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2018 14th Conference on Ph.D. Research in Microelectronics and Electronics : 2-5 July 2018, Prague, Czech Republic / / IEEE Circuits and Systems Society
2018 14th Conference on Ph.D. Research in Microelectronics and Electronics : 2-5 July 2018, Prague, Czech Republic / / IEEE Circuits and Systems Society
Pubbl/distr/stampa Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018
Descrizione fisica 1 online resource (268 pages)
Disciplina 621.38072
Soggetto topico Electronics - Research
Microelectronics - Research
ISBN 1-5386-5387-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996279610303316
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018
Materiale a stampa
Lo trovi qui: Univ. di Salerno
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2018 14th Conference on Ph.D. Research in Microelectronics and Electronics : 2-5 July 2018, Prague, Czech Republic / / IEEE Circuits and Systems Society
2018 14th Conference on Ph.D. Research in Microelectronics and Electronics : 2-5 July 2018, Prague, Czech Republic / / IEEE Circuits and Systems Society
Pubbl/distr/stampa Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018
Descrizione fisica 1 online resource (268 pages)
Disciplina 621.38072
Soggetto topico Electronics - Research
Microelectronics - Research
ISBN 1-5386-5387-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910282234703321
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
PRIME 2012 : 8th Conference on Ph.D. Research in Microelectronics & Electronics : 12-15 June 2012
PRIME 2012 : 8th Conference on Ph.D. Research in Microelectronics & Electronics : 12-15 June 2012
Pubbl/distr/stampa Berlin, Germany : , : VDE, , 2012
Descrizione fisica 1 online resource (246 pages)
Soggetto topico Electronics - Research
Microelectronics - Research
ISBN 3-8007-3442-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996205227203316
Berlin, Germany : , : VDE, , 2012
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
PRIME 2012 : 8th Conference on Ph.D. Research in Microelectronics & Electronics : 12-15 June 2012
PRIME 2012 : 8th Conference on Ph.D. Research in Microelectronics & Electronics : 12-15 June 2012
Pubbl/distr/stampa Berlin, Germany : , : VDE, , 2012
Descrizione fisica 1 online resource (246 pages)
Soggetto topico Electronics - Research
Microelectronics - Research
ISBN 3-8007-3442-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910137588503321
Berlin, Germany : , : VDE, , 2012
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits
Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits
Pubbl/distr/stampa Piscataway, N.J., : IEEE Service Center
Disciplina 621
Soggetto topico Integrated circuits - Design and construction
Integrated circuits - Testing
Microelectronics - Research
Soggetto genere / forma Periodicals.
Conference papers and proceedings.
ISSN 1946-1550
Formato Materiale a stampa
Livello bibliografico Periodico
Lingua di pubblicazione eng
Altri titoli varianti IPFA ... proceedings
Proceedings of the ... International Symposium on the Physical and Failure Analysis of Integrated Circuits
International Symposium on the Physical and Failure Analysis of Integrated Circuits
.. IEEE ... International Symposium on the Physical and Failure Analysis of Integrated Circuits
Record Nr. UNISA-996281137603316
Piscataway, N.J., : IEEE Service Center
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits
Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits
Pubbl/distr/stampa Piscataway, N.J., : IEEE Service Center
Disciplina 621
Soggetto topico Integrated circuits - Design and construction
Integrated circuits - Testing
Microelectronics - Research
Circuits intégrés - Conception et construction
Microélectronique - Recherche
Soggetto genere / forma Periodicals.
Conference papers and proceedings.
ISSN 1946-1550
Formato Materiale a stampa
Livello bibliografico Periodico
Lingua di pubblicazione eng
Altri titoli varianti IPFA ... proceedings
Proceedings of the ... International Symposium on the Physical and Failure Analysis of Integrated Circuits
International Symposium on the Physical and Failure Analysis of Integrated Circuits
.. IEEE ... International Symposium on the Physical and Failure Analysis of Integrated Circuits
Record Nr. UNINA-9910625173203321
Piscataway, N.J., : IEEE Service Center
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Semiconductor microelectronics and nanoelectronics programs [[electronic resource] /] / edited by Stephen Knight, Joaquin V. Martinez de Pinillos, and Michele Buckley
Semiconductor microelectronics and nanoelectronics programs [[electronic resource] /] / edited by Stephen Knight, Joaquin V. Martinez de Pinillos, and Michele Buckley
Autore Knight Stephen
Pubbl/distr/stampa [Gaithersburg, Md.] : , : NIST, Technology Administration, U.S. Dept. of Commerce, , [2007]
Descrizione fisica vii, 244 pages : digital, PDF file
Altri autori (Persone) KnightStephen
PinillosJoaquin V. Martinez de
BuckleyMichele
Collana NISTIR
Soggetto topico Semiconductors - Measurement
Nanotechnology - Research
Molecular electronics - Research
Microelectronics - Research
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910697237003321
Knight Stephen  
[Gaithersburg, Md.] : , : NIST, Technology Administration, U.S. Dept. of Commerce, , [2007]
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui