactions -- 13.3. Intermolecular Macroscopic Interactions -- 13.4. Lever-Tip-Sample Contact Interactions -- 13.5. Lever-Tip-Sample Noncontact Interactions -- 13.6. Experimental Results for the Contact Mode -- References -- Index.
Record Nr. UNINA-9910783590503321
Sarid Dror  
New York, New York ; ; Oxford, England : , : Oxford University Press, , 1994
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui