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ICMTS 1998 : proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan
| ICMTS 1998 : proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan |
| Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1998 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Congresses - Testing
Semiconductors - Congresses - Testing Electronic apparatus and appliances - Testing - Congresses Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996212463903316 |
| [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
ICMTS 1998 : proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan
| ICMTS 1998 : proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, March 23-26, 1998, Kanazawa, Japan |
| Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1998 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Congresses - Testing
Semiconductors - Congresses - Testing Electronic apparatus and appliances - Testing - Congresses Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872859203321 |
| [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1998 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Proceedings
| Proceedings |
| Pubbl/distr/stampa | [Place of publication not identified], : The Conference, 1997 |
| Disciplina | 621.3815/48 |
| Soggetto topico |
Integrated circuits - Congresses - Testing
Electronic digital computers - Testing - Congresses - Circuits Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| ISBN | 0-7803-4210-0 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | International Test Conference 1997 |
| Record Nr. | UNISA-996212474403316 |
| [Place of publication not identified], : The Conference, 1997 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings
| Proceedings |
| Pubbl/distr/stampa | [Place of publication not identified], : The Conference, 1996 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Congresses - Testing
Electronic digital computers - Circuits - Congresses - Testing Integrated circuits - Congresses - Fault tolerance Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996203703303316 |
| [Place of publication not identified], : The Conference, 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings
| Proceedings |
| Pubbl/distr/stampa | [Place of publication not identified], : The Conference, 1996 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Congresses - Testing
Electronic digital computers - Circuits - Congresses - Testing Integrated circuits - Congresses - Fault tolerance Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872893403321 |
| [Place of publication not identified], : The Conference, 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits
| Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits |
| Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1995 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Defects - Congresses
Integrated circuits - Congresses - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996204463203316 |
| [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1995 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits
| Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits |
| Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1995 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Defects - Congresses
Integrated circuits - Congresses - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872403403321 |
| [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1995 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97 : 21-25 July, 1997, Raffles City Convention Centre, Singapore
| Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97 : 21-25 July, 1997, Raffles City Convention Centre, Singapore |
| Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1997 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Congresses - Defects
Integrated circuits - Congresses - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996212490003316 |
| [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1997 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97 : 21-25 July, 1997, Raffles City Convention Centre, Singapore
| Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97 : 21-25 July, 1997, Raffles City Convention Centre, Singapore |
| Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1997 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Congresses - Defects
Integrated circuits - Congresses - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872407503321 |
| [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1997 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
