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6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California
| 6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2005 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Very large scale integration - Computer-aided design Integrated circuits - Very large scale integration - Testing - Quality control Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5386-0067-6 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996202254303316 |
| [Place of publication not identified], : IEEE Computer Society, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California
| 6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2005 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Very large scale integration - Computer-aided design Integrated circuits - Very large scale integration - Testing - Quality control Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN |
9781538600672
1538600676 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910146498103321 |
| [Place of publication not identified], : IEEE Computer Society, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California
| 7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified] : , : IEEE Computer Society, , 2006 |
| Disciplina | 621.3815 |
| Collana | ACM Conferences. |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Testing - Quality control - Very large scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-9459-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | ISQED '06 |
| Record Nr. | UNISA-996197586203316 |
| [Place of publication not identified] : , : IEEE Computer Society, , 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California
| 7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified] : , : IEEE Computer Society, , 2006 |
| Disciplina | 621.3815 |
| Collana | ACM Conferences. |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Testing - Quality control - Very large scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN |
9781509094592
1509094598 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | ISQED '06 |
| Record Nr. | UNINA-9910145452103321 |
| [Place of publication not identified] : , : IEEE Computer Society, , 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
8th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March
| 8th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2007 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Very large scale integration - Computer-aided design Integrated circuits - Testing - Quality control - Very large scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-8811-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996202098303316 |
| [Place of publication not identified], : IEEE Computer Society, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
8th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March
| 8th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2007 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Very large scale integration - Computer-aided design Integrated circuits - Testing - Quality control - Very large scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN |
9781509088119
1509088113 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910142701303321 |
| [Place of publication not identified], : IEEE Computer Society, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
International Symposium on Quality Electronic Design : 18-21 March, 2002, San Jose, California : proceedings
| International Symposium on Quality Electronic Design : 18-21 March, 2002, San Jose, California : proceedings |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2002 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Design and construction - Very large scale integration Integrated circuits - Very large scale integration - Computer-aided design Integrated circuits - Very large scale integration - Quality control - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996200682203316 |
| [Place of publication not identified], : IEEE Computer Society, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
International Symposium on Quality Electronic Design : 18-21 March, 2002, San Jose, California : proceedings
| International Symposium on Quality Electronic Design : 18-21 March, 2002, San Jose, California : proceedings |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2002 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Design and construction - Very large scale integration Integrated circuits - Very large scale integration - Computer-aided design Integrated circuits - Very large scale integration - Quality control - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872735203321 |
| [Place of publication not identified], : IEEE Computer Society, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
International Symposium on Quality Electronic Design : proceedings, 26-28 March, 2001, San Jose, California
| International Symposium on Quality Electronic Design : proceedings, 26-28 March, 2001, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2001 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Design and construction - Very large scale integration Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Testing - Very large scale integration - Quality control Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996203396803316 |
| [Place of publication not identified], : IEEE Computer Society, 2001 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
International Symposium on Quality Electronic Design : proceedings, 26-28 March, 2001, San Jose, California
| International Symposium on Quality Electronic Design : proceedings, 26-28 March, 2001, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2001 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Design and construction - Very large scale integration Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Testing - Very large scale integration - Quality control Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872976303321 |
| [Place of publication not identified], : IEEE Computer Society, 2001 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
