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Expedition into the nanoworld : an exciting voyage from optical microscopy to nanoscopy / / Alberto Diaspro
| Expedition into the nanoworld : an exciting voyage from optical microscopy to nanoscopy / / Alberto Diaspro |
| Autore | Diaspro Alberto <1959-> |
| Pubbl/distr/stampa | Cham, Switzerland : , : Springer, , [2022] |
| Descrizione fisica | 1 online resource (226 pages) |
| Disciplina | 502.82 |
| Soggetto topico |
Materials - Analysis
Materials - Microscopy Imaging systems |
| ISBN |
9783030944728
9783030944711 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Intro -- Foreword -- Acknowledgements -- About This Book -- Contents -- 1 Curious Premise -- 2 Just Observe! -- 3 The Colours of the Rainbow -- 4 A Piece of Curved Glass, the Sharpener of Light -- 5 A World in Three Dimensions -- 6 Modern Times: Space and the Time of Observations -- 7 Two-Photon Are Better Than One -- 8 Super Eyes to Watch Light Signals -- 9 Label-Free -- 10 The Future of Microscopy -- Pop Microscopy. |
| Record Nr. | UNINA-9910553072303321 |
Diaspro Alberto <1959->
|
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| Cham, Switzerland : , : Springer, , [2022] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Expedition into the nanoworld : an exciting voyage from optical microscopy to nanoscopy / / Alberto Diaspro
| Expedition into the nanoworld : an exciting voyage from optical microscopy to nanoscopy / / Alberto Diaspro |
| Autore | Diaspro Alberto <1959-> |
| Pubbl/distr/stampa | Cham, Switzerland : , : Springer, , [2022] |
| Descrizione fisica | 1 online resource (226 pages) |
| Disciplina | 502.82 |
| Soggetto topico |
Materials - Analysis
Materials - Microscopy Imaging systems |
| ISBN |
9783030944728
9783030944711 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Intro -- Foreword -- Acknowledgements -- About This Book -- Contents -- 1 Curious Premise -- 2 Just Observe! -- 3 The Colours of the Rainbow -- 4 A Piece of Curved Glass, the Sharpener of Light -- 5 A World in Three Dimensions -- 6 Modern Times: Space and the Time of Observations -- 7 Two-Photon Are Better Than One -- 8 Super Eyes to Watch Light Signals -- 9 Label-Free -- 10 The Future of Microscopy -- Pop Microscopy. |
| Record Nr. | UNISA-996466840103316 |
|
Diaspro Alberto <1959->
|
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| Cham, Switzerland : , : Springer, , [2022] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Handbook of Microscopy: Applications in Materials Science, Solid-State Physics and Chemistry. Vol. 123
| Handbook of Microscopy: Applications in Materials Science, Solid-State Physics and Chemistry. Vol. 123 |
| Autore | Amelinckx S |
| Pubbl/distr/stampa | [Place of publication not identified], : Wiley VCH Imprint, 1997 |
| Descrizione fisica | 1 online resource (xxxi, 833 pages) : illustrations |
| Disciplina | 620.11299 |
| Altri autori (Persone) | AmelinckxSeverin |
| Soggetto topico | Materials - Microscopy |
| ISBN | 3-527-61928-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | [1] Methods I -- [2] Methods II -- [3] Applications. |
| Record Nr. | UNINA-9910144686503321 |
|
Amelinckx S
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| [Place of publication not identified], : Wiley VCH Imprint, 1997 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Methods II [[electronic resource] /] / edited by S. Amelinckx ... [et al.]
| Methods II [[electronic resource] /] / edited by S. Amelinckx ... [et al.] |
| Pubbl/distr/stampa | Weinheim, : VCH, 1997 |
| Descrizione fisica | 1 online resource (509 p.) |
| Disciplina |
502.82
502/.8/2 |
| Altri autori (Persone) | AmelinckxS |
| Collana | Handbook of microscopy : applications in materials science, solid-state physics, and chemistry |
| Soggetto topico |
Microscopy
Materials - Microscopy |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-281-76465-5
9786611764654 3-527-62052-4 3-527-62053-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Handbook of Microscopy, Applications in Materials Science , Solid-state Physics and Chemistry; Contents; IV Electron Microscopy; 2 Scanning Beam Methods; 2.1 Scanning Reflection Electron Microscopy; 2.1.1 Introduction; 2.1.2 Instrumentation; 2.1.3 Performance; 2.1.4 Modes of Operation; 2.1.4.1 Secondary Electron Imaging; 2.1.4.2 Backscattered Electrons; 2.1.4.3 Special Techniques; 2.1.5 Conclusions; 2.1.6 References; 2.2 Scanning Transmission Electron Microscopy; 2.2.1 Introduction; 2.2.2 Scanning Transmission Electron Microscopy Imaging Modes
2.2.3 Scanning Transmission Electron Microscopy Theory2.2.4 Inelastic Scattering and Secondary Radiations; 2.2.5 Convergent-Beam and Nanodiffraction; 2.2.6 Coherent Nanodiffraction, Electron Holography, Ptychology; 2.2.7 Holography; 2.2.8 STEM Instrumentation; 2.2.9 Applications of Scanning Transmission Electron Microscopy; 2.2.10 References; 2.3 Scanning Transmission Electron Microscopy: Z Contrast; 2.3.1 Introduction; 2.3.2 Incoherent Imaging with Elastically Scattered Electrons; 2.3.3 Incoherent Imaging with Thermally Scattered Electrons 2.3.4 Incoherent Imaging using Inelastically Scattered Electrons2.3.5 Probe Channeling; 2.3.6 Applications to Materials Research; 2.3.6.1 Semiconductors; 2.3.6.2 Ceramics; 2.3.6.3 Nanocrystalline Materials; 2.3.7 References; 2.4 Scanning Auger Microscopy (SAM) and Imaging X-Ray Photoelectron Microscopy (XPS); 2.4.1 Introduction; 2.4.2 Basic Principles of Auger Electron Spectroscopy (AES) and X-Ray Photoelectron Spectroscopy (XPS); 2.4.2.1 Auger Electron Spectroscopy (AES); 2.4.2.2 X-Ray Photoelectron Spectroscopy (XPS); 2.4.2.3 Quantitative Analysis in AES and XPS 2.4.3 Scanning Auger Microscopy (SAM) and Imaging XPS2.4.3.1 Basic Principles of Imaging; 2.4.3.2 General Aspects of Analyzers; 2.4.3.3 Energy Resolution of Deflecting Electrostatic Analyzers; 2.4.3.4 Cylindrical Mirror Analyzer (CMA) versus the Concentric Hemispherical Analyzer (CHA); 2.4.3.5 Imaging Techniques; 2.4.3.6 Magnetic Fields in Imaging XPS; 2.4.4 Characteristics of Scanning Auger Microscopy Images; 2.4.4.1 General Aspects; 2.4.4.2 Background Slope Effects; 2.4.4.3 Substrate Backscattering Effects; 2.4.4.4 Topographic Effects; 2.4.4.5 Beam Current Fluctuation Effects 2.4.4.6 Edge Effects2.4.5 Conclusion; 2.4.6 References; 2.5 Scanning Microanalysis; 2.5.1 Physical Basis of Electron Probe Microanalysis; 2.5.1.1 Electron Interactions with Solids; 2.5.1.2 X-Ray Emission Spectra; 2.5.1.3 Characteristic X-Ray Spectra; 2.5.1.4 Soft X-Ray Spectra; 2.5.1.5 X-Ray Continuum; 2.5.1.6 Overview of Methods of Scanning Electron Beam Analysis; 2.5.1.7 Electron Probe X-Ray Microanalyzers; 2.5.1.8 Analytical Electron Microscopes; 2.5.1.9 Multipurpose Electron Probe Analytical Systems; 2.5.1.10 X-Ray Emission Spectrometry; 2.5.1.11 Wavelength-Dispersive Spectrometry 2.5.1.12 Energy-Dispersive Spectrometry |
| Record Nr. | UNINA-9910143988403321 |
| Weinheim, : VCH, 1997 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Methods II [[electronic resource] /] / edited by S. Amelinckx ... [et al.]
| Methods II [[electronic resource] /] / edited by S. Amelinckx ... [et al.] |
| Pubbl/distr/stampa | Weinheim, : VCH, 1997 |
| Descrizione fisica | 1 online resource (509 p.) |
| Disciplina |
502.82
502/.8/2 |
| Altri autori (Persone) | AmelinckxS |
| Collana | Handbook of microscopy : applications in materials science, solid-state physics, and chemistry |
| Soggetto topico |
Microscopy
Materials - Microscopy |
| ISBN |
1-281-76465-5
9786611764654 3-527-62052-4 3-527-62053-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Handbook of Microscopy, Applications in Materials Science , Solid-state Physics and Chemistry; Contents; IV Electron Microscopy; 2 Scanning Beam Methods; 2.1 Scanning Reflection Electron Microscopy; 2.1.1 Introduction; 2.1.2 Instrumentation; 2.1.3 Performance; 2.1.4 Modes of Operation; 2.1.4.1 Secondary Electron Imaging; 2.1.4.2 Backscattered Electrons; 2.1.4.3 Special Techniques; 2.1.5 Conclusions; 2.1.6 References; 2.2 Scanning Transmission Electron Microscopy; 2.2.1 Introduction; 2.2.2 Scanning Transmission Electron Microscopy Imaging Modes
2.2.3 Scanning Transmission Electron Microscopy Theory2.2.4 Inelastic Scattering and Secondary Radiations; 2.2.5 Convergent-Beam and Nanodiffraction; 2.2.6 Coherent Nanodiffraction, Electron Holography, Ptychology; 2.2.7 Holography; 2.2.8 STEM Instrumentation; 2.2.9 Applications of Scanning Transmission Electron Microscopy; 2.2.10 References; 2.3 Scanning Transmission Electron Microscopy: Z Contrast; 2.3.1 Introduction; 2.3.2 Incoherent Imaging with Elastically Scattered Electrons; 2.3.3 Incoherent Imaging with Thermally Scattered Electrons 2.3.4 Incoherent Imaging using Inelastically Scattered Electrons2.3.5 Probe Channeling; 2.3.6 Applications to Materials Research; 2.3.6.1 Semiconductors; 2.3.6.2 Ceramics; 2.3.6.3 Nanocrystalline Materials; 2.3.7 References; 2.4 Scanning Auger Microscopy (SAM) and Imaging X-Ray Photoelectron Microscopy (XPS); 2.4.1 Introduction; 2.4.2 Basic Principles of Auger Electron Spectroscopy (AES) and X-Ray Photoelectron Spectroscopy (XPS); 2.4.2.1 Auger Electron Spectroscopy (AES); 2.4.2.2 X-Ray Photoelectron Spectroscopy (XPS); 2.4.2.3 Quantitative Analysis in AES and XPS 2.4.3 Scanning Auger Microscopy (SAM) and Imaging XPS2.4.3.1 Basic Principles of Imaging; 2.4.3.2 General Aspects of Analyzers; 2.4.3.3 Energy Resolution of Deflecting Electrostatic Analyzers; 2.4.3.4 Cylindrical Mirror Analyzer (CMA) versus the Concentric Hemispherical Analyzer (CHA); 2.4.3.5 Imaging Techniques; 2.4.3.6 Magnetic Fields in Imaging XPS; 2.4.4 Characteristics of Scanning Auger Microscopy Images; 2.4.4.1 General Aspects; 2.4.4.2 Background Slope Effects; 2.4.4.3 Substrate Backscattering Effects; 2.4.4.4 Topographic Effects; 2.4.4.5 Beam Current Fluctuation Effects 2.4.4.6 Edge Effects2.4.5 Conclusion; 2.4.6 References; 2.5 Scanning Microanalysis; 2.5.1 Physical Basis of Electron Probe Microanalysis; 2.5.1.1 Electron Interactions with Solids; 2.5.1.2 X-Ray Emission Spectra; 2.5.1.3 Characteristic X-Ray Spectra; 2.5.1.4 Soft X-Ray Spectra; 2.5.1.5 X-Ray Continuum; 2.5.1.6 Overview of Methods of Scanning Electron Beam Analysis; 2.5.1.7 Electron Probe X-Ray Microanalyzers; 2.5.1.8 Analytical Electron Microscopes; 2.5.1.9 Multipurpose Electron Probe Analytical Systems; 2.5.1.10 X-Ray Emission Spectrometry; 2.5.1.11 Wavelength-Dispersive Spectrometry 2.5.1.12 Energy-Dispersive Spectrometry |
| Record Nr. | UNISA-996218389603316 |
| Weinheim, : VCH, 1997 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Methods II [[electronic resource] /] / edited by S. Amelinckx ... [et al.]
| Methods II [[electronic resource] /] / edited by S. Amelinckx ... [et al.] |
| Pubbl/distr/stampa | Weinheim, : VCH, 1997 |
| Descrizione fisica | 1 online resource (509 p.) |
| Disciplina |
502.82
502/.8/2 |
| Altri autori (Persone) | AmelinckxS |
| Collana | Handbook of microscopy : applications in materials science, solid-state physics, and chemistry |
| Soggetto topico |
Microscopy
Materials - Microscopy |
| ISBN |
1-281-76465-5
9786611764654 3-527-62052-4 3-527-62053-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Handbook of Microscopy, Applications in Materials Science , Solid-state Physics and Chemistry; Contents; IV Electron Microscopy; 2 Scanning Beam Methods; 2.1 Scanning Reflection Electron Microscopy; 2.1.1 Introduction; 2.1.2 Instrumentation; 2.1.3 Performance; 2.1.4 Modes of Operation; 2.1.4.1 Secondary Electron Imaging; 2.1.4.2 Backscattered Electrons; 2.1.4.3 Special Techniques; 2.1.5 Conclusions; 2.1.6 References; 2.2 Scanning Transmission Electron Microscopy; 2.2.1 Introduction; 2.2.2 Scanning Transmission Electron Microscopy Imaging Modes
2.2.3 Scanning Transmission Electron Microscopy Theory2.2.4 Inelastic Scattering and Secondary Radiations; 2.2.5 Convergent-Beam and Nanodiffraction; 2.2.6 Coherent Nanodiffraction, Electron Holography, Ptychology; 2.2.7 Holography; 2.2.8 STEM Instrumentation; 2.2.9 Applications of Scanning Transmission Electron Microscopy; 2.2.10 References; 2.3 Scanning Transmission Electron Microscopy: Z Contrast; 2.3.1 Introduction; 2.3.2 Incoherent Imaging with Elastically Scattered Electrons; 2.3.3 Incoherent Imaging with Thermally Scattered Electrons 2.3.4 Incoherent Imaging using Inelastically Scattered Electrons2.3.5 Probe Channeling; 2.3.6 Applications to Materials Research; 2.3.6.1 Semiconductors; 2.3.6.2 Ceramics; 2.3.6.3 Nanocrystalline Materials; 2.3.7 References; 2.4 Scanning Auger Microscopy (SAM) and Imaging X-Ray Photoelectron Microscopy (XPS); 2.4.1 Introduction; 2.4.2 Basic Principles of Auger Electron Spectroscopy (AES) and X-Ray Photoelectron Spectroscopy (XPS); 2.4.2.1 Auger Electron Spectroscopy (AES); 2.4.2.2 X-Ray Photoelectron Spectroscopy (XPS); 2.4.2.3 Quantitative Analysis in AES and XPS 2.4.3 Scanning Auger Microscopy (SAM) and Imaging XPS2.4.3.1 Basic Principles of Imaging; 2.4.3.2 General Aspects of Analyzers; 2.4.3.3 Energy Resolution of Deflecting Electrostatic Analyzers; 2.4.3.4 Cylindrical Mirror Analyzer (CMA) versus the Concentric Hemispherical Analyzer (CHA); 2.4.3.5 Imaging Techniques; 2.4.3.6 Magnetic Fields in Imaging XPS; 2.4.4 Characteristics of Scanning Auger Microscopy Images; 2.4.4.1 General Aspects; 2.4.4.2 Background Slope Effects; 2.4.4.3 Substrate Backscattering Effects; 2.4.4.4 Topographic Effects; 2.4.4.5 Beam Current Fluctuation Effects 2.4.4.6 Edge Effects2.4.5 Conclusion; 2.4.6 References; 2.5 Scanning Microanalysis; 2.5.1 Physical Basis of Electron Probe Microanalysis; 2.5.1.1 Electron Interactions with Solids; 2.5.1.2 X-Ray Emission Spectra; 2.5.1.3 Characteristic X-Ray Spectra; 2.5.1.4 Soft X-Ray Spectra; 2.5.1.5 X-Ray Continuum; 2.5.1.6 Overview of Methods of Scanning Electron Beam Analysis; 2.5.1.7 Electron Probe X-Ray Microanalyzers; 2.5.1.8 Analytical Electron Microscopes; 2.5.1.9 Multipurpose Electron Probe Analytical Systems; 2.5.1.10 X-Ray Emission Spectrometry; 2.5.1.11 Wavelength-Dispersive Spectrometry 2.5.1.12 Energy-Dispersive Spectrometry |
| Record Nr. | UNINA-9910830565703321 |
| Weinheim, : VCH, 1997 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Methods II / / edited by S. Amelinckx ... [et al.]
| Methods II / / edited by S. Amelinckx ... [et al.] |
| Pubbl/distr/stampa | Weinheim, : VCH, 1997 |
| Descrizione fisica | 1 online resource (509 p.) |
| Disciplina |
502.82
502/.8/2 |
| Altri autori (Persone) | AmelinckxS |
| Collana | Handbook of microscopy : applications in materials science, solid-state physics, and chemistry |
| Soggetto topico |
Microscopy
Materials - Microscopy |
| ISBN |
1-281-76465-5
9786611764654 3-527-62052-4 3-527-62053-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Handbook of Microscopy, Applications in Materials Science , Solid-state Physics and Chemistry; Contents; IV Electron Microscopy; 2 Scanning Beam Methods; 2.1 Scanning Reflection Electron Microscopy; 2.1.1 Introduction; 2.1.2 Instrumentation; 2.1.3 Performance; 2.1.4 Modes of Operation; 2.1.4.1 Secondary Electron Imaging; 2.1.4.2 Backscattered Electrons; 2.1.4.3 Special Techniques; 2.1.5 Conclusions; 2.1.6 References; 2.2 Scanning Transmission Electron Microscopy; 2.2.1 Introduction; 2.2.2 Scanning Transmission Electron Microscopy Imaging Modes
2.2.3 Scanning Transmission Electron Microscopy Theory2.2.4 Inelastic Scattering and Secondary Radiations; 2.2.5 Convergent-Beam and Nanodiffraction; 2.2.6 Coherent Nanodiffraction, Electron Holography, Ptychology; 2.2.7 Holography; 2.2.8 STEM Instrumentation; 2.2.9 Applications of Scanning Transmission Electron Microscopy; 2.2.10 References; 2.3 Scanning Transmission Electron Microscopy: Z Contrast; 2.3.1 Introduction; 2.3.2 Incoherent Imaging with Elastically Scattered Electrons; 2.3.3 Incoherent Imaging with Thermally Scattered Electrons 2.3.4 Incoherent Imaging using Inelastically Scattered Electrons2.3.5 Probe Channeling; 2.3.6 Applications to Materials Research; 2.3.6.1 Semiconductors; 2.3.6.2 Ceramics; 2.3.6.3 Nanocrystalline Materials; 2.3.7 References; 2.4 Scanning Auger Microscopy (SAM) and Imaging X-Ray Photoelectron Microscopy (XPS); 2.4.1 Introduction; 2.4.2 Basic Principles of Auger Electron Spectroscopy (AES) and X-Ray Photoelectron Spectroscopy (XPS); 2.4.2.1 Auger Electron Spectroscopy (AES); 2.4.2.2 X-Ray Photoelectron Spectroscopy (XPS); 2.4.2.3 Quantitative Analysis in AES and XPS 2.4.3 Scanning Auger Microscopy (SAM) and Imaging XPS2.4.3.1 Basic Principles of Imaging; 2.4.3.2 General Aspects of Analyzers; 2.4.3.3 Energy Resolution of Deflecting Electrostatic Analyzers; 2.4.3.4 Cylindrical Mirror Analyzer (CMA) versus the Concentric Hemispherical Analyzer (CHA); 2.4.3.5 Imaging Techniques; 2.4.3.6 Magnetic Fields in Imaging XPS; 2.4.4 Characteristics of Scanning Auger Microscopy Images; 2.4.4.1 General Aspects; 2.4.4.2 Background Slope Effects; 2.4.4.3 Substrate Backscattering Effects; 2.4.4.4 Topographic Effects; 2.4.4.5 Beam Current Fluctuation Effects 2.4.4.6 Edge Effects2.4.5 Conclusion; 2.4.6 References; 2.5 Scanning Microanalysis; 2.5.1 Physical Basis of Electron Probe Microanalysis; 2.5.1.1 Electron Interactions with Solids; 2.5.1.2 X-Ray Emission Spectra; 2.5.1.3 Characteristic X-Ray Spectra; 2.5.1.4 Soft X-Ray Spectra; 2.5.1.5 X-Ray Continuum; 2.5.1.6 Overview of Methods of Scanning Electron Beam Analysis; 2.5.1.7 Electron Probe X-Ray Microanalyzers; 2.5.1.8 Analytical Electron Microscopes; 2.5.1.9 Multipurpose Electron Probe Analytical Systems; 2.5.1.10 X-Ray Emission Spectrometry; 2.5.1.11 Wavelength-Dispersive Spectrometry 2.5.1.12 Energy-Dispersive Spectrometry |
| Altri titoli varianti |
Methods 2
Methods two |
| Record Nr. | UNINA-9910877211603321 |
| Weinheim, : VCH, 1997 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Microscopy Techniques for Biomedical Education and Healthcare Practice : Principles in Light, Fluorescence, Super-Resolution and Digital Microscopy, and Medical Imaging / / edited by Leonard Shapiro
| Microscopy Techniques for Biomedical Education and Healthcare Practice : Principles in Light, Fluorescence, Super-Resolution and Digital Microscopy, and Medical Imaging / / edited by Leonard Shapiro |
| Autore | Shapiro Leonard |
| Edizione | [1st ed. 2023.] |
| Pubbl/distr/stampa | Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2023 |
| Descrizione fisica | 1 online resource (235 pages) |
| Disciplina | 616.0758 |
| Collana | Biomedical Visualization |
| Soggetto topico |
Medicine - Research
Biology - Research Medical education Materials - Microscopy Anatomy Cytology Education - Data processing Biomedical Research Medical Education Microscopy Cell Biology Computers and Education |
| ISBN | 3-031-36850-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Part I. Advances in Microscopy for Visualization, Education and Healthcare Practice -- Chapter 1. Visualizing the Invisible: Microscopy and How It Affects Our Understanding of Cells and Tissues -- Chapter 2. Morphometric Image Analysis and Its Applications in Biomedicine Using Different Microscopy Modes -- Chapter 3. The Shift in Power from Conventional to Digital and Virtual Microscopy -- Chapter 4. How Visualizations Have Revolutionized Taxonomy: From Macroscopic, to Microscopic, to Genetic -- Chapter 5. Bright New World: Principles of Fluorescence and Applications in Spectroscopy and Microscopy -- Chapter 6. An Introduction to Particle Tracking Techniques with Applications in Biomedical Research -- Chapter 7. An Exploration of the Practice of CT Modalities to Evaluate Anterior Cranial Deformities in Craniosynostosis -- Part II. Anatomical and Cell Biology Education -- Chapter 8. The Use of Biomedical Imaging in Visuospatial Teaching of Anatomy -- Chapter 9. Ultrasound Imaging for Musculoskeletal Research -- Chapter 10. Skill Acquisition in Histology Education. |
| Record Nr. | UNINA-9910746978403321 |
|
Shapiro Leonard
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| Cham : , : Springer Nature Switzerland : , : Imprint : Springer, , 2023 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Microstructural Characterisation Techniques / / by Gunturi Venkata Sitarama Sastry
| Microstructural Characterisation Techniques / / by Gunturi Venkata Sitarama Sastry |
| Autore | Sastry Gunturi Venkata Sitarama |
| Edizione | [1st ed. 2022.] |
| Pubbl/distr/stampa | Singapore : , : Springer Nature Singapore : , : Imprint : Springer, , 2022 |
| Descrizione fisica | 1 online resource (254 pages) |
| Disciplina | 620.1 |
| Collana | Indian Institute of Metals Series |
| Soggetto topico |
Metals
Materials - Analysis Materials - Microscopy Metals and Alloys Materials Characterization Technique Microscopy |
| ISBN |
9789811935091
9789811935084 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- Electromagnetic Waves and Electron Waves -- Fourier Analysis and Fourier Transformation -- Transmission Electron Microscope -- Electron Diffraction -- Optical Microscopy -- Transmission Electron Microscopy -- Lens-less Electron Microscopy. |
| Record Nr. | UNINA-9910595053203321 |
|
Sastry Gunturi Venkata Sitarama
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| Singapore : , : Springer Nature Singapore : , : Imprint : Springer, , 2022 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Microstructural Characterization of Materials [[electronic resource]]
| Microstructural Characterization of Materials [[electronic resource]] |
| Autore | Brandon David |
| Edizione | [2nd ed.] |
| Pubbl/distr/stampa | Hoboken, : Wiley, 2008 |
| Descrizione fisica | 1 online resource (554 p.) |
| Disciplina | 620.1/1299 |
| Altri autori (Persone) |
KaplanWayne D
BrandonD. G |
| Collana | Quantitative software engineering series Microstructural characterization of materials |
| Soggetto topico |
Electronic books. -- local
Materials -- Microscopy Microstructure Materials - Microscopy Materials Science Chemical & Materials Engineering Engineering & Applied Sciences |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-282-34294-0
9786612342943 0-470-72712-8 0-470-72713-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Microstructural Characterization of Materials; Contents; Preface to the Second Edition; Preface to the First Edition; 1 The Concept of Microstructure; 1.1 Microstructural Features; 1.1.1 Structure-Property Relationships; 1.1.2 Microstructural Scale; 1.1.3 Microstructural Parameters; 1.2 Crystallography and Crystal Structure; 1.2.1 Interatomic Bonding in Solids; 1.2.2 Crystalline and Amorphous Phases; 1.2.3 The Crystal Lattice; Summary; Bibliography; Worked Examples; Problems; 2 Diffraction Analysis of Crystal Structure; 2.1 Scattering of Radiation by Crystals
2.1.1 The Laue Equations and Bragg's Law2.1.2 Allowed and Forbidden Reflections; 2.2 Reciprocal Space; 2.2.1 The Limiting Sphere Construction; 2.2.2 Vector Representation of Bragg's Law; 2.2.3 The Reciprocal Lattice; 2.3 X-Ray Diffraction Methods; 2.3.1 The X-Ray Diffractometer; 2.3.2 Powder Diffraction-Particles and Polycrystals; 2.3.3 Single Crystal Laue Diffraction; 2.3.4 Rotating Single Crystal Methods; 2.4 Diffraction Analysis; 2.4.1 Atomic Scattering Factors; 2.4.2 Scattering by the Unit Cell; 2.4.3 The Structure Factor in the Complex Plane 2.4.4 Interpretation of Diffracted Intensities2.4.5 Errors and Assumptions; 2.5 Electron Diffraction; 2.5.1 Wave Properties of Electrons; 2.5.2 Ring Patterns, Spot Patterns and Laue Zones; 2.5.3 Kikuchi Patterns and Their Interpretation; Summary; Bibliography; Worked Examples; Problems; 3 Optical Microscopy; 3.1 Geometrical Optics; 3.1.1 Optical Image Formation; 3.1.2 Resolution in the Optical Microscope; 3.1.3 Depth of Field and Depth of Focus; 3.2 Construction of the Microscope; 3.2.1 Light Sources and Condenser Systems; 3.2.2 The Specimen Stage; 3.2.3 Selection of Objective Lenses 3.2.4 Image Observation and Recording3.3 Specimen Preparation; 3.3.1 Sampling and Sectioning; 3.3.2 Mounting and Grinding; 3.3.3 Polishing and Etching Methods; 3.4 Image Contrast; 3.4.1 Reflection and Absorption of Light; 3.4.2 Bright-Field and Dark-Field Image Contrast; 3.4.3 Confocal Microscopy; 3.4.4 Interference Contrast and Interference Microscopy; 3.4.5 Optical Anisotropy and Polarized Light; 3.4.6 Phase Contrast Microscopy; 3.5 Working with Digital Images; 3.5.1 Data Collection and The Optical System; 3.5.2 Data Processing and Analysis; 3.5.3 Data Storage and Presentation 3.5.4 Dynamic Range and Digital Storage3.6 Resolution, Contrast and Image Interpretation; Summary; Bibliography; Worked Examples; Problems; 4 Transmission Electron Microscopy; 4.1 Basic Principles; 4.1.1 Wave Properties of Electrons; 4.1.2 Resolution Limitations and Lens Aberrations; 4.1.3 Comparative Performance of Transmission and Scanning Electron Microscopy; 4.2 Specimen Preparation; 4.2.1 Mechanical Thinning; 4.2.2 Electrochemical Thinning; 4.2.3 Ion Milling; 4.2.4 Sputter Coating and Carbon Coating; 4.2.5 Replica Methods; 4.3 The Origin of Contrast; 4.3.1 Mass-Thickness Contrast 4.3.2 Diffraction Contrast and Crystal Lattice Defects |
| Record Nr. | UNINA-9910146741103321 |
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Brandon David
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| Hoboken, : Wiley, 2008 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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