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1998 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998
| 1998 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1998 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996212589903316 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1998 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998
| 1998 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1998 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872867103321 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998
| 1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1999 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996215080003316 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998
| 1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 1999 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872502503321 |
| [Place of publication not identified], : IEEE Electron Devices Society, 1999 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002
| 2002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Society, 2002 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Wafer-scale integration - Reliability Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996202498803316 |
| [Place of publication not identified], : IEEE Society, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002
| 2002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Society, 2002 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Wafer-scale integration - Reliability Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872440403321 |
| [Place of publication not identified], : IEEE Society, 2002 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2003 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003
| 2003 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Society, 2003 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996202927503316 |
| [Place of publication not identified], : IEEE Society, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2003 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003
| 2003 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Society, 2003 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872466303321 |
| [Place of publication not identified], : IEEE Society, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005
| 2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 2005 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration |
| ISBN | 1-5090-9773-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996204072103316 |
| [Place of publication not identified], : IEEE Electron Devices Society, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005
| 2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005 |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Electron Devices Society, 2005 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Reliability - Wafer-scale integration |
| ISBN | 1-5090-9773-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910146457403321 |
| [Place of publication not identified], : IEEE Electron Devices Society, 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
