Info
- Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.
.. East-West Design and Test Symposium
| .. East-West Design and Test Symposium |
| Pubbl/distr/stampa | Piscataway, NJ : , : Institute of Electrical and Electronics Engineers, Inc |
| Disciplina | 621.38195 |
| Soggetto topico |
Computer engineering
Electronic circuit design Electronic circuits - Testing Electronic digital computers - Circuits - Testing Integrated circuits - Testing |
| Soggetto genere / forma |
Periodicals.
Conference papers and proceedings. Electronic journals |
| ISSN | 2472-761X |
| Formato | Materiale a stampa  |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910626115703321 |
| Piscataway, NJ : , : Institute of Electrical and Electronics Engineers, Inc | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
.. East-West Design and Test Symposium
| .. East-West Design and Test Symposium |
| Pubbl/distr/stampa | Piscataway, NJ : , : Institute of Electrical and Electronics Engineers, Inc |
| Disciplina | 621.38195 |
| Soggetto topico |
Computer engineering
Electronic circuit design Electronic circuits - Testing Electronic digital computers - Circuits - Testing Integrated circuits - Testing |
| Soggetto genere / forma |
Periodicals.
Conference papers and proceedings. |
| ISSN | 2472-761X |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
EWDTS ..
Proceedings Proceedings of IEEE East-West Disign & Test Symposium Proceedings of IEEE East-West Disign and Test Symposium IEEE East-West Design & Test International Symposium |
| Record Nr. | UNISA-996581539603316 |
| Piscataway, NJ : , : Institute of Electrical and Electronics Engineers, Inc | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1500-2022 - IEEE Standard Testability Method for Embedded Core-based Integrated Circuits / / IEEE
| 1500-2022 - IEEE Standard Testability Method for Embedded Core-based Integrated Circuits / / IEEE |
| Pubbl/distr/stampa | New York : , : IEEE, , 2022 |
| Descrizione fisica | 1 online resource (168 pages) |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Testing
Embedded computer systems - Testing Systems on a chip - Testing - Standards |
| ISBN | 1-5044-8866-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996574994103316 |
| New York : , : IEEE, , 2022 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX
| 2005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX |
| Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2005 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Testing
Semiconductors - Testing Electronics Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| ISBN | 1-5090-9767-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996204068103316 |
| [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX
| 2005 IEEE International Test Conference (ITC) : 8-10 November, 2005, Austin, TX |
| Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2005 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Testing
Semiconductors - Testing Electronics Electrical Engineering Electrical & Computer Engineering Engineering & Applied Sciences |
| ISBN | 1-5090-9767-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910146829703321 |
| [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2006 IEEE International Test Conference : Santa Clara, CA : 22-27 October 2006
| 2006 IEEE International Test Conference : Santa Clara, CA : 22-27 October 2006 |
| Pubbl/distr/stampa | IEEE |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Testing
Electronic digital computers - Circuits - Testing Telecommunication Radio frequency |
| ISBN | 1-5090-9088-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
Autonomic Computing
2006 IEEE International Test Conference |
| Record Nr. | UNISA-996281106603316 |
| IEEE | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2006 IEEE International Test Conference : Santa Clara, CA : 22-27 October 2006
| 2006 IEEE International Test Conference : Santa Clara, CA : 22-27 October 2006 |
| Pubbl/distr/stampa | IEEE |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Testing
Electronic digital computers - Circuits - Testing Telecommunication Radio frequency |
| ISBN | 1-5090-9088-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
Autonomic Computing
2006 IEEE International Test Conference |
| Record Nr. | UNINA-9910142706203321 |
| IEEE | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings
| 2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings |
| Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2006 |
| Soggetto topico |
Integrated circuits - Design and construction
Integrated circuits - Testing Nanotechnology - Design Microelectronics Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| ISBN | 1-5090-9548-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996207484803316 |
| [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings
| 2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings |
| Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2006 |
| Soggetto topico |
Integrated circuits - Design and construction
Integrated circuits - Testing Nanotechnology - Design Microelectronics Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| ISBN | 1-5090-9548-9 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910145647203321 |
| [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan
| 2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2007 |
| Soggetto topico |
Integrated circuits - Testing
Semiconductors - Testing Electronic apparatus and appliances - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-8269-7 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996280845903316 |
| [Place of publication not identified], : IEEE, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
