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ANSI/IEEE Std C62.32-1981 : IEEE Standard Test Specifications for Low-Voltage Air Gap Surge-Protective Devices (Excluding Valve and Expulsion Type Devices) / / Surge Protective Devices Committee of the IEEE Power Engineering Society
| ANSI/IEEE Std C62.32-1981 : IEEE Standard Test Specifications for Low-Voltage Air Gap Surge-Protective Devices (Excluding Valve and Expulsion Type Devices) / / Surge Protective Devices Committee of the IEEE Power Engineering Society |
| Pubbl/distr/stampa | Piscataway, NJ : , : IEEE, , 1981 |
| Descrizione fisica | 1 online resource (17 pages) |
| Disciplina | 621.317 |
| Collana | ANSI/IEEE |
| Soggetto topico |
Electric apparatus and appliances - Protection
Transients (Electricity) - Standards Overvoltage |
| ISBN | 0-7381-0923-1 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
C62.32-1981 - IEEE Standard Test Specifications for Low-Voltage Air Gap Surge-Protective Devices
ANSI/IEEE Std C62.32-1981: IEEE Standard Test Specifications for Low-Voltage Air Gap Surge-Protective Devices (Excluding Valve and Expulsion Type Devices) ANSI/IEEE C62.32-1981 |
| Record Nr. | UNINA-9910439946003321 |
| Piscataway, NJ : , : IEEE, , 1981 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
ANSI/IEEE Std C62.32-1981 : IEEE Standard Test Specifications for Low-Voltage Air Gap Surge-Protective Devices (Excluding Valve and Expulsion Type Devices) / / Surge Protective Devices Committee of the IEEE Power Engineering Society
| ANSI/IEEE Std C62.32-1981 : IEEE Standard Test Specifications for Low-Voltage Air Gap Surge-Protective Devices (Excluding Valve and Expulsion Type Devices) / / Surge Protective Devices Committee of the IEEE Power Engineering Society |
| Pubbl/distr/stampa | Piscataway, NJ : , : IEEE, , 1981 |
| Descrizione fisica | 1 online resource (17 pages) |
| Disciplina | 621.317 |
| Collana | ANSI/IEEE |
| Soggetto topico |
Electric apparatus and appliances - Protection
Transients (Electricity) - Standards Overvoltage |
| ISBN | 0-7381-0923-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
C62.32-1981 - IEEE Standard Test Specifications for Low-Voltage Air Gap Surge-Protective Devices
ANSI/IEEE Std C62.32-1981: IEEE Standard Test Specifications for Low-Voltage Air Gap Surge-Protective Devices (Excluding Valve and Expulsion Type Devices) ANSI/IEEE C62.32-1981 |
| Record Nr. | UNISA-996279882203316 |
| Piscataway, NJ : , : IEEE, , 1981 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
ANSI/IEEE Std C62.41-1980 : IEEE Guide for Surge Voltages in Low-Voltage AC Power Circuits / / IEEE
| ANSI/IEEE Std C62.41-1980 : IEEE Guide for Surge Voltages in Low-Voltage AC Power Circuits / / IEEE |
| Pubbl/distr/stampa | Piscataway, NJ : , : IEEE, , 1981 |
| Descrizione fisica | 1 online resource (25 pages) |
| Disciplina | 621.317 |
| Soggetto topico |
Overvoltage
Electric circuits - Alternating current Electric currents, Alternating Transients (Electricity) - Standards |
| ISBN | 0-7381-4305-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | ANSI/IEEE Std C62.41-1980: IEEE Guide for Surge Voltages in Low-Voltage Ac Power Circuits |
| Record Nr. | UNINA-9910135767103321 |
| Piscataway, NJ : , : IEEE, , 1981 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
ANSI/IEEE Std C62.41-1980 : IEEE Guide for Surge Voltages in Low-Voltage AC Power Circuits / / IEEE
| ANSI/IEEE Std C62.41-1980 : IEEE Guide for Surge Voltages in Low-Voltage AC Power Circuits / / IEEE |
| Pubbl/distr/stampa | Piscataway, NJ : , : IEEE, , 1981 |
| Descrizione fisica | 1 online resource (25 pages) |
| Disciplina | 621.317 |
| Soggetto topico |
Overvoltage
Electric circuits - Alternating current Electric currents, Alternating Transients (Electricity) - Standards |
| ISBN | 0-7381-4305-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | ANSI/IEEE Std C62.41-1980: IEEE Guide for Surge Voltages in Low-Voltage Ac Power Circuits |
| Record Nr. | UNISA-996279556303316 |
| Piscataway, NJ : , : IEEE, , 1981 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Electrical overstress (EOS) [[electronic resource] ] : devices, circuits and systems / / Steven H. Voldman
| Electrical overstress (EOS) [[electronic resource] ] : devices, circuits and systems / / Steven H. Voldman |
| Autore | Voldman Steven H |
| Pubbl/distr/stampa | Chichester, West Sussex, U.K., : John Wiley & Sons Inc., 2014 |
| Descrizione fisica | 1 online resource (370 p.) |
| Disciplina | 621.3815 |
| Collana | ESD series |
| Soggetto topico |
Semiconductors - Failures
Semiconductors - Protection Transients (Electricity) Overvoltage |
| ISBN |
1-118-70333-2
1-118-70332-4 1-118-70334-0 |
| Classificazione | TEC008010 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Electrical Overstress (EOS): Devices, Circuits and Systems; Contents; About the Author; Preface; Acknowledgements; 1 Fundamentals of Electrical Overstress; 1.1 Electrical Overstress; 1.1.1 The Cost of Electrical Overstress; 1.1.2 Product Field Returns - The Percentage that is Electrical Overstress; 1.1.3 Product Field Returns - No Defect Found versus Electrical Overstress; 1.1.4 Product Failures - Failures in Integrated Circuits; 1.1.5 Classification of Electrical Overstress Events; 1.1.6 Electrical Over-Current; 1.1.7 Electrical Over-Voltage; 1.1.8 Electrical Over-Power
1.2 De-Mystifying Electrical Overstress1.2.1 Electrical Overstress Events; 1.3 Sources of Electrical Overstress; 1.3.1 Sources of Electrical Overstress in Manufacturing Environment; 1.3.2 Sources of Electrical Overstress in Production Environments; 1.4 Misconceptions of Electrical Overstress; 1.5 Minimization of Electrical Overstress Sources; 1.6 Mitigation of Electrical Overstress; 1.7 Signs of Electrical Overstress Damage; 1.7.1 Signs of Electrical Overstress Damage - The Electrical Signature; 1.7.2 Signs of Electrical Overstress Damage - The Visual Signature 1.8 Electrical Overstress and Electrostatic Discharge1.8.1 Comparison of High and Low Current EOS versus ESD Events; 1.8.2 Electrical Overstress and Electrostatic Discharge Differences; 1.8.3 Electrical Overstress and Electrostatic Discharge Similarities; 1.8.4 Comparison of EOS versus ESDWaveforms; 1.8.5 Comparison of EOS versus ESD Event Failure Damage; 1.9 Electromagnetic Interference; 1.9.1 Electrical Overstress Induced Electromagnetic Interference; 1.10 Electromagnetic Compatibility; 1.11 Thermal Over-Stress; 1.11.1 Electrical Overstress and Thermal Overstress 1.11.2 Temperature Dependent Electrical Overstress1.11.3 Electrical Overstress and Melting Temperature; 1.12 Reliability Technology Scaling; 1.12.1 Reliability Technology Scaling and the Reliability Bathtub Curve; 1.12.2 The Shrinking Reliability Design Box; 1.12.3 The Shrinking Electrostatic Discharge Design Box; 1.12.4 Application Voltage, Trigger Voltage, and Absolute Maximum Voltage; 1.13 Safe Operating Area; 1.13.1 Electrical Safe Operating Area; 1.13.2 Thermal Safe Operating Area; 1.13.3 Transient Safe Operating Area; 1.14 Summary and Closing Comments; References 2 Fundamentals of EOS Models2.1 Thermal Time Constants; 2.1.1 The Thermal Diffusion Time; 2.1.2 The Adiabatic Regime Time Constant; 2.1.3 The Thermal Diffusion Regime Time Constant; 2.1.4 The Steady State Regime Time Constant; 2.2 Pulse Event Time Constants; 2.2.1 The ESD HBM Pulse Time Constant; 2.2.2 The ESD MM Pulse Time Constant; 2.2.3 The ESD Charged Device Model Pulse Time Constant; 2.2.4 The ESD Pulse Time Constant - Transmission Line Pulse; 2.2.5 The ESD Pulse Time Constant - Very Fast Transmission Line Pulse; 2.2.6 The IEC 61000-4-2 Pulse Time Constant 2.2.7 The Cable Discharge Event Pulse Time Constant |
| Record Nr. | UNINA-9910139024303321 |
Voldman Steven H
|
||
| Chichester, West Sussex, U.K., : John Wiley & Sons Inc., 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Electrical overstress (EOS) : devices, circuits and systems / / Steven H. Voldman
| Electrical overstress (EOS) : devices, circuits and systems / / Steven H. Voldman |
| Autore | Voldman Steven H |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Chichester, West Sussex, U.K., : John Wiley & Sons Inc., 2014 |
| Descrizione fisica | 1 online resource (370 p.) |
| Disciplina | 621.3815 |
| Collana | ESD series |
| Soggetto topico |
Semiconductors - Failures
Semiconductors - Protection Transients (Electricity) Overvoltage |
| ISBN |
1-118-70333-2
1-118-70332-4 1-118-70334-0 |
| Classificazione | TEC008010 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Electrical Overstress (EOS): Devices, Circuits and Systems; Contents; About the Author; Preface; Acknowledgements; 1 Fundamentals of Electrical Overstress; 1.1 Electrical Overstress; 1.1.1 The Cost of Electrical Overstress; 1.1.2 Product Field Returns - The Percentage that is Electrical Overstress; 1.1.3 Product Field Returns - No Defect Found versus Electrical Overstress; 1.1.4 Product Failures - Failures in Integrated Circuits; 1.1.5 Classification of Electrical Overstress Events; 1.1.6 Electrical Over-Current; 1.1.7 Electrical Over-Voltage; 1.1.8 Electrical Over-Power
1.2 De-Mystifying Electrical Overstress1.2.1 Electrical Overstress Events; 1.3 Sources of Electrical Overstress; 1.3.1 Sources of Electrical Overstress in Manufacturing Environment; 1.3.2 Sources of Electrical Overstress in Production Environments; 1.4 Misconceptions of Electrical Overstress; 1.5 Minimization of Electrical Overstress Sources; 1.6 Mitigation of Electrical Overstress; 1.7 Signs of Electrical Overstress Damage; 1.7.1 Signs of Electrical Overstress Damage - The Electrical Signature; 1.7.2 Signs of Electrical Overstress Damage - The Visual Signature 1.8 Electrical Overstress and Electrostatic Discharge1.8.1 Comparison of High and Low Current EOS versus ESD Events; 1.8.2 Electrical Overstress and Electrostatic Discharge Differences; 1.8.3 Electrical Overstress and Electrostatic Discharge Similarities; 1.8.4 Comparison of EOS versus ESDWaveforms; 1.8.5 Comparison of EOS versus ESD Event Failure Damage; 1.9 Electromagnetic Interference; 1.9.1 Electrical Overstress Induced Electromagnetic Interference; 1.10 Electromagnetic Compatibility; 1.11 Thermal Over-Stress; 1.11.1 Electrical Overstress and Thermal Overstress 1.11.2 Temperature Dependent Electrical Overstress1.11.3 Electrical Overstress and Melting Temperature; 1.12 Reliability Technology Scaling; 1.12.1 Reliability Technology Scaling and the Reliability Bathtub Curve; 1.12.2 The Shrinking Reliability Design Box; 1.12.3 The Shrinking Electrostatic Discharge Design Box; 1.12.4 Application Voltage, Trigger Voltage, and Absolute Maximum Voltage; 1.13 Safe Operating Area; 1.13.1 Electrical Safe Operating Area; 1.13.2 Thermal Safe Operating Area; 1.13.3 Transient Safe Operating Area; 1.14 Summary and Closing Comments; References 2 Fundamentals of EOS Models2.1 Thermal Time Constants; 2.1.1 The Thermal Diffusion Time; 2.1.2 The Adiabatic Regime Time Constant; 2.1.3 The Thermal Diffusion Regime Time Constant; 2.1.4 The Steady State Regime Time Constant; 2.2 Pulse Event Time Constants; 2.2.1 The ESD HBM Pulse Time Constant; 2.2.2 The ESD MM Pulse Time Constant; 2.2.3 The ESD Charged Device Model Pulse Time Constant; 2.2.4 The ESD Pulse Time Constant - Transmission Line Pulse; 2.2.5 The ESD Pulse Time Constant - Very Fast Transmission Line Pulse; 2.2.6 The IEC 61000-4-2 Pulse Time Constant 2.2.7 The Cable Discharge Event Pulse Time Constant |
| Record Nr. | UNINA-9910810547003321 |
|
Voldman Steven H
|
||
| Chichester, West Sussex, U.K., : John Wiley & Sons Inc., 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Measurement and analysis of overvoltages in power systems / / by Jianming Li
| Measurement and analysis of overvoltages in power systems / / by Jianming Li |
| Autore | Li Jianming <1952-> |
| Pubbl/distr/stampa | Singapore : , : Wiley, , 2018 |
| Descrizione fisica | 1 online resource (364 pages) |
| Disciplina | 621.31/7 |
| Soggetto topico | Overvoltage |
| ISBN |
1-119-12904-4
1-119-12903-6 1-119-12905-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Overvoltage mechanism in power system -- Transducers for online overvoltage monitoring -- Online overvoltage monitoring system -- Wave process of incoming surges and transient response characteristics -- Typical field tests and waveform analysis in uhvdc transmission systems -- Overvoltage digital simulation -- Entity dynamic simulation of overvoltages on transmission lines -- Overvoltage pattern recognition in power system. |
| Record Nr. | UNINA-9910270929603321 |
|
Li Jianming <1952->
|
||
| Singapore : , : Wiley, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Measurement and analysis of overvoltages in power systems / / by Jianming Li
| Measurement and analysis of overvoltages in power systems / / by Jianming Li |
| Autore | Li Jianming <1952-> |
| Pubbl/distr/stampa | Singapore : , : Wiley, , 2018 |
| Descrizione fisica | 1 online resource (364 pages) |
| Disciplina | 621.31/7 |
| Soggetto topico | Overvoltage |
| ISBN |
1-119-12904-4
1-119-12903-6 1-119-12905-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Overvoltage mechanism in power system -- Transducers for online overvoltage monitoring -- Online overvoltage monitoring system -- Wave process of incoming surges and transient response characteristics -- Typical field tests and waveform analysis in uhvdc transmission systems -- Overvoltage digital simulation -- Entity dynamic simulation of overvoltages on transmission lines -- Overvoltage pattern recognition in power system. |
| Record Nr. | UNINA-9910821078103321 |
|
Li Jianming <1952->
|
||
| Singapore : , : Wiley, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
