2008 IEEE International Workshop on Hardware-Oriented Security and Trust, Anaheim, CA, 9 June 2008 |
Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2008 |
Disciplina | 005.8 |
Soggetto topico |
Computers - Design and construction - Circuits
Integrated circuits - Verification Computer security Electronic security systems Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
ISBN | 1-5090-7858-4 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996205031403316 |
[Place of publication not identified], : IEEE, 2008 | ||
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Lo trovi qui: Univ. di Salerno | ||
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2008 IEEE International Workshop on Hardware-Oriented Security and Trust, Anaheim, CA, 9 June 2008 |
Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2008 |
Disciplina | 005.8 |
Soggetto topico |
Computers - Design and construction - Circuits
Integrated circuits - Verification Computer security Electronic security systems Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
ISBN | 1-5090-7858-4 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910145387203321 |
[Place of publication not identified], : IEEE, 2008 | ||
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Lo trovi qui: Univ. Federico II | ||
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2008 IEEE International Workshop on Microprocessor Test and Verification |
Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2008 |
Descrizione fisica | 1 online resource (110 pages) |
Soggetto topico |
Microprocessors - Testing
Systems on a chip - Testing Integrated circuits - Verification |
ISBN | 1-5090-7784-7 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996213969703316 |
[Place of publication not identified], : IEEE, 2008 | ||
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Lo trovi qui: Univ. di Salerno | ||
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2008 IEEE International Workshop on Microprocessor Test and Verification |
Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2008 |
Descrizione fisica | 1 online resource (110 pages) |
Soggetto topico |
Microprocessors - Testing
Systems on a chip - Testing Integrated circuits - Verification |
ISBN | 1-5090-7784-7 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910145431403321 |
[Place of publication not identified], : IEEE, 2008 | ||
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Lo trovi qui: Univ. Federico II | ||
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22nd Workshop - Methods and Description Languages for Modelling and Verification of Circuits and Systems : 8 April 2019, Kaiserslautern, Germany / / Institute of Electrical and Electronics Engineers |
Edizione | [Neuerscheinung] |
Pubbl/distr/stampa | Berlin, Germany : , : VDE Verlag, , 2019 |
Descrizione fisica | 1 online resource (9 pages) |
Disciplina | 621.392 |
Soggetto topico |
Computer hardware description languages
Integrated circuits - Verification System design |
ISBN | 3-8007-4946-7 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996575445603316 |
Berlin, Germany : , : VDE Verlag, , 2019 | ||
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Lo trovi qui: Univ. di Salerno | ||
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5th International Workshop on Microprocessor Test and Verification : common challenges and solutions : proceedings : Austin, Texas, September 9-10, 2004 |
Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2005 |
Disciplina | 004.16 |
Soggetto topico |
Microprocessors - Testing
Integrated circuits - Testing Integrated circuits - Verification Systems on a chip - Testing Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996202252903316 |
[Place of publication not identified], : IEEE Computer Society, 2005 | ||
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Lo trovi qui: Univ. di Salerno | ||
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5th International Workshop on Microprocessor Test and Verification : common challenges and solutions : proceedings : Austin, Texas, September 9-10, 2004 |
Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2005 |
Disciplina | 004.16 |
Soggetto topico |
Microprocessors - Testing
Integrated circuits - Testing Integrated circuits - Verification Systems on a chip - Testing Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910872509303321 |
[Place of publication not identified], : IEEE Computer Society, 2005 | ||
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Lo trovi qui: Univ. Federico II | ||
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Authentication of embedded devices : technologies, protocols and emerging applications / / editor, Basel Halak |
Edizione | [1st edition 2021.] |
Pubbl/distr/stampa | Cham, Switzerland : , : Springer, , [2021] |
Descrizione fisica | 1 online resource (XV, 188 p. 74 illus., 36 illus. in color.) |
Disciplina | 621.3815 |
Soggetto topico |
Integrated circuits - Verification
Embedded computer systems Electronic circuits Computer engineering Computer organization Internet of things Microprocessors |
ISBN | 3-030-60769-0 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Introduction -- Integrated Circuit Fingerprinting -- Novel PUF designs for device Identification -- Authentication Protocols: Standards, limitation and research opportunities -- Hardware-based Authentication Protocols for better physical security -- Energy Efficient Authentication Protocols -- Case study 1: Securing Hardware Supply Chain -- Case study 2: GPS spoofing attack detection and survival. |
Record Nr. | UNINA-9910484330603321 |
Cham, Switzerland : , : Springer, , [2021] | ||
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Lo trovi qui: Univ. Federico II | ||
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Comprehensive functional verification : the complete industry cycle [[electronic resource] /] / Bruce Wile, John C. Goss, Wolfgang Roesner |
Autore | Wile Bruce |
Pubbl/distr/stampa | Amsterdam ; ; Boston, : Elsevier/Morgan Kaufmann, c2005 |
Descrizione fisica | 1 online resource (702 p.) |
Disciplina | 621.3815/48 |
Altri autori (Persone) |
GossJohn C
RoesnerW (Wolfgang) |
Collana | Systems on Silicon |
Soggetto topico |
Circuits integrats - Verificació
Integrated circuits - Verification Computer engineering |
Soggetto genere / forma | Electronic books. |
ISBN |
1-281-00839-7
9786611008390 1-4237-2233-7 9780080476643 0-08-047664-3 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Cover; Author Bios; FOREWORD; Table of contents; PREFACE; ACKNOWLEDGEMENTS; PART I: INTRODUCTION TO VERIFICATION; PART II: SIMULATION-BASED VERIFICATION; PART III: FORMAL VERIFICATION; PART IV: COMPREHENSIVE VERIFICATION; PART V: CASE STUDIES; VERIFICATION GLOSSARY; REFERENCES; SUBJECT INDEX |
Record Nr. | UNINA-9910458499603321 |
Wile Bruce
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Amsterdam ; ; Boston, : Elsevier/Morgan Kaufmann, c2005 | ||
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Lo trovi qui: Univ. Federico II | ||
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Comprehensive functional verification : the complete industry cycle [[electronic resource] /] / Bruce Wile, John C. Goss, Wolfgang Roesner |
Autore | Wile Bruce |
Pubbl/distr/stampa | Amsterdam ; ; Boston, : Elsevier/Morgan Kaufmann, c2005 |
Descrizione fisica | 1 online resource (702 p.) |
Disciplina | 621.3815/48 |
Altri autori (Persone) |
GossJohn C
RoesnerW (Wolfgang) |
Collana | Systems on Silicon |
Soggetto topico |
Circuits integrats - Verificació
Integrated circuits - Verification Computer engineering |
ISBN |
1-281-00839-7
9786611008390 1-4237-2233-7 9780080476643 0-08-047664-3 |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Cover; Author Bios; FOREWORD; Table of contents; PREFACE; ACKNOWLEDGEMENTS; PART I: INTRODUCTION TO VERIFICATION; PART II: SIMULATION-BASED VERIFICATION; PART III: FORMAL VERIFICATION; PART IV: COMPREHENSIVE VERIFICATION; PART V: CASE STUDIES; VERIFICATION GLOSSARY; REFERENCES; SUBJECT INDEX |
Record Nr. | UNINA-9910784566503321 |
Wile Bruce
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Amsterdam ; ; Boston, : Elsevier/Morgan Kaufmann, c2005 | ||
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Lo trovi qui: Univ. Federico II | ||
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