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1998 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998
| 1998 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1998 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996212589903316 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998
| 1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1999 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996215080003316 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002
| 2002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Society, 2002 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Wafer-scale integration - Reliability Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996202498803316 |
| [Place of publication not identified], : IEEE Society, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2003 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003
| 2003 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Society, 2003 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996202927503316 |
| [Place of publication not identified], : IEEE Society, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005
| 2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 2005 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration |
| ISBN | 1-5090-9773-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996204072103316 |
| [Place of publication not identified], : IEEE Electron Devices Society, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005
| 2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 2005 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration |
| ISBN | 1-5090-9773-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910146457403321 |
| [Place of publication not identified], : IEEE Electron Devices Society, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2006 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-19, 2006
| 2006 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-19, 2006 |
| Pubbl/distr/stampa | [Place of publication not identified], : Electron Devices Society, 2006 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN |
1-5090-9096-7
1-4244-0297-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996197886603316 |
| [Place of publication not identified], : Electron Devices Society, 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2006 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-19, 2006
| 2006 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-19, 2006 |
| Pubbl/distr/stampa | [Place of publication not identified], : Electron Devices Society, 2006 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN |
1-5090-9096-7
1-4244-0297-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910146723603321 |
| [Place of publication not identified], : Electron Devices Society, 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2007 IEEE International Integrated Reliability Workshop Final Report : 15-18 October 2007, S. Lake Tahoe, CA, USA / / IEEE Electron Devices Society
| 2007 IEEE International Integrated Reliability Workshop Final Report : 15-18 October 2007, S. Lake Tahoe, CA, USA / / IEEE Electron Devices Society |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2007 |
| Descrizione fisica | 1 online resource (x, 168 pages) |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration |
| ISBN |
1-5090-8459-2
9781424417726 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2007 Institute of Electrical and Electronics Engineers International Integrated Reliability Workshop Final Report |
| Record Nr. | UNISA-996279898803316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2007 IEEE International Integrated Reliability Workshop Final Report : 15-18 October 2007, S. Lake Tahoe, CA, USA / / IEEE Electron Devices Society
| 2007 IEEE International Integrated Reliability Workshop Final Report : 15-18 October 2007, S. Lake Tahoe, CA, USA / / IEEE Electron Devices Society |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2007 |
| Descrizione fisica | 1 online resource (x, 168 pages) |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration |
| ISBN |
1-5090-8459-2
9781424417726 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2007 Institute of Electrical and Electronics Engineers International Integrated Reliability Workshop Final Report |
| Record Nr. | UNINA-9910139130803321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
