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1993 Symposium on Semiconductor Modeling & Simulation : March 6 (Sat)-March 7 (Sun), 1993, National Taiwan University, Taipei, Taiwan, ROC : technical digest
| 1993 Symposium on Semiconductor Modeling & Simulation : March 6 (Sat)-March 7 (Sun), 1993, National Taiwan University, Taipei, Taiwan, ROC : technical digest |
| Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1992 |
| Disciplina | 621.3815/2/011 |
| Soggetto topico |
Semiconductors - Mathematical models
Semiconductors - Computer simulation Integrated circuits - Computer-aided design - Very large scale integration Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996209202303316 |
| [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1992 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
1993 Symposium on Semiconductor Modeling & Simulation : March 6 (Sat)-March 7 (Sun), 1993, National Taiwan University, Taipei, Taiwan, ROC : technical digest
| 1993 Symposium on Semiconductor Modeling & Simulation : March 6 (Sat)-March 7 (Sun), 1993, National Taiwan University, Taipei, Taiwan, ROC : technical digest |
| Pubbl/distr/stampa | [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1992 |
| Disciplina | 621.3815/2/011 |
| Soggetto topico |
Semiconductors - Mathematical models
Semiconductors - Computer simulation Integrated circuits - Computer-aided design - Very large scale integration Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872751003321 |
| [Place of publication not identified], : Institute of Electrical and Electronics Engineers, 1992 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
5th International Symposium on Quality Electronic Design : proceedings : 22-24 March, 2004, San Jose, California
| 5th International Symposium on Quality Electronic Design : proceedings : 22-24 March, 2004, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2004 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Reliability
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Quality control - Very large scale integration - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996214938303316 |
| [Place of publication not identified], : IEEE Computer Society, 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
5th International Symposium on Quality Electronic Design : proceedings : 22-24 March, 2004, San Jose, California
| 5th International Symposium on Quality Electronic Design : proceedings : 22-24 March, 2004, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2004 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Reliability
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Quality control - Very large scale integration - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872691203321 |
| [Place of publication not identified], : IEEE Computer Society, 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California
| 7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified] : , : IEEE Computer Society, , 2006 |
| Disciplina | 621.3815 |
| Collana | ACM Conferences. |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Testing - Quality control - Very large scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-9459-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | ISQED '06 |
| Record Nr. | UNISA-996197586203316 |
| [Place of publication not identified] : , : IEEE Computer Society, , 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California
| 7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified] : , : IEEE Computer Society, , 2006 |
| Disciplina | 621.3815 |
| Collana | ACM Conferences. |
| Soggetto topico |
Integrated circuits - Reliability - Very large scale integration
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Testing - Quality control - Very large scale integration Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| ISBN | 1-5090-9459-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | ISQED '06 |
| Record Nr. | UNINA-9910145452103321 |
| [Place of publication not identified] : , : IEEE Computer Society, , 2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
AGILE 2007 : 13-17 August, 2007, Washington, D.C
| AGILE 2007 : 13-17 August, 2007, Washington, D.C |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2007 |
| Disciplina | 005.1 |
| Soggetto topico |
Computer software - Development
Integrated circuits - Computer-aided design - Very large scale integration Computer Science Engineering & Applied Sciences |
| ISBN | 1-5090-8775-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996202058003316 |
| [Place of publication not identified], : IEEE Computer Society, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
AGILE 2007 : 13-17 August, 2007, Washington, D.C
| AGILE 2007 : 13-17 August, 2007, Washington, D.C |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2007 |
| Disciplina | 005.1 |
| Soggetto topico |
Computer software - Development
Integrated circuits - Computer-aided design - Very large scale integration Computer Science Engineering & Applied Sciences |
| ISBN | 1-5090-8775-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910142654003321 |
| [Place of publication not identified], : IEEE Computer Society, 2007 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Fourth International Symposium on Quality Electronic Design : proceedings : 24-26 March, 2003, San Jose, California
| Fourth International Symposium on Quality Electronic Design : proceedings : 24-26 March, 2003, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2003 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Reliability
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Very large scale integration - Quality control - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996217941903316 |
| [Place of publication not identified], : IEEE Computer Society, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
Fourth International Symposium on Quality Electronic Design : proceedings : 24-26 March, 2003, San Jose, California
| Fourth International Symposium on Quality Electronic Design : proceedings : 24-26 March, 2003, San Jose, California |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2003 |
| Disciplina | 621.39/5 |
| Soggetto topico |
Integrated circuits - Very large scale integration - Reliability
Integrated circuits - Very large scale integration - Design and construction Integrated circuits - Computer-aided design - Very large scale integration Integrated circuits - Very large scale integration - Quality control - Testing Electrical & Computer Engineering Engineering & Applied Sciences Electrical Engineering |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872441303321 |
| [Place of publication not identified], : IEEE Computer Society, 2003 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
