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22nd European Mask and Lithography Conference : 23-26 January 2006
| 22nd European Mask and Lithography Conference : 23-26 January 2006 |
| Pubbl/distr/stampa | New York : , : IEEE, , 2011 |
| Descrizione fisica | 1 online resource (175 pages) |
| Disciplina | 621.3815 |
| Altri autori (Persone) | BehringerUwe F. W |
| Soggetto topico |
Microlithography
Integrated circuits - Masks |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996215980503316 |
| New York : , : IEEE, , 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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23rd European Mask and Lithography Conference : 22-26 January 2007
| 23rd European Mask and Lithography Conference : 22-26 January 2007 |
| Pubbl/distr/stampa | New York : , : IEEE, , 2011 |
| Descrizione fisica | 1 online resource (230 pages) |
| Soggetto topico |
Microlithography
Integrated circuits - Masks |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996215980403316 |
| New York : , : IEEE, , 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
25th European Mask and Lithography Conference : 12-15 January 2009
| 25th European Mask and Lithography Conference : 12-15 January 2009 |
| Pubbl/distr/stampa | Frankfurt am Main, Germany : , : VDE, , 2011 |
| Descrizione fisica | 1 online resource (135 pages) |
| Disciplina | 621.3815 |
| Altri autori (Persone) | BehringerUwe F. W |
| Soggetto topico |
Microlithography
Integrated circuits - Masks |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996215980303316 |
| Frankfurt am Main, Germany : , : VDE, , 2011 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Built-in fault-tolerant computing paradigm for resilient large-scale chip design : a self-test, self-diagnosis, and self-repair-based approach / / Xiaowei Li, Guihai Yan, and Cheng Liu
| Built-in fault-tolerant computing paradigm for resilient large-scale chip design : a self-test, self-diagnosis, and self-repair-based approach / / Xiaowei Li, Guihai Yan, and Cheng Liu |
| Autore | Li Xiaowei |
| Edizione | [1st ed. 2023.] |
| Pubbl/distr/stampa | Gateway East, Singapore : , : Springer, , [2023] |
| Descrizione fisica | 1 online resource (318 pages) |
| Disciplina | 004.2 |
| Soggetto topico |
Fault-tolerant computing
Integrated circuits - Masks |
| ISBN | 981-19-8551-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Chapter 1: Introduction -- Chapter 2: Fault-tolerant general circuits with 3S -- Chapter 3: Fault-tolerant general purposed processors with 3S -- Chapter 4: Fault-tolerant network-on-chip with 3S -- Chapter 5: Fault-tolerant deep learning processors with 3S -- Chapter 6: Conclusion. |
| Record Nr. | UNINA-9910678251903321 |
Li Xiaowei
|
||
| Gateway East, Singapore : , : Springer, , [2023] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Built-in fault-tolerant computing paradigm for resilient large-scale chip design : a self-test, self-diagnosis, and self-repair-based approach / / Xiaowei Li, Guihai Yan, and Cheng Liu
| Built-in fault-tolerant computing paradigm for resilient large-scale chip design : a self-test, self-diagnosis, and self-repair-based approach / / Xiaowei Li, Guihai Yan, and Cheng Liu |
| Autore | Li Xiaowei |
| Edizione | [1st ed. 2023.] |
| Pubbl/distr/stampa | Gateway East, Singapore : , : Springer, , [2023] |
| Descrizione fisica | 1 online resource (318 pages) |
| Disciplina | 004.2 |
| Soggetto topico |
Fault-tolerant computing
Integrated circuits - Masks |
| ISBN | 981-19-8551-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Chapter 1: Introduction -- Chapter 2: Fault-tolerant general circuits with 3S -- Chapter 3: Fault-tolerant general purposed processors with 3S -- Chapter 4: Fault-tolerant network-on-chip with 3S -- Chapter 5: Fault-tolerant deep learning processors with 3S -- Chapter 6: Conclusion. |
| Record Nr. | UNISA-996547956703316 |
|
Li Xiaowei
|
||
| Gateway East, Singapore : , : Springer, , [2023] | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
EMLC 2007 : 23rd European Mask and Lithography Conference : 22-25 January 2007, Grenoble, France
| EMLC 2007 : 23rd European Mask and Lithography Conference : 22-25 January 2007, Grenoble, France |
| Pubbl/distr/stampa | [Place of publication not identified], : SPIE, 2007 |
| Disciplina | 621.3815/31 |
| Collana | Proceedings of SPIE EMLC 2007 |
| Soggetto topico |
Integrated circuits - Masks
Microlithography Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996279650603316 |
| [Place of publication not identified], : SPIE, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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