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2000 digest of the LEOS Summer Topical Meetings : electronic-enhanced optics, optical sensing in semiconductor manufacturing, electro-optics in space, broadband optical networks, 24-28 July, 2000, Turnberry Isle Resort & Club, Aventura, FL
2000 digest of the LEOS Summer Topical Meetings : electronic-enhanced optics, optical sensing in semiconductor manufacturing, electro-optics in space, broadband optical networks, 24-28 July, 2000, Turnberry Isle Resort & Club, Aventura, FL
Pubbl/distr/stampa [Place of publication not identified], : IEEE, 2000
Disciplina 621.381/045
Soggetto topico Optical instruments - Design and construction - Equipment and supplies
Optical communications
Optoelectronic devices
Broadband communication systems
Semiconductors
Engineering & Applied Sciences
Applied Physics
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996217149703316
[Place of publication not identified], : IEEE, 2000
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
2000 digest of the LEOS Summer Topical Meetings : electronic-enhanced optics, optical sensing in semiconductor manufacturing, electro-optics in space, broadband optical networks, 24-28 July, 2000, Turnberry Isle Resort & Club, Aventura, FL
2000 digest of the LEOS Summer Topical Meetings : electronic-enhanced optics, optical sensing in semiconductor manufacturing, electro-optics in space, broadband optical networks, 24-28 July, 2000, Turnberry Isle Resort & Club, Aventura, FL
Pubbl/distr/stampa [Place of publication not identified], : IEEE, 2000
Disciplina 621.381/045
Soggetto topico Optical instruments - Design and construction - Equipment and supplies
Optical communications
Optoelectronic devices
Broadband communication systems
Semiconductors
Engineering & Applied Sciences
Applied Physics
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910872518603321
[Place of publication not identified], : IEEE, 2000
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui