Info
- Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.
2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings
| 2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2000 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Defects
Iddq testing Metal oxide semiconductors, Complementary Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996218751103316 |
| [Place of publication not identified], : IEEE Computer Society, 2000 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings
| 2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2000 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Defects
Iddq testing Metal oxide semiconductors, Complementary Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872792503321 |
| [Place of publication not identified], : IEEE Computer Society, 2000 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
| 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2012 |
| Descrizione fisica | 1 online resource (408 pages) |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Defects
Integrated circuits - Design and construction |
| ISBN | 1-4673-0983-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996215705003316 |
| [Place of publication not identified], : IEEE, 2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
| 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2012 |
| Descrizione fisica | 1 online resource (408 pages) |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Defects
Integrated circuits - Design and construction |
| ISBN |
9781467309837
1467309834 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910130653803321 |
| [Place of publication not identified], : IEEE, 2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
DBT 2005 : proceedings, 2005 IEEE International Workshop on Current and Defect Based Testing, 2005 : 1 May 2005
| DBT 2005 : proceedings, 2005 IEEE International Workshop on Current and Defect Based Testing, 2005 : 1 May 2005 |
| Pubbl/distr/stampa | New York : , : IEEE, , 2005 |
| Descrizione fisica | 1 online resource (81 pages) |
| Soggetto topico |
Integrated circuits - Defects
Iddq testing Metal oxide semiconductors, Complementary |
| ISBN | 1-5386-0065-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996218586703316 |
| New York : , : IEEE, , 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
DBT 2005 : proceedings, 2005 IEEE International Workshop on Current and Defect Based Testing, 2005 : 1 May 2005
| DBT 2005 : proceedings, 2005 IEEE International Workshop on Current and Defect Based Testing, 2005 : 1 May 2005 |
| Pubbl/distr/stampa | New York : , : IEEE, , 2005 |
| Descrizione fisica | 1 online resource (81 pages) |
| Soggetto topico |
Integrated circuits - Defects
Iddq testing Metal oxide semiconductors, Complementary |
| ISBN | 1-5386-0065-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910142184203321 |
| New York : , : IEEE, , 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
IPFA : proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits : June 30, 2014-July 4, 2014, Marina Bay Sands, Singapore / / organised by IEEE, IEEE Singapore Reliability/CPMT/ED Chapter ; technically co-sponsored by IEEE Electron Devices Society, Reliability Society
| IPFA : proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits : June 30, 2014-July 4, 2014, Marina Bay Sands, Singapore / / organised by IEEE, IEEE Singapore Reliability/CPMT/ED Chapter ; technically co-sponsored by IEEE Electron Devices Society, Reliability Society |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2014 |
| Descrizione fisica | 1 online resource (291 pages) |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Testing Semiconductors - Failures Integrated circuits - Defects |
| ISBN | 1-4799-3929-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910141899703321 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
IPFA : proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits : June 30, 2014-July 4, 2014, Marina Bay Sands, Singapore / / organised by IEEE, IEEE Singapore Reliability/CPMT/ED Chapter ; technically co-sponsored by IEEE Electron Devices Society, Reliability Society
| IPFA : proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits : June 30, 2014-July 4, 2014, Marina Bay Sands, Singapore / / organised by IEEE, IEEE Singapore Reliability/CPMT/ED Chapter ; technically co-sponsored by IEEE Electron Devices Society, Reliability Society |
| Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2014 |
| Descrizione fisica | 1 online resource (291 pages) |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Reliability
Integrated circuits - Testing Semiconductors - Failures Integrated circuits - Defects |
| ISBN | 1-4799-3929-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996281136103316 |
| Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2003 : [scheduled, 7 to 11 July, 2003, Singapore
| Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2003 : [scheduled, 7 to 11 July, 2003, Singapore |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2003 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Defects
Integrated circuits - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996202483603316 |
| [Place of publication not identified], : IEEE, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2003 : [scheduled, 7 to 11 July, 2003, Singapore
| Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2003 : [scheduled, 7 to 11 July, 2003, Singapore |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2003 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Defects
Integrated circuits - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872465103321 |
| [Place of publication not identified], : IEEE, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
