1994 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994 |
Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1994 |
Disciplina | 621.3815/2 |
Soggetto topico |
Integrated circuits - Reliability - Congresses
Integrated circuits - Reliability - Congresses - Wafer scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996214351703316 |
[Place of publication not identified], : IEEE Electron Devices Society, 1994 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. di Salerno | ||
|
1994 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994 |
Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1994 |
Disciplina | 621.3815/2 |
Soggetto topico |
Integrated circuits - Reliability - Congresses
Integrated circuits - Reliability - Congresses - Wafer scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910872753003321 |
[Place of publication not identified], : IEEE Electron Devices Society, 1994 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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