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RF measurements for cellular phones and wireless data systems / / Allan W. Scott, Rex Frobenius
RF measurements for cellular phones and wireless data systems / / Allan W. Scott, Rex Frobenius
Autore Scott Allan W.
Pubbl/distr/stampa Hoboken, New Jersey : , : IEEE, , c2008
Descrizione fisica 1 online resource (525 p.)
Disciplina 621.3845/6
Altri autori (Persone) FrobeniusRex
Soggetto topico Radio frequency integrated circuits - Testing
Wireless communication systems - Equipment and supplies - Design and construction
Cell phones - Equipment and supplies - Design and construction
ISBN 0-470-65234-9
1-118-21031-X
1-281-75191-X
9786611751913
0-470-37801-8
0-470-37800-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto RF MEASUREMENTS FOR CELLULAR PHONES AND WIRELESS DATA SYSTEMS; CONTENTS; FOREWORD; ACKNOWLEDGMENTS; 1 INTRODUCTION; PART I RF AND WIRELESS PRINCIPLES; PART II RF MEASUREMENT EQUIPMENT; PART III MEASUREMENT OF INDIVIDUAL RF COMPONENTS; PART IV TESTING OF DEVICES WITH DIGITALLY MODULATED SIGNALS; TERMINOLOGY; INDEX;
Record Nr. UNINA-9910144135603321
Scott Allan W.  
Hoboken, New Jersey : , : IEEE, , c2008
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
RF measurements for cellular phones and wireless data systems / / Allan W. Scott, Rex Frobenius
RF measurements for cellular phones and wireless data systems / / Allan W. Scott, Rex Frobenius
Autore Scott Allan W.
Pubbl/distr/stampa Hoboken, New Jersey : , : IEEE, , c2008
Descrizione fisica 1 online resource (525 p.)
Disciplina 621.3845/6
Altri autori (Persone) FrobeniusRex
Soggetto topico Radio frequency integrated circuits - Testing
Wireless communication systems - Equipment and supplies - Design and construction
Cell phones - Equipment and supplies - Design and construction
ISBN 0-470-65234-9
1-118-21031-X
1-281-75191-X
9786611751913
0-470-37801-8
0-470-37800-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto RF MEASUREMENTS FOR CELLULAR PHONES AND WIRELESS DATA SYSTEMS; CONTENTS; FOREWORD; ACKNOWLEDGMENTS; 1 INTRODUCTION; PART I RF AND WIRELESS PRINCIPLES; PART II RF MEASUREMENT EQUIPMENT; PART III MEASUREMENT OF INDIVIDUAL RF COMPONENTS; PART IV TESTING OF DEVICES WITH DIGITALLY MODULATED SIGNALS; TERMINOLOGY; INDEX;
Record Nr. UNISA-996218393003316
Scott Allan W.  
Hoboken, New Jersey : , : IEEE, , c2008
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
RF measurements for cellular phones and wireless data systems / / Allan W. Scott, Rex Frobenius
RF measurements for cellular phones and wireless data systems / / Allan W. Scott, Rex Frobenius
Autore Scott Allan W
Edizione [1st ed.]
Pubbl/distr/stampa Hoboken, N.J., : IEEE, : Wiley & Sons, c2008
Descrizione fisica 1 online resource (525 p.)
Disciplina 621.3845/6
Altri autori (Persone) FrobeniusRex
Soggetto topico Radio frequency integrated circuits - Testing
Wireless communication systems - Equipment and supplies - Design and construction
Cell phones - Equipment and supplies - Design and construction
ISBN 9786611751913
9780470652343
0470652349
9781118210314
111821031X
9781281751911
128175191X
9780470378014
0470378018
9780470378007
047037800X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto RF MEASUREMENTS FOR CELLULAR PHONES AND WIRELESS DATA SYSTEMS; CONTENTS; FOREWORD; ACKNOWLEDGMENTS; 1 INTRODUCTION; PART I RF AND WIRELESS PRINCIPLES; PART II RF MEASUREMENT EQUIPMENT; PART III MEASUREMENT OF INDIVIDUAL RF COMPONENTS; PART IV TESTING OF DEVICES WITH DIGITALLY MODULATED SIGNALS; TERMINOLOGY; INDEX;
Record Nr. UNINA-9910810367103321
Scott Allan W  
Hoboken, N.J., : IEEE, : Wiley & Sons, c2008
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach / / edited by Yichuang Sun
Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach / / edited by Yichuang Sun
Pubbl/distr/stampa London, : Institution of Engineering and Technology, 2008
Descrizione fisica 1 online resource (411 p.)
Disciplina 621.38150287
Altri autori (Persone) SunYichuang
Collana Circuits, devices and systems series
Soggetto topico Linear integrated circuits - Testing
Mixed signal circuits - Testing
Radio frequency integrated circuits - Testing
ISBN 1-281-97130-8
9786611971304
1-61583-315-3
0-86341-999-2
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Contents; Preface; List of contributors; 1 Fault diagnosis of linear and non-linear analogue circuits; 2 Symbolic function approaches for analogue fault diagnosis 37Stefano Manetti and Maria Cristina Piccirilli; 3 Neural-network-based approaches for analogue circuit faultdiagnosis; 4 Hierarchical/decomposition techniques for large-scale analoguediagnosis; 5 DFT and BIST techniques for analogue and mixed-signal test; 6 Design-for-testability of analogue filters; 7 Test of A/D converters: From converter characteristics to built-inself-test proposals; 8 Test of Sigma Delta converters
9 Phase-locked loop test methodologies: Current characterization and production test practices10 On-chip testing techniques for RF wireless transceiver systemsand components; 11 Tuning and calibration of analogue, mixed-signal and RF circuits; Index
Record Nr. UNINA-9911006603503321
London, : Institution of Engineering and Technology, 2008
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui