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Basic statistical tools for improving quality [[electronic resource] /] / Chang W. Kang, Paul H. Kvam
| Basic statistical tools for improving quality [[electronic resource] /] / Chang W. Kang, Paul H. Kvam |
| Autore | Kang Chang W (Chang Wok), <1957-> |
| Pubbl/distr/stampa | Hoboken, N.J., : Wiley, 2011 |
| Descrizione fisica | 1 online resource (264 p.) |
| Disciplina |
658.562
658.562015195 |
| Altri autori (Persone) | KvamPaul H. <1962-> |
| Soggetto topico |
Process control - Statistical methods
Quality control - Statistical methods Acceptance sampling |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-283-59282-7
9786613905277 1-118-49175-0 1-118-49149-1 1-118-49151-3 |
| Classificazione | TEC032000 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Basic Statistical Tools for Improving Quality; CONTENTS; Preface; 1 The Importance of Quality Improvement; 1.1 Introduction; 1.2 What Is Statistical Process Control?; 1.3 The Birth of Quality Control; 1.4 What Is a Process?; 1.5 Examples of Processes from Daily Life; 1.6 Implementing the Tools and Techniques; 1.7 Continuous Process Improvement; 1.8 The Goal of Statistical Process Control; 1.9 The Eight Dimensions of Quality for Manufacturing & Service; 1.10 The Cost of (Poor) Quality; 1.11 What Did We Learn?; 1.12 Test Your Knowledge; 2 Graphical Display of Data; 2.1 Introduction to eZ SPC
2.2 Qualitative and Quantitative Data2.3 Bar Chart; 2.4 Pie Chart; 2.5 Pareto Chart; 2.6 Radar Chart; 2.7 Histogram; 2.8 Box Plot; 2.9 Scatter Plot; 2.10 Cause and Effect Diagram; 2.11 What Did We Learn?; 2.12 Test Your Knowledge; Exercises; 3 Summarizing Data; 3.1 Central Tendency; 3.2 Variability; 3.3 Statistical Distributions; 3.4 Distributions in eZ SPC; 3.5 What Did We Learn?; 3.6 Test Your Knowledge; Exercises; 4 Analyzing Data; 4.1 Confidence Intervals; 4.2 Test of Hypothesis; 4.3 The p-value; 4.4 Probability Plots; 4.5 What Did We Learn?; 4.6 Test Your Knowledge; Exercises 5 Shewhart Control Charts5.1 The Concept of a Control Chart; 5.2 Managing the Process with Control Charts; 5.3 Variable Control Charts; 5.4 Attribute Control Charts; 5.5 Deciding Which Chart to Use; 5.6 What Did We Learn?; 5.7 Test Your Knowledge; Exercises; 6 Advanced Control Charts; 6.1 CUSUM Control Chart; 6.2 EWMA Control Chart; 6.3 CV Control Chart; 6.4 Nonparametric Control Charts; 6.5 Process Capability; 6.6 Gage R & R; 6.7 What Did We Learn?; 6.8 Test Your Knowledge; Exercises; 7 Process Improvement; 7.1 Correlation Analysis; 7.2 Regression Analysis; 7.3 Experimental Design 7.4 Overview of Experimental Design7.5 Principles of Experimentation; 7.6 One-Way Analysis of Variance; 7.7 Two Way Analysis of Variance; 7.8 Two-level Factorial Design Analysis; 7.9 What Did We Learn?; 7.10 Test Your Knowledge; Exercises; 8 End Material; 8.1 Final Exam; 8.2 Final Exam Solutions; 8.3 Test Your Knowledge: Answers; References; Glossary; Subject Index |
| Record Nr. | UNINA-9910141415103321 |
Kang Chang W (Chang Wok), <1957->
|
||
| Hoboken, N.J., : Wiley, 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Basic statistical tools for improving quality [[electronic resource] /] / Chang W. Kang, Paul H. Kvam
| Basic statistical tools for improving quality [[electronic resource] /] / Chang W. Kang, Paul H. Kvam |
| Autore | Kang Chang W (Chang Wok), <1957-> |
| Pubbl/distr/stampa | Hoboken, N.J., : Wiley, 2011 |
| Descrizione fisica | 1 online resource (264 p.) |
| Disciplina |
658.562
658.562015195 |
| Altri autori (Persone) | KvamPaul H. <1962-> |
| Soggetto topico |
Process control - Statistical methods
Quality control - Statistical methods Acceptance sampling |
| ISBN |
1-283-59282-7
9786613905277 1-118-49175-0 1-118-49149-1 1-118-49151-3 |
| Classificazione | TEC032000 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Basic Statistical Tools for Improving Quality; CONTENTS; Preface; 1 The Importance of Quality Improvement; 1.1 Introduction; 1.2 What Is Statistical Process Control?; 1.3 The Birth of Quality Control; 1.4 What Is a Process?; 1.5 Examples of Processes from Daily Life; 1.6 Implementing the Tools and Techniques; 1.7 Continuous Process Improvement; 1.8 The Goal of Statistical Process Control; 1.9 The Eight Dimensions of Quality for Manufacturing & Service; 1.10 The Cost of (Poor) Quality; 1.11 What Did We Learn?; 1.12 Test Your Knowledge; 2 Graphical Display of Data; 2.1 Introduction to eZ SPC
2.2 Qualitative and Quantitative Data2.3 Bar Chart; 2.4 Pie Chart; 2.5 Pareto Chart; 2.6 Radar Chart; 2.7 Histogram; 2.8 Box Plot; 2.9 Scatter Plot; 2.10 Cause and Effect Diagram; 2.11 What Did We Learn?; 2.12 Test Your Knowledge; Exercises; 3 Summarizing Data; 3.1 Central Tendency; 3.2 Variability; 3.3 Statistical Distributions; 3.4 Distributions in eZ SPC; 3.5 What Did We Learn?; 3.6 Test Your Knowledge; Exercises; 4 Analyzing Data; 4.1 Confidence Intervals; 4.2 Test of Hypothesis; 4.3 The p-value; 4.4 Probability Plots; 4.5 What Did We Learn?; 4.6 Test Your Knowledge; Exercises 5 Shewhart Control Charts5.1 The Concept of a Control Chart; 5.2 Managing the Process with Control Charts; 5.3 Variable Control Charts; 5.4 Attribute Control Charts; 5.5 Deciding Which Chart to Use; 5.6 What Did We Learn?; 5.7 Test Your Knowledge; Exercises; 6 Advanced Control Charts; 6.1 CUSUM Control Chart; 6.2 EWMA Control Chart; 6.3 CV Control Chart; 6.4 Nonparametric Control Charts; 6.5 Process Capability; 6.6 Gage R & R; 6.7 What Did We Learn?; 6.8 Test Your Knowledge; Exercises; 7 Process Improvement; 7.1 Correlation Analysis; 7.2 Regression Analysis; 7.3 Experimental Design 7.4 Overview of Experimental Design7.5 Principles of Experimentation; 7.6 One-Way Analysis of Variance; 7.7 Two Way Analysis of Variance; 7.8 Two-level Factorial Design Analysis; 7.9 What Did We Learn?; 7.10 Test Your Knowledge; Exercises; 8 End Material; 8.1 Final Exam; 8.2 Final Exam Solutions; 8.3 Test Your Knowledge: Answers; References; Glossary; Subject Index |
| Record Nr. | UNINA-9910830940603321 |
|
Kang Chang W (Chang Wok), <1957->
|
||
| Hoboken, N.J., : Wiley, 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Basic statistical tools for improving quality / / Chang W. Kang, Paul H. Kvam
| Basic statistical tools for improving quality / / Chang W. Kang, Paul H. Kvam |
| Autore | Kang Chang W (Chang Wok), <1957-> |
| Pubbl/distr/stampa | Hoboken, N.J., : Wiley, 2011 |
| Descrizione fisica | 1 online resource (264 p.) |
| Disciplina | 658.5/62 |
| Altri autori (Persone) | KvamPaul H. <1962-> |
| Soggetto topico |
Process control - Statistical methods
Quality control - Statistical methods Acceptance sampling |
| ISBN |
1-283-59282-7
9786613905277 1-118-49175-0 1-118-49149-1 1-118-49151-3 |
| Classificazione | TEC032000 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Basic Statistical Tools for Improving Quality; CONTENTS; Preface; 1 The Importance of Quality Improvement; 1.1 Introduction; 1.2 What Is Statistical Process Control?; 1.3 The Birth of Quality Control; 1.4 What Is a Process?; 1.5 Examples of Processes from Daily Life; 1.6 Implementing the Tools and Techniques; 1.7 Continuous Process Improvement; 1.8 The Goal of Statistical Process Control; 1.9 The Eight Dimensions of Quality for Manufacturing & Service; 1.10 The Cost of (Poor) Quality; 1.11 What Did We Learn?; 1.12 Test Your Knowledge; 2 Graphical Display of Data; 2.1 Introduction to eZ SPC
2.2 Qualitative and Quantitative Data2.3 Bar Chart; 2.4 Pie Chart; 2.5 Pareto Chart; 2.6 Radar Chart; 2.7 Histogram; 2.8 Box Plot; 2.9 Scatter Plot; 2.10 Cause and Effect Diagram; 2.11 What Did We Learn?; 2.12 Test Your Knowledge; Exercises; 3 Summarizing Data; 3.1 Central Tendency; 3.2 Variability; 3.3 Statistical Distributions; 3.4 Distributions in eZ SPC; 3.5 What Did We Learn?; 3.6 Test Your Knowledge; Exercises; 4 Analyzing Data; 4.1 Confidence Intervals; 4.2 Test of Hypothesis; 4.3 The p-value; 4.4 Probability Plots; 4.5 What Did We Learn?; 4.6 Test Your Knowledge; Exercises 5 Shewhart Control Charts5.1 The Concept of a Control Chart; 5.2 Managing the Process with Control Charts; 5.3 Variable Control Charts; 5.4 Attribute Control Charts; 5.5 Deciding Which Chart to Use; 5.6 What Did We Learn?; 5.7 Test Your Knowledge; Exercises; 6 Advanced Control Charts; 6.1 CUSUM Control Chart; 6.2 EWMA Control Chart; 6.3 CV Control Chart; 6.4 Nonparametric Control Charts; 6.5 Process Capability; 6.6 Gage R & R; 6.7 What Did We Learn?; 6.8 Test Your Knowledge; Exercises; 7 Process Improvement; 7.1 Correlation Analysis; 7.2 Regression Analysis; 7.3 Experimental Design 7.4 Overview of Experimental Design7.5 Principles of Experimentation; 7.6 One-Way Analysis of Variance; 7.7 Two Way Analysis of Variance; 7.8 Two-level Factorial Design Analysis; 7.9 What Did We Learn?; 7.10 Test Your Knowledge; Exercises; 8 End Material; 8.1 Final Exam; 8.2 Final Exam Solutions; 8.3 Test Your Knowledge: Answers; References; Glossary; Subject Index |
| Record Nr. | UNINA-9910877538903321 |
|
Kang Chang W (Chang Wok), <1957->
|
||
| Hoboken, N.J., : Wiley, 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Concepts for R&R studies / / Larry B. Barrentine
| Concepts for R&R studies / / Larry B. Barrentine |
| Autore | Barrentine Larry B. <1938-> |
| Edizione | [Second edition.] |
| Pubbl/distr/stampa | Milwaukee, Wisconsin : , : ASQ Quality Press, , 2003 |
| Descrizione fisica | 1 online resource (74 p.) |
| Disciplina | 658.5/62/015195 |
| Soggetto topico |
Quality control - Statistical methods
Process control - Statistical methods Measurement |
| Soggetto genere / forma | Electronic books. |
| ISBN | 600-00-4715-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910463101703321 |
|
Barrentine Larry B. <1938->
|
||
| Milwaukee, Wisconsin : , : ASQ Quality Press, , 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Determining and assessing process capability for engineers and manufacturing [[electronic resource] /] / Fred Spiring
| Determining and assessing process capability for engineers and manufacturing [[electronic resource] /] / Fred Spiring |
| Autore | Spiring Fred |
| Pubbl/distr/stampa | New York, : Nova Science Publishers, c2010 |
| Descrizione fisica | 1 online resource (189 p.) |
| Disciplina | 658.5 |
| Collana | Quality control engineering and manufacturing |
| Soggetto topico |
Process control
Process control - Statistical methods Manufacturing processes |
| Soggetto genere / forma | Electronic books. |
| ISBN | 1-61209-900-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910465205103321 |
|
Spiring Fred
|
||
| New York, : Nova Science Publishers, c2010 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Determining and assessing process capability for engineers and manufacturing [[electronic resource] /] / Fred Spiring
| Determining and assessing process capability for engineers and manufacturing [[electronic resource] /] / Fred Spiring |
| Autore | Spiring Fred |
| Pubbl/distr/stampa | New York, : Nova Science Publishers, c2010 |
| Descrizione fisica | 1 online resource (189 p.) |
| Disciplina | 658.5 |
| Collana | Quality control engineering and manufacturing |
| Soggetto topico |
Process control
Process control - Statistical methods Manufacturing processes |
| ISBN | 1-61209-900-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910791817403321 |
|
Spiring Fred
|
||
| New York, : Nova Science Publishers, c2010 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Fundamentals of semiconductor manufacturing and process control / / Gary S. May, Costas J. Spanos
| Fundamentals of semiconductor manufacturing and process control / / Gary S. May, Costas J. Spanos |
| Autore | May Gary S. |
| Pubbl/distr/stampa | [Piscataway, New Jersey] : , : IEEE, , c2006 |
| Descrizione fisica | 1 online resource (485 p.) |
| Disciplina |
621.3815/2
621.38152 |
| Altri autori (Persone) | SpanosCostas J |
| Soggetto topico |
Semiconductors - Design and construction
Integrated circuits - Design and construction Process control - Statistical methods |
| ISBN |
1-280-45023-1
9786610450237 0-470-35916-1 0-471-79028-1 1-61583-845-7 0-471-79027-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction to semiconductor manufacturing -- Technology overview -- Process monitoring -- Statistical fundamentals -- Yield modeling -- Statistical process control -- Statistical experimental design -- Process modeling -- Advanced process control -- Process and equipment diagnosis. |
| Record Nr. | UNINA-9910143417603321 |
|
May Gary S.
|
||
| [Piscataway, New Jersey] : , : IEEE, , c2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Fundamentals of semiconductor manufacturing and process control / / Gary S. May, Costas J. Spanos
| Fundamentals of semiconductor manufacturing and process control / / Gary S. May, Costas J. Spanos |
| Autore | May Gary S. |
| Pubbl/distr/stampa | [Piscataway, New Jersey] : , : IEEE, , c2006 |
| Descrizione fisica | 1 online resource (485 p.) |
| Disciplina |
621.3815/2
621.38152 |
| Altri autori (Persone) | SpanosCostas J |
| Soggetto topico |
Semiconductors - Design and construction
Integrated circuits - Design and construction Process control - Statistical methods |
| ISBN |
1-280-45023-1
9786610450237 0-470-35916-1 0-471-79028-1 1-61583-845-7 0-471-79027-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction to semiconductor manufacturing -- Technology overview -- Process monitoring -- Statistical fundamentals -- Yield modeling -- Statistical process control -- Statistical experimental design -- Process modeling -- Advanced process control -- Process and equipment diagnosis. |
| Record Nr. | UNISA-996202373203316 |
|
May Gary S.
|
||
| [Piscataway, New Jersey] : , : IEEE, , c2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Fundamentals of semiconductor manufacturing and process control / / Gary S. May, Costas J. Spanos
| Fundamentals of semiconductor manufacturing and process control / / Gary S. May, Costas J. Spanos |
| Autore | May Gary S. |
| Pubbl/distr/stampa | [Piscataway, New Jersey] : , : IEEE, , c2006 |
| Descrizione fisica | 1 online resource (485 p.) |
| Disciplina |
621.3815/2
621.38152 |
| Altri autori (Persone) | SpanosCostas J |
| Soggetto topico |
Semiconductors - Design and construction
Integrated circuits - Design and construction Process control - Statistical methods |
| ISBN |
1-280-45023-1
9786610450237 0-470-35916-1 0-471-79028-1 1-61583-845-7 0-471-79027-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction to semiconductor manufacturing -- Technology overview -- Process monitoring -- Statistical fundamentals -- Yield modeling -- Statistical process control -- Statistical experimental design -- Process modeling -- Advanced process control -- Process and equipment diagnosis. |
| Record Nr. | UNINA-9910830857403321 |
|
May Gary S.
|
||
| [Piscataway, New Jersey] : , : IEEE, , c2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Fundamentals of semiconductor manufacturing and process control / / Gary S. May, Costas J. Spanos
| Fundamentals of semiconductor manufacturing and process control / / Gary S. May, Costas J. Spanos |
| Autore | May Gary S |
| Pubbl/distr/stampa | [Piscataway], : IEEE |
| Descrizione fisica | 1 online resource (485 p.) |
| Disciplina | 621.3815/2 |
| Altri autori (Persone) | SpanosCostas J |
| Soggetto topico |
Semiconductors - Design and construction
Integrated circuits - Design and construction Process control - Statistical methods |
| ISBN |
1-280-45023-1
9786610450237 0-470-35916-1 0-471-79028-1 1-61583-845-7 0-471-79027-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction to semiconductor manufacturing -- Technology overview -- Process monitoring -- Statistical fundamentals -- Yield modeling -- Statistical process control -- Statistical experimental design -- Process modeling -- Advanced process control -- Process and equipment diagnosis. |
| Record Nr. | UNINA-9910877792603321 |
|
May Gary S
|
||
| [Piscataway], : IEEE | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
