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Advancements in Optical Methods, Digital Image Correlation & Micro-and Nanomechanics, Volume 4 : Proceedings of the 2022 Annual Conference on Experimental and Applied Mechanics / / edited by Ming-Tzer Lin, Cosme Furlong, Chi-Hung Hwang, Mohammad Naraghi, Frank DelRio
Advancements in Optical Methods, Digital Image Correlation & Micro-and Nanomechanics, Volume 4 : Proceedings of the 2022 Annual Conference on Experimental and Applied Mechanics / / edited by Ming-Tzer Lin, Cosme Furlong, Chi-Hung Hwang, Mohammad Naraghi, Frank DelRio
Edizione [1st ed. 2023.]
Pubbl/distr/stampa Cham : , : Springer International Publishing : , : Imprint : Springer, , 2023
Descrizione fisica 1 online resource (83 pages)
Disciplina 003
621.36
Collana Conference Proceedings of the Society for Experimental Mechanics Series
Soggetto topico Materials - Analysis
Signal processing
Mechanics, Applied
Nanotechnology
Materials Characterization Technique
Signal, Speech and Image Processing
Engineering Mechanics
Nanometrology
ISBN 87-438-0404-7
87-438-0036-X
3-031-17471-2
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Innovations in Super Resolution Microscopy -- Measuring Strain Distribution Around Inclusions and Matrix Interface Using Global Digital Image Correlation -- Evaluation of Stress State and Fracture Strain of High-Strength Steel Using Stereo Image Correction -- Bistability and Irregular Oscillations in Pairs of Opto-thermal Micro-oscillators -- Noninvasive Shape Measurements by MEMS-based Fringe Projection with Application to Middle-ear Mechanics -- High-Speed Optical Extensometer for Uniaxial Kolsky Bar Experiments -- On the Miura Ori Modal Response: A Look Throughout the Experimental Side -- Using Digital Image Correlation to Characterize the Static and Dynamic Behavior of Structures: Industrial Applications and Lessons Learned -- Enabling Digital Image Correlation with High-Resolution Microscopic Optics via Working Distance Automation: Advancing Resolution and Accuracy Limits -- Characterization of Bioengineered Tissues by Digital Holographic Vibrometry and 3D Shape Deep Learning -- CoordinatedTwinning Bands in Magnesium at the Existence of Stress Raisers via in situ Microscopic Image Correlation -- Determining the Onset of Transverse Cracking in a Woven Composite using Digital Image Correlation.
Record Nr. UNINA-9910659477903321
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2023
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Advances in Metrology : Select Proceedings of AdMet 2024 / / edited by Sanjay Yadav, Naveen Garg, Mukesh Kumar, Shankar G. Aggarwal, Shiv Kumar Jaiswal, Manoj Kumar
Advances in Metrology : Select Proceedings of AdMet 2024 / / edited by Sanjay Yadav, Naveen Garg, Mukesh Kumar, Shankar G. Aggarwal, Shiv Kumar Jaiswal, Manoj Kumar
Autore Yadav Sanjay
Edizione [1st ed. 2025.]
Pubbl/distr/stampa Singapore : , : Springer Nature Singapore : , : Imprint : Springer, , 2025
Descrizione fisica 1 online resource (338 pages)
Disciplina 539
530.8
Altri autori (Persone) GargNaveen
KumarMukesh
AggarwalShankar G
JaiswalShiv Kumar
KumarManoj
Collana Lecture Notes in Mechanical Engineering
Soggetto topico Atoms
Metrology
Measurement
Measuring instruments
Optical measurements
Nanotechnology
Metrology and Fundamental Constants
Measurement Science and Instrumentation
Optical Metrology
Nanometrology
ISBN 981-9664-18-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Progress towards the measurement of low differential pressure by using twin-piston pressure balance in hydraulic mode -- Analysis of Source and Source Region of Coarse Mode Aerosol (PM10) in Varanasi, India -- A review on microplastics in indoor environments: Techniques for measurement and environmental implications -- Evaluating the Stratum 1 NTP Server Performance at CSIR – NPL for Nation-Wide Time Synchronization -- Data acquisition and remote monitoring of critical parameters of Primary Frequency Standard.
Record Nr. UNINA-9911022454803321
Yadav Sanjay  
Singapore : , : Springer Nature Singapore : , : Imprint : Springer, , 2025
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Handbook of Metrology and Applications / / edited by Dinesh K. Aswal, Sanjay Yadav, Toshiyuki Takatsuji, Prem Rachakonda, Harish Kumar
Handbook of Metrology and Applications / / edited by Dinesh K. Aswal, Sanjay Yadav, Toshiyuki Takatsuji, Prem Rachakonda, Harish Kumar
Autore Aswal Dinesh K
Edizione [1st ed. 2023.]
Pubbl/distr/stampa Singapore : , : Springer Nature Singapore : , : Imprint : Springer, , 2023
Descrizione fisica 1 online resource (2504 pages)
Disciplina 530.8
Altri autori (Persone) YadavSanjay
TakatsujiToshiyuki
RachakondaPrem
KumarHarish
Soggetto topico Atoms
Metrology
Measurement
Measuring instruments
Nanotechnology
Metrology and Fundamental Constants
Measurement Science and Instrumentation
Nanometrology
ISBN 9789819920747
9819920744
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto International and National Metrology: Evolution -- Quantum Redefinition of Mass: The State of the Art -- Optical Frequency Comb: A Novel Ruler of Light for Realization of SI Unit Meter -- Realization of Candela: Past, Present and Future -- Time and Frequency Metrology: An Introduction -- Precise time transfer techniques - Part I: Telephone, LWR and Network -- Precise Time and Frequency Transfer: Techniques -- Two Way Satellite Time and Frequency Transfer -- Certified Reference Materials (CRMs): An Introduction -- Bharatiya Nirdeshak Dravya for Antibiotics and Pesticide: Reference materials for food analysis -- Alloys as Certified Reference Materials (CRMs): Ferrous & Non-Ferrous in Global Perspectives – A Review -- CRMs: Ensuring the Quality of Cement and Building Materials for Civil Infrastructure -- Petroleum-Based Indian Reference Materials (BND): Production and Dissemination -- Industrial Metrology: Introduction -- Pressure and Its Measurement: An Introduction -- Artificial Intelligence Implementation and Obstacles in Industry 4.0 -- Additive Manufacturing Metrology: Challenges -- Soft Metrology: Concept and Challenges from Uncertainty Estimation -- Necessity of Anatomically Real Numerical Phantoms in Optical Metrology: A Study -- Microscopy Using Liquid Lenses for Industrial and Biological Applications -- Error analysis and uncertainty evaluation -- Antennas for mm-wave MIMO RADAR -- Design and Integration Challenges for Automotive Applications -- Environmental Metrology An introduction -- Measurements of Indoor Air Quality: Science and Applications -- Advancements in Measuring Cognition Using EEG and fNIRS A Survey -- Sanctity of Calibrations: Vital for the Export of Indian Products Vital for the Export of Indian Products -- Advanced Techniques in Evaluation of Measurement Uncertainty: A Prelude -- Evaluation and Analysis of Measurement Uncertainty: Methodologies, Implications and Future Prospects -- Application of Contemporary Techniques of Evaluation of Measurement Uncertainty in Pressure Transducer: A Case Study -- Redefined SI unit.
Record Nr. UNINA-9910742496303321
Aswal Dinesh K  
Singapore : , : Springer Nature Singapore : , : Imprint : Springer, , 2023
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Laser Desorption Ionization Mass Spectrometry Based on Nanophotonic Structure: From Material Design to Mechanistic Understanding / / by Moon-Ju Kim
Laser Desorption Ionization Mass Spectrometry Based on Nanophotonic Structure: From Material Design to Mechanistic Understanding / / by Moon-Ju Kim
Autore Kim Moon-Ju
Edizione [1st ed. 2023.]
Pubbl/distr/stampa Singapore : , : Springer Nature Singapore : , : Imprint : Springer, , 2023
Descrizione fisica 1 online resource (107 pages)
Disciplina 543.65
Collana Springer Theses, Recognizing Outstanding Ph.D. Research
Soggetto topico Mass spectrometry
Nanotechnology
Spectrum analysis
Mass Spectrometry
Nanoscale Design, Synthesis and Processing
Nanometrology
Spectroscopy
ISBN 9789819968787
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Introduction -- Backgrounds -- Synergistic Effect of the Hybrid of Au Nanoislands on TiO2 Nanowires (Au-TNW) in Laser Desorption and Ionization -- In Situ Surface Reconstruction-Driven Desorption and Ionization Enhancement in Nanoporous Au-modified TiO2 Nanowires Hybrid (npAu-TNW) -- Photothermal Structural Dynamics of Au Nanofurnace-Functionalized ZnO Nanotube (AuNI-ZNT) for In Situ Enhancement in Desorption and Ionization.
Record Nr. UNINA-9910751395803321
Kim Moon-Ju  
Singapore : , : Springer Nature Singapore : , : Imprint : Springer, , 2023
Materiale a stampa
Lo trovi qui: Univ. Federico II
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Metrology and Measurement Uncertainty : Concepts and Applications / / by Pedro Paulo Novellino do Rosario, Alexandre Mendes
Metrology and Measurement Uncertainty : Concepts and Applications / / by Pedro Paulo Novellino do Rosario, Alexandre Mendes
Autore Novellino do Rosario Pedro Paulo
Edizione [1st ed. 2025.]
Pubbl/distr/stampa Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2025
Descrizione fisica 1 online resource (XXIII, 325 p. 143 illus., 102 illus. in color.)
Disciplina 530.8
530.7
Soggetto topico Measurement
Measuring instruments
Atoms
Metrology
Optical measurements
Quantum theory
Nanotechnology
Measurement Science and Instrumentation
Metrology and Fundamental Constants
Optical Metrology
Quantum Measurement and Metrology
Nanometrology
ISBN 3-031-82303-6
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto International System of Units -- Knowing metrology and its international structure -- Statistics applied to metrology -- Measurement systems -- Evaluating of measure uncertainty in direct measurements -- Evaluating of measure uncertainty in indirect measurements -- Industrial calibration -- Measurement uncertainty and conformity assessment -- Critical analysis of calibration certificates.
Record Nr. UNINA-9911001466703321
Novellino do Rosario Pedro Paulo  
Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2025
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui