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1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995
| 1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1996 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer scale integration - Congresses Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872781003321 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
1998 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998
| 1998 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1998 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996212589903316 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1998 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998
| 1998 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1998 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872867103321 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
1998 IEEE International Reliability Physics Symposium
| 1998 IEEE International Reliability Physics Symposium |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 1998 |
| Descrizione fisica | 1 online resource (400 pages) |
| Disciplina | 621.381 |
| Soggetto topico |
Electronic apparatus and appliances - Reliability
Integrated circuits - Reliability |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872647503321 |
| [Place of publication not identified], : IEEE, 1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998
| 1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1999 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996215080003316 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998
| 1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1999 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872502503321 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2000 IEEE International Integrated Reliability Workshop Final Report
| 2000 IEEE International Integrated Reliability Workshop Final Report |
| Pubbl/distr/stampa | [Place of publication not identified], : I E E E, 2000 |
| Descrizione fisica | 1 online resource |
| Disciplina | 621.3815 |
| Soggetto topico | Integrated circuits - Reliability |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872641003321 |
| [Place of publication not identified], : I E E E, 2000 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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2002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002
| 2002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Society, 2002 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Wafer-scale integration - Reliability Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996202498803316 |
| [Place of publication not identified], : IEEE Society, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002
| 2002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Society, 2002 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Wafer-scale integration - Reliability Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872440403321 |
| [Place of publication not identified], : IEEE Society, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2003 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003
| 2003 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Society, 2003 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996202927503316 |
| [Place of publication not identified], : IEEE Society, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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