Info
Anionen-photodetachment-photoelektronen-spektroskopie als neuer, systematischer zugang zu dunklen, angeregten neutralzuständen / / Swen Siegert
| Anionen-photodetachment-photoelektronen-spektroskopie als neuer, systematischer zugang zu dunklen, angeregten neutralzuständen / / Swen Siegert |
| Autore | Siegert Swen |
| Pubbl/distr/stampa | Göttingen, [Germany] : , : Cuvillier Verlag, , 2011 |
| Descrizione fisica | 1 online resource (268 pages) : illustrations |
| Disciplina | 547.346 |
| Soggetto topico | Photoelectron spectroscopy |
| ISBN | 3-7369-3660-5 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | ger |
| Record Nr. | UNINA-9910794956103321 |
Siegert Swen
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| Göttingen, [Germany] : , : Cuvillier Verlag, , 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Anionen-photodetachment-photoelektronen-spektroskopie als neuer, systematischer zugang zu dunklen, angeregten neutralzuständen / / Swen Siegert
| Anionen-photodetachment-photoelektronen-spektroskopie als neuer, systematischer zugang zu dunklen, angeregten neutralzuständen / / Swen Siegert |
| Autore | Siegert Swen |
| Pubbl/distr/stampa | Göttingen, [Germany] : , : Cuvillier Verlag, , 2011 |
| Descrizione fisica | 1 online resource (268 pages) : illustrations |
| Disciplina | 547.346 |
| Soggetto topico | Photoelectron spectroscopy |
| ISBN | 3-7369-3660-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | ger |
| Record Nr. | UNINA-9910820800903321 |
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Siegert Swen
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| Göttingen, [Germany] : , : Cuvillier Verlag, , 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Chemistry characterization of jet aircraft engine particulate by XPS : results from APEX III / / Randy L. Vander Wal, Victoria M. Bryg
| Chemistry characterization of jet aircraft engine particulate by XPS : results from APEX III / / Randy L. Vander Wal, Victoria M. Bryg |
| Autore | Vander Wal R (Randy L.) |
| Pubbl/distr/stampa | Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , June 2014 |
| Descrizione fisica | 1 online resource (9 pages) : illustrations |
| Collana | NASA/CR |
| Soggetto topico |
Jet exhaust
Exhaust emission Carboxylic acids Carbonyl compounds Photoelectron spectroscopy X ray spectroscopy |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Chemistry characterization of jet aircraft engine particulate by XPS |
| Record Nr. | UNINA-9910702720803321 |
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Vander Wal R (Randy L.)
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| Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , June 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Ionization potential and appearance potential measurements, 1971-1981 [[electronic resource] /] / Rhoda D. Levin and Sharon G. Lias
| Ionization potential and appearance potential measurements, 1971-1981 [[electronic resource] /] / Rhoda D. Levin and Sharon G. Lias |
| Autore | Levin Rhoda D |
| Pubbl/distr/stampa | Washington, [D.C.] : , : U.S. Dept. of Commerce, National Bureau of Standards, , 1982 |
| Descrizione fisica | iv, 628 pages ; ; 28 cm |
| Altri autori (Persone) | LiasSharon G. <1935-> |
| Collana | NSRDS-NBS |
| Soggetto topico |
Photoelectron spectroscopy
Photoionization Ionization |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910697864103321 |
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Levin Rhoda D
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| Washington, [D.C.] : , : U.S. Dept. of Commerce, National Bureau of Standards, , 1982 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Modelling the dissociation dynamics and threshold photoelectron spectra of small halogenated molecules / / Jonelle Harvey
| Modelling the dissociation dynamics and threshold photoelectron spectra of small halogenated molecules / / Jonelle Harvey |
| Autore | Harvey Jonelle |
| Edizione | [1st ed. 2014.] |
| Pubbl/distr/stampa | Cham [Switzerland] : , : Springer, , 2014 |
| Descrizione fisica | 1 online resource (xiii, 174 pages) : illustrations (some color) |
| Disciplina | 539 |
| Collana | Springer Theses, Recognizing Outstanding Ph.D. Research |
| Soggetto topico |
Photoelectron spectroscopy
Dissociation Halocarbons |
| ISBN | 3-319-02976-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | From the Contents: Introduction -- Measuring the photoelectron signal -- The study of ionic dissociations -- Thermochemistry -- Experimental -- The synchrotron radiation source -- The endstation -- Capturing the electron signal -- The experimental results -- Theory -- Computational methods -- Modelling. |
| Record Nr. | UNINA-9910298637403321 |
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Harvey Jonelle
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| Cham [Switzerland] : , : Springer, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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NIST x-ray photoelectron spectroscopy (XPS) database / / C. D. Wagner
| NIST x-ray photoelectron spectroscopy (XPS) database / / C. D. Wagner |
| Autore | Wagner C. D |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1990 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | WagnerC. D |
| Collana | NIST technical note |
| Soggetto topico |
Electron spectroscopy
Photoelectron spectroscopy X-ray spectroscopy |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | NIST x-ray photoelectron spectroscopy |
| Record Nr. | UNINA-9910711215503321 |
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Wagner C. D
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1990 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Photoelectron spectroscopy : bulk and surface electronic structures / / Shigemasa Suga, Akira Sekiyama, Christian Tusche
| Photoelectron spectroscopy : bulk and surface electronic structures / / Shigemasa Suga, Akira Sekiyama, Christian Tusche |
| Autore | Suga Shigemasa |
| Edizione | [Second edition.] |
| Pubbl/distr/stampa | Cham, Switzerland : , : Springer, , [2021] |
| Descrizione fisica | 1 online resource (529 pages) |
| Disciplina | 543.0858 |
| Collana | Springer series in surface sciences |
| Soggetto topico | Photoelectron spectroscopy |
| ISBN | 3-030-64073-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Intro -- Preface -- Acknowledgements -- Contents -- About the Authors -- Acronyms -- Symbols -- 1 Introduction -- References -- 2 Theoretical Background -- 2.1 Photoemission Process as One of the Optical Processes -- 2.2 Three-Step Model -- 2.2.1 Introduction of Three-Step Model -- 2.2.2 Step-1: Photoexitations in Solids -- 2.2.3 Step-2: Travel of Photoelectrons to the Surface -- 2.2.4 Step-3: Emission of Photoelectrons into the Vacuum -- 2.3 Matrix Element Effects -- 2.3.1 Momentum Conservation Law for Valence-Band Excitations -- 2.3.2 Photoionization Cross-Sections (PICS) -- 2.3.3 Photoelectron Angular Distribution and Polarization Dependence -- 2.3.4 Polarization Dependence in Angle-Resolved Photoemission -- 2.3.5 Other Remarks -- 2.4 Valence-Band Photoexcitation Process for Non-interacting Systems -- 2.4.1 Koopmans' Theorem -- 2.4.2 Formulation of Angle-Integrated Photoemission for Non-interacting Systems -- 2.4.3 Formulation of Angle-Resolved Photoemission for Non-interacting Systems -- 2.5 Valence-Band Photoexcitation Process for Strongly Correlated Electrons Systems -- 2.5.1 Effects of Coulomb Repulsions -- 2.5.2 Formulations of ARPES Spectra of Strongly Correlated Electron Systems -- 2.5.3 Quasiparticles and Incoherent Part in the PES Spectra -- 2.5.4 Energy Scale of the Self-energy -- 2.6 Core-Level Photoexcitation Process for Strongly Correlated Electrons Systems -- 2.6.1 Core-Level PES Spectra Reflecting the Outer Strongly Correlated Electronic States -- 2.6.2 Formulations of Core-Level PES -- 2.6.3 Intra-atomic Multiplet Structure in the Core-Level PES Spectra -- 2.7 Theoretical Models to Describe the Spectra of Strongly Correlated Electron Systems -- 2.7.1 Overview -- 2.7.2 Periodic Anderson Model (PAM) and d-p Model -- 2.7.3 Single Impurity Anderson Model -- 2.7.4 Configuration-Interaction Cluster Model -- 2.7.5 Hubbard Model.
2.7.6 Dynamical Mean Field Theory -- 2.7.7 Some Remarks -- References -- 3 Instrumentation and Methodology -- 3.1 Synchrotron Radiation and Undulator Radiation -- 3.2 Principle of Grating and Crystal Monochromators -- 3.2.1 Grating Monochromators -- 3.2.2 Crystal Monochromators -- 3.2.3 Focusing Mirrors -- 3.3 Examples of Light Sources -- 3.3.1 High Resolution Vacuum Ultraviolet Synchrotron Radiation Beam Lines -- 3.3.2 High Resolution Soft X-ray Beam Lines -- 3.3.3 High Resolution Hard X-ray Beam Lines -- 3.3.4 Laboratory Vacuum Ultraviolet Sources -- 3.3.5 Laser Sources -- 3.3.6 Miscellaneous Subjects -- 3.4 Electron Spectrometers -- 3.4.1 Hemispherical Analyzers -- 3.4.2 Cylindrical Mirror Analyzers -- 3.4.3 Two-Dimensional Analyzers -- 3.4.4 Time-of-Flight Analyzers -- 3.5 Sample Preparation and Characterization -- 3.5.1 Ion Sputtering, Scraping, Fracturing and Cleavage -- 3.5.2 In-Situ Sample Growth and Surface Analysis -- 3.5.3 Samples at Low Temperatures or at Ambient Pressure -- 3.6 Methodology -- 3.6.1 Angle-Integrated Photoelectron Spectroscopy -- 3.6.2 Resonance Photoemission and Constant Initial State Spectrum -- 3.6.3 Angle-Resolved Photoelectron Spectroscopy -- 3.6.4 Photoelectron Spectroscopy in the μm and nm Regions -- 3.6.5 Momentum Microscope -- References -- 4 Bulk and Surface Sensitivity of Photoelectron Spectroscopy -- 4.1 Concept of Inelastic Mean Free Path -- 4.2 How to Separate the Bulk and Surface Contributions in the Spectra -- References -- 5 Examples of Angle-Integrated Photoelectron Spectroscopy -- 5.1 Valence Band Spectra -- 5.2 Core Level Spectra -- 5.3 Multiplet Structures -- References -- 6 Angle Resolved Photoelectron Spectroscopy in the hν Region of 15 to 200 eV -- 6.1 General -- 6.2 Layered Materials -- 6.3 Rare Earth Compounds -- 6.4 One Dimensional Materials -- 6.5 Topological Insulators -- 6.6 Superconductors. 6.7 Quantum Well States -- References -- 7 High-Resolution Soft X-ray Angle-Integrated and -Resolved Photoelectron Spectroscopy of Correlated Electron Systems -- 7.1 Angle-Integrated Soft X-ray Photoelectron Spectroscopy -- 7.1.1 Ce Compounds -- 7.1.2 Yb Compounds -- 7.1.3 Transition Metal Compounds -- 7.2 Angle-Resolved Soft X-ray Photoelectron Spectroscopy -- 7.2.1 Ce Compounds -- 7.2.2 La2−xSrxCuO4 and Nd2−xCexCuO4 -- 7.2.3 Layered Ruthenates Sr2−xCaxRuO4 -- 7.2.4 V6O13 and SrCuO2 -- 7.2.5 Other Materials (VSe2, LaRu2P2, BiTeI) -- 7.3 Standing Wave -- References -- 8 Hard X-ray Photoelectron Spectroscopy -- 8.1 La1−xSrxMnO3, La2−xSrxCuO4 and Nd2-xCexCuO4 -- 8.2 Sm Compounds -- 8.3 Pr Compounds -- 8.4 Yb Compounds -- 8.5 V Oxides -- 8.6 Recoil Effects -- 8.7 Angle-Resolved Hard X-ray Photoelectron Spectroscopy -- 8.8 Polarization Dependence of Hard X-ray Photoelectron Spectroscopy -- 8.9 Linear Dichroism in Angle-Resolved Core-Level Photoemission -- 8.9.1 Formulations and Simulations of Polarization-Dependent Angle-Resolved Core-Level Photoemission Spectra -- 8.9.2 Partially Filled 4f States Under Crystalline Electric Fields -- 8.9.3 Tetragonal and Cubic Yb Compounds -- 8.9.4 Tetragonal Sm Compounds -- 8.9.5 Cubic Pr Compounds -- 8.9.6 Tetragonal Ce Compounds -- References -- 9 Very Low Photon Energy Photoelectron Spectroscopy -- 9.1 Angle Integrated and Resolved ELEPES by Laser Excitation -- 9.1.1 Angle-Integrated Measurements -- 9.1.2 Angle-Resolved Measurements -- 9.2 ELEPES by Synchrotron Radiation -- 9.3 ELEPES by Microwave-Excited Rare Gas Lamp -- 9.4 Two-Photon Excitation Photoelectron Spectroscopy -- References -- 10 Magnetic Dichroism and Spin Polarization in Photoelectron Spectroscopy -- 10.1 Magnetic Circular and Linear Dichroism in Photoelectron Spectroscopy. 10.2 Principle and Instrumentation for Spin Polarized Photoelectron Spectroscopy -- 10.3 Spin Polarized Photoelectron Spectroscopy for Non-magnetic Materials -- 10.3.1 Pt -- 10.3.2 High-Tc Cuprate -- 10.3.3 Rashba Effect and Topological Insulators -- 10.4 Spin Polarized Photoelectron Spectroscopy of Magnetic Materials -- References -- 11 Momentum Microscopy -- 11.1 The Concept of Momentum Space Imaging -- 11.1.1 Instrumental Aspects -- 11.1.2 Energy and Momentum Resolution -- 11.2 Evolution and Applications of Momentum Microscopy -- 11.2.1 Fermi Surface Mapping with a High-Pass Energy Filter -- 11.2.2 Aberration Compensated Energy Filter -- 11.2.3 Electronic Structure of Noble Metals -- 11.2.4 High-Resolution Spectroscopy of Layered Semiconductors -- 11.2.5 Double-Pass Energy Filter -- 11.2.6 Other Dispersive Energy Filters -- 11.3 Time-of-Flight Momentum Microscopy -- 11.3.1 Time-of-Flight Electron Energy Analysis -- 11.3.2 Energy Resolution of a Time-of-Flight Spectrometer -- 11.3.3 Rapid Band Structure Mapping -- 11.3.4 Time-Resolved Spectroscopy -- 11.4 High-Energy Momentum Microscopy -- 11.4.1 Hard X-ray Photoemission Microscopy and Spectroscopy -- 11.4.2 Bulk Fermi Surface Tomography -- 11.5 Spin-Resolved Momentum Microscopy -- 11.5.1 Working Principle of Imaging Spin Filters -- 11.5.2 Properties of the Spin-Filter Crystal -- 11.5.3 Measurements Principles -- 11.5.4 Spin-Resolved ToF Momentum Microscopy -- 11.5.5 Imaging Complex Spin Textures -- 11.5.6 Electronic Structure of Ferromagnets -- 11.5.7 Efficiency of Multichannel Spin Filters -- 11.6 Spin-Resolved Photoelectron Microscopy -- 11.7 Laser Excited Momentum Microscopy -- 11.7.1 Spin Texture of Topological Insulators -- 11.7.2 Surface Doping Effects -- References -- 12 Photoelectron Diffraction and Photoelectron Holography -- References -- 13 Inverse Photoemission -- 13.1 General Concept. 13.2 Isochromat IPES -- 13.3 Angle-Resolved IPES -- 13.4 IPES with a Fixed Incident Electron Energy -- 13.5 IPES of Quantum Well States -- 13.6 Spin Polarized Inverse Photoemission Spectroscopy (SP-IPES) -- 13.6.1 Principle and Instrumentation -- 13.6.2 Several SP-IPES Studies -- References -- 14 Complementary Techniques for Studying Bulk Electronic States -- 14.1 Core Absorption Spectroscopy -- 14.2 Infrared and Far-Infrared Spectroscopy -- 14.3 Resonance Inelastic X-ray Scattering -- 14.4 Magneto Optical Studies: Core Absorption and Soft X-ray Resonance Inelastic Scattering -- References -- 15 Surface Spectroscopy by Scanning Tunneling Microscope -- 15.1 Scanning Tunneling Spectroscopy by Scanning Tunneling Microscope -- 15.2 Scanning Tunneling Spectroscopy and Momentum Microscopy of SmB6 -- References -- 16 Summary and Outlook -- 16.1 Bulk Sensitive Electronic Structure Investigation: HAXARPES -- 16.2 Advances of Photoelectron Analyzers for ARPES and Momentum Microscopy -- 16.3 Electronic Structure Investigation of Micro-Nano Regions -- 16.4 Investigation of Complex Spin Textures in k-Space -- 16.5 Miscellaneous -- 16.6 Outlook -- References -- List of Samples -- Index. |
| Record Nr. | UNINA-9910488693403321 |
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Suga Shigemasa
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| Cham, Switzerland : , : Springer, , [2021] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Photoemission in solids II / edited by L. Ley and M. Cardona
| Photoemission in solids II / edited by L. Ley and M. Cardona |
| Autore | Cardona, M. |
| Pubbl/distr/stampa | Berlin : Springer-Verlag, 1979 |
| Descrizione fisica | 2 v. : ill. ; 24 cm. |
| Altri autori (Persone) | Ley, L. |
| Soggetto topico |
Photoelectron spectroscopy
Photoemission Solids |
| Classificazione |
53.8.22
53.8.24 530.4'1 QC454 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991001144729707536 |
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Cardona, M.
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| Berlin : Springer-Verlag, 1979 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. del Salento | ||
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Photoemission spectroscopy on high temperature superconductor : a study of Bi2Sr2CaCu2O8 by laser-based angle-resolved photoemission / / Wentao Zhang
| Photoemission spectroscopy on high temperature superconductor : a study of Bi2Sr2CaCu2O8 by laser-based angle-resolved photoemission / / Wentao Zhang |
| Autore | Zhang Wentao |
| Edizione | [1st ed. 2013.] |
| Pubbl/distr/stampa | Berlin ; ; Heidelberg, : Springer, 2012, c2013 |
| Descrizione fisica | 1 online resource (146 p.) |
| Disciplina | 539.744 |
| Collana | Springer theses |
| Soggetto topico |
Photoelectron spectroscopy
Photoemission |
| ISBN |
1-283-91044-6
3-642-32472-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- Angle-Resolved Photoemission Spectroscopy -- Growth of Bi2Sr2Ca1−xDyxCu2O8+δ Single Crystals -- Nodal Electron Coupling in the Bi2Sr2Ca1Cu2O8+δ -- High Energy Dispersion in Bi2Sr2Ca1Cu2O8+δ -- Normal Electron Self-Energy and Pairing Self-Energy in Bi2Sr2CaCu2O8 -- Superconducting Gap and Pseudogap in Bi2Sr2CaCu2O8+δ -- Summary. |
| Record Nr. | UNINA-9910438107203321 |
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Zhang Wentao
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| Berlin ; ; Heidelberg, : Springer, 2012, c2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Polytetrafluoroethylene transfer film studied with X-ray photoelectron spectroscopy / / Donald R. Wheeler
| Polytetrafluoroethylene transfer film studied with X-ray photoelectron spectroscopy / / Donald R. Wheeler |
| Autore | Wheeler Donald R. |
| Pubbl/distr/stampa | [Washington, D.C.] : , : National Aeronautics and Space Administration, Scientific and Technical Information Branch, , November 1980 |
| Descrizione fisica | 1 online resource (8 pages) : illustrations |
| Collana | NASA technical paper |
| Soggetto topico |
Nickel
Polytetrafluoroethylene Ultrahigh vacuum Vacuum deposition X ray spectroscopy Photoelectron spectroscopy Polymerization Polymers |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910707470803321 |
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Wheeler Donald R.
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| [Washington, D.C.] : , : National Aeronautics and Space Administration, Scientific and Technical Information Branch, , November 1980 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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