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2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale : 13-17 August 2018, Hangzhou, China / / Institute of Electrical and Electronics Engineers
| 2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale : 13-17 August 2018, Hangzhou, China / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (344 pages) |
| Disciplina | 620.5 |
| Soggetto topico |
Nanotechnology
Nanomanufacturing Nanostructured materials - Measurement |
| ISBN | 1-5386-6214-0 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996280353903316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale : 13-17 August 2018, Hangzhou, China / / Institute of Electrical and Electronics Engineers
| 2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale : 13-17 August 2018, Hangzhou, China / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (344 pages) |
| Disciplina | 620.5 |
| Soggetto topico |
Nanotechnology
Nanomanufacturing Nanostructured materials - Measurement |
| ISBN | 1-5386-6214-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910295657503321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
3M-NANO : 2017 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale : 7-11 August 2017
| 3M-NANO : 2017 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale : 7-11 August 2017 |
| Pubbl/distr/stampa | New York : , : IEEE, , 2018 |
| Descrizione fisica | 1 online resource (289 pages) |
| Soggetto topico |
Nanotechnology
Nanomanufacturing Nanostructured materials - Measurement |
| ISBN | 1-5386-1081-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996280257803316 |
| New York : , : IEEE, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
3M-NANO : 2017 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale : 7-11 August 2017
| 3M-NANO : 2017 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale : 7-11 August 2017 |
| Pubbl/distr/stampa | New York : , : IEEE, , 2018 |
| Descrizione fisica | 1 online resource (289 pages) |
| Soggetto topico |
Nanotechnology
Nanomanufacturing Nanostructured materials - Measurement |
| ISBN | 1-5386-1081-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910258256403321 |
| New York : , : IEEE, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
3M-NANO : 2014 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale : 27-31 October 2014
| 3M-NANO : 2014 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale : 27-31 October 2014 |
| Pubbl/distr/stampa | New York : , : IEEE, , 2015 |
| Descrizione fisica | 1 online resource (304 pages) |
| Soggetto topico |
Nanomanufacturing
Nanotechnology Nanostructured materials - Measurement |
| ISBN | 1-4799-7923-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996280307103316 |
| New York : , : IEEE, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
3M-NANO : 2014 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale : 27-31 October 2014
| 3M-NANO : 2014 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale : 27-31 October 2014 |
| Pubbl/distr/stampa | New York : , : IEEE, , 2015 |
| Descrizione fisica | 1 online resource (304 pages) |
| Soggetto topico |
Nanomanufacturing
Nanotechnology Nanostructured materials - Measurement |
| ISBN | 1-4799-7923-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910135186903321 |
| New York : , : IEEE, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Measurement issues in single wall carbon nanotubes [[electronic resource] /] / edited by Stephen Freiman ... [and others]
| Measurement issues in single wall carbon nanotubes [[electronic resource] /] / edited by Stephen Freiman ... [and others] |
| Pubbl/distr/stampa | Gaithersburg, Md. : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , [2008] |
| Descrizione fisica | 1 online resource (vi, 72 pages) : illustrations (some color) |
| Altri autori (Persone) | FreimanS. W |
| Collana |
NIST special publication
NIST recommended practice guide |
| Soggetto topico |
Nanotubes - Measurement
Nanostructured materials - Measurement |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910699290803321 |
| Gaithersburg, Md. : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , [2008] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Nanomaterial composites for next generation water filters : cooperative research and development final report
| Nanomaterial composites for next generation water filters : cooperative research and development final report |
| Pubbl/distr/stampa | [Golden, Colo.] : , : National Renewable Energy Laboratory, , 2013 |
| Descrizione fisica | 1 online resource (2 pages) |
| Collana |
NREL/TP
CRADA report |
| Soggetto topico |
Nanostructured materials - Measurement
Water - Purification - Filtration |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Nanomaterial composites for next generation water filters |
| Record Nr. | UNINA-9910704616303321 |
| [Golden, Colo.] : , : National Renewable Energy Laboratory, , 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Nanoscale calibration standards and methods [[electronic resource] ] : dimensional and related measurements in the micro- and nanometer range / / edited by Günter Wilkening, Ludger Koenders
| Nanoscale calibration standards and methods [[electronic resource] ] : dimensional and related measurements in the micro- and nanometer range / / edited by Günter Wilkening, Ludger Koenders |
| Pubbl/distr/stampa | Weinheim ; ; [Chichester?], : Wiley-VCH, c2005 |
| Descrizione fisica | 1 online resource (543 p.) |
| Disciplina | 620.50287 |
| Altri autori (Persone) |
KoendersLudger
WilkeningGünter |
| Soggetto topico |
Microstructure - Measurement
Nanostructured materials - Measurement Scientific apparatus and instruments - Calibration Stereology |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-280-85401-4
9786610854011 3-527-60666-1 3-527-60687-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Nanoscale Calibration Standards and Methods; Contents; List of Contributors; Part I Instrumentation - Overview; 1 Metrological Scanning Probe Microscopes - Instruments for Dimensional Nanometrology; 1.1 Introduction; 1.2 High-Resolution Probing Systems; 1.2.1 Sensor Objective with Beam Deflection Detection; 1.2.2 Sensor Objective with Piezolever Module; 1.2.3 Sensor Objective with Tuning Fork Module; 1.2.4 Sensor Head for Combined Scanning Probe and Interference Microscopy; 1.3 Metrology Systems Based on Scanning Probe Microscopes; 1.3.1 Scanning Force Microscopes of Type Veritekt
1.3.2 Metrological Large Range Scanning Force Microscope1.4 Summary; Acknowledgments; References; 2 Nanometrology at the IMGC; 2.1 Introduction; 2.2 Surface Metrology; 2.2.1 Scanning Probe Microscopy; 2.2.2 Optical Diffractometry; 2.2.3 Stylus Profilometry; 2.3 Atomic Scale Metrology; 2.3.1 Lattice Parameter of Silicon; 2.3.2 Combined Optical and X-Ray Interferometry (COXI); 2.4 Phase-Contrast Topograpy; 2.4.1 Detection of Small Lattice Strain; 2.4.2 Phase-Contrast Imaging; 2.5 Nanobalance; 2.6 Conclusions; References; 3 Metrological Applications of X-ray Interferometry; 3.1 Introduction 3.2 Measurement of Non-linearity in Optical Interferometers3.3 Combined Optical and X-ray Interferometry; 3.4 Measurement of Small Angles; 3.5 X-ray Interferometry and Scanning Probe Microscopy; 3.6 Conclusions; References; Part II Instrumentation - Long-range Scanning Probe Microscopes; 4 Advances in Traceable Nanometrology with the Nanopositioning and Nanomeasuring Machine; 4.1 Introduction; 4.2 Design and Operation; 4.3 Uncertainty Budget; 4.4 Focus Sensor; 4.5 Measuring Opportunities and Performance with Focus Sensor; 4.6 Focus Probe with SFM Cantilever; 4.7 Conclusion; Acknowledgements References5 Coordinate Measurements in Microsystems by Using AFM-Probing: Problems and Solutions; 5.1 Introduction; 5.2 Realizing CMMs for Microsystems; 5.3 Problems and Solutions; 5.3.1 Dynamics of Positioning System; 5.3.2 CMM: One-Millimeter Scan; 5.3.3 Measuring Strategies; 5.4 Conclusion and Outlook; References; 6 Metrological Large Range Scanning Force Microscope Applicable for Traceable Calibration of Surface Textures; 6.1 Introduction; 6.2 Instrumentation; 6.2.1 Principle; 6.2.2 Metrological Properties; 6.2.3 Traceability; 6.2.4 Specially Designed Features 6.3 Measurement Result of a 2D-Grating Standard6.3.1 Measurement Strategy; 6.3.2 Data Evaluation; 6.3.3 Measurement Result of the Mean Pitch Value; 6.3.4 Measurement of the Local Pitch Variation; 6.4 A Selected Measurement Result of a Microroughness Standard; 6.4.1 Measurement Result of a Glass Flatness Standard; 6.4.2 Measurement of a PTB Microroughness Standard; 6.4.3 Comparison of the Roughness Measurement Results Derived from SFM and Stylus Instruments Using Gaussian Filter; 6.4.4 Comparison Using Morphological Filters; 6.4.5 Evaluation Results Using PTB Reference Software 6.5 Outlook and Conclusion |
| Record Nr. | UNINA-9910144578403321 |
| Weinheim ; ; [Chichester?], : Wiley-VCH, c2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Nanoscale calibration standards and methods [[electronic resource] ] : dimensional and related measurements in the micro- and nanometer range / / edited by Günter Wilkening, Ludger Koenders
| Nanoscale calibration standards and methods [[electronic resource] ] : dimensional and related measurements in the micro- and nanometer range / / edited by Günter Wilkening, Ludger Koenders |
| Pubbl/distr/stampa | Weinheim ; ; [Chichester?], : Wiley-VCH, c2005 |
| Descrizione fisica | 1 online resource (543 p.) |
| Disciplina | 620.50287 |
| Altri autori (Persone) |
KoendersLudger
WilkeningGünter |
| Soggetto topico |
Microstructure - Measurement
Nanostructured materials - Measurement Scientific apparatus and instruments - Calibration Stereology |
| ISBN |
1-280-85401-4
9786610854011 3-527-60666-1 3-527-60687-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Nanoscale Calibration Standards and Methods; Contents; List of Contributors; Part I Instrumentation - Overview; 1 Metrological Scanning Probe Microscopes - Instruments for Dimensional Nanometrology; 1.1 Introduction; 1.2 High-Resolution Probing Systems; 1.2.1 Sensor Objective with Beam Deflection Detection; 1.2.2 Sensor Objective with Piezolever Module; 1.2.3 Sensor Objective with Tuning Fork Module; 1.2.4 Sensor Head for Combined Scanning Probe and Interference Microscopy; 1.3 Metrology Systems Based on Scanning Probe Microscopes; 1.3.1 Scanning Force Microscopes of Type Veritekt
1.3.2 Metrological Large Range Scanning Force Microscope1.4 Summary; Acknowledgments; References; 2 Nanometrology at the IMGC; 2.1 Introduction; 2.2 Surface Metrology; 2.2.1 Scanning Probe Microscopy; 2.2.2 Optical Diffractometry; 2.2.3 Stylus Profilometry; 2.3 Atomic Scale Metrology; 2.3.1 Lattice Parameter of Silicon; 2.3.2 Combined Optical and X-Ray Interferometry (COXI); 2.4 Phase-Contrast Topograpy; 2.4.1 Detection of Small Lattice Strain; 2.4.2 Phase-Contrast Imaging; 2.5 Nanobalance; 2.6 Conclusions; References; 3 Metrological Applications of X-ray Interferometry; 3.1 Introduction 3.2 Measurement of Non-linearity in Optical Interferometers3.3 Combined Optical and X-ray Interferometry; 3.4 Measurement of Small Angles; 3.5 X-ray Interferometry and Scanning Probe Microscopy; 3.6 Conclusions; References; Part II Instrumentation - Long-range Scanning Probe Microscopes; 4 Advances in Traceable Nanometrology with the Nanopositioning and Nanomeasuring Machine; 4.1 Introduction; 4.2 Design and Operation; 4.3 Uncertainty Budget; 4.4 Focus Sensor; 4.5 Measuring Opportunities and Performance with Focus Sensor; 4.6 Focus Probe with SFM Cantilever; 4.7 Conclusion; Acknowledgements References5 Coordinate Measurements in Microsystems by Using AFM-Probing: Problems and Solutions; 5.1 Introduction; 5.2 Realizing CMMs for Microsystems; 5.3 Problems and Solutions; 5.3.1 Dynamics of Positioning System; 5.3.2 CMM: One-Millimeter Scan; 5.3.3 Measuring Strategies; 5.4 Conclusion and Outlook; References; 6 Metrological Large Range Scanning Force Microscope Applicable for Traceable Calibration of Surface Textures; 6.1 Introduction; 6.2 Instrumentation; 6.2.1 Principle; 6.2.2 Metrological Properties; 6.2.3 Traceability; 6.2.4 Specially Designed Features 6.3 Measurement Result of a 2D-Grating Standard6.3.1 Measurement Strategy; 6.3.2 Data Evaluation; 6.3.3 Measurement Result of the Mean Pitch Value; 6.3.4 Measurement of the Local Pitch Variation; 6.4 A Selected Measurement Result of a Microroughness Standard; 6.4.1 Measurement Result of a Glass Flatness Standard; 6.4.2 Measurement of a PTB Microroughness Standard; 6.4.3 Comparison of the Roughness Measurement Results Derived from SFM and Stylus Instruments Using Gaussian Filter; 6.4.4 Comparison Using Morphological Filters; 6.4.5 Evaluation Results Using PTB Reference Software 6.5 Outlook and Conclusion |
| Record Nr. | UNINA-9910830318003321 |
| Weinheim ; ; [Chichester?], : Wiley-VCH, c2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
