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Fourth International Symposium on Quality Electronic Design : proceedings : 24-26 March, 2003, San Jose, California
| Fourth International Symposium on Quality Electronic Design : proceedings : 24-26 March, 2003, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2003 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Reliability
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Very large scale integration - Quality control - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996217941903316 |
| [Place of publication not identified], : IEEE Computer Society, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Fourth International Symposium on Quality Electronic Design : proceedings : 24-26 March, 2003, San Jose, California
| Fourth International Symposium on Quality Electronic Design : proceedings : 24-26 March, 2003, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2003 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Reliability
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Very large scale integration - Quality control - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872441303321 |
| [Place of publication not identified], : IEEE Computer Society, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
International Symposium on Quality Electronic Design : 18-21 March, 2002, San Jose, California : proceedings
| International Symposium on Quality Electronic Design : 18-21 March, 2002, San Jose, California : proceedings |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2002 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Design and construction - Very large scale integration Integrated circuits - Very large scale integration - Computer-aided design Integrated circuits - Very large scale integration - Quality control - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996200682203316 |
| [Place of publication not identified], : IEEE Computer Society, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
International Symposium on Quality Electronic Design : 18-21 March, 2002, San Jose, California : proceedings
| International Symposium on Quality Electronic Design : 18-21 March, 2002, San Jose, California : proceedings |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2002 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Design and construction - Very large scale integration Integrated circuits - Very large scale integration - Computer-aided design Integrated circuits - Very large scale integration - Quality control - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872735203321 |
| [Place of publication not identified], : IEEE Computer Society, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
