Biological low-voltage scanning electron microscopy [[electronic resource] /] / edited by Heide Schatten, James B. Pawley |
Edizione | [1st ed. 2008.] |
Pubbl/distr/stampa | New York, : Springer, c2008 |
Descrizione fisica | 1 online resource (328 p.) |
Disciplina | 570.2825 |
Altri autori (Persone) |
SchattenHeide
PawleyJames B |
Soggetto topico |
Low-voltage scanning electron microscopy
Field emission cathodes Scanning electron microscopes |
Soggetto genere / forma | Electronic books. |
ISBN |
1-281-13990-4
9786611139902 0-387-72972-0 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | The Early Development of the Scanning Electron Microscope -- LVSEM for Biology -- The Aberration-Corrected SEM -- Noise and Its Effects on the Low-Voltage SEM -- High-Resolution, Low Voltage, Field-Emission Scanning Electron Microscopy (HRLVFESEM) Applications for Cell Biology and Specimen Preparation Protocols -- Molecular Labeling for Correlative Microscopy: LM, LVSEM, TEM, EF-TEM and HVEM -- Low kV and Video-Rate, Beam-Tilt Stereo for Viewing Live-Time Experiments in the SEM -- Cryo-SEM of Chemically Fixed Animal Cells -- High-Resolution and Low-Voltage SEM of Plant Cells -- High-Resolution Cryoscanning Electron Microscopy of Biological Samples -- Developments in Instrumentation for Microanalysis in Low-Voltage Scanning Electron Microscopy. |
Record Nr. | UNINA-9910451694003321 |
New York, : Springer, c2008 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Biological low-voltage scanning electron microscopy [[electronic resource] /] / edited by Heide Schatten, James B. Pawley |
Edizione | [1st ed. 2008.] |
Pubbl/distr/stampa | New York, : Springer, c2008 |
Descrizione fisica | 1 online resource (328 p.) |
Disciplina | 570.2825 |
Altri autori (Persone) |
SchattenHeide
PawleyJames B |
Soggetto topico |
Low-voltage scanning electron microscopy
Field emission cathodes Scanning electron microscopes |
ISBN |
1-281-13990-4
9786611139902 0-387-72972-0 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | The Early Development of the Scanning Electron Microscope -- LVSEM for Biology -- The Aberration-Corrected SEM -- Noise and Its Effects on the Low-Voltage SEM -- High-Resolution, Low Voltage, Field-Emission Scanning Electron Microscopy (HRLVFESEM) Applications for Cell Biology and Specimen Preparation Protocols -- Molecular Labeling for Correlative Microscopy: LM, LVSEM, TEM, EF-TEM and HVEM -- Low kV and Video-Rate, Beam-Tilt Stereo for Viewing Live-Time Experiments in the SEM -- Cryo-SEM of Chemically Fixed Animal Cells -- High-Resolution and Low-Voltage SEM of Plant Cells -- High-Resolution Cryoscanning Electron Microscopy of Biological Samples -- Developments in Instrumentation for Microanalysis in Low-Voltage Scanning Electron Microscopy. |
Record Nr. | UNINA-9910782096403321 |
New York, : Springer, c2008 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Biological low-voltage scanning electron microscopy [[electronic resource] /] / edited by Heide Schatten, James B. Pawley |
Edizione | [1st ed. 2008.] |
Pubbl/distr/stampa | New York, : Springer, c2008 |
Descrizione fisica | 1 online resource (328 p.) |
Disciplina | 570.2825 |
Altri autori (Persone) |
SchattenHeide
PawleyJames B |
Soggetto topico |
Low-voltage scanning electron microscopy
Field emission cathodes Scanning electron microscopes |
ISBN |
1-281-13990-4
9786611139902 0-387-72972-0 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | The Early Development of the Scanning Electron Microscope -- LVSEM for Biology -- The Aberration-Corrected SEM -- Noise and Its Effects on the Low-Voltage SEM -- High-Resolution, Low Voltage, Field-Emission Scanning Electron Microscopy (HRLVFESEM) Applications for Cell Biology and Specimen Preparation Protocols -- Molecular Labeling for Correlative Microscopy: LM, LVSEM, TEM, EF-TEM and HVEM -- Low kV and Video-Rate, Beam-Tilt Stereo for Viewing Live-Time Experiments in the SEM -- Cryo-SEM of Chemically Fixed Animal Cells -- High-Resolution and Low-Voltage SEM of Plant Cells -- High-Resolution Cryoscanning Electron Microscopy of Biological Samples -- Developments in Instrumentation for Microanalysis in Low-Voltage Scanning Electron Microscopy. |
Record Nr. | UNINA-9910811183403321 |
New York, : Springer, c2008 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Scanning electron microscope optics and spectrometers [[electronic resource] /] / Anjam Khursheed |
Autore | Khursheed Anjam |
Pubbl/distr/stampa | Singapore ; ; Hackensack, N.J., : World Scientific Pub. Co., 2011 |
Descrizione fisica | 1 online resource (400 p.) |
Disciplina | 681.413 |
Soggetto topico |
Scanning electron microscopes
Optical spectrometers |
Soggetto genere / forma | Electronic books. |
ISBN |
1-283-14355-0
9786613143556 981-283-668-3 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Dedication; Preface; Contents; Chapter 1 Conventional SEM Design; Chapter 2 Spectrometer Design Principles; Chapter 3 In-lens Improvements; Chapter 4 Sub-nanometer Probe Diameters; Chapter 5 Secondary Electron Spectrometers; Chapter 6 Full Range Deflector Spectrometer Designs; Chapter 7 Full Range Parallel Energy Spectrometer Designs; Chapter 8 Spectroscopic SEM proposals; Appendix 1.0 Field Expansions; Appendix 1.1 Derivation of the Paraxial Equation; Appendix 1.2 Spherical Aberration; Appendix 1.3 Chromatic Aberration; Appendix 2 Multipole Lenses; Bibliography; Index |
Record Nr. | UNINA-9910461623303321 |
Khursheed Anjam | ||
Singapore ; ; Hackensack, N.J., : World Scientific Pub. Co., 2011 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Scanning electron microscope optics and spectrometers [[electronic resource] /] / Anjam Khursheed |
Autore | Khursheed Anjam |
Pubbl/distr/stampa | Singapore ; ; Hackensack, N.J., : World Scientific Pub. Co., 2011 |
Descrizione fisica | 1 online resource (400 p.) |
Disciplina | 681.413 |
Soggetto topico |
Scanning electron microscopes
Optical spectrometers |
ISBN |
1-283-14355-0
9786613143556 981-283-668-3 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Dedication; Preface; Contents; Chapter 1 Conventional SEM Design; Chapter 2 Spectrometer Design Principles; Chapter 3 In-lens Improvements; Chapter 4 Sub-nanometer Probe Diameters; Chapter 5 Secondary Electron Spectrometers; Chapter 6 Full Range Deflector Spectrometer Designs; Chapter 7 Full Range Parallel Energy Spectrometer Designs; Chapter 8 Spectroscopic SEM proposals; Appendix 1.0 Field Expansions; Appendix 1.1 Derivation of the Paraxial Equation; Appendix 1.2 Spherical Aberration; Appendix 1.3 Chromatic Aberration; Appendix 2 Multipole Lenses; Bibliography; Index |
Record Nr. | UNINA-9910789407403321 |
Khursheed Anjam | ||
Singapore ; ; Hackensack, N.J., : World Scientific Pub. Co., 2011 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Scanning electron microscope optics and spectrometers [[electronic resource] /] / Anjam Khursheed |
Autore | Khursheed Anjam |
Pubbl/distr/stampa | Singapore ; ; Hackensack, N.J., : World Scientific Pub. Co., 2011 |
Descrizione fisica | 1 online resource (400 p.) |
Disciplina | 681.413 |
Soggetto topico |
Scanning electron microscopes
Optical spectrometers |
ISBN |
1-283-14355-0
9786613143556 981-283-668-3 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Dedication; Preface; Contents; Chapter 1 Conventional SEM Design; Chapter 2 Spectrometer Design Principles; Chapter 3 In-lens Improvements; Chapter 4 Sub-nanometer Probe Diameters; Chapter 5 Secondary Electron Spectrometers; Chapter 6 Full Range Deflector Spectrometer Designs; Chapter 7 Full Range Parallel Energy Spectrometer Designs; Chapter 8 Spectroscopic SEM proposals; Appendix 1.0 Field Expansions; Appendix 1.1 Derivation of the Paraxial Equation; Appendix 1.2 Spherical Aberration; Appendix 1.3 Chromatic Aberration; Appendix 2 Multipole Lenses; Bibliography; Index |
Record Nr. | UNINA-9910808833503321 |
Khursheed Anjam | ||
Singapore ; ; Hackensack, N.J., : World Scientific Pub. Co., 2011 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Scanning microscopy |
Pubbl/distr/stampa | Chicago, : Scanning Microscopy International, ©1987-1996 |
Descrizione fisica | 1 online resource |
Disciplina | 535/.3325 |
Soggetto topico |
Scanning electron microscopy
Scanning electron microscopes Microscopes électroniques à balayage Microscopie électronique à balayage Microscopie Scanning Elektronenmicroscopie Microscopy Microscopy, Electron, Scanning |
Soggetto genere / forma |
Periodicals.
Periodical periodicals. Périodiques. |
Formato | Materiale a stampa |
Livello bibliografico | Periodico |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910145708603321 |
Chicago, : Scanning Microscopy International, ©1987-1996 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|