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Experimental techniques for low-temperature measurements [[electronic resource] ] : cryostat design, material properties, and superconductor critical-current testing / / Jack W. Ekin
| Experimental techniques for low-temperature measurements [[electronic resource] ] : cryostat design, material properties, and superconductor critical-current testing / / Jack W. Ekin |
| Autore | Ekin J. W |
| Pubbl/distr/stampa | Oxford ; ; New York, : Oxford University Press, 2006 |
| Descrizione fisica | 1 online resource (704 p.) |
| Disciplina | 536/.54 |
| Soggetto topico |
Low temperatures - Measurement
Low temperatures - Instruments Low temperature research Superconductors |
| Soggetto genere / forma | Electronic books. |
| ISBN |
1-4356-0684-1
9786611160388 0-19-152469-7 1-281-16038-5 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
CONTENTS; SYMBOLS AND ABBREVIATIONS; ACKNOWLEDGMENTS; ABOUT THE AUTHOR; CONTACT INFORMATION; DISCLAIMER; PART I: CRYOSTAT DESIGN AND MATERIALS SELECTION; 1 Introduction to Measurement Cryostats and Cooling Methods; 1.1 Introduction; 1.2 Cryogenic liquids; 1.3 Introduction to measurement cryostats; 1.4 Examples of measurement cryostats and cooling methods-low transport current ((omitted) 1 A); 1.5 Examples of measurement cryostats and cooling methods-high transport current ((omitted) 1 A); 1.6 Addenda: safety and cryogen handling; 1.7 References; 2 Heat Transfer at Cryogenic Temperatures
2.1 Introduction2.2 Heat conduction through solids; 2.3 Heat conduction through gases (and liquids); 2.4 Radiative heat transfer; 2.5 Heat conduction across liquid/solid interfaces; 2.6 Heat conduction across solid/solid interfaces; 2.7 Heat conduction across solid/gas interfaces; 2.8 Other heat sources; 2.9 Examples of heat-transfer calculation; 2.10 References; 3 Cryostat Construction; 3.1 Introduction; 3.2 Material selection for cryostat parts; 3.3 Joining techniques; 3.4 Construction example for a basic dipper probe; 3.5 Sizing of parts for mechanical strength 3.6 Mechanical motion at cryogenic temperature3.7 Vacuum techniques and seals for cryogenic use; 3.8 Addenda: high and ultrahigh vacuum techniques; 3.9 References; 4 Wiring and Connections; 4.1 Introduction; 4.2 Wire selection; 4.3 Insulation selection; 4.4 Heat sinks for instrumentation leads; 4.5 Solder connections; 4.6 Sensitive dc voltage leads: techniques for minimizing thermoelectric voltages; 4.7 Vacuum electrical lead-throughs; 4.8 Radio-frequency coaxial cables; 4.9 High-current leads; 4.10 Flexible current leads; 4.11 References; 5 Temperature Measurement and Control 5.1 Thermometer selection (1-300 K)5.2 Selection of thermometers for use in high magnetic fields; 5.3 Thermometer installation and measurement procedures; 5.4 Controlling temperature; 5.5 Addendum: reference compendium of cryogenic-thermometer properties and application techniques; 5.6 References; 6 Properties of Solids at Low Temperatures; 6.1 Specific heat and thermal diffusivity; 6.2 Thermal expansion/contraction; 6.3 Electrical resistivity; 6.4 Thermal conductivity; 6.5 Magnetic susceptibility; 6.6 Mechanical properties; 6.7 References PART II: ELECTRICAL TRANSPORT MEASUREMENTS: SAMPLE HOLDERS AND CONTACTS7 Sample Holders; 7.1 General principles for sample-holder design; 7.2 Four-lead and two-lead electrical transport measurements; 7.3 Bulk sample holders; 7.4 Thin-film sample holders; 7.5 Addenda; 7.6 References; 8 Sample Contacts; 8.1 Introduction; 8.2 Definition of specific contact resistivity and values for practical applications; 8.3 Contact techniques for high-current superconductors; 8.4 Contact techniques for film superconductors; 8.5 Example calculations of minimum contact area 8.6 Spreading-resistance effect in thin contact pads and example calculations |
| Record Nr. | UNINA-9910465142703321 |
Ekin J. W
|
||
| Oxford ; ; New York, : Oxford University Press, 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Experimental techniques for low-temperature measurements [[electronic resource] ] : cryostat design, material properties, and superconductor critical-current testing / / Jack W. Ekin
| Experimental techniques for low-temperature measurements [[electronic resource] ] : cryostat design, material properties, and superconductor critical-current testing / / Jack W. Ekin |
| Autore | Ekin J. W |
| Pubbl/distr/stampa | Oxford ; ; New York, : Oxford University Press, 2006 |
| Descrizione fisica | xxviii, 673 p. : ill |
| Disciplina | 536/.54 |
| Soggetto topico |
Low temperatures - Measurement
Low temperatures - Instruments Low temperature research Superconductors |
| ISBN |
9780191524691
0191524697 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910795860903321 |
|
Ekin J. W
|
||
| Oxford ; ; New York, : Oxford University Press, 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Experimental techniques for low-temperature measurements : cryostat design, material properties, and superconductor critical-current testing / / Jack W. Ekin
| Experimental techniques for low-temperature measurements : cryostat design, material properties, and superconductor critical-current testing / / Jack W. Ekin |
| Autore | Ekin J. W |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Oxford ; ; New York, : Oxford University Press, 2006 |
| Descrizione fisica | xxviii, 673 p. : ill |
| Disciplina | 536/.54 |
| Soggetto topico |
Low temperatures - Measurement
Low temperatures - Instruments Low temperature research Superconductors |
| ISBN |
9780191524691
0191524697 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Intro -- CONTENTS -- SYMBOLS AND ABBREVIATIONS -- ACKNOWLEDGMENTS -- ABOUT THE AUTHOR -- CONTACT INFORMATION -- DISCLAIMER -- PART I: CRYOSTAT DESIGN AND MATERIALS SELECTION -- 1 Introduction to Measurement Cryostats and Cooling Methods -- 1.1 Introduction -- 1.2 Cryogenic liquids -- 1.3 Introduction to measurement cryostats -- 1.4 Examples of measurement cryostats and cooling methods-low transport current ((omitted) 1 A) -- 1.5 Examples of measurement cryostats and cooling methods-high transport current ((omitted) 1 A) -- 1.6 Addenda: safety and cryogen handling -- 1.7 References -- 2 Heat Transfer at Cryogenic Temperatures -- 2.1 Introduction -- 2.2 Heat conduction through solids -- 2.3 Heat conduction through gases (and liquids) -- 2.4 Radiative heat transfer -- 2.5 Heat conduction across liquid/solid interfaces -- 2.6 Heat conduction across solid/solid interfaces -- 2.7 Heat conduction across solid/gas interfaces -- 2.8 Other heat sources -- 2.9 Examples of heat-transfer calculation -- 2.10 References -- 3 Cryostat Construction -- 3.1 Introduction -- 3.2 Material selection for cryostat parts -- 3.3 Joining techniques -- 3.4 Construction example for a basic dipper probe -- 3.5 Sizing of parts for mechanical strength -- 3.6 Mechanical motion at cryogenic temperature -- 3.7 Vacuum techniques and seals for cryogenic use -- 3.8 Addenda: high and ultrahigh vacuum techniques -- 3.9 References -- 4 Wiring and Connections -- 4.1 Introduction -- 4.2 Wire selection -- 4.3 Insulation selection -- 4.4 Heat sinks for instrumentation leads -- 4.5 Solder connections -- 4.6 Sensitive dc voltage leads: techniques for minimizing thermoelectric voltages -- 4.7 Vacuum electrical lead-throughs -- 4.8 Radio-frequency coaxial cables -- 4.9 High-current leads -- 4.10 Flexible current leads -- 4.11 References -- 5 Temperature Measurement and Control.
5.1 Thermometer selection (1-300 K) -- 5.2 Selection of thermometers for use in high magnetic fields -- 5.3 Thermometer installation and measurement procedures -- 5.4 Controlling temperature -- 5.5 Addendum: reference compendium of cryogenic-thermometer properties and application techniques -- 5.6 References -- 6 Properties of Solids at Low Temperatures -- 6.1 Specific heat and thermal diffusivity -- 6.2 Thermal expansion/contraction -- 6.3 Electrical resistivity -- 6.4 Thermal conductivity -- 6.5 Magnetic susceptibility -- 6.6 Mechanical properties -- 6.7 References -- PART II: ELECTRICAL TRANSPORT MEASUREMENTS: SAMPLE HOLDERS AND CONTACTS -- 7 Sample Holders -- 7.1 General principles for sample-holder design -- 7.2 Four-lead and two-lead electrical transport measurements -- 7.3 Bulk sample holders -- 7.4 Thin-film sample holders -- 7.5 Addenda -- 7.6 References -- 8 Sample Contacts -- 8.1 Introduction -- 8.2 Definition of specific contact resistivity and values for practical applications -- 8.3 Contact techniques for high-current superconductors -- 8.4 Contact techniques for film superconductors -- 8.5 Example calculations of minimum contact area -- 8.6 Spreading-resistance effect in thin contact pads and example calculations -- 8.7 References -- PART III: SUPERCONDUCTOR CRITICAL-CURRENT MEASUREMENTS AND DATA ANALYSIS -- 9 Critical-Current Measurements -- 9.1 Introduction -- 9.2 Instrumentation -- 9.3 Measurement procedures -- 9.4 Examples of critical-current measurement cryostats -- 9.5 References -- 10 Critical-Current Data Analysis -- 10.1 Practical critical-current definitions -- 10.2 Current-transfer correction -- 10.3 Magnetic-field dependence of critical current -- 10.4 Temperature dependence of critical current -- 10.5 Strain-induced changes in the critical current. 10.6 Transformation method for simplified application of scaling relations -- 10.7 Unified strain-and-temperature scaling law and transformations -- 10.8 References -- Appendixes: Data handbook of materials properties and cryostat design -- INDEX -- A -- B -- C -- D -- E -- F -- G -- H -- I -- J -- K -- L -- M -- N -- O -- P -- Q -- R -- S -- T -- U -- V -- W -- Y -- Z. |
| Record Nr. | UNINA-9910963983003321 |
|
Ekin J. W
|
||
| Oxford ; ; New York, : Oxford University Press, 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
