IIRW : 2018 IEEE International Integrated Reliability Workshop : Stanford Sierra Conference Center, South Lake Tahoe, CA, USA, October 7-11, 2018 / / sponsored by the Electron Devices Society and the IEEE Reliability Society |
Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
Descrizione fisica | 1 online resource (69 pages) |
Disciplina | 621.3815 |
Soggetto topico |
Semiconductors - Reliability
Integrated circuits - Wafer-scale integratio - Reliability Integrated circuits - Reliability |
ISBN | 1-5386-6039-3 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910326259803321 |
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
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Lo trovi qui: Univ. Federico II | ||
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IIRW : 2018 IEEE International Integrated Reliability Workshop : Stanford Sierra Conference Center, South Lake Tahoe, CA, USA, October 7-11, 2018 / / sponsored by the Electron Devices Society and the IEEE Reliability Society |
Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
Descrizione fisica | 1 online resource (69 pages) |
Disciplina | 621.3815 |
Soggetto topico |
Semiconductors - Reliability
Integrated circuits - Wafer-scale integratio - Reliability Integrated circuits - Reliability |
ISBN | 1-5386-6039-3 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996577955303316 |
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
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Lo trovi qui: Univ. di Salerno | ||
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