Assessment of paint layers by FE-SEM and EDS examination [[electronic resource] /] / by Donovan Harris
| Assessment of paint layers by FE-SEM and EDS examination [[electronic resource] /] / by Donovan Harris |
| Autore | Harris Donovan |
| Pubbl/distr/stampa | Aberdeen Proving Ground, MD : , : Army Research Laboratory, , [2004] |
| Descrizione fisica | 1 online resource (vi, 30 pages) : color illustrations |
| Collana | ARL-TR |
| Soggetto topico |
Paint - Analysis
Scanning electron microscopy |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910697172503321 |
Harris Donovan
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| Aberdeen Proving Ground, MD : , : Army Research Laboratory, , [2004] | ||
| Lo trovi qui: Univ. Federico II | ||
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Calcium-magnesium-aluminosilicate (CMAS) reactions and degradation mechanisms of advanced environmental barrier coatings / / Nadia L. Ahlborg and Dongming Zhu
| Calcium-magnesium-aluminosilicate (CMAS) reactions and degradation mechanisms of advanced environmental barrier coatings / / Nadia L. Ahlborg and Dongming Zhu |
| Autore | Ahlborg Nadia |
| Pubbl/distr/stampa | Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , November 2013 |
| Descrizione fisica | 1 online resource (16 pages) : illustrations (some color) |
| Collana | NASA/TM |
| Soggetto topico |
Protective coatings
Thermochemistry High temperature Ceramic matrix composites Scanning electron microscopy |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Calcium-magnesium-aluminosilicate |
| Record Nr. | UNINA-9910702437403321 |
Ahlborg Nadia
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| Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , November 2013 | ||
| Lo trovi qui: Univ. Federico II | ||
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Degradation of spacesuit fabrics in low earth orbit / / James R. Gaier [and ten others]
| Degradation of spacesuit fabrics in low earth orbit / / James R. Gaier [and ten others] |
| Autore | Gaier James R. |
| Pubbl/distr/stampa | Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , 2012 |
| Descrizione fisica | 1 online resource (20 pages) : illustrations (some color) |
| Collana | NASA/TM |
| Soggetto topico |
Space suits
Fabrics Dust Degradation Modulus of elasticity Abrasion Scanning electron microscopy Tensile strength |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910702353603321 |
Gaier James R.
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| Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , 2012 | ||
| Lo trovi qui: Univ. Federico II | ||
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Determination of cross-sectional area of focused picosecond Gaussian laser beam / / Rodolfo Ledesma [and three others]
| Determination of cross-sectional area of focused picosecond Gaussian laser beam / / Rodolfo Ledesma [and three others] |
| Autore | Ledesma Rodolfo |
| Pubbl/distr/stampa | Hampton, Virginia : , : National Aeronautics and Space Administration, Langley Research Center, , February 2018 |
| Descrizione fisica | 1 online resource (6 pages) : color illustrations |
| Collana | NASA/TM |
| Soggetto topico |
Surface roughness
Laser ablation Pulse duration Lasers Scanning electron microscopy |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910706801903321 |
Ledesma Rodolfo
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| Hampton, Virginia : , : National Aeronautics and Space Administration, Langley Research Center, , February 2018 | ||
| Lo trovi qui: Univ. Federico II | ||
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Discovery of co-existing non-collinear spin textures in D2d Heusler compounds / / Jagannath Jena
| Discovery of co-existing non-collinear spin textures in D2d Heusler compounds / / Jagannath Jena |
| Autore | Jena Jagannath |
| Pubbl/distr/stampa | Cham, Switzerland : , : Springer, , [2022] |
| Descrizione fisica | 1 online resource (147 pages) |
| Disciplina | 502.825 |
| Collana | Springer Theses |
| Soggetto topico | Scanning electron microscopy |
| ISBN |
9783031039102
9783031039096 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996478858303316 |
Jena Jagannath
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| Cham, Switzerland : , : Springer, , [2022] | ||
| Lo trovi qui: Univ. di Salerno | ||
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Discovery of co-existing non-collinear spin textures in D2d Heusler compounds / / Jagannath Jena
| Discovery of co-existing non-collinear spin textures in D2d Heusler compounds / / Jagannath Jena |
| Autore | Jena Jagannath |
| Pubbl/distr/stampa | Cham, Switzerland : , : Springer, , [2022] |
| Descrizione fisica | 1 online resource (147 pages) |
| Disciplina | 502.825 |
| Collana | Springer Theses |
| Soggetto topico | Scanning electron microscopy |
| ISBN |
9783031039102
9783031039096 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910735382203321 |
Jena Jagannath
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| Cham, Switzerland : , : Springer, , [2022] | ||
| Lo trovi qui: Univ. Federico II | ||
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Flame spray strain gages with improved durability and lifetimes [[electronic resource] /] / Otto Gregory
| Flame spray strain gages with improved durability and lifetimes [[electronic resource] /] / Otto Gregory |
| Autore | Gregory Otto |
| Pubbl/distr/stampa | [Cleveland, Ohio] : , : National Aeronautics and Space Administration, Glenn Research Center, , [2003] |
| Descrizione fisica | 1 online resource (20 pages) : illustrations |
| Collana | NASA/CR |
| Soggetto topico |
Strain gages
Heat resistant alloys Scanning electron microscopy Flame spraying Fabrication Life (durability) Heat treatment |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910704366603321 |
Gregory Otto
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| [Cleveland, Ohio] : , : National Aeronautics and Space Administration, Glenn Research Center, , [2003] | ||
| Lo trovi qui: Univ. Federico II | ||
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Laser ablation cleaning of self-reacting friction stir weld seam surfaces : a preliminary evaluation / / A.C. Nunes, Jr. [and four others]
| Laser ablation cleaning of self-reacting friction stir weld seam surfaces : a preliminary evaluation / / A.C. Nunes, Jr. [and four others] |
| Autore | Nunes A. C. |
| Pubbl/distr/stampa | Huntsville, Alabama : , : National Aeronautics and Space Administration, Marshall Space Flight Center, , 2014 |
| Descrizione fisica | 1 online resource (vii, 27 pages) : illustrations |
| Collana | NASA/TM 2014-217500 |
| Soggetto topico |
Friction stir welding
Laser ablation Laser applications Scanning electron microscopy Surface energy Mechanical properties |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Laser ablation cleaning of self-reacting friction stir weld seam surfaces |
| Record Nr. | UNINA-9910702410603321 |
Nunes A. C.
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| Huntsville, Alabama : , : National Aeronautics and Space Administration, Marshall Space Flight Center, , 2014 | ||
| Lo trovi qui: Univ. Federico II | ||
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Principles and practice of variable pressure/environmental scanning electron microscopy (VP-ESEM) [[electronic resource] /] / Debbie J. Stokes
| Principles and practice of variable pressure/environmental scanning electron microscopy (VP-ESEM) [[electronic resource] /] / Debbie J. Stokes |
| Autore | Stokes Debbie |
| Pubbl/distr/stampa | Chichester, U.K., : Wiley, 2008 |
| Descrizione fisica | 1 online resource (235 p.) |
| Disciplina | 502.8/25 |
| Collana | RMS - Royal Microscopical Society |
| Soggetto topico |
Scanning electron microscopy
Microscopy |
| ISBN |
1-282-34350-5
9786612343506 0-470-75873-2 0-470-75874-0 |
| Classificazione | UH 6310 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Principles and Practice of Variable Pressure/Environmental Scanning Electron Microscopy (VP-ESEM); Contents; Preface; 1 A Brief Historical Overview; 1.1 Scanning Electron Microscopy; 1.1.1 The Beginnings; 1.1.2 The Need for Added Capabilities; 1.2 The Development of Imaging in a Gas Environment; 1.2.1 Overcoming the Limits of Conventional SEM; 1.2.2 Leaps and Bounds; 2 Principles of SEM; 2.1 Introduction; 2.1.1 Why Use An Electron Beam?; 2.1.2 The SEM Column; 2.1.3 Why Do We Need a Vacuum System?; 2.2 Electron Sources; 2.2.1 Thermionic Emission Sources; 2.2.2 Field Emission Sources
2.3 Electron Optics2.3.1 Lenses; 2.3.2 Lens Aberrations; 2.4 Signals and Detection; 2.4.1 Primary Electrons and the Interaction Volume; 2.4.2 Backscattered Electrons; 2.4.3 Secondary Electrons; 2.4.4 X-ray Radiation; 2.4.5 Cathodoluminescence; 2.5 Practical Aspects of Electron Beam Irradiation; 2.5.1 Radiation Damage; 2.5.2 Minimising Specimen Charging - Low-Voltage SEM; 2.5.3 Increasing Surface and Bulk Conductivities; 2.6 SEM in Operation; 2.6.1 Building Up an Image; 2.6.2 Magnification; 2.6.3 Signal-to-Noise Ratio; 2.6.4 Contrast; 2.6.5 Adjusting the Contrast; 2.6.6 Resolution 2.6.7 Depth of Field2.6.8 Image Capture; 3 General Principles of VP-ESEM: Utilising a Gas; 3.1 Introduction; 3.2 VP-ESEM Instrumentation; 3.2.1 Typical Features; 3.2.2 Primary Electron Scattering in VP-ESEM - the General Case; 3.2.3 Units of Pressure; 3.3 Signal Generation in a Gas; 3.3.1 Introduction; 3.3.2 Direct Collection of Electrons and Ions; 3.3.3 Collection of Photons - the Gas Luminescence Signal; 3.3.4 Detecting Indirect Electron and Ion Currents; 3.4 Imaging with Water Vapour; 3.4.1 Introduction; 3.4.2 Thermodynamic Equilibria; 3.4.3 Nonequilibrium Conditions 3.4.4 Practicalities of Stabilising Hydrated Specimens4 Imaging and Analysis in VP-ESEM: The Influence of a Gas; 4.1 Introduction; 4.2 Background to Theoretical Calculations; 4.2.1 Calculating the Mean Free Paths of Primary Electrons; 4.2.2 Calculating Pressure-Dependent Variables; 4.2.3 Estimating the 'Useful' Primary Electron Current; 4.3 Which Gas?; 4.3.1 Introduction; 4.3.2 Usefulness of the Gas - Experimental Conditions; 4.3.3 Ionisation and Excitation for Different Gases; 4.3.4 Scattering of the Primary Electron Beam in Different Gases; 4.4 Exploring the Gas Path Length 4.4.1 Introduction4.4.2 Influence of GPL on the Skirt Radius; 4.4.3 Gas Path Length and Useful Primary Electron Beam Current; 4.4.4 Constraints on Reducing the Gas Path Length; 4.4.5 Separating Gas Path Length from Working Distance; 4.5 How Much Gas?; 4.5.1 Introduction; 4.5.2 Scattering of Primary Electrons as a Function of Pressure; 4.6 X-ray Microanalysis in VP-ESEM; 4.6.1 Introduction; 4.6.2 Effects of Chamber Gas on X-ray Signals; 4.6.3 Considerations for Minimising the Effects of the Gas; 4.6.4 Post-Acquisition Methods to Correct for Scattering 5 Imaging Uncoated Specimens in the VP-ESEM |
| Record Nr. | UNINA-9910144405803321 |
Stokes Debbie
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| Chichester, U.K., : Wiley, 2008 | ||
| Lo trovi qui: Univ. Federico II | ||
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Principles and practice of variable pressure/environmental scanning electron microscopy (VP-ESEM) / / Debbie J. Stokes
| Principles and practice of variable pressure/environmental scanning electron microscopy (VP-ESEM) / / Debbie J. Stokes |
| Autore | Stokes Debbie |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Chichester, U.K., : Wiley, 2008 |
| Descrizione fisica | 1 online resource (235 p.) |
| Disciplina | 502.8/25 |
| Collana | RMS - Royal Microscopical Society |
| Soggetto topico |
Scanning electron microscopy
Microscopy |
| ISBN |
9786612343506
9781282343504 1282343505 9780470758731 0470758732 9780470758748 0470758740 |
| Classificazione | UH 6310 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Principles and Practice of Variable Pressure/Environmental Scanning Electron Microscopy (VP-ESEM); Contents; Preface; 1 A Brief Historical Overview; 1.1 Scanning Electron Microscopy; 1.1.1 The Beginnings; 1.1.2 The Need for Added Capabilities; 1.2 The Development of Imaging in a Gas Environment; 1.2.1 Overcoming the Limits of Conventional SEM; 1.2.2 Leaps and Bounds; 2 Principles of SEM; 2.1 Introduction; 2.1.1 Why Use An Electron Beam?; 2.1.2 The SEM Column; 2.1.3 Why Do We Need a Vacuum System?; 2.2 Electron Sources; 2.2.1 Thermionic Emission Sources; 2.2.2 Field Emission Sources
2.3 Electron Optics2.3.1 Lenses; 2.3.2 Lens Aberrations; 2.4 Signals and Detection; 2.4.1 Primary Electrons and the Interaction Volume; 2.4.2 Backscattered Electrons; 2.4.3 Secondary Electrons; 2.4.4 X-ray Radiation; 2.4.5 Cathodoluminescence; 2.5 Practical Aspects of Electron Beam Irradiation; 2.5.1 Radiation Damage; 2.5.2 Minimising Specimen Charging - Low-Voltage SEM; 2.5.3 Increasing Surface and Bulk Conductivities; 2.6 SEM in Operation; 2.6.1 Building Up an Image; 2.6.2 Magnification; 2.6.3 Signal-to-Noise Ratio; 2.6.4 Contrast; 2.6.5 Adjusting the Contrast; 2.6.6 Resolution 2.6.7 Depth of Field2.6.8 Image Capture; 3 General Principles of VP-ESEM: Utilising a Gas; 3.1 Introduction; 3.2 VP-ESEM Instrumentation; 3.2.1 Typical Features; 3.2.2 Primary Electron Scattering in VP-ESEM - the General Case; 3.2.3 Units of Pressure; 3.3 Signal Generation in a Gas; 3.3.1 Introduction; 3.3.2 Direct Collection of Electrons and Ions; 3.3.3 Collection of Photons - the Gas Luminescence Signal; 3.3.4 Detecting Indirect Electron and Ion Currents; 3.4 Imaging with Water Vapour; 3.4.1 Introduction; 3.4.2 Thermodynamic Equilibria; 3.4.3 Nonequilibrium Conditions 3.4.4 Practicalities of Stabilising Hydrated Specimens4 Imaging and Analysis in VP-ESEM: The Influence of a Gas; 4.1 Introduction; 4.2 Background to Theoretical Calculations; 4.2.1 Calculating the Mean Free Paths of Primary Electrons; 4.2.2 Calculating Pressure-Dependent Variables; 4.2.3 Estimating the 'Useful' Primary Electron Current; 4.3 Which Gas?; 4.3.1 Introduction; 4.3.2 Usefulness of the Gas - Experimental Conditions; 4.3.3 Ionisation and Excitation for Different Gases; 4.3.4 Scattering of the Primary Electron Beam in Different Gases; 4.4 Exploring the Gas Path Length 4.4.1 Introduction4.4.2 Influence of GPL on the Skirt Radius; 4.4.3 Gas Path Length and Useful Primary Electron Beam Current; 4.4.4 Constraints on Reducing the Gas Path Length; 4.4.5 Separating Gas Path Length from Working Distance; 4.5 How Much Gas?; 4.5.1 Introduction; 4.5.2 Scattering of Primary Electrons as a Function of Pressure; 4.6 X-ray Microanalysis in VP-ESEM; 4.6.1 Introduction; 4.6.2 Effects of Chamber Gas on X-ray Signals; 4.6.3 Considerations for Minimising the Effects of the Gas; 4.6.4 Post-Acquisition Methods to Correct for Scattering 5 Imaging Uncoated Specimens in the VP-ESEM |
| Record Nr. | UNINA-9910817296103321 |
Stokes Debbie
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| Chichester, U.K., : Wiley, 2008 | ||
| Lo trovi qui: Univ. Federico II | ||
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