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Functional test results of a high power patch array antenna [[electronic resource] /] / by Canh Ly
| Functional test results of a high power patch array antenna [[electronic resource] /] / by Canh Ly |
| Autore | Ly Canh |
| Pubbl/distr/stampa | Adelphi, MD : , : Army Research Laboratory, , [2008] |
| Descrizione fisica | vi, 22 pages : digital, PDF file |
| Collana | ARL-TR |
| Soggetto topico |
Antenna arrays - Testing - Evaluation
Microwave devices - Testing Vibration - Testing |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910698177603321 |
Ly Canh
|
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| Adelphi, MD : , : Army Research Laboratory, , [2008] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Handbook of microwave component measurements : with advanced VNA techniques / / by Joel P. Dunsmore
| Handbook of microwave component measurements : with advanced VNA techniques / / by Joel P. Dunsmore |
| Autore | Dunsmore Joel P. |
| Edizione | [Second edition.] |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : John Wiley & Sons, Inc., , 2020 |
| Descrizione fisica | 1 online resource (837 pages) |
| Disciplina | 621.381330287 |
| Soggetto topico | Microwave devices - Testing |
| ISBN |
1-119-47712-3
1-119-47711-5 1-119-47716-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Foreword to the Second Edition xvii -- Foreword to the First Edition xix -- Preface to the Second Edition xxi -- Preface to the First Edition xxiii -- Acknowledgments for the Second Edition xxv -- Acknowledgments from the First Edition xxvii -- 1 Introduction to Microwave Measurements 1 -- 1.1 Modern Measurement Process 2 -- 1.2 A Practical Measurement Focus 3 -- 1.3 Definition of Microwave Parameters 3 -- 1.3.1 S-Parameter Primer 4 -- 1.3.2 Phase Response of Networks 11 -- 1.4 Power Parameters 13 -- 1.4.1 Incident and Reflected Power 13 -- 1.4.2 Available Power 13 -- 1.4.3 Delivered Power 14 -- 1.4.4 Power Available from a Network 14 -- 1.4.5 Available Gain 15 -- 1.5 Noise Figure and Noise Parameters 15 -- 1.5.1 Noise Temperature 16 -- 1.5.2 Effective or Excess Input Noise Temperature 17 -- 1.5.3 Excess Noise Power and Operating Temperature 17 -- 1.5.4 Noise Power Density 17 -- 1.5.5 Noise Parameters 18 -- 1.6 Distortion Parameters 19 -- 1.6.1 Harmonics 19 -- 1.6.2 Second-Order Intercept 19 -- 1.6.3 Two-Tone Intermodulation Distortion 20 -- 1.6.4 Adjacent Channel Power and Adjacent Channel Level Ratio 23 -- 1.6.5 Noise Power Ratio (NPR) 24 -- 1.6.6 Error Vector Magnitude (EVM) 25 -- 1.7 Characteristics of Microwave Components 26 -- 1.8 Passive Microwave Components 27 -- 1.8.1 Cables, Connectors, and Transmission Lines 27 -- 1.8.2 Connectors 31 -- 1.8.3 Non-coaxial Transmission Lines 44 -- 1.9 Filters 47 -- 1.10 Directional Couplers 49 -- 1.11 Circulators and Isolators 51 -- 1.12 Antennas 52 -- 1.13 PC Board Components 53 -- 1.13.1 SMT Resistors 53 -- 1.13.2 SMT Capacitors 56 -- 1.13.3 SMT Inductors 57 -- 1.13.4 PC Board Vias 57 -- 1.14 Active Microwave Components 58 -- 1.14.1 Linear and Non-linear 58 -- 1.14.2 Amplifiers: System, Low-Noise, High Power 58 -- 1.14.3 Mixers and Frequency Converters 59 -- 1.14.4 Frequency Multiplier and Limiters and Dividers 61 -- 1.14.5 Oscillators 62 -- 1.15 Measurement Instrumentation 63 -- 1.15.1 Power Meters 63 -- 1.15.2 Signal Sources 64.
1.15.3 Spectrum Analyzers 65 -- 1.15.4 Vector Signal Analyzers 66 -- 1.15.5 Noise Figure Analyzers 67 -- 1.15.6 Network Analyzers 67 -- References 70 -- 2 VNA Measurement Systems 71 -- 2.1 Introduction 71 -- 2.2 VNA Block Diagrams 72 -- 2.2.1 VNA Source 73 -- 2.2.2 Understanding Source-Match 76 -- 2.2.3 VNA Test Set 82 -- 2.2.4 Directional Devices 85 -- 2.2.5 VNA Receivers 91 -- 2.2.6 IF and Data Processing 95 -- 2.2.7 Multiport VNAs 97 -- 2.2.8 High-Power Test Systems 104 -- 2.2.9 VNA with mm-Wave Extenders 105 -- 2.3 VNA Measurement of Linear Microwave Parameters 107 -- 2.3.1 Measurement Limitations of the VNA 107 -- 2.3.2 Limitations Due to External Components 111 -- 2.4 Measurements Derived from S-Parameters 112 -- 2.4.1 The Smith Chart 112 -- 2.4.2 Transforming S-Parameters to Other Impedances 117 -- 2.4.3 Concatenating Circuits and T-Parameters 118 -- 2.5 Modeling Circuits Using Y and Z Conversion 120 -- 2.5.1 Reflection Conversion 120 -- 2.5.2 Transmission Conversion 120 -- 2.6 Other Linear Parameters 121 -- 2.6.1 Z-Parameters, or Open-Circuit Impedance Parameters 122 -- 2.6.2 Y-Parameters, or Short-Circuit Admittance Parameters 123 -- 2.6.3 ABCD Parameters 124 -- 2.6.4 H-Parameters or Hybrid Parameters 125 -- 2.6.5 Complex Conversions and Non-equal Reference Impedances 126 -- References 126 -- 3 Calibration and Vector Error Correction 127 -- 3.1 Introduction 127 -- 3.1.1 Error Correction and Linear Measurement Methods for S-Parameters 128 -- 3.1.2 Power Measurements with a VNA 131 -- 3.2 Basic Error Correction for S-Parameters: Cal-Application 134 -- 3.2.1 12-Term Error Model 134 -- 3.2.2 1-Port Error Model 136 -- 3.2.3 8-Term Error Model 136 -- 3.3 Determining Error Terms: Cal-Acquisition for 12-Term Models 139 -- 3.3.1 1-Port Error Terms 139 -- 3.3.2 1-Port Standards 141 -- 3.3.3 2-Port Error Terms 148 -- 3.3.4 12-Term to 11-Term Error Model 153 -- 3.4 Determining Error Terms: Cal-Acquisition for 8-Term Models 153 -- 3.4.1 TRL Standards and Raw Measurements 153. 3.4.2 Special Cases for TRL Calibration 157 -- 3.4.3 Unknown Thru or SOLR (Reciprocal Thru Calibration) 158 -- 3.4.4 Applications of Unknown Thru Calibrations 159 -- 3.4.5 QSOLT Calibration 161 -- 3.4.6 Electronic Calibration (ECaĺó) or Automatic Calibration 162 -- 3.5 Waveguide Calibrations 166 -- 3.6 Calibration for Source Power 167 -- 3.6.1 Calibrating Source Power for Source Frequency Response 168 -- 3.6.2 Calibration for Power Sensor Mismatch 169 -- 3.6.3 Calibration for Source Power Linearity 171 -- 3.7 Calibration for Receiver Power 173 -- 3.7.1 Some Historical Perspective 173 -- 3.7.2 Modern Receiver Power Calibration 173 -- 3.7.3 Response Correction for the Transmission Test Receiver 178 -- 3.7.4 Power Waves vs. Actual Waves 181 -- 3.8 Calibrating Multiple Channels Simultaneously: Cal All 182 -- 3.9 Multiport Calibration Strategies 186 -- 3.9.1 N x 2-Port Calibrations: Switching Test Sets 186 -- 3.9.2 N-port Calibration: True Multiport 188 -- 3.10 Automatic In-Situ Calibrations: CalPod 191 -- 3.10.1 CalPod Initialization and Recorrection 192 -- 3.10.2 CalPod-as-Ecal 194 -- 3.11 Devolved Calibrations 194 -- 3.11.1 Response Calibrations 195 -- 3.11.2 Enhanced Response Calibration 196 -- 3.12 Determining Residual Errors 199 -- 3.12.1 Reflection Errors 199 -- 3.12.2 Using Airlines to Determine Residual Errors 199 -- 3.13 Computing Measurement Uncertainties 210 -- 3.13.1 Uncertainty in Reflection Measurements 210 -- 3.13.2 Uncertainty in Source Power 211 -- 3.13.3 Uncertainty in Measuring Power (Receiver Uncertainty) 212 -- 3.14 S21 or Transmission Uncertainty 212 -- 3.14.1 General Uncertainty Equation for S21 214 -- 3.14.2 Dynamic Uncertainty Computation 215 -- 3.15 Errors in Phase 218 -- 3.16 Practical Calibration Limitations 219 -- 3.16.1 Cable Flexure 220 -- 3.16.2 Changing Power after Calibration 221 -- 3.16.3 Compensating for Changes in Step Attenuators 223 -- 3.16.4 Connector Repeatability 225 -- 3.16.5 Noise Effects 226 -- 3.16.6 Drift: Short-Term and Long-Term 227. 3.16.7 Interpolation of Error Terms 229 -- 3.16.8 Calibration Quality: Electronic vs. Mechanical Kits 231 -- Reference 232 -- 4 Time-Domain Transforms 235 -- 4.1 Introduction 235 -- 4.2 The Fourier Transform 236 -- 4.2.1 The Continuous Fourier Transform 236 -- 4.2.2 Even and Odd Functions and the Fourier Transform 236 -- 4.2.3 Modulation (Shift) Theorem 237 -- 4.3 The Discrete Fourier Transform 238 -- 4.3.1 Fast Fourier Transform (FFT) and Inverse Fast Fourier Transform (IFFT) 238 -- 4.3.2 Discrete Fourier Transforms 240 -- 4.4 Fourier Transform (Analytic) vs. VNA Time Domain Transform 240 -- 4.4.1 Defining the Fourier Transform 241 -- 4.4.2 Effects of Discrete Sampling 242 -- 4.4.3 Effects of Truncated Frequency 244 -- 4.4.4 Windowing to Reduce Effects of Truncation 246 -- 4.4.5 Scaling and Renormalization 248 -- 4.5 Low-Pass Transforms 248 -- 4.5.1 Low-Pass Impulse Mode 248 -- 4.5.2 DC Extrapolation 249 -- 4.5.3 Low-Pass Step Mode 249 -- 4.5.4 Band-Pass Mode 251 -- 4.6 Time-Domain Gating 252 -- 4.6.1 Gating Loss and Renormalization 253 -- 4.7 Examples of Time-Domain Transforms of Various Networks 256 -- 4.7.1 Time-Domain Response of Changes in Line Impedance 256 -- 4.7.2 Time-Domain Response of Discrete Discontinuities 257 -- 4.7.3 Time-Domain Responses of Various Circuits 257 -- 4.8 The Effects of Masking and Gating on Measurement Accuracy 259 -- 4.8.1 Compensation for Changes in Line Impedance 259 -- 4.8.2 Compensation for Discrete Discontinuities 260 -- 4.8.3 Time-Domain Gating 260 -- 4.8.4 Estimating an Uncertainty Due to Masking 265 -- 4.9 Time-Domain Transmission Using VNA 265 -- 4.10 Conclusions 269 -- References 269 -- 5 Measuring Linear Passive Devices 271 -- 5.1 Transmission Lines, Cables, and Connectors 271 -- 5.1.1 Calibration for Low Loss Devices with Connectors 271 -- 5.1.2 Measuring Electrically Long Devices 273 -- 5.1.3 Attenuation Measurements 278 -- 5.1.4 Return Loss Measurements 295 -- 5.1.5 Cable Length and Delay 305 -- 5.2 Filters and Filter Measurements 306. 5.2.1 Filter Classes and Difficulties 306 -- 5.2.2 Duplexer and Diplexers 307 -- 5.2.3 Measuring Tunable High-Performance Filters 308 -- 5.2.4 Measuring Transmission Response 310 -- 5.2.5 High Speed vs. Dynamic Range 315 -- 5.2.6 Extremely High Dynamic Range Measurements 317 -- 5.2.7 Calibration Considerations 326 -- 5.3 Multiport Devices 327 -- 5.3.1 Differential Cables and Lines 328 -- 5.3.2 Couplers 328 -- 5.3.3 Hybrids, Splitters, and Dividers 331 -- 5.3.4 Circulators and Isolators 334 -- 5.4 Resonators 336 -- 5.4.1 Resonator Responses on a Smith Chart 336 -- 5.5 Antenna Measurements 338 -- 5.6 Conclusions 340 -- References 341 -- 6 Measuring Amplifiers 343 -- 6.1 Amplifiers as a Linear Devices 343 -- 6.1.1 Pretesting an Amplifier 344 -- 6.1.2 Optimizing VNA Settings for Calibration 346 -- 6.1.3 Calibration for Amplifier Measurements 347 -- 6.1.4 Amplifier Measurements 351 -- 6.1.5 Analysis of Amplifier Measurements 357 -- 6.1.6 Saving Amplifier Measurement Results 367 -- 6.2 Gain Compression Measurements 372 -- 6.2.1 Compression Definitions 372 -- 6.2.2 AM-to-PM or Phase Compression 376 -- 6.2.3 Swept Frequency Gain and Phase Compression 377 -- 6.2.4 Gain Compression Application, Smart Sweep, and Safe-Sweep Mode 378 -- 6.3 Measuring High-Gain Amplifiers 384 -- 6.3.1 Setup for High-Gain Amplifiers 386 -- 6.3.2 Calibration Considerations 386 -- 6.4 Measuring High-Power Amplifiers 389 -- 6.4.1 Configurations for Generating High Drive Power 389 -- 6.4.2 Configurations for Receiving High-Power 391 -- 6.4.3 Power Calibration and Pre/Post Leveling 393 -- 6.5 Making Pulsed-RF Measurements 394 -- 6.5.1 Wideband vs. Narrowband Measurements 395 -- 6.5.2 Pulse Profile Measurements 398 -- 6.5.3 Pulse-to-Pulse Measurements 401 -- 6.5.4 DC Measurements for Pulsed RF Stimulus 401 -- 6.6 Distortion Measurements 403 -- 6.6.1 Harmonic Measurements on Amplifiers 404 -- 6.7 Measuring Doherty Amplifiers 410 -- 6.8 X-Parameters, Load-Pull Measurements, Active Loads, and Hot S-Parameters 413. 6.8.1 Non-linear Responses and X-Parameters 414 -- 6.8.2 Load-Pull, Source-Pull, and Load Contours 417 -- 6.8.3 Hot S-Parameters and True Hot-S22 421 -- 6.9 Conclusions on Amplifier Measurements 433 -- References 434 -- 7 Mixer and Frequency Converter Measurements 435 -- 7.1 Mixer Characteristics 435 -- 7.1.1 Small Signal Model of Mixers 438 -- 7.1.2 Reciprocity in Mixers 442 -- 7.1.3 Scalar and Vector Responses 444 -- 7.2 Mixers vs. Frequency Converters 445 -- 7.2.1 Frequency Converter Design 446 -- 7.2.2 Multiple Conversions and Spur Avoidance 446 -- 7.3 Mixers as a 12-Port Device 448 -- 7.3.1 Mixer Conversion Terms 448 -- 7.4 Mixer Measurements: Frequency Response 451 -- 7.4.1 Introduction 451 -- 7.4.2 Amplitude Response 452 -- 7.4.3 Phase Response 456 -- 7.4.4 Group Delay and Modulation Methods 466 -- 7.4.5 Swept LO Measurements 469 -- 7.5 Calibration for Mixer Measurements 476 -- 7.5.1 Calibrating for Power 476 -- 7.5.2 Calibrating for Phase 479 -- 7.5.3 Determining the Phase and Delay of a Reciprocal Calibration Mixer 482 -- 7.6 Mixers Measurements vs. Drive Power 493 -- 7.6.1 Mixer Measurements vs. LO Drive 493 -- 7.6.2 Mixer Measurements vs. RF Drive Level 497 -- 7.7 TOI and Mixers 501 -- 7.7.1 IMD vs. LO Drive Power 502 -- 7.7.2 IMD vs. RF Power 502 -- 7.7.3 IMD vs. Frequency Response 505 -- 7.8 Noise Figure in Mixers and Converters 507 -- 7.9 Special Cases 507 -- 7.9.1 Mixers with RF or LO Multipliers 507 -- 7.9.2 Segmented Sweeps 509 -- 7.9.3 Measuring Higher-Order Products 509 -- 7.9.4 Mixers with an Embedded LO 515 -- 7.9.5 High-Gain and High-Power Converters 517 -- 7.10 I/Q Converters and Modulators 518 -- 7.11 Conclusions on Mixer Measurements 530 -- References 531 -- 8 Spectrum Analysis: Distortion and Modulation Measurements 533 -- 8.1 Spectrum Analysis in Vector Network Analyzers 534 -- 8.1.1 Spectrum Analysis Fundamentals 534 -- 8.1.2 SA Block Diagrams: Image Rejection: Hardware vs. Software 539 -- 8.1.3 Attributes of Repetitive Signals and Spectrum Measurements 546. 8.1.4 Coherent Spectrum Analysis 559 -- 8.1.5 Calibration of SA Results 568 -- 8.1.6 Two-Tone Measurements, IMD, and TOI Definition 571 -- 8.1.7 Measurement Techniques for Two-Tone TOI 574 -- 8.1.8 Swept IMD 576 -- 8.1.9 Optimizing Results 579 -- 8.1.10 Error Correction 582 -- 8.2 Distortion Measurement of Complex Modulated Signals 583 -- 8.2.1 Adjacent Power Measurements 584 -- 8.2.2 Noise Power Ratio (NPR) Measurements 587 -- 8.2.3 NPR Signal Quality and Correction 592 -- 8.2.4 EVM Derived from Distortion Measurements 596 -- 8.3 Measurements of Spurious Signals with VNA Spectrum Analyzer 605 -- 8.3.1 Spurious at Predictable Frequencies 605 -- 8.3.2 Multiport Mixer Spurious Measurements 607 -- 8.3.3 Spurious Oscillations 608 -- 8.4 Measurements of Pulsed Signals and Time-Gated Spectrum Analysis 611 -- 8.4.1 Understanding Pulsed Spectrum 611 -- 8.4.2 Time-Gated Spectrum Analysis 612 -- 8.5 Summary 615 -- Reference 615 -- 9 Measuring Noise Figure and Noise Power 617 -- 9.1 Noise-Figure Measurements for Amplifiers 617 -- 9.1.1 Definition of Noise Figure 618 -- 9.1.2 Noise-Power Measurements 619 -- 9.1.3 Computing Noise Figure from Noise Powers 623 -- 9.1.4 Computing DUT Noise Figure from Y-Factor Measurements 624 -- 9.1.5 Cold-Source Methods 626 -- 9.1.6 Noise Parameters 628 -- 9.1.7 Noise Parameter Measurement Results 634 -- 9.1.8 Error Correction in Noise Figure Measurements 637 -- 9.2 Active Antenna Noise-Figure Measurements (G/T) 638 -- 9.3 Noise Figure in Mixers and Converters 642 -- 9.3.1 Y-Factor Measurements on Mixers 642 -- 9.3.2 Cold-Source Measurements on Mixers 644 -- 9.4 Other Noise-Related Measurements 650 -- 9.4.1 Noise Power Measurements with a VNA Spectrum Analyzer 650 -- 9.4.2 Noise-Power Measurements 650 -- 9.4.3 Noise Figure Measurements Using Spectrum Analysis 653 -- 9.4.4 Carrier-to-Noise Measurements 654 -- 9.5 Uncertainty, Verification, and Improvement of Noise-Figure Measurements 655 -- 9.5.1 Uncertainty of Noise-Figure Measurements 655 -- 9.5.2 Existing Methodologies 656. 9.5.3 Techniques for Improving Noise-Figure Measurements 665 -- 9.6 Summary: Noise and Noise-Figure Measurements 668 -- References 668 -- 10 VNA Balanced Measurements 669 -- 10.1 Differential and Balanced S-Parameters 669 -- 10.2 3-Port Balanced Devices 674 -- 10.3 Measurement Examples for Mixed-Mode Devices 675 -- 10.3.1 Passive Differential Devices: Balanced Transmission Lines 675 -- 10.3.2 Differential Amplifier Measurements 680 -- 10.3.3 Differential Amplifiers and Non-linear Operation 682 -- 10.4 True-Mode VNA for Non-linear Testing 689 -- 10.4.1 True-Mode Instruments 689 -- 10.4.2 True-Mode Measurements 692 -- 10.4.3 Determining the Phase Skew of a Differential Device 698 -- 10.4.4 Differential Harmonic Measurements 700 -- 10.5 Differential Testing Using Baluns, Hybrids, and Transformers 708 -- 10.5.1 Transformers vs. Hybrids 708 -- 10.5.2 Using Hybrids and Baluns with a 2-Port VNA 711 -- 10.6 Distortion Measurements of Differential Devices 714 -- 10.6.1 Comparing Single-Ended IMD Measurement to True-Mode Measurements 715 -- 10.6.2 Differential IMD without Baluns 718 -- 10.7 Noise Figure Measurements on Differential Devices 723 -- 10.7.2 Measurement Setup 725 -- 10.8 Conclusions on Differential Device Measurement 731 -- References 732 -- 11 Advanced Measurement Techniques 733 -- 11.1 Creating Your Own Cal-Kits 733 -- 11.1.1 PC Board Example 734 -- 11.1.2 Evaluating PC Board Fixtures 735 -- 11.2 Fixturing and De-embedding 750 -- 11.2.1 De-embedding Mathematics 751 -- 11.3 Determining S-Parameters for Fixtures 753 -- 11.3.1 Fixture Characterization Using 1-Port Calibrations 753 -- 11.4 Automatic Port Extensions (APE) 759 -- 11.5 AFR: Fixture Removal Using Time Domain 764 -- 11.5.1 2-Port AFR 764 -- 11.5.2 Fixture-Enhanced AFR 768 -- 11.5.3 1-Port AFR 770 -- 11.6 Embedding Port-Matching Elements 772 -- 11.7 Impedance Transformations 774 -- 11.8 De-embedding High-Loss Devices 775 -- 11.9 Understanding System Stability 778 -- 11.9.1 Determining Cable Transmission Stability 778. 11.9.2 Determining Cable Mismatch Stability 778 -- 11.9.3 Reflection Tracking Stability 781 -- 11.10 Some Final Comments on Advanced Techniques and Measurements 782 -- References 783 -- Appendix A Physical Constants 785 -- Appendix B Common RF and Microwave Connectors 787 -- Appendix C Common Waveguides 789 -- Appendix D Some Definitions for Calibration Kit Opens and Shorts 791 -- Appendix E Frequency, Wavelength, and Period 795 -- Index 797. |
| Record Nr. | UNINA-9910555040903321 |
|
Dunsmore Joel P.
|
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| Hoboken, New Jersey : , : John Wiley & Sons, Inc., , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Handbook of microwave component measurements : with advanced VNA techniques / / by Joel P. Dunsmore
| Handbook of microwave component measurements : with advanced VNA techniques / / by Joel P. Dunsmore |
| Autore | Dunsmore Joel P. |
| Edizione | [Second edition.] |
| Pubbl/distr/stampa | Hoboken, New Jersey : , : John Wiley & Sons, Inc., , 2020 |
| Descrizione fisica | 1 online resource (837 pages) |
| Disciplina | 621.381330287 |
| Soggetto topico | Microwave devices - Testing |
| ISBN |
1-119-47712-3
1-119-47711-5 1-119-47716-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Foreword to the Second Edition xvii -- Foreword to the First Edition xix -- Preface to the Second Edition xxi -- Preface to the First Edition xxiii -- Acknowledgments for the Second Edition xxv -- Acknowledgments from the First Edition xxvii -- 1 Introduction to Microwave Measurements 1 -- 1.1 Modern Measurement Process 2 -- 1.2 A Practical Measurement Focus 3 -- 1.3 Definition of Microwave Parameters 3 -- 1.3.1 S-Parameter Primer 4 -- 1.3.2 Phase Response of Networks 11 -- 1.4 Power Parameters 13 -- 1.4.1 Incident and Reflected Power 13 -- 1.4.2 Available Power 13 -- 1.4.3 Delivered Power 14 -- 1.4.4 Power Available from a Network 14 -- 1.4.5 Available Gain 15 -- 1.5 Noise Figure and Noise Parameters 15 -- 1.5.1 Noise Temperature 16 -- 1.5.2 Effective or Excess Input Noise Temperature 17 -- 1.5.3 Excess Noise Power and Operating Temperature 17 -- 1.5.4 Noise Power Density 17 -- 1.5.5 Noise Parameters 18 -- 1.6 Distortion Parameters 19 -- 1.6.1 Harmonics 19 -- 1.6.2 Second-Order Intercept 19 -- 1.6.3 Two-Tone Intermodulation Distortion 20 -- 1.6.4 Adjacent Channel Power and Adjacent Channel Level Ratio 23 -- 1.6.5 Noise Power Ratio (NPR) 24 -- 1.6.6 Error Vector Magnitude (EVM) 25 -- 1.7 Characteristics of Microwave Components 26 -- 1.8 Passive Microwave Components 27 -- 1.8.1 Cables, Connectors, and Transmission Lines 27 -- 1.8.2 Connectors 31 -- 1.8.3 Non-coaxial Transmission Lines 44 -- 1.9 Filters 47 -- 1.10 Directional Couplers 49 -- 1.11 Circulators and Isolators 51 -- 1.12 Antennas 52 -- 1.13 PC Board Components 53 -- 1.13.1 SMT Resistors 53 -- 1.13.2 SMT Capacitors 56 -- 1.13.3 SMT Inductors 57 -- 1.13.4 PC Board Vias 57 -- 1.14 Active Microwave Components 58 -- 1.14.1 Linear and Non-linear 58 -- 1.14.2 Amplifiers: System, Low-Noise, High Power 58 -- 1.14.3 Mixers and Frequency Converters 59 -- 1.14.4 Frequency Multiplier and Limiters and Dividers 61 -- 1.14.5 Oscillators 62 -- 1.15 Measurement Instrumentation 63 -- 1.15.1 Power Meters 63 -- 1.15.2 Signal Sources 64.
1.15.3 Spectrum Analyzers 65 -- 1.15.4 Vector Signal Analyzers 66 -- 1.15.5 Noise Figure Analyzers 67 -- 1.15.6 Network Analyzers 67 -- References 70 -- 2 VNA Measurement Systems 71 -- 2.1 Introduction 71 -- 2.2 VNA Block Diagrams 72 -- 2.2.1 VNA Source 73 -- 2.2.2 Understanding Source-Match 76 -- 2.2.3 VNA Test Set 82 -- 2.2.4 Directional Devices 85 -- 2.2.5 VNA Receivers 91 -- 2.2.6 IF and Data Processing 95 -- 2.2.7 Multiport VNAs 97 -- 2.2.8 High-Power Test Systems 104 -- 2.2.9 VNA with mm-Wave Extenders 105 -- 2.3 VNA Measurement of Linear Microwave Parameters 107 -- 2.3.1 Measurement Limitations of the VNA 107 -- 2.3.2 Limitations Due to External Components 111 -- 2.4 Measurements Derived from S-Parameters 112 -- 2.4.1 The Smith Chart 112 -- 2.4.2 Transforming S-Parameters to Other Impedances 117 -- 2.4.3 Concatenating Circuits and T-Parameters 118 -- 2.5 Modeling Circuits Using Y and Z Conversion 120 -- 2.5.1 Reflection Conversion 120 -- 2.5.2 Transmission Conversion 120 -- 2.6 Other Linear Parameters 121 -- 2.6.1 Z-Parameters, or Open-Circuit Impedance Parameters 122 -- 2.6.2 Y-Parameters, or Short-Circuit Admittance Parameters 123 -- 2.6.3 ABCD Parameters 124 -- 2.6.4 H-Parameters or Hybrid Parameters 125 -- 2.6.5 Complex Conversions and Non-equal Reference Impedances 126 -- References 126 -- 3 Calibration and Vector Error Correction 127 -- 3.1 Introduction 127 -- 3.1.1 Error Correction and Linear Measurement Methods for S-Parameters 128 -- 3.1.2 Power Measurements with a VNA 131 -- 3.2 Basic Error Correction for S-Parameters: Cal-Application 134 -- 3.2.1 12-Term Error Model 134 -- 3.2.2 1-Port Error Model 136 -- 3.2.3 8-Term Error Model 136 -- 3.3 Determining Error Terms: Cal-Acquisition for 12-Term Models 139 -- 3.3.1 1-Port Error Terms 139 -- 3.3.2 1-Port Standards 141 -- 3.3.3 2-Port Error Terms 148 -- 3.3.4 12-Term to 11-Term Error Model 153 -- 3.4 Determining Error Terms: Cal-Acquisition for 8-Term Models 153 -- 3.4.1 TRL Standards and Raw Measurements 153. 3.4.2 Special Cases for TRL Calibration 157 -- 3.4.3 Unknown Thru or SOLR (Reciprocal Thru Calibration) 158 -- 3.4.4 Applications of Unknown Thru Calibrations 159 -- 3.4.5 QSOLT Calibration 161 -- 3.4.6 Electronic Calibration (ECaĺó) or Automatic Calibration 162 -- 3.5 Waveguide Calibrations 166 -- 3.6 Calibration for Source Power 167 -- 3.6.1 Calibrating Source Power for Source Frequency Response 168 -- 3.6.2 Calibration for Power Sensor Mismatch 169 -- 3.6.3 Calibration for Source Power Linearity 171 -- 3.7 Calibration for Receiver Power 173 -- 3.7.1 Some Historical Perspective 173 -- 3.7.2 Modern Receiver Power Calibration 173 -- 3.7.3 Response Correction for the Transmission Test Receiver 178 -- 3.7.4 Power Waves vs. Actual Waves 181 -- 3.8 Calibrating Multiple Channels Simultaneously: Cal All 182 -- 3.9 Multiport Calibration Strategies 186 -- 3.9.1 N x 2-Port Calibrations: Switching Test Sets 186 -- 3.9.2 N-port Calibration: True Multiport 188 -- 3.10 Automatic In-Situ Calibrations: CalPod 191 -- 3.10.1 CalPod Initialization and Recorrection 192 -- 3.10.2 CalPod-as-Ecal 194 -- 3.11 Devolved Calibrations 194 -- 3.11.1 Response Calibrations 195 -- 3.11.2 Enhanced Response Calibration 196 -- 3.12 Determining Residual Errors 199 -- 3.12.1 Reflection Errors 199 -- 3.12.2 Using Airlines to Determine Residual Errors 199 -- 3.13 Computing Measurement Uncertainties 210 -- 3.13.1 Uncertainty in Reflection Measurements 210 -- 3.13.2 Uncertainty in Source Power 211 -- 3.13.3 Uncertainty in Measuring Power (Receiver Uncertainty) 212 -- 3.14 S21 or Transmission Uncertainty 212 -- 3.14.1 General Uncertainty Equation for S21 214 -- 3.14.2 Dynamic Uncertainty Computation 215 -- 3.15 Errors in Phase 218 -- 3.16 Practical Calibration Limitations 219 -- 3.16.1 Cable Flexure 220 -- 3.16.2 Changing Power after Calibration 221 -- 3.16.3 Compensating for Changes in Step Attenuators 223 -- 3.16.4 Connector Repeatability 225 -- 3.16.5 Noise Effects 226 -- 3.16.6 Drift: Short-Term and Long-Term 227. 3.16.7 Interpolation of Error Terms 229 -- 3.16.8 Calibration Quality: Electronic vs. Mechanical Kits 231 -- Reference 232 -- 4 Time-Domain Transforms 235 -- 4.1 Introduction 235 -- 4.2 The Fourier Transform 236 -- 4.2.1 The Continuous Fourier Transform 236 -- 4.2.2 Even and Odd Functions and the Fourier Transform 236 -- 4.2.3 Modulation (Shift) Theorem 237 -- 4.3 The Discrete Fourier Transform 238 -- 4.3.1 Fast Fourier Transform (FFT) and Inverse Fast Fourier Transform (IFFT) 238 -- 4.3.2 Discrete Fourier Transforms 240 -- 4.4 Fourier Transform (Analytic) vs. VNA Time Domain Transform 240 -- 4.4.1 Defining the Fourier Transform 241 -- 4.4.2 Effects of Discrete Sampling 242 -- 4.4.3 Effects of Truncated Frequency 244 -- 4.4.4 Windowing to Reduce Effects of Truncation 246 -- 4.4.5 Scaling and Renormalization 248 -- 4.5 Low-Pass Transforms 248 -- 4.5.1 Low-Pass Impulse Mode 248 -- 4.5.2 DC Extrapolation 249 -- 4.5.3 Low-Pass Step Mode 249 -- 4.5.4 Band-Pass Mode 251 -- 4.6 Time-Domain Gating 252 -- 4.6.1 Gating Loss and Renormalization 253 -- 4.7 Examples of Time-Domain Transforms of Various Networks 256 -- 4.7.1 Time-Domain Response of Changes in Line Impedance 256 -- 4.7.2 Time-Domain Response of Discrete Discontinuities 257 -- 4.7.3 Time-Domain Responses of Various Circuits 257 -- 4.8 The Effects of Masking and Gating on Measurement Accuracy 259 -- 4.8.1 Compensation for Changes in Line Impedance 259 -- 4.8.2 Compensation for Discrete Discontinuities 260 -- 4.8.3 Time-Domain Gating 260 -- 4.8.4 Estimating an Uncertainty Due to Masking 265 -- 4.9 Time-Domain Transmission Using VNA 265 -- 4.10 Conclusions 269 -- References 269 -- 5 Measuring Linear Passive Devices 271 -- 5.1 Transmission Lines, Cables, and Connectors 271 -- 5.1.1 Calibration for Low Loss Devices with Connectors 271 -- 5.1.2 Measuring Electrically Long Devices 273 -- 5.1.3 Attenuation Measurements 278 -- 5.1.4 Return Loss Measurements 295 -- 5.1.5 Cable Length and Delay 305 -- 5.2 Filters and Filter Measurements 306. 5.2.1 Filter Classes and Difficulties 306 -- 5.2.2 Duplexer and Diplexers 307 -- 5.2.3 Measuring Tunable High-Performance Filters 308 -- 5.2.4 Measuring Transmission Response 310 -- 5.2.5 High Speed vs. Dynamic Range 315 -- 5.2.6 Extremely High Dynamic Range Measurements 317 -- 5.2.7 Calibration Considerations 326 -- 5.3 Multiport Devices 327 -- 5.3.1 Differential Cables and Lines 328 -- 5.3.2 Couplers 328 -- 5.3.3 Hybrids, Splitters, and Dividers 331 -- 5.3.4 Circulators and Isolators 334 -- 5.4 Resonators 336 -- 5.4.1 Resonator Responses on a Smith Chart 336 -- 5.5 Antenna Measurements 338 -- 5.6 Conclusions 340 -- References 341 -- 6 Measuring Amplifiers 343 -- 6.1 Amplifiers as a Linear Devices 343 -- 6.1.1 Pretesting an Amplifier 344 -- 6.1.2 Optimizing VNA Settings for Calibration 346 -- 6.1.3 Calibration for Amplifier Measurements 347 -- 6.1.4 Amplifier Measurements 351 -- 6.1.5 Analysis of Amplifier Measurements 357 -- 6.1.6 Saving Amplifier Measurement Results 367 -- 6.2 Gain Compression Measurements 372 -- 6.2.1 Compression Definitions 372 -- 6.2.2 AM-to-PM or Phase Compression 376 -- 6.2.3 Swept Frequency Gain and Phase Compression 377 -- 6.2.4 Gain Compression Application, Smart Sweep, and Safe-Sweep Mode 378 -- 6.3 Measuring High-Gain Amplifiers 384 -- 6.3.1 Setup for High-Gain Amplifiers 386 -- 6.3.2 Calibration Considerations 386 -- 6.4 Measuring High-Power Amplifiers 389 -- 6.4.1 Configurations for Generating High Drive Power 389 -- 6.4.2 Configurations for Receiving High-Power 391 -- 6.4.3 Power Calibration and Pre/Post Leveling 393 -- 6.5 Making Pulsed-RF Measurements 394 -- 6.5.1 Wideband vs. Narrowband Measurements 395 -- 6.5.2 Pulse Profile Measurements 398 -- 6.5.3 Pulse-to-Pulse Measurements 401 -- 6.5.4 DC Measurements for Pulsed RF Stimulus 401 -- 6.6 Distortion Measurements 403 -- 6.6.1 Harmonic Measurements on Amplifiers 404 -- 6.7 Measuring Doherty Amplifiers 410 -- 6.8 X-Parameters, Load-Pull Measurements, Active Loads, and Hot S-Parameters 413. 6.8.1 Non-linear Responses and X-Parameters 414 -- 6.8.2 Load-Pull, Source-Pull, and Load Contours 417 -- 6.8.3 Hot S-Parameters and True Hot-S22 421 -- 6.9 Conclusions on Amplifier Measurements 433 -- References 434 -- 7 Mixer and Frequency Converter Measurements 435 -- 7.1 Mixer Characteristics 435 -- 7.1.1 Small Signal Model of Mixers 438 -- 7.1.2 Reciprocity in Mixers 442 -- 7.1.3 Scalar and Vector Responses 444 -- 7.2 Mixers vs. Frequency Converters 445 -- 7.2.1 Frequency Converter Design 446 -- 7.2.2 Multiple Conversions and Spur Avoidance 446 -- 7.3 Mixers as a 12-Port Device 448 -- 7.3.1 Mixer Conversion Terms 448 -- 7.4 Mixer Measurements: Frequency Response 451 -- 7.4.1 Introduction 451 -- 7.4.2 Amplitude Response 452 -- 7.4.3 Phase Response 456 -- 7.4.4 Group Delay and Modulation Methods 466 -- 7.4.5 Swept LO Measurements 469 -- 7.5 Calibration for Mixer Measurements 476 -- 7.5.1 Calibrating for Power 476 -- 7.5.2 Calibrating for Phase 479 -- 7.5.3 Determining the Phase and Delay of a Reciprocal Calibration Mixer 482 -- 7.6 Mixers Measurements vs. Drive Power 493 -- 7.6.1 Mixer Measurements vs. LO Drive 493 -- 7.6.2 Mixer Measurements vs. RF Drive Level 497 -- 7.7 TOI and Mixers 501 -- 7.7.1 IMD vs. LO Drive Power 502 -- 7.7.2 IMD vs. RF Power 502 -- 7.7.3 IMD vs. Frequency Response 505 -- 7.8 Noise Figure in Mixers and Converters 507 -- 7.9 Special Cases 507 -- 7.9.1 Mixers with RF or LO Multipliers 507 -- 7.9.2 Segmented Sweeps 509 -- 7.9.3 Measuring Higher-Order Products 509 -- 7.9.4 Mixers with an Embedded LO 515 -- 7.9.5 High-Gain and High-Power Converters 517 -- 7.10 I/Q Converters and Modulators 518 -- 7.11 Conclusions on Mixer Measurements 530 -- References 531 -- 8 Spectrum Analysis: Distortion and Modulation Measurements 533 -- 8.1 Spectrum Analysis in Vector Network Analyzers 534 -- 8.1.1 Spectrum Analysis Fundamentals 534 -- 8.1.2 SA Block Diagrams: Image Rejection: Hardware vs. Software 539 -- 8.1.3 Attributes of Repetitive Signals and Spectrum Measurements 546. 8.1.4 Coherent Spectrum Analysis 559 -- 8.1.5 Calibration of SA Results 568 -- 8.1.6 Two-Tone Measurements, IMD, and TOI Definition 571 -- 8.1.7 Measurement Techniques for Two-Tone TOI 574 -- 8.1.8 Swept IMD 576 -- 8.1.9 Optimizing Results 579 -- 8.1.10 Error Correction 582 -- 8.2 Distortion Measurement of Complex Modulated Signals 583 -- 8.2.1 Adjacent Power Measurements 584 -- 8.2.2 Noise Power Ratio (NPR) Measurements 587 -- 8.2.3 NPR Signal Quality and Correction 592 -- 8.2.4 EVM Derived from Distortion Measurements 596 -- 8.3 Measurements of Spurious Signals with VNA Spectrum Analyzer 605 -- 8.3.1 Spurious at Predictable Frequencies 605 -- 8.3.2 Multiport Mixer Spurious Measurements 607 -- 8.3.3 Spurious Oscillations 608 -- 8.4 Measurements of Pulsed Signals and Time-Gated Spectrum Analysis 611 -- 8.4.1 Understanding Pulsed Spectrum 611 -- 8.4.2 Time-Gated Spectrum Analysis 612 -- 8.5 Summary 615 -- Reference 615 -- 9 Measuring Noise Figure and Noise Power 617 -- 9.1 Noise-Figure Measurements for Amplifiers 617 -- 9.1.1 Definition of Noise Figure 618 -- 9.1.2 Noise-Power Measurements 619 -- 9.1.3 Computing Noise Figure from Noise Powers 623 -- 9.1.4 Computing DUT Noise Figure from Y-Factor Measurements 624 -- 9.1.5 Cold-Source Methods 626 -- 9.1.6 Noise Parameters 628 -- 9.1.7 Noise Parameter Measurement Results 634 -- 9.1.8 Error Correction in Noise Figure Measurements 637 -- 9.2 Active Antenna Noise-Figure Measurements (G/T) 638 -- 9.3 Noise Figure in Mixers and Converters 642 -- 9.3.1 Y-Factor Measurements on Mixers 642 -- 9.3.2 Cold-Source Measurements on Mixers 644 -- 9.4 Other Noise-Related Measurements 650 -- 9.4.1 Noise Power Measurements with a VNA Spectrum Analyzer 650 -- 9.4.2 Noise-Power Measurements 650 -- 9.4.3 Noise Figure Measurements Using Spectrum Analysis 653 -- 9.4.4 Carrier-to-Noise Measurements 654 -- 9.5 Uncertainty, Verification, and Improvement of Noise-Figure Measurements 655 -- 9.5.1 Uncertainty of Noise-Figure Measurements 655 -- 9.5.2 Existing Methodologies 656. 9.5.3 Techniques for Improving Noise-Figure Measurements 665 -- 9.6 Summary: Noise and Noise-Figure Measurements 668 -- References 668 -- 10 VNA Balanced Measurements 669 -- 10.1 Differential and Balanced S-Parameters 669 -- 10.2 3-Port Balanced Devices 674 -- 10.3 Measurement Examples for Mixed-Mode Devices 675 -- 10.3.1 Passive Differential Devices: Balanced Transmission Lines 675 -- 10.3.2 Differential Amplifier Measurements 680 -- 10.3.3 Differential Amplifiers and Non-linear Operation 682 -- 10.4 True-Mode VNA for Non-linear Testing 689 -- 10.4.1 True-Mode Instruments 689 -- 10.4.2 True-Mode Measurements 692 -- 10.4.3 Determining the Phase Skew of a Differential Device 698 -- 10.4.4 Differential Harmonic Measurements 700 -- 10.5 Differential Testing Using Baluns, Hybrids, and Transformers 708 -- 10.5.1 Transformers vs. Hybrids 708 -- 10.5.2 Using Hybrids and Baluns with a 2-Port VNA 711 -- 10.6 Distortion Measurements of Differential Devices 714 -- 10.6.1 Comparing Single-Ended IMD Measurement to True-Mode Measurements 715 -- 10.6.2 Differential IMD without Baluns 718 -- 10.7 Noise Figure Measurements on Differential Devices 723 -- 10.7.2 Measurement Setup 725 -- 10.8 Conclusions on Differential Device Measurement 731 -- References 732 -- 11 Advanced Measurement Techniques 733 -- 11.1 Creating Your Own Cal-Kits 733 -- 11.1.1 PC Board Example 734 -- 11.1.2 Evaluating PC Board Fixtures 735 -- 11.2 Fixturing and De-embedding 750 -- 11.2.1 De-embedding Mathematics 751 -- 11.3 Determining S-Parameters for Fixtures 753 -- 11.3.1 Fixture Characterization Using 1-Port Calibrations 753 -- 11.4 Automatic Port Extensions (APE) 759 -- 11.5 AFR: Fixture Removal Using Time Domain 764 -- 11.5.1 2-Port AFR 764 -- 11.5.2 Fixture-Enhanced AFR 768 -- 11.5.3 1-Port AFR 770 -- 11.6 Embedding Port-Matching Elements 772 -- 11.7 Impedance Transformations 774 -- 11.8 De-embedding High-Loss Devices 775 -- 11.9 Understanding System Stability 778 -- 11.9.1 Determining Cable Transmission Stability 778. 11.9.2 Determining Cable Mismatch Stability 778 -- 11.9.3 Reflection Tracking Stability 781 -- 11.10 Some Final Comments on Advanced Techniques and Measurements 782 -- References 783 -- Appendix A Physical Constants 785 -- Appendix B Common RF and Microwave Connectors 787 -- Appendix C Common Waveguides 789 -- Appendix D Some Definitions for Calibration Kit Opens and Shorts 791 -- Appendix E Frequency, Wavelength, and Period 795 -- Index 797. |
| Record Nr. | UNINA-9910677240603321 |
|
Dunsmore Joel P.
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| Hoboken, New Jersey : , : John Wiley & Sons, Inc., , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Handbook of Microwave Component Measurements [[electronic resource] ] : with Advanced VNA Techniques
| Handbook of Microwave Component Measurements [[electronic resource] ] : with Advanced VNA Techniques |
| Autore | Dunsmore Joel P |
| Edizione | [2nd ed.] |
| Pubbl/distr/stampa | Hoboken, : Wiley, 2012 |
| Descrizione fisica | 1 online resource (637 p.) |
| Disciplina |
537.5344
621.3813 |
| Soggetto topico |
Microwave devices - Testing
Microwave devices -- Testing TECHNOLOGY & ENGINEERING / Microwaves Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN |
1-283-54976-X
9786613862211 1-118-39125-X 1-118-39124-1 1-118-39132-2 |
| Classificazione | TEC024000 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
HANDBOOK OFMICROWAVE COMPONENTMEASUREMENTS; Contents; Foreword; Preface; Acknowledgments; List of Acronyms; 1 Introduction to Microwave Measurements; 1.1 Modern Measurement Process; 1.2 A Practical Measurement Focus; 1.3 Definition of Microwave Parameters; 1.3.1 S-Parameter Primer; 1.3.2 Phase Response of Networks; 1.4 Power Parameters; 1.4.1 Incident and Reflected Power; 1.4.2 Available Power; 1.4.3 Delivered Power; 1.4.4 Power Available from a Network; 1.4.5 Available Gain; 1.5 Noise Figure and Noise Parameters; 1.5.1 Noise Temperature; 1.5.2 Effective or Excess Input Noise Temperature
1.5.3 Excess Noise Power and Operating Temperature1.5.4 Noise Power Density; 1.5.5 Noise Parameters; 1.6 Distortion Parameters; 1.6.1 Harmonics; 1.6.2 Second-Order Intercept; 1.6.3 Two-Tone Intermodulation Distortion; 1.7 Characteristics of Microwave Components; 1.8 Passive Microwave Components; 1.8.1 Cables, Connectors and Transmission Lines; 1.8.2 Connectors; 1.8.3 Non-Coaxial Transmission Lines; 1.9 Filters; 1.10 Directional Couplers; 1.11 Circulators and Isolators; 1.12 Antennas; 1.13 PCB Components; 1.13.1 SMT Resistors; 1.13.2 SMT Capacitors; 1.13.3 SMT Inductors; 1.13.4 PCB Vias 1.14 Active Microwave Components1.14.1 Linear and Non-Linear; 1.14.2 Amplifiers: System, Low Noise, High Power; 1.14.3 Mixers and Frequency Converters; 1.14.4 Frequency Multipliers and Limiters and Dividers; 1.14.5 Oscillators; 1.15 Measurement Instrumentation; 1.15.1 Power Meters; 1.15.2 Signal Sources; 1.15.3 Spectrum Analyzers; 1.15.4 Vector Signal Analyzers; 1.15.5 Noise Figure Analyzers; 1.15.6 Network Analyzers; References; 2 VNA Measurement Systems; 2.1 Introduction; 2.2 VNA Block Diagrams; 2.2.1 VNA Source; 2.2.2 Understanding Source Match; 2.2.3 VNA Test Set 2.2.4 Directional Devices2.2.5 VNA Receivers; 2.2.6 IF and Data Processing; 2.2.7 Multiport Extensions; 2.2.8 High Power Test Systems; 2.3 VNA Measurement of Linear Microwave Parameters; 2.3.1 Linear Measurements Methods for S-Parameters; 2.3.2 Power Measurements with a VNA; 2.3.3 Other Measurement Limitations of the VNA; 2.3.4 Limitations Due to External Components; 2.4 Measurements Derived from S-Parameters; 2.4.1 The Smith Chart; 2.4.2 Transforming S-Parameters to Other Impedances; 2.4.3 Concatenating Circuits and T-Parameters; 2.5 Modeling Circuits Using Y and Z Conversion 2.5.1 Reflection Conversion2.5.2 Transmission Conversion; 2.6 Other Linear Parameters; 2.6.1 Z-Parameters, or Open-Circuit Impedance Parameters; 2.6.2 Y-Parameters, or Short-Circuit Admittance Parameters; 2.6.3 ABCD Parameters; 2.6.4 H-Parameters or Hybrid Parameters; 2.6.5 Complex Conversions and Non-Equal Reference Impedances; References; 3 Calibration and Vector Error Correction; 3.1 Introduction; 3.2 Basic Error Correction for S-Parameters: Cal Application; 3.2.1 Twelve-Term Error Model; 3.2.2 One-Port Error Model; 3.2.3 Eight-Term Error Model 3.3 Determining Error Terms: Cal Acquisition for 12-Term Models |
| Record Nr. | UNINA-9910791706103321 |
|
Dunsmore Joel P
|
||
| Hoboken, : Wiley, 2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
