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2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) / / IEEE Staff
| 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) / / IEEE Staff |
| Pubbl/distr/stampa | Piscataway, NJ : , : IEEE, , 2013 |
| Descrizione fisica | 1 online resource |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Very large scale integration
Integrated circuits - Fault tolerance |
| ISBN |
1-4799-1585-8
1-4799-1584-X |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Defect and Fault Tolerance in VLSI and Nanotechnology Systems |
| Record Nr. | UNISA-996279995003316 |
| Piscataway, NJ : , : IEEE, , 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) / / IEEE Staff
| 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) / / IEEE Staff |
| Pubbl/distr/stampa | Piscataway, NJ : , : IEEE, , 2013 |
| Descrizione fisica | 1 online resource |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Very large scale integration
Integrated circuits - Fault tolerance |
| ISBN |
1-4799-1585-8
1-4799-1584-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Defect and Fault Tolerance in VLSI and Nanotechnology Systems |
| Record Nr. | UNINA-9910133227303321 |
| Piscataway, NJ : , : IEEE, , 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) / / Institute of Electrical and Electronics Engineers (IEEE)
| 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) / / Institute of Electrical and Electronics Engineers (IEEE) |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2020 |
| Descrizione fisica | 1 online resource : illustrations some color |
| Disciplina | 004.2 |
| Soggetto topico |
Integrated circuits - Fault tolerance
Nanotechnology Conference papers and proceedings |
| ISBN | 1-7281-9457-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems |
| Record Nr. | UNINA-9910437213503321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) / / Institute of Electrical and Electronics Engineers (IEEE)
| 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) / / Institute of Electrical and Electronics Engineers (IEEE) |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2020 |
| Descrizione fisica | 1 online resource : illustrations some color |
| Disciplina | 004.2 |
| Soggetto topico |
Integrated circuits - Fault tolerance
Nanotechnology Conference papers and proceedings |
| ISBN | 1-7281-9457-1 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems |
| Record Nr. | UNISA-996575516903316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
DFT : proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems : 1-3 October 2014, Amsterdam
| DFT : proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems : 1-3 October 2014, Amsterdam |
| Pubbl/distr/stampa | New York : , : IEEE, , 2014 |
| Descrizione fisica | 1 online resource (xvi, 190 pages) |
| Soggetto topico |
Integrated circuits - Very large scale integration
Nanotechnology Integrated circuits - Fault tolerance |
| ISBN | 1-4799-6155-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996279994703316 |
| New York : , : IEEE, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
DFT : proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems : 1-3 October 2014, Amsterdam
| DFT : proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems : 1-3 October 2014, Amsterdam |
| Pubbl/distr/stampa | New York : , : IEEE, , 2014 |
| Descrizione fisica | 1 online resource (xvi, 190 pages) |
| Soggetto topico |
Integrated circuits - Very large scale integration
Nanotechnology Integrated circuits - Fault tolerance |
| ISBN | 1-4799-6155-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910141903303321 |
| New York : , : IEEE, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Energy-efficient fault-tolerant systems / / Jimson Mathew, Rishad A. Shafik, Dhiraj K. Pradhan, editors
| Energy-efficient fault-tolerant systems / / Jimson Mathew, Rishad A. Shafik, Dhiraj K. Pradhan, editors |
| Autore | Mathew Jimson |
| Edizione | [1st ed. 2014.] |
| Pubbl/distr/stampa | New York : , : Springer, , 2014 |
| Descrizione fisica | 1 online resource (xiv, 335 pages) : illustrations (some color) |
| Disciplina |
006.22
621.39/5/0287 |
| Collana | Embedded Systems |
| Soggetto topico | Integrated circuits - Fault tolerance |
| ISBN | 1-4614-4193-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Evolution of Fault Tolerant Design -- Fault and Reliability Models -- Energy Efficient Design Techniques -- Error Correction Coding -- System-level Reliable Design -- Fault Tolerant -- Finite Field Arithmetic Circuit Design and Testing Techniques -- Reliable Network-on-Chip Architectures -- Energy Efficient Reconfigurable Systems -- Bio-Inspired Online Fault Detection in NoC Interconnect -- Fault-tolerant dynamically reconfigurable NoC-based SoC. |
| Record Nr. | UNINA-9910299744903321 |
Mathew Jimson
|
||
| New York : , : Springer, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Fault-Tolerant Computing, 28th International Symposium (FTCS '98)
| Fault-Tolerant Computing, 28th International Symposium (FTCS '98) |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society Press, 1998 |
| Descrizione fisica | 1 online resource (496 pages) |
| Disciplina | 004.2 |
| Soggetto topico |
Fault-tolerant computing
Integrated circuits - Fault tolerance |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996200242503316 |
| [Place of publication not identified], : IEEE Computer Society Press, 1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings : ... IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
| Proceedings : ... IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems |
| Pubbl/distr/stampa | Los Alamitos, California : , : CPS, Conference Publishing Services, IEEE Computer Society, , [2011]- |
| Disciplina | 621 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Integrated circuits - Fault tolerance Nanotechnology Circuits intégrés - Tolérance aux fautes Nanotechnologie |
| Soggetto genere / forma | Conference papers and proceedings. |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Altri titoli varianti |
.. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
DFT .. Proceedings of the ... IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Proceedings of the ... IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) DFTS Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ... IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) ... IEEE International Symposium on |
| Record Nr. | UNISA-996564470003316 |
| Los Alamitos, California : , : CPS, Conference Publishing Services, IEEE Computer Society, , [2011]- | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings / / IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : (DFT)
| Proceedings / / IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : (DFT) |
| Pubbl/distr/stampa | Los Alamitos, Calif. : , : IEEE Computer Society Press, , 1996-2010 |
| Descrizione fisica | 15 volumes |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Design and construction
Integrated circuits - Fault tolerance |
| Soggetto genere / forma |
Electronic journals.
Conference papers and proceedings. Periodicals. |
| ISSN | 2377-7966 |
| Formato | Materiale a stampa |
| Livello bibliografico | Periodico |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996279994503316 |
| Los Alamitos, Calif. : , : IEEE Computer Society Press, , 1996-2010 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
