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5th International Symposium on Quality Electronic Design : proceedings : 22-24 March, 2004, San Jose, California
| 5th International Symposium on Quality Electronic Design : proceedings : 22-24 March, 2004, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2004 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Reliability
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Quality control - Very large scale integration - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996214938303316 |
| [Place of publication not identified], : IEEE Computer Society, 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
5th International Symposium on Quality Electronic Design : proceedings : 22-24 March, 2004, San Jose, California
| 5th International Symposium on Quality Electronic Design : proceedings : 22-24 March, 2004, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2004 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Reliability
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Quality control - Very large scale integration - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872691203321 |
| [Place of publication not identified], : IEEE Computer Society, 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Fourth International Symposium on Quality Electronic Design : proceedings : 24-26 March, 2003, San Jose, California
| Fourth International Symposium on Quality Electronic Design : proceedings : 24-26 March, 2003, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2003 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Reliability
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Very large scale integration - Quality control - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996217941903316 |
| [Place of publication not identified], : IEEE Computer Society, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Fourth International Symposium on Quality Electronic Design : proceedings : 24-26 March, 2003, San Jose, California
| Fourth International Symposium on Quality Electronic Design : proceedings : 24-26 March, 2003, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2003 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Reliability
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Very large scale integration - Quality control - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872441303321 |
| [Place of publication not identified], : IEEE Computer Society, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||