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10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems : 26-29 April 2009, Delft, Netherlands / / Institute of Electrical and Electronics Engineers
10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems : 26-29 April 2009, Delft, Netherlands / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2009
Descrizione fisica 1 online resource (114 pages)
Disciplina 621.3815
Soggetto topico Integrated circuits - Simulation methods
Microelectronics - Design
Microelectronics - Simulation methods
ISBN 1-4244-4161-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISA-996212387603316
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2009
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems : 26-29 April 2009, Delft, Netherlands / / Institute of Electrical and Electronics Engineers
10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems : 26-29 April 2009, Delft, Netherlands / / Institute of Electrical and Electronics Engineers
Pubbl/distr/stampa Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2009
Descrizione fisica 1 online resource (114 pages)
Disciplina 621.3815
Soggetto topico Integrated circuits - Simulation methods
Microelectronics - Design
Microelectronics - Simulation methods
ISBN 1-4244-4161-7
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910138914903321
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2009
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Noise in semiconductor devices : modeling and simulation / Fabrizio Bonani, Giovanni Ghione
Noise in semiconductor devices : modeling and simulation / Fabrizio Bonani, Giovanni Ghione
Autore Bonani, Fabrizio, 1967-
Pubbl/distr/stampa New York : Springer, c2001
Descrizione fisica xxxi, 213 p. : ill. ; 24 cm.
Disciplina 621.38152
Altri autori (Persone) Ghione, Giovanni, 1956-author
Collana Springer series in advanced microelectronics, 1437-0387 ; 7
Soggetto topico Electronic noise - Mathematical models
Integrated circuits - Simulation methods
Semiconductors - Mathematical models
ISBN 3540665838
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNISALENTO-991002300269707536
Bonani, Fabrizio, 1967-  
New York : Springer, c2001
Materiale a stampa
Lo trovi qui: Univ. del Salento
Opac: Controlla la disponibilità qui