Autore	Kang Chang W (Chang Wok), <1957->
Pubbl/distr/stampa	Hoboken, N.J., : Wiley, 2011
Descrizione fisica	1 online resource (264 p.)
Disciplina	658.562 658.562015195
Altri autori (Persone)	KvamPaul H. <1962->
Soggetto topico	Process control - Statistical methods Quality control - Statistical methods Acceptance sampling
Soggetto genere / forma	Electronic books.
ISBN	1-283-59282-7 9786613905277 1-118-49175-0 1-118-49149-1 1-118-49151-3
Classificazione	TEC032000
Formato	Materiale a stampa
Livello bibliografico	Monografia
Lingua di pubblicazione	eng
Nota di contenuto	Basic Statistical Tools for Improving Quality; CONTENTS; Preface; 1 The Importance of Quality Improvement; 1.1 Introduction; 1.2 What Is Statistical Process Control?; 1.3 The Birth of Quality Control; 1.4 What Is a Process?; 1.5 Examples of Processes from Daily Life; 1.6 Implementing the Tools and Techniques; 1.7 Continuous Process Improvement; 1.8 The Goal of Statistical Process Control; 1.9 The Eight Dimensions of Quality for Manufacturing & Service; 1.10 The Cost of (Poor) Quality; 1.11 What Did We Learn?; 1.12 Test Your Knowledge; 2 Graphical Display of Data; 2.1 Introduction to eZ SPC 2.2 Qualitative and Quantitative Data2.3 Bar Chart; 2.4 Pie Chart; 2.5 Pareto Chart; 2.6 Radar Chart; 2.7 Histogram; 2.8 Box Plot; 2.9 Scatter Plot; 2.10 Cause and Effect Diagram; 2.11 What Did We Learn?; 2.12 Test Your Knowledge; Exercises; 3 Summarizing Data; 3.1 Central Tendency; 3.2 Variability; 3.3 Statistical Distributions; 3.4 Distributions in eZ SPC; 3.5 What Did We Learn?; 3.6 Test Your Knowledge; Exercises; 4 Analyzing Data; 4.1 Confidence Intervals; 4.2 Test of Hypothesis; 4.3 The p-value; 4.4 Probability Plots; 4.5 What Did We Learn?; 4.6 Test Your Knowledge; Exercises 5 Shewhart Control Charts5.1 The Concept of a Control Chart; 5.2 Managing the Process with Control Charts; 5.3 Variable Control Charts; 5.4 Attribute Control Charts; 5.5 Deciding Which Chart to Use; 5.6 What Did We Learn?; 5.7 Test Your Knowledge; Exercises; 6 Advanced Control Charts; 6.1 CUSUM Control Chart; 6.2 EWMA Control Chart; 6.3 CV Control Chart; 6.4 Nonparametric Control Charts; 6.5 Process Capability; 6.6 Gage R & R; 6.7 What Did We Learn?; 6.8 Test Your Knowledge; Exercises; 7 Process Improvement; 7.1 Correlation Analysis; 7.2 Regression Analysis; 7.3 Experimental Design 7.4 Overview of Experimental Design7.5 Principles of Experimentation; 7.6 One-Way Analysis of Variance; 7.7 Two Way Analysis of Variance; 7.8 Two-level Factorial Design Analysis; 7.9 What Did We Learn?; 7.10 Test Your Knowledge; Exercises; 8 End Material; 8.1 Final Exam; 8.2 Final Exam Solutions; 8.3 Test Your Knowledge: Answers; References; Glossary; Subject Index
Record Nr.	UNINA-9910141415103321

Autore	Barrentine Larry B. <1938->
Edizione	[Second edition.]
Pubbl/distr/stampa	Milwaukee, Wisconsin : , : ASQ Quality Press, , 2003
Descrizione fisica	1 online resource (74 p.)
Disciplina	658.5/62/015195
Soggetto topico	Quality control - Statistical methods Process control - Statistical methods Measurement
Soggetto genere / forma	Electronic books.
ISBN	600-00-4715-0
Formato	Materiale a stampa
Livello bibliografico	Monografia
Lingua di pubblicazione	eng
Record Nr.	UNINA-9910463101703321

Autore	Spiring Fred
Pubbl/distr/stampa	New York, : Nova Science Publishers, c2010
Descrizione fisica	1 online resource (189 p.)
Disciplina	658.5
Collana	Quality control engineering and manufacturing
Soggetto topico	Process control Process control - Statistical methods Manufacturing processes
Soggetto genere / forma	Electronic books.
ISBN	1-61209-900-9
Formato	Materiale a stampa
Livello bibliografico	Monografia
Lingua di pubblicazione	eng
Record Nr.	UNINA-9910465205103321

Autore	Pearn W. L
Pubbl/distr/stampa	Singapore ; ; Hackensack, NJ, : World Scientific, c2006
Descrizione fisica	1 online resource (391 p.)
Disciplina	658.5
Altri autori (Persone)	KotzSamuel
Collana	Series on quality, reliability & engineering statistics
Soggetto topico	Process control - Statistical methods Automatic control
ISBN	9786611924935 9781628702323 162870232X 9781281924933 1281924938 9789812773753 9812773754
Formato	Materiale a stampa
Livello bibliografico	Monografia
Lingua di pubblicazione	eng
Nota di contenuto	Contents; About the Authors; Introduction; 1. The Cp Index; 1.1 Process precision and the Cp index; 1.2 Estimating and testing Cp based on a single sample; 1.2.1 Estimation of Cp; 1.2.2 The r-th moment of Ĉp; 1.2.3 Statistical properties of the estimated Cp; 1.2.4 Confidence interval for Cp; 1.2.5 Sample size determination for estimation of Cp; 1.2.6 Hypothesis testing with Cp; 1.3 Estimating and testing C based on multiple samples; 1.3.1 Estimation of Cp and its properties; 1.3.2 Lower confidence bound on Cp; 1.3.3 Hypothesis testing with Cp 1.4 Estimating and testing Cp based on (X, R) control chart samples1.4.1 Estimation of Cp based on (X, R) samples; 1.4.2 Hypothesis testing for Cp based on (X, R) samples; 1.5 Estimating and testing Cp based on (X, S) control chart samples; 1.5.1 Estimation of Cp based on (X, S) samples; 1.5.2 Hypotheses testing for Cp based on (X, S) samples; 1.6 A Bayesian approach to assessment of Cp; 2. The Ca Index; 2.1 Process accuracy and the Ca index; 2.2 Estimating and testing Ca based on a single sample; 2.2.1 The first two moments of Ĉa; 2.2.2 Confidence interval on Ca 2.3 Estimating and testing Ca based on multiple samples2.4 Bayesian-like estimator of Ca; 3. The Cpk Index; 3.1 Process capability and the Cpk index; 3.2 Estimating and testing Cpk based on a single sample; 3.2.1 The r-th moment of Ĉpk; 3.2.2 Distributional properties of Cpk; 3.2.3 Confidence intervals for Cpk; 3.2.4 Hypothesis testing with Cpk; 3.3 Estimating and testing Cpk based on multiple samples; 3.4 The Bayesian approach to Cpk; 3.5 The Bayesian-like estimator of Cpk; 4. The Cpm Index; 4.1 Process capability and the Cpm index; 4.2 Estimating and testing Cpm based on a single sample 4.2.1 Estimation and distributional properties of estimators4.2.2 Confidence intervals for Cpm; 4.2.3 Sample size determination for Cpm; 4.2.4 Hypothesis testing procedure (using Cpm); 4.3 Estimating and testing Cpm based on multiple samples; 4.4 The Bayesian approach to Cpm; 5. The Loss Indices; 5.1 Process loss and the Le index; 5.2 Estimation of Lpe, Lot, and Le; 5.2.1 Estimating the process relative inconsistency loss, Lpe; 5.2.2 Estimation of a process relative the off-target loss, Lot; 5.2.3 Estimation of process expected relative loss, Le 5.3 Upper confidence bounds of Lpe, Lot, and Le5.3.1 An upper confidence bound on Lpe; 5.3.2 An upper confidence bound on Lot; 5.3.3 An upper confidence bound on Le; 5.4 Testing process capability based on the process loss; 6. The Cpmk Index; 6.1 Process capability and the Cpmk index; 6.2 Estimating and testing Cpmk based on a single sample; 6.2.1 Estimation and the distribution of the estimated Cpmk; 6.2.2 Confidence intervals on Cpmk; 6.2.3 Hypothesis testing with Cpmk; 6.3 Estimating and testing Cpmk based on multiple samples; 6.4 Bayesian-like estimation of Cpmk; 7. The Spk Index 7.1 Process capability and the Spk index
Record Nr.	UNINA-9911006889203321

Autore	May Gary S.
Pubbl/distr/stampa	[Piscataway, New Jersey] : , : IEEE, , c2006
Descrizione fisica	1 online resource (485 p.)
Disciplina	621.3815/2 621.38152
Altri autori (Persone)	SpanosCostas J
Soggetto topico	Semiconductors - Design and construction Integrated circuits - Design and construction Process control - Statistical methods
ISBN	1-280-45023-1 9786610450237 0-470-35916-1 0-471-79028-1 1-61583-845-7 0-471-79027-3
Formato	Materiale a stampa
Livello bibliografico	Monografia
Lingua di pubblicazione	eng
Nota di contenuto	Introduction to semiconductor manufacturing -- Technology overview -- Process monitoring -- Statistical fundamentals -- Yield modeling -- Statistical process control -- Statistical experimental design -- Process modeling -- Advanced process control -- Process and equipment diagnosis.
Record Nr.	UNINA-9910143417603321