The design of optical spectrometers / J. James, R.S. Sternberg
| The design of optical spectrometers / J. James, R.S. Sternberg |
| Autore | James, J. |
| Pubbl/distr/stampa | London : Chapman and Hall, 1969 |
| Descrizione fisica | xii, 239 p. : ill. ; 23 cm. |
| Altri autori (Persone) | Sternberg, R.S. |
| Soggetto topico | Optical spectrometers |
| Classificazione |
53.0.64
535'.84 QC33 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISALENTO-991000885779707536 |
James, J.
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| London : Chapman and Hall, 1969 | ||
| Lo trovi qui: Univ. del Salento | ||
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Scanning electron microscope optics and spectrometers [[electronic resource] /] / Anjam Khursheed
| Scanning electron microscope optics and spectrometers [[electronic resource] /] / Anjam Khursheed |
| Autore | Khursheed Anjam |
| Pubbl/distr/stampa | Singapore ; ; Hackensack, N.J., : World Scientific Pub. Co., 2011 |
| Descrizione fisica | 1 online resource (400 p.) |
| Disciplina | 681.413 |
| Soggetto topico |
Scanning electron microscopes
Optical spectrometers |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-283-14355-0
9786613143556 981-283-668-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Dedication; Preface; Contents; Chapter 1 Conventional SEM Design; Chapter 2 Spectrometer Design Principles; Chapter 3 In-lens Improvements; Chapter 4 Sub-nanometer Probe Diameters; Chapter 5 Secondary Electron Spectrometers; Chapter 6 Full Range Deflector Spectrometer Designs; Chapter 7 Full Range Parallel Energy Spectrometer Designs; Chapter 8 Spectroscopic SEM proposals; Appendix 1.0 Field Expansions; Appendix 1.1 Derivation of the Paraxial Equation; Appendix 1.2 Spherical Aberration; Appendix 1.3 Chromatic Aberration; Appendix 2 Multipole Lenses; Bibliography; Index |
| Record Nr. | UNINA-9910461623303321 |
Khursheed Anjam
|
||
| Singapore ; ; Hackensack, N.J., : World Scientific Pub. Co., 2011 | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Scanning electron microscope optics and spectrometers [[electronic resource] /] / Anjam Khursheed
| Scanning electron microscope optics and spectrometers [[electronic resource] /] / Anjam Khursheed |
| Autore | Khursheed Anjam |
| Pubbl/distr/stampa | Singapore ; ; Hackensack, N.J., : World Scientific Pub. Co., 2011 |
| Descrizione fisica | 1 online resource (400 p.) |
| Disciplina | 681.413 |
| Soggetto topico |
Scanning electron microscopes
Optical spectrometers |
| ISBN |
1-283-14355-0
9786613143556 981-283-668-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Dedication; Preface; Contents; Chapter 1 Conventional SEM Design; Chapter 2 Spectrometer Design Principles; Chapter 3 In-lens Improvements; Chapter 4 Sub-nanometer Probe Diameters; Chapter 5 Secondary Electron Spectrometers; Chapter 6 Full Range Deflector Spectrometer Designs; Chapter 7 Full Range Parallel Energy Spectrometer Designs; Chapter 8 Spectroscopic SEM proposals; Appendix 1.0 Field Expansions; Appendix 1.1 Derivation of the Paraxial Equation; Appendix 1.2 Spherical Aberration; Appendix 1.3 Chromatic Aberration; Appendix 2 Multipole Lenses; Bibliography; Index |
| Record Nr. | UNINA-9910789407403321 |
Khursheed Anjam
|
||
| Singapore ; ; Hackensack, N.J., : World Scientific Pub. Co., 2011 | ||
| Lo trovi qui: Univ. Federico II | ||
| ||