2001 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems : digest of papers |
Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2001 |
Disciplina | 621.384/12 |
Soggetto topico |
Integrated circuits - Design and construction
Radio circuits - Design and construction Radio frequency integrated circuits Wireless communication systems Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996217703303316 |
[Place of publication not identified], : IEEE, 2001 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. di Salerno | ||
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2003 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems : digest of papers : [9-11 April, 2003, Grainau, Germany |
Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2003 |
Disciplina | 621.384/12 |
Soggetto topico |
Integrated circuits - Design and construction
Radio circuits - Design and construction Radio frequency integrated circuits Wireless communication systems Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996202479203316 |
[Place of publication not identified], : IEEE, 2003 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. di Salerno | ||
|
2004 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems : digest of papers |
Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2004 |
Disciplina | 621.384/12 |
Soggetto topico |
Integrated circuits - Design and construction
Radio circuits - Design and construction Very high speed integrated circuits - Equipment and supplies Wireless communication systems Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996204504203316 |
[Place of publication not identified], : IEEE, 2004 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. di Salerno | ||
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2007 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems : digest of papers : [10-12 January 2007, Long Beach, CA, USA] / / Rhonda Franklin Drayton, editor ; sponsored by IEEE Microwave Theory and Techniques Society |
Pubbl/distr/stampa | IEEE |
Disciplina | 621.384/12 |
Altri autori (Persone) | DraytonRhonda Franklin |
Soggetto topico |
Integrated circuits - Design and construction
Radio circuits - Design and construction Very high speed integrated circuits Wireless communication systems - Equipment and supplies |
ISBN | 1-5090-8237-9 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti |
Systems, Signals and Image Processing held with 2007 6th EURASIP Conference Focused on Speech and Image Processing, Multimedia Communication and Services
2007 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems |
Record Nr. | UNISA-996279697503316 |
IEEE | ||
Materiale a stampa | ||
Lo trovi qui: Univ. di Salerno | ||
|
2007 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems : digest of papers : [10-12 January 2007, Long Beach, CA, USA] / / Rhonda Franklin Drayton, editor ; sponsored by IEEE Microwave Theory and Techniques Society |
Pubbl/distr/stampa | IEEE |
Disciplina | 621.384/12 |
Altri autori (Persone) | DraytonRhonda Franklin |
Soggetto topico |
Integrated circuits - Design and construction
Radio circuits - Design and construction Very high speed integrated circuits Wireless communication systems - Equipment and supplies |
ISBN | 1-5090-8237-9 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti |
Systems, Signals and Image Processing held with 2007 6th EURASIP Conference Focused on Speech and Image Processing, Multimedia Communication and Services
2007 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems |
Record Nr. | UNINA-9910142663503321 |
IEEE | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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2018 IEEE 18th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems : 14-17 January 2018, Anaheim, California, USA / / Institute of Electrical and Electronics Engineers |
Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
Descrizione fisica | 1 online resource (53 pages) |
Disciplina | 621 |
Soggetto topico |
Wireless communication systems - Equipment and supplies
Very high speed integrated circuits Radio circuits - Design and construction |
ISBN | 1-5386-1298-4 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996279512803316 |
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. di Salerno | ||
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2018 IEEE 18th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems : 14-17 January 2018, Anaheim, California, USA / / Institute of Electrical and Electronics Engineers |
Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
Descrizione fisica | 1 online resource (53 pages) |
Disciplina | 621 |
Soggetto topico |
Wireless communication systems - Equipment and supplies
Very high speed integrated circuits Radio circuits - Design and construction |
ISBN | 1-5386-1298-4 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910262258603321 |
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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2023 IEEE 23rd Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems / / Institute of Electrical and Electronics Engineers |
Pubbl/distr/stampa | Piscataway, New Jersey : , : IEEE, , 2023 |
Descrizione fisica | 1 online resource |
Disciplina | 621.3815 |
Soggetto topico |
Integrated circuits - Design and construction
Radio circuits - Design and construction Radio frequency integrated circuits |
ISBN | 1-66549-319-4 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996575111503316 |
Piscataway, New Jersey : , : IEEE, , 2023 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. di Salerno | ||
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Design and characterization of integrated varactors for RF applications [[electronic resource] /] / Íñigo Gutiérrez, Juan Meléndez, Erik Hernández |
Autore | Gutiérrez Íñigo |
Pubbl/distr/stampa | Chichester, West Sussex, England ; ; Hoboken, NJ, : Wiley, c2006 |
Descrizione fisica | 1 online resource (182 p.) |
Disciplina |
621.3815
621.381522 |
Altri autori (Persone) |
MeléndezJuan <1974->
HernándezErik |
Soggetto topico |
Varactors - Design and construction
Radio capacitors - Design and construction Radio circuits - Design and construction Integrated circuits - Design and construction |
Soggetto genere / forma | Electronic books. |
ISBN |
1-280-85476-6
9786610854769 0-470-03592-7 1-60119-377-7 0-470-03591-9 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
Design and Characterization of Integrated Varactors for RF Applications; Contents; List of Figures; List of Tables; Preface; Acknowledgements; 1 Introduction; 1.1 Passive Elements; 1.2 Figures of Merit of Varactors; 1.2.1 Quality Factor; 1.2.2 Tuning Range; 1.2.3 Self-resonant Frequency(fR); 1.2.4 Effective Silicon Area; 1.2.5 Absolute Capacity Value; 1.3 Principal Types of Varactor Manufacture; 1.3.1 Discrete Varactors; 1.3.2 MEMS Varactors; 1.3.3 BST Varactors; 1.3.4 Integrated Varactors using Standard Technologies; References; 2 PN-junction Varactors
2.1 The Operating Principle of a PN-junction Varactor2.1.1 Electrical Phenomena in a PN-junction Varactor; 2.2 Different Architectures of PN-junction Varactors; 2.2.1 Different Configurations of PN-junction Varactors; 2.3 Influence of Bias Voltage on the Behaviour of a PN-junction Varactor; 2.4 Influence of Geometric Parameters on the Behaviour of a PN-junction Varactor; 2.4.1 Influence in the Variation of the Number of Islands; 2.4.2 Influence of the Size of the Islands; 2.4.3 Influence of the Distance Between Islands; 2.4.4 Variation of the Size of the N Well 2.5 Influence of the Working Frequency on the Results2.5.1 Influence of the Frequency on the Quality of a Varactor; 2.5.2 Influence of the Frequency on the Capacitance of a Varactor; 2.6 Comparison Between the Different Types of PN-junction Varactors; 2.6.1 Comparison According to the Effective Silicon Area; 2.6.2 Comparison According to the Quality Factor; References; 3 MOS Varactors; 3.1 Operating Principles of an NMOS Varactor; 3.1.1 Operating Ranges of the NMOS Varactor; 3.1.2 Electrical Phenomena of an NMOS Varactor in Accumulation Mode 3.1.3 Electrical Phenomena of an NMOS Varactor in Depletion Mode3.2 NMOS Varactors; 3.2.1 Operating Ranges of the NMOS Varactor; 3.3 Influence of the Operating Mode on an NMOS Varactor; 3.4 Influence of Bias Voltage on the Behaviour of an NMOS Accumulation Varactor; 3.5 Influence of Geometric Parameters on the Behaviour of an NMOS Varactor; 3.5.1 Influence of the Variation of the Varactor Size; 3.5.2 Influence of the Varactor Gate Length on its Performance; 3.5.3 Influence of the Varactor Gate Width on its Performance; 3.6 Influence of the Working Frequency on the Results; References 4 Measurement Techniques for Integrated Varactors4.1 Test System; 4.2 Equipment Required for the On-Wafer Testing of Integrated Varactors; 4.2.1 Test Probes; 4.2.2 Connectivity; 4.3 Calibrating the Test System; 4.4 Test Structures; 4.4.1 Choosing the Test Structure Configuration; 4.4.2 Design of the Test Structures; 4.4.3 Effects Introduced by the Test Structures; 4.5 Test Structure DE-embedding Techniques; 4.5.1 Single-Short Structure; 4.5.2 Single-Open Structure; 4.5.3 Thru Structure; 4.6 Characterization of Integrated Varactors; 4.7 Test System Verification 4.7.1 Error Introduced by Positioning the Test Probes on the Pads |
Record Nr. | UNINA-9910143584503321 |
Gutiérrez Íñigo | ||
Chichester, West Sussex, England ; ; Hoboken, NJ, : Wiley, c2006 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Design and characterization of integrated varactors for RF applications [[electronic resource] /] / Íñigo Gutiérrez, Juan Meléndez, Erik Hernández |
Autore | Gutiérrez Íñigo |
Pubbl/distr/stampa | Chichester, West Sussex, England ; ; Hoboken, NJ, : Wiley, c2006 |
Descrizione fisica | 1 online resource (182 p.) |
Disciplina |
621.3815
621.381522 |
Altri autori (Persone) |
MeléndezJuan <1974->
HernándezErik |
Soggetto topico |
Varactors - Design and construction
Radio capacitors - Design and construction Radio circuits - Design and construction Integrated circuits - Design and construction |
ISBN |
1-280-85476-6
9786610854769 0-470-03592-7 1-60119-377-7 0-470-03591-9 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
Design and Characterization of Integrated Varactors for RF Applications; Contents; List of Figures; List of Tables; Preface; Acknowledgements; 1 Introduction; 1.1 Passive Elements; 1.2 Figures of Merit of Varactors; 1.2.1 Quality Factor; 1.2.2 Tuning Range; 1.2.3 Self-resonant Frequency(fR); 1.2.4 Effective Silicon Area; 1.2.5 Absolute Capacity Value; 1.3 Principal Types of Varactor Manufacture; 1.3.1 Discrete Varactors; 1.3.2 MEMS Varactors; 1.3.3 BST Varactors; 1.3.4 Integrated Varactors using Standard Technologies; References; 2 PN-junction Varactors
2.1 The Operating Principle of a PN-junction Varactor2.1.1 Electrical Phenomena in a PN-junction Varactor; 2.2 Different Architectures of PN-junction Varactors; 2.2.1 Different Configurations of PN-junction Varactors; 2.3 Influence of Bias Voltage on the Behaviour of a PN-junction Varactor; 2.4 Influence of Geometric Parameters on the Behaviour of a PN-junction Varactor; 2.4.1 Influence in the Variation of the Number of Islands; 2.4.2 Influence of the Size of the Islands; 2.4.3 Influence of the Distance Between Islands; 2.4.4 Variation of the Size of the N Well 2.5 Influence of the Working Frequency on the Results2.5.1 Influence of the Frequency on the Quality of a Varactor; 2.5.2 Influence of the Frequency on the Capacitance of a Varactor; 2.6 Comparison Between the Different Types of PN-junction Varactors; 2.6.1 Comparison According to the Effective Silicon Area; 2.6.2 Comparison According to the Quality Factor; References; 3 MOS Varactors; 3.1 Operating Principles of an NMOS Varactor; 3.1.1 Operating Ranges of the NMOS Varactor; 3.1.2 Electrical Phenomena of an NMOS Varactor in Accumulation Mode 3.1.3 Electrical Phenomena of an NMOS Varactor in Depletion Mode3.2 NMOS Varactors; 3.2.1 Operating Ranges of the NMOS Varactor; 3.3 Influence of the Operating Mode on an NMOS Varactor; 3.4 Influence of Bias Voltage on the Behaviour of an NMOS Accumulation Varactor; 3.5 Influence of Geometric Parameters on the Behaviour of an NMOS Varactor; 3.5.1 Influence of the Variation of the Varactor Size; 3.5.2 Influence of the Varactor Gate Length on its Performance; 3.5.3 Influence of the Varactor Gate Width on its Performance; 3.6 Influence of the Working Frequency on the Results; References 4 Measurement Techniques for Integrated Varactors4.1 Test System; 4.2 Equipment Required for the On-Wafer Testing of Integrated Varactors; 4.2.1 Test Probes; 4.2.2 Connectivity; 4.3 Calibrating the Test System; 4.4 Test Structures; 4.4.1 Choosing the Test Structure Configuration; 4.4.2 Design of the Test Structures; 4.4.3 Effects Introduced by the Test Structures; 4.5 Test Structure DE-embedding Techniques; 4.5.1 Single-Short Structure; 4.5.2 Single-Open Structure; 4.5.3 Thru Structure; 4.6 Characterization of Integrated Varactors; 4.7 Test System Verification 4.7.1 Error Introduced by Positioning the Test Probes on the Pads |
Record Nr. | UNINA-9910830721603321 |
Gutiérrez Íñigo | ||
Chichester, West Sussex, England ; ; Hoboken, NJ, : Wiley, c2006 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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