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7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California
| 7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified] : , : IEEE Computer Society, , 2006 |
| Disciplina | 621.3815 |
| Collana | ACM Conferences. |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Testing - Quality control - Very large scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-9459-8 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | ISQED '06 |
| Record Nr. | UNISA-996197586203316 |
| [Place of publication not identified] : , : IEEE Computer Society, , 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California
| 7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified] : , : IEEE Computer Society, , 2006 |
| Disciplina | 621.3815 |
| Collana | ACM Conferences. |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Testing - Quality control - Very large scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN |
9781509094592
1509094598 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | ISQED '06 |
| Record Nr. | UNINA-9910145452103321 |
| [Place of publication not identified] : , : IEEE Computer Society, , 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
8th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March
| 8th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2007 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Very large scale integration - Computer-aided design Integrated circuits - Testing - Quality control - Very large scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-8811-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996202098303316 |
| [Place of publication not identified], : IEEE Computer Society, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
8th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March
| 8th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2007 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Very large scale integration - Computer-aided design Integrated circuits - Testing - Quality control - Very large scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN |
9781509088119
1509088113 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910142701303321 |
| [Place of publication not identified], : IEEE Computer Society, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
