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Biological low-voltage scanning electron microscopy [[electronic resource] /] / edited by Heide Schatten, James B. Pawley
| Biological low-voltage scanning electron microscopy [[electronic resource] /] / edited by Heide Schatten, James B. Pawley |
| Edizione | [1st ed. 2008.] |
| Pubbl/distr/stampa | New York, : Springer, c2008 |
| Descrizione fisica | 1 online resource (328 p.) |
| Disciplina | 570.2825 |
| Altri autori (Persone) |
SchattenHeide
PawleyJames B |
| Soggetto topico |
Low-voltage scanning electron microscopy
Field emission cathodes Scanning electron microscopes |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-281-13990-4
9786611139902 0-387-72972-0 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | The Early Development of the Scanning Electron Microscope -- LVSEM for Biology -- The Aberration-Corrected SEM -- Noise and Its Effects on the Low-Voltage SEM -- High-Resolution, Low Voltage, Field-Emission Scanning Electron Microscopy (HRLVFESEM) Applications for Cell Biology and Specimen Preparation Protocols -- Molecular Labeling for Correlative Microscopy: LM, LVSEM, TEM, EF-TEM and HVEM -- Low kV and Video-Rate, Beam-Tilt Stereo for Viewing Live-Time Experiments in the SEM -- Cryo-SEM of Chemically Fixed Animal Cells -- High-Resolution and Low-Voltage SEM of Plant Cells -- High-Resolution Cryoscanning Electron Microscopy of Biological Samples -- Developments in Instrumentation for Microanalysis in Low-Voltage Scanning Electron Microscopy. |
| Record Nr. | UNINA-9910451694003321 |
| New York, : Springer, c2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Biological low-voltage scanning electron microscopy [[electronic resource] /] / edited by Heide Schatten, James B. Pawley
| Biological low-voltage scanning electron microscopy [[electronic resource] /] / edited by Heide Schatten, James B. Pawley |
| Edizione | [1st ed. 2008.] |
| Pubbl/distr/stampa | New York, : Springer, c2008 |
| Descrizione fisica | 1 online resource (328 p.) |
| Disciplina | 570.2825 |
| Altri autori (Persone) |
SchattenHeide
PawleyJames B |
| Soggetto topico |
Low-voltage scanning electron microscopy
Field emission cathodes Scanning electron microscopes |
| ISBN |
1-281-13990-4
9786611139902 0-387-72972-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | The Early Development of the Scanning Electron Microscope -- LVSEM for Biology -- The Aberration-Corrected SEM -- Noise and Its Effects on the Low-Voltage SEM -- High-Resolution, Low Voltage, Field-Emission Scanning Electron Microscopy (HRLVFESEM) Applications for Cell Biology and Specimen Preparation Protocols -- Molecular Labeling for Correlative Microscopy: LM, LVSEM, TEM, EF-TEM and HVEM -- Low kV and Video-Rate, Beam-Tilt Stereo for Viewing Live-Time Experiments in the SEM -- Cryo-SEM of Chemically Fixed Animal Cells -- High-Resolution and Low-Voltage SEM of Plant Cells -- High-Resolution Cryoscanning Electron Microscopy of Biological Samples -- Developments in Instrumentation for Microanalysis in Low-Voltage Scanning Electron Microscopy. |
| Record Nr. | UNINA-9910782096403321 |
| New York, : Springer, c2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Scanning electron microscope optics and spectrometers [[electronic resource] /] / Anjam Khursheed
| Scanning electron microscope optics and spectrometers [[electronic resource] /] / Anjam Khursheed |
| Autore | Khursheed Anjam |
| Pubbl/distr/stampa | Singapore ; ; Hackensack, N.J., : World Scientific Pub. Co., 2011 |
| Descrizione fisica | 1 online resource (400 p.) |
| Disciplina | 681.413 |
| Soggetto topico |
Scanning electron microscopes
Optical spectrometers |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-283-14355-0
9786613143556 981-283-668-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Dedication; Preface; Contents; Chapter 1 Conventional SEM Design; Chapter 2 Spectrometer Design Principles; Chapter 3 In-lens Improvements; Chapter 4 Sub-nanometer Probe Diameters; Chapter 5 Secondary Electron Spectrometers; Chapter 6 Full Range Deflector Spectrometer Designs; Chapter 7 Full Range Parallel Energy Spectrometer Designs; Chapter 8 Spectroscopic SEM proposals; Appendix 1.0 Field Expansions; Appendix 1.1 Derivation of the Paraxial Equation; Appendix 1.2 Spherical Aberration; Appendix 1.3 Chromatic Aberration; Appendix 2 Multipole Lenses; Bibliography; Index |
| Record Nr. | UNINA-9910461623303321 |
Khursheed Anjam
|
||
| Singapore ; ; Hackensack, N.J., : World Scientific Pub. Co., 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Scanning electron microscope optics and spectrometers [[electronic resource] /] / Anjam Khursheed
| Scanning electron microscope optics and spectrometers [[electronic resource] /] / Anjam Khursheed |
| Autore | Khursheed Anjam |
| Pubbl/distr/stampa | Singapore ; ; Hackensack, N.J., : World Scientific Pub. Co., 2011 |
| Descrizione fisica | 1 online resource (400 p.) |
| Disciplina | 681.413 |
| Soggetto topico |
Scanning electron microscopes
Optical spectrometers |
| ISBN |
1-283-14355-0
9786613143556 981-283-668-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Dedication; Preface; Contents; Chapter 1 Conventional SEM Design; Chapter 2 Spectrometer Design Principles; Chapter 3 In-lens Improvements; Chapter 4 Sub-nanometer Probe Diameters; Chapter 5 Secondary Electron Spectrometers; Chapter 6 Full Range Deflector Spectrometer Designs; Chapter 7 Full Range Parallel Energy Spectrometer Designs; Chapter 8 Spectroscopic SEM proposals; Appendix 1.0 Field Expansions; Appendix 1.1 Derivation of the Paraxial Equation; Appendix 1.2 Spherical Aberration; Appendix 1.3 Chromatic Aberration; Appendix 2 Multipole Lenses; Bibliography; Index |
| Record Nr. | UNINA-9910789407403321 |
|
Khursheed Anjam
|
||
| Singapore ; ; Hackensack, N.J., : World Scientific Pub. Co., 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Scanning microscopy
| Scanning microscopy |
| Pubbl/distr/stampa | Chicago, : Scanning Microscopy International, ©1987-1996 |
| Descrizione fisica | 1 online resource |
| Disciplina | 535/.3325 |
| Soggetto topico |
Scanning electron microscopy
Scanning electron microscopes Microscopes électroniques à balayage Microscopie électronique à balayage Microscopie Scanning Elektronenmicroscopie Microscopy Microscopy, Electron, Scanning |
| Soggetto genere / forma |
Periodicals.
Periodical periodicals. Périodiques. |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910145708603321 |
| Chicago, : Scanning Microscopy International, ©1987-1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
