Info
- Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.
2012 13th International Symposium on Quality Electronic Design
| 2012 13th International Symposium on Quality Electronic Design |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2012 |
| Descrizione fisica | 1 online resource : illustrations |
| Disciplina | 621.395 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Computer-aided design
Integrated circuits - Very large scale integration - Design and construction |
| ISBN | 1-4673-1036-0 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996215700203316 |
| [Place of publication not identified], : IEEE, 2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2012 13th International Symposium on Quality Electronic Design
| 2012 13th International Symposium on Quality Electronic Design |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2012 |
| Descrizione fisica | 1 online resource : illustrations |
| Disciplina | 621.395 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Computer-aided design
Integrated circuits - Very large scale integration - Design and construction |
| ISBN | 1-4673-1036-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910130691103321 |
| [Place of publication not identified], : IEEE, 2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2013 IEEE 8th International Conference on Global Software Engineering (ICGSE 2013) : Bari, Italy, 26-29 August 2013
| 2013 IEEE 8th International Conference on Global Software Engineering (ICGSE 2013) : Bari, Italy, 26-29 August 2013 |
| Pubbl/distr/stampa | IEEE |
| Soggetto topico |
Computer software - Development
Software localization System design Integrated circuits - Very large scale integration - Computer-aided design |
| ISBN | 0-7695-5057-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
2013 IEEE 8th International Conference on Global Software Engineering
Global Software Engineering |
| Record Nr. | UNISA-996279285003316 |
| IEEE | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2013 IEEE 8th International Conference on Global Software Engineering (ICGSE 2013) : Bari, Italy, 26-29 August 2013
| 2013 IEEE 8th International Conference on Global Software Engineering (ICGSE 2013) : Bari, Italy, 26-29 August 2013 |
| Pubbl/distr/stampa | IEEE |
| Soggetto topico |
Computer software - Development
Software localization System design Integrated circuits - Very large scale integration - Computer-aided design |
| ISBN | 0-7695-5057-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
2013 IEEE 8th International Conference on Global Software Engineering
Global Software Engineering |
| Record Nr. | UNINA-9910132396503321 |
| IEEE | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2018 19th International Symposium on Quality Electronic Design : March 13-14, 2018, Santa Clara, California USA. / / IEEE Electron Devices Society [and four others]
| 2018 19th International Symposium on Quality Electronic Design : March 13-14, 2018, Santa Clara, California USA. / / IEEE Electron Devices Society [and four others] |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (81 pages) |
| Disciplina | 621.395 |
| Soggetto topico |
Integrated circuits industry - Quality control
Three-dimensional integrated circuits Integrated circuits - Very large scale integration - Computer-aided design |
| ISBN | 1-5386-1214-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996280720903316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2018 19th International Symposium on Quality Electronic Design : March 13-14, 2018, Santa Clara, California USA. / / IEEE Electron Devices Society [and four others]
| 2018 19th International Symposium on Quality Electronic Design : March 13-14, 2018, Santa Clara, California USA. / / IEEE Electron Devices Society [and four others] |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica | 1 online resource (81 pages) |
| Disciplina | 621.395 |
| Soggetto topico |
Integrated circuits industry - Quality control
Three-dimensional integrated circuits Integrated circuits - Very large scale integration - Computer-aided design |
| ISBN | 1-5386-1214-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910280929303321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
20th International Symposium on Quality Electronic Design : March 6-7, 2019, Santa Clara, California USA / / Institute of Electrical and Electronics Engineers
| 20th International Symposium on Quality Electronic Design : March 6-7, 2019, Santa Clara, California USA / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2019 |
| Descrizione fisica | 1 online resource (75 pages) |
| Disciplina | 621.395 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Computer-aided design
Three-dimensional integrated circuits Integrated circuits industry - Quality control |
| ISBN | 1-7281-0392-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910320655603321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
20th International Symposium on Quality Electronic Design : March 6-7, 2019, Santa Clara, California USA / / Institute of Electrical and Electronics Engineers
| 20th International Symposium on Quality Electronic Design : March 6-7, 2019, Santa Clara, California USA / / Institute of Electrical and Electronics Engineers |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2019 |
| Descrizione fisica | 1 online resource (75 pages) |
| Disciplina | 621.395 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Computer-aided design
Three-dimensional integrated circuits Integrated circuits industry - Quality control |
| ISBN | 1-7281-0392-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996575389303316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California
| 6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2005 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Very large scale integration - Computer-aided design Integrated circuits - Very large scale integration - Testing - Quality control Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5386-0067-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996202254303316 |
| [Place of publication not identified], : IEEE Computer Society, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California
| 6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2005 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Very large scale integration - Computer-aided design Integrated circuits - Very large scale integration - Testing - Quality control Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5386-0067-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910146498103321 |
| [Place of publication not identified], : IEEE Computer Society, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
