1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995 |
Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1996 |
Disciplina | 621.3815 |
Soggetto topico |
Integrated circuits - Congresses - Reliability
Integrated circuits - Reliability - Wafer scale integration - Congresses Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996204469603316 |
[Place of publication not identified], : IEEE Electron Devices Society, 1996 | ||
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Lo trovi qui: Univ. di Salerno | ||
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1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995 |
Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1996 |
Disciplina | 621.3815 |
Soggetto topico |
Integrated circuits - Congresses - Reliability
Integrated circuits - Reliability - Wafer scale integration - Congresses Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910872781003321 |
[Place of publication not identified], : IEEE Electron Devices Society, 1996 | ||
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Lo trovi qui: Univ. Federico II | ||
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