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6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California
| 6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2005 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Very large scale integration - Computer-aided design Integrated circuits - Very large scale integration - Testing - Quality control Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5386-0067-6 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996202254303316 |
| [Place of publication not identified], : IEEE Computer Society, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California
| 6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2005 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Very large scale integration - Computer-aided design Integrated circuits - Very large scale integration - Testing - Quality control Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN |
9781538600672
1538600676 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910146498103321 |
| [Place of publication not identified], : IEEE Computer Society, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||