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Failure analysis of sapphire refractive secondary concentrators [[electronic resource] /] / Jonathan A. Salem, George D. Quinn
| Failure analysis of sapphire refractive secondary concentrators [[electronic resource] /] / Jonathan A. Salem, George D. Quinn |
| Autore | Salem J. A (Jonathan A.), <1960-> |
| Pubbl/distr/stampa | Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , [2009] |
| Descrizione fisica | 1 online resource (38 pages) : illustrations |
| Altri autori (Persone) | QuinnG. D (George D.) |
| Collana | NASA TM- |
| Soggetto topico |
Sapphire
Thermal stresses Failure analysis Twinning Fractures (materials) Concentrators Tensile stress Temperature gradients Fractography |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910696935703321 |
Salem J. A (Jonathan A.), <1960->
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| Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , [2009] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Transmission electron microscopy (TEM) sample preparation of Si[subscript 1-x]Ge[subscript x] in c-plane sapphire substrate [[electronic resource] /] / Hyun Jung Kim ... [and others]
| Transmission electron microscopy (TEM) sample preparation of Si[subscript 1-x]Ge[subscript x] in c-plane sapphire substrate [[electronic resource] /] / Hyun Jung Kim ... [and others] |
| Pubbl/distr/stampa | Hampton, Va. : , : National Aeronautics and Space Administration, Langley Research Center, , [2012] |
| Descrizione fisica | 1 online resource (ix, 29 pages) : illustrations (some color) |
| Altri autori (Persone) | KimHyŏn-jŏng |
| Collana | NASA/TM |
| Soggetto topico |
Ion beams
Sapphire Transmission electron microscopy X ray diffraction Single crystals Rhombohedrons Germanium Density measurement Crystal structure |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Transmission electron microscopy |
| Record Nr. | UNINA-9910702249303321 |
| Hampton, Va. : , : National Aeronautics and Space Administration, Langley Research Center, , [2012] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Soggetto topico
-
Sapphire
(2)
- Concentrators (1)
- Crystal structure (1)
- Density measurement (1)
- Failure analysis (1)