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2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings
| 2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2000 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Defects
Iddq testing Metal oxide semiconductors, Complementary Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996218751103316 |
| [Place of publication not identified], : IEEE Computer Society, 2000 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings
| 2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE Computer Society, 2000 |
| Disciplina | 621.3815 |
| Soggetto topico |
Integrated circuits - Defects
Iddq testing Metal oxide semiconductors, Complementary Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872792503321 |
| [Place of publication not identified], : IEEE Computer Society, 2000 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
DBT 2004 : 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA
| DBT 2004 : 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2004 |
| Disciplina | 621.39/732 |
| Soggetto topico |
Metal oxide semiconductors, Complementary - Defects
Integrated circuits Iddq testing Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996204076503316 |
| [Place of publication not identified], : IEEE, 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
DBT 2004 : 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA
| DBT 2004 : 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA |
| Pubbl/distr/stampa | [Place of publication not identified], : IEEE, 2004 |
| Disciplina | 621.39/732 |
| Soggetto topico |
Metal oxide semiconductors, Complementary - Defects
Integrated circuits Iddq testing Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910872527003321 |
| [Place of publication not identified], : IEEE, 2004 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
DBT 2005 : proceedings, 2005 IEEE International Workshop on Current and Defect Based Testing, 2005 : 1 May 2005
| DBT 2005 : proceedings, 2005 IEEE International Workshop on Current and Defect Based Testing, 2005 : 1 May 2005 |
| Pubbl/distr/stampa | New York : , : IEEE, , 2005 |
| Descrizione fisica | 1 online resource (81 pages) |
| Soggetto topico |
Integrated circuits - Defects
Iddq testing Metal oxide semiconductors, Complementary |
| ISBN | 1-5386-0065-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNISA-996218586703316 |
| New York : , : IEEE, , 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
| ||
DBT 2005 : proceedings, 2005 IEEE International Workshop on Current and Defect Based Testing, 2005 : 1 May 2005
| DBT 2005 : proceedings, 2005 IEEE International Workshop on Current and Defect Based Testing, 2005 : 1 May 2005 |
| Pubbl/distr/stampa | New York : , : IEEE, , 2005 |
| Descrizione fisica | 1 online resource (81 pages) |
| Soggetto topico |
Integrated circuits - Defects
Iddq testing Metal oxide semiconductors, Complementary |
| ISBN | 1-5386-0065-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910142184203321 |
| New York : , : IEEE, , 2005 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
