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2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan
| 2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2005 |
| Disciplina | 621.39/732 |
| Soggetto topico |
Semiconductor storage devices - Testing
Random access memory Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5386-0323-3 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996206157703316 |
| [Place of publication not identified], : IEEE Computer Society, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan
| 2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2005 |
| Disciplina | 621.39/732 |
| Soggetto topico |
Semiconductor storage devices - Testing
Random access memory Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN |
9781538603239
1538603233 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910142332303321 |
| [Place of publication not identified], : IEEE Computer Society, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings
| 2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2006 |
| Disciplina | 621.39/732 |
| Soggetto topico |
Semiconductor storage devices - Testing
Random access memory Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-9829-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996197570903316 |
| [Place of publication not identified], : IEEE Computer Society, 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings
| 2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2006 |
| Disciplina | 621.39/732 |
| Soggetto topico |
Semiconductor storage devices - Testing
Random access memory Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN |
9781509098293
1509098291 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910145618003321 |
| [Place of publication not identified], : IEEE Computer Society, 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2007 IEEE International Workshop on Memory Technology, Design and Testing (MTDT)
| 2007 IEEE International Workshop on Memory Technology, Design and Testing (MTDT) |
| Pubbl/distr/stampa | [Place of publication not identified], : I E E E, 2007 |
| Descrizione fisica | 1 online resource |
| Disciplina | 004.5 |
| Soggetto topico | Random access memory |
| ISBN |
9781509090501
1509090509 9781424416554 1424416558 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910145703603321 |
| [Place of publication not identified], : I E E E, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2018 IEEE 27th North Atlantic Test Workshop : 7-9 May 2018, Essex, VT, USA / / Institute of Electrical and Electronics Engineers
| 2018 IEEE 27th North Atlantic Test Workshop : 7-9 May 2018, Essex, VT, USA / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (11 pages) |
| Disciplina | 004.16 |
| Soggetto topico |
Embedded computer systems
Random access memory Systems on a chip - Testing |
| ISBN | 1-5386-6400-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996280697003316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2018 IEEE 27th North Atlantic Test Workshop : 7-9 May 2018, Essex, VT, USA / / Institute of Electrical and Electronics Engineers
| 2018 IEEE 27th North Atlantic Test Workshop : 7-9 May 2018, Essex, VT, USA / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (11 pages) |
| Disciplina | 004.16 |
| Soggetto topico |
Embedded computer systems
Random access memory Systems on a chip - Testing |
| ISBN | 1-5386-6400-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910280921803321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Cosmic ray simulation and testing program [[electronic resource] ] : final report / / W. A. Kolasinski ... [and others]
| Cosmic ray simulation and testing program [[electronic resource] ] : final report / / W. A. Kolasinski ... [and others] |
| Pubbl/distr/stampa | Los Angeles, CA : , : Space Sciences Laboratory, the Aerospace Corporation |
| Descrizione fisica | 1 online resource (3 unnumbered pages, 25 pages, 25 unnumbered pages) : illustrations |
| Altri autori (Persone) | KolasinskiW. A |
| Collana | [NASA contractor report] |
| Soggetto topico |
Latch-up
Linear energy transfer (LET) Random access memory Single event upsets |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Cosmic ray simulation and testing program |
| Record Nr. | UNINA-9910702128503321 |
| Los Angeles, CA : , : Space Sciences Laboratory, the Aerospace Corporation | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
DRAMs and DRAM modules from Korea [[electronic resource] ] : investigation no. 701-TA-431 (remand)
| DRAMs and DRAM modules from Korea [[electronic resource] ] : investigation no. 701-TA-431 (remand) |
| Pubbl/distr/stampa | Washington, D.C. : , : U.S. International Trade Commission, , [2006] |
| Descrizione fisica | 1 volume (various pagings) : digital, PDF file |
| Collana | Publication |
| Soggetto topico |
Random access memory
Semiconductor industry - Korea (South) Semiconductor industry - United States |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | DRAMs and DRAM modules from Korea |
| Record Nr. | UNINA-9910696178303321 |
| Washington, D.C. : , : U.S. International Trade Commission, , [2006] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
IMW : 2015 IEEE 7th International Memory Workshop : Monterey, CA, 17-20 May 2015 / / Institute of Electrical and Electronics Engineers
| IMW : 2015 IEEE 7th International Memory Workshop : Monterey, CA, 17-20 May 2015 / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2015 |
| Descrizione fisica | 1 online resource (264 pages) |
| Disciplina | 621.39732 |
| Soggetto topico |
Semiconductor storage devices
Random access memory |
| ISBN | 1-4673-6933-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910131514803321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
