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Nonlinear optical properties of materials. / / Rashid A. Ganeev
| Nonlinear optical properties of materials. / / Rashid A. Ganeev |
| Autore | Ganeev Rashid A. |
| Edizione | [1st ed. 2013.] |
| Pubbl/distr/stampa | Dordrecht, Netherlands ; ; New York, New York : , : Springer, , [2013] |
| Descrizione fisica | 1 online resource (XV, 244 p.) |
| Disciplina | 620.11295 |
| Collana | Springer series in optical sciences |
| Soggetto topico |
Materials - Optical properties
Nonlinear optics |
| ISBN | 94-007-6022-1 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- References -- Chapter 1 Low-order harmonic generation of laser radiation in various media -- Chapter 2 High-order harmonic generation from laser ablation of various surfaces -- Chapter 3 Nonlinear optical refraction and absorption of media -- Chapter 4 Laser ablation induced cluster formation -- Chapter 5 Low-order nonlinear optical characterization of clusters -- Chapter 6 Application of nanoparticle-contained plasmas for high-order harmonic generation. |
| Record Nr. | UNINA-9910739416403321 |
Ganeev Rashid A.
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| Dordrecht, Netherlands ; ; New York, New York : , : Springer, , [2013] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Optical properties of advanced materials / / Yoshinobu Aoyagi, Kotaro Kajikawa, editors
| Optical properties of advanced materials / / Yoshinobu Aoyagi, Kotaro Kajikawa, editors |
| Edizione | [1st ed. 2013.] |
| Pubbl/distr/stampa | Heidelberg [Germany] : , : Springer, , 2013 |
| Descrizione fisica | 1 online resource (xi, 191 pages) : illustrations (some color) |
| Disciplina | 621 |
| Collana | Springer Series in Materials Science |
| Soggetto topico | Materials - Optical properties |
| ISBN | 3-642-33527-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Quantum Structures of Advanced Materials -- Photonic Crystals -- Surface Plasmons -- Photonic Metamaterials -- Materials for Magnetic Materials and Spintronics -- Modern Liquid Crystals.- Materials for Organic LED -- Optical Characterization of Advanced Materials. |
| Record Nr. | UNINA-9910437980103321 |
| Heidelberg [Germany] : , : Springer, , 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Optical properties of materials and their applications / / edited by Jai Singh
| Optical properties of materials and their applications / / edited by Jai Singh |
| Autore | Singh Jai |
| Edizione | [Second edition.] |
| Pubbl/distr/stampa | Hoboken, NJ : , : Wiley, , 2020 |
| Descrizione fisica | 1 online resource (670 pages) |
| Disciplina | 530.412 |
| Soggetto topico |
Condensed matter - Optical properties
Materials - Optical properties Electrooptics - Materials |
| ISBN |
1-119-50605-0
1-119-50600-X 1-119-50606-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910555283603321 |
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Singh Jai
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| Hoboken, NJ : , : Wiley, , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Optical properties of materials and their applications / / edited by Jai Singh
| Optical properties of materials and their applications / / edited by Jai Singh |
| Autore | Singh Jai |
| Edizione | [Second edition.] |
| Pubbl/distr/stampa | Hoboken, NJ : , : Wiley, , 2020 |
| Descrizione fisica | 1 online resource (670 pages) |
| Disciplina | 530.412 |
| Soggetto topico |
Condensed matter - Optical properties
Materials - Optical properties Electrooptics - Materials |
| ISBN |
1-119-50605-0
1-119-50600-X 1-119-50606-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910818640903321 |
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Singh Jai
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| Hoboken, NJ : , : Wiley, , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Spectroscopic ellipsometry [[electronic resource] ] : principles and applications / / Hiroyuki Fujiwara
| Spectroscopic ellipsometry [[electronic resource] ] : principles and applications / / Hiroyuki Fujiwara |
| Autore | Fujiwara Hiroyuki |
| Pubbl/distr/stampa | Chichester, England ; ; Hoboken, NJ, : John Wiley & Sons, c2007 |
| Descrizione fisica | 1 online resource (389 p.) |
| Disciplina |
535.52
620.1/1295 |
| Soggetto topico |
Ellipsometry
Spectrum analysis Materials - Optical properties |
| ISBN |
1-281-00211-9
9786611002114 0-470-06019-0 0-470-06018-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Spectroscopic Ellipsometry; Contents; Foreword; Preface; Acknowledgments; 1 Introduction to Spectroscopic Ellipsometry; 1.1 Features of Spectroscopic Ellipsometry; 1.2 Applications of Spectroscopic Ellipsometry; 1.3 Data Analysis; 1.4 History of Development; 1.5 Future Prospects; References; 2 Principles of Optics; 2.1 Propagation of Light; 2.1.1 Propagation of One-Dimensional Waves; 2.1.2 Electromagnetic Waves; 2.1.3 Refractive Index; 2.2 Dielectrics; 2.2.1 Dielectric Polarization; 2.2.2 Dielectric Constant; 2.2.3 Dielectric Function; 2.3 Reflection and Transmission of Light
2.3.1 Refraction of Light2.3.2 p- and s-Polarized Light Waves; 2.3.3 Reflectance and Transmittance; 2.3.4 Brewster Angle; 2.3.5 Total Reflection; 2.4 Optical Interference; 2.4.1 Optical Interference in Thin Films; 2.4.2 Multilayers; References; 3 Polarization of Light; 3.1 Representation of Polarized Light; 3.1.1 Phase of Light; 3.1.2 Polarization States of Light Waves; 3.2 Optical Elements; 3.2.1 Polarizer (Analyzer); 3.2.2 Compensator (Retarder); 3.2.3 Photoelastic Modulator; 3.2.4 Depolarizer; 3.3 Jones Matrix; 3.3.1 Jones Vector; 3.3.2 Transformation of Coordinate Systems 3.3.3 Jones Matrices of Optical Elements3.3.4 Representation of Optical Measurement by Jones Matrices; 3.4 Stokes Parameters; 3.4.1 Definition of Stokes Parameters; 3.4.2 Poincaré Sphere; 3.4.3 Partially Polarized Light; 3.4.4 Mueller Matrix; References; 4 Principles of Spectroscopic Ellipsometry; 4.1 Principles of Ellipsometry Measurement; 4.1.1 Measured Values in Ellipsometry; 4.1.2 Coordinate System in Ellipsometry; 4.1.3 Jones and Mueller Matrices of Samples; 4.2 Ellipsometry Measurement; 4.2.1 Measurement Methods of Ellipsometry; 4.2.2 Rotating-Analyzer Ellipsometry (RAE) 5.3.2 Modeling of Surface Roughness |
| Record Nr. | UNINA-9910143718703321 |
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Fujiwara Hiroyuki
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| Chichester, England ; ; Hoboken, NJ, : John Wiley & Sons, c2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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